NSC 5962-9469601VFA, 5962-9469601MFA Datasheet
100315
Low-Skew Quad Clock Driver
General Description
The 100315 contains four low skew differential drivers, designed for generation of multiple, minimum skew differential
clocks from a single differential input. This device also has
the capability to select a secondary single-ended clock
source for use in lower frequency system level testing. The
100315 is a 300 Series redesign of the 100115 clock driver.
Features
n Low output to output skew (≤50 ps)
n Differential inputs and outputs
n Secondary clock available for system level testing
n 2000V ESD protection
n Voltage compensated operating range: −4.2V to −5.7V
n Standard Microcircuit Drawing
(SMD) 5962-9469601
Logic Diagram
Connection Diagram
Pin Names Description
CLKIN, CLKIN
Differential Clock Inputs
CLK
1–4
, CLK
1–4
Differential Clock Outputs
TCLK Test Clock Input (Note 1)
CLKSEL Clock Input Select (Note 1)
Note 1: TCLK andCLKSELare single-endedinputs, withinternal 50kΩ pull-
down resistors.
Truth Table
CLKSEL CLKIN CLKIN TCLK CLKNCLK
N
LLHXLH
LHLXHL
HXXLLH
HXXHHL
L
=
Low Voltage Level
H=High Voltage Level
X=Don’t Care
DS100319-1
Flatpak
DS100319-2
August 1998
100315 Low-Skew Quad Clock Driver
© 1998 National Semiconductor Corporation DS100319 www.national.com
Absolute Maximum Ratings (Note 2)
If Military/Aerospace specified devices are required,
please contact theNational Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired
Storage Temperature −65˚C to +150˚C
Maximum Junction Temperature (T
J
)
Ceramic +175˚C
Case Temperature under Bias (T
C
) –55˚C to +125˚C
V
EE
Pin Potential to Ground Pin −7.0V to +0.5V
Input Voltage (DC) V
CC
to +0.5V
Output Current (DC Output HIGH) −50 mA
Operating Range (Note 2) −5.7V to −4.2V
ESD (Note 3) ≥2000V
Recommended Operating
Conditions
Case Temperature (TC)
Military −55˚C to +125˚C
Supply Voltage (V
EE
) −5.7V to −4.2V
Note 2: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 3: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE
=
−4.2V to −5.7V, V
CC
=
V
CCA
=
GND (Note 6)
Symbol Parameter Min Typ Max Units T
C
Conditions Notes
V
OH
Output HIGH −1025 −870 mV 0˚C to
V
IN
=
V
IH(Max)
or V
IL(Min)
Loading with
50Ω to −2.0V
(Notes
4, 5, 6)
Voltage +125˚C
−1085 −870 mV −55˚C
V
OL
Output LOW −1830 −1620 mV 0˚C to
Voltage +125˚C
−1830 −1555 mV −55˚C
V
OHC
Output HIGH −1035 mV 0˚C to
V
IN
=
V
IH(Min)
or V
IL(Max)
Loading with
50Ω to −2.0V
Voltage +125˚C
−1085 mV −55˚C (Notes
4, 5, 6)
V
OLC
Output LOW −1610 mV 0˚C to
Voltage +125˚C
−1555 mV −55˚C
DC Electrical Characteristics
V
EE
=
−4.2V to −5.7V, V
CC
=
V
CCA
=
GND (Note 6)
Symbol Parameter Min Typ Max Units T
C
Conditions Notes
V
DIFF
Input Voltage 150 mV −55˚C to Required for Full
(Notes 4, 5,
6)
Differential +125˚C Output Swing
V
CM
Common Mode VCC− 2.0 VCC− 0.5 V −55˚C to
(Notes 4, 5,
6)
Voltage +125˚C
V
IH
Single-Ended −1165 −870 mV −55˚C to Guaranteed HIGH Signal
(Notes 4, 5,
6, 7)
Input High Voltage +125˚C for All Inputs
V
IL
Single-Ended −1830 −1475 mV −55˚C to Guaranteed LOW Signal
(Notes 4, 5,
6, 7)
Input Low Voltage +125˚C for All Inputs
I
IH
Input HIGH Current 150 µA −55˚C to V
IN
=
V
IH(Max)
(Notes 4, 5,
6)
CLKIN, CLKIN
+125˚C
TCLK 450 µA
CLKSEL 380 µA
I
CBO
Input Leakage −10 µA −55˚C to V
IN
=
V
EE
(Notes 4, 5,
6)
Current +125˚C
I
EE
Power Supply −80 −25 mA −55˚C to
(Notes 4, 5,
6)
Current, Normal +125˚C
Note 4: F100K 300 Series cold temperature testing is performed by temperature soaking(to guaranteejunction temperatureequals −55˚C),then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
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