This is a family of 1048576-word by 4-bit dynamic RAMS,
fabricated with the high performance CMOS process,and is ideal
for large-capacity memory systems where high speed, low power
dissipation , and low costs are essential.
The use of quadruple-layer polysilicon process combined with
silicide technology and a single-transistor dynamic storage stacked
capacitor cell provide high circuit density at reduced costs.
Multiplexed address inputs permit both a reduction in pins and an
increase in system densities.
Self or extended refresh current is low enough for battery
back-up application.
MITSUBISHI LSIs
Lap top personal computer,Solid state disc, Microcomputer
memory, Refresh memory for CRT
MITSUBISHI LSIs
M5M4V4405CJ,TP-6,-7,-6S,-7S
EDO (HYPER PAGE MODE) 4194304-BIT(1048576-WORD BY 4-BIT) DYNAMIC RAM
EDO (HYPER PAGE MODE) 4194304-BIT (1048576-WORD BY 4-BIT) DYNAMIC RAM
DESCRIPTION
FEATURES
access
time
(max.ns)
Address
access
time
(max.ns)
(max.ns)
*
OE
access
time
Cycle
time
(min.ns)
Power
dissipa-
tion
(typ.mW)
RASCAS
Type name
M5M4V4405CXX-6, -6S
M5M4V4405CXX-7, -7S
XX=J, TP
access
time
(max.ns)
601530 11026415
70203513023120
Standard 26 pin SOJ, 26 pin TSOP(II)
Single 3.3V±0.3V supply
Low stand-by power dissipation
Self refresh current ..............................................100µA(max)
Extended refresh capability*
Extended refresh current ....................................100µA(max)
Hyper-page mode (1024-bit random access), Read-modify- write,
RAS-only refresh CAS before RAS refresh, Hidden refresh, CBR
self refresh(-6S,-7S) capabilities.
Early-write mode and OE and W to control output buffer impedance
1024 refresh cycles every 16.4ms (A0~A9)
1024refresh cycle every128ms (A0~A9)
*: Applicable to self refresh version (M5M4V4405Cxx-6S,-7S:
option) only
M5M4V4405CJ,TP-6,-7,-6S,-7S
PIN CONFIGURATION (TOP VIEW)
DQ1
1
DQ2
2
W
3
4
RAS
A9
5
9
A0
10
A1
A2
11
A3
12
13
VCC
Outline 26P0J (300mil SOJ)
DQ1
1
DQ2
2
W
3
4
RAS
A9
5
9
A0
10
A1
A2
11
A3
12
13
VCC
26
VSS
25
DQ4
24
DQ3
23
CAS
OE
22
A8
18
A7
17
A6A516
15
A4
14
26
VSS
25
DQ4
24
DQ3
23
CAS
22
OE
A8
18
A7
17
16
A6
15
A5
A4
14
APPLICATION
PIN DESCRIPTION
Pin name
A0~A9
DQ1~DQ4
RAS
CAS
W
OE
VCC
VSS
Address inputs
Data inputs / outputs
Row address strobe input
Column address strobe input
Write control input
Output enable input
Power supply (+3.3V)
Ground (0V)
1
Function
Outline 26P3Z-E (300mil TSOP)
M5M4V4405CJ,TP-6,-7,-6S,-7S
In addition to normal read, write, and read-modify-write operations
the M5M4V4405CJ,TP provide, a number of other functions, e.g.,
Hyper Page mode, RAS-only refresh, and delayed-write. The input
conditions for each are shown in Table 1.
EDO (HYPER PAGE MODE) 4194304-BIT(1048576-WORD BY 4-BIT) DYNAMIC RAM
FUNCTION
Table 1 Input conditions for each mode
Operation
Read
Write (Early write)
Write (Delayed write)
Read-modify-write
RAS-only refresh
Hidden refresh
CAS before RAS refresh
Self refresh
*
Stand-by
Note : ACT : active, NAC : nonactive, DNC : don' t care, VLD : valid, IVD : Invalid, APD : applied, OPN : open
RAS
ACT
ACT
ACT
ACT
ACT
ACT
ACT
CAS
ACT
ACT
ACT
ACT
NAC
ACT
ACT
ACTACTNACDNCDNCDNCDNCOPNYES
NAC
DNC
W
NAC
ACT
ACT
ACT
DNC
DNC
NAC
DNC
Inputs
OE
ACT
DNC
NAC
ACT
DNC
ACT
DNC
DNC
Row
address address
APD
APD
APD
APD
APD
DNC
DNC
DNC
Column
APD
APD
AP
D
APD
DNC
DNC
DNC
DNC
Input/Output
InputOutput
OPN
APD
APD
APD
DNC
OPN
DNC
DNC
VLD
OPN
IVD
VLD
OPN
VLD
OPN
OPN
MITSUBISHI LSIs
Refresh Remark
YES
Hyper
YES
Page
mode
YES
identical
YES
YES
YES
YES
NO
BLOCK DIAGRAM
COLUMN ADDRESS
STROBE INPUT
ROW ADDRESS
STROBE INPUT
WRITE CONTROL
INPUT
ADDRESS INPUTS
2
CAS
RAS
W
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
ROW &
COLUMN
ADDRESS
BUFFER
A0~
A9
A0 ~ A9
ROW
DECODER
CLOCK GENERATOR
CIRCUIT
COLUMN DECODER
SENSE REFRESH
AMPLIFER & I /O CONTROL
MEMORY CELL
(4,194,304 BITS)
(4)
DATA IN
BUFFERS
(4)
DATA OUT
BUFFERS
VCC(3.3V)
VSS (0V)
DQ1
DATA
DQ2
INPUTS /
DQ3
OUTPUTS
DQ4
OUTPUT
OE
ENABLE
INPUT
M5M4V4405CJ,TP-6,-7,-6S,-7S
EDO (HYPER PAGE MODE) 4194304-BIT(1048576-WORD BY 4-BIT) DYNAMIC RAM
ABSOLUTE MAXIMUM RATINGS
Symbol
VCC
VI
VO
IO
Pd
Topr
Tstg
Supply voltage
Input voltage
Output voltage
Output current
Power dissipation
Operating temperature
Storage temperature
CAS before RAS refresh cycling
tRC=min.
output open
RAS cycling CAS≤0.2V or CAS
before RAS refresh cycling
RAS≤0.2V or ≥VCC-0.2V
CAS≤0.2V or ≥VCC-0.2V
ICC8(AV)*
Average supply current
from VCC
Extended-Refresh cycle
(Note 6)
W≤0.2V (Except for RAS falling
edge) or ≥VCC-0.2V
OE≤0.2V or ≥VCC-0.2V
A0~A9≤0.2V or≥VCC-0.2V
DQ=open
tRC=125µs, tRAS=tRAS min ~1µs
ICC9(AV)*
Note 2: Current flowing into an IC is positive, out is negative.
3: ICC1 (AV), ICC3 (AV), ICC4 (AV) and ICC6 (AV) are dependent on cycle rate. Maximum current is measured at the fastest cycle rate.
4: ICC1 (AV) and ICC4 (AV) are dependent on output loading. Specified values are obtained with the output open.
5: Column Addres can be changed once or less while RAS=VIL and CAS=VIH.
3
Average supply current
from VCC
Self-Refresh cycle
(Note 6)
M5M4V4405C(S)
RAS=CAS≤0.2V
output open
Limits
Vcc
0.4
5
5
80
70
2
0.5
0.05
80
70
80
70
70
60
100
100
Unit
V
V
µA
µA
mA
mA
*
mA
mA
mA
µA
µA
MITSUBISHI LSIs
Test conditions
15
303360
20
353870
Parameter
CAC
RAC
Parameter
5
7
7
(Note 12)
(Note 7)
15
20515
15
20
20
(Note 12)
151520
20
Å@
(Note 7)
M5M4V4405CJ,TP-6,-7,-6S,-7S
EDO (HYPER PAGE MODE) 4194304-BIT(1048576-WORD BY 4-BIT) DYNAMIC RAM
MinMaxMinMax
t
t
tAA
tCPA
tOEA
tOHC
tOHR
tCLZ
tOEZ
tWEZ
tOFF
tREZ
Note 6: An initial pause of 200µs is required after power-up followed by a minimum of eight initialization cycles (RAS only refresh or CAS before RAS refresh
cycles)ÅDÅ@Å@Å@Å@Å@Å@Å@Å@Å@Å@Å@Å@Å@ Å@
Note the RAS may be cycled during the initial pause. And eight initialization cycles are required after prolonged periods (greater than tREF(max)) of
RAS inactivity before proper device operation is achieved.
7: Measured with a load circuit equivalent to 100pF, VOH=2.4V(IOH=-2mA) and VOL=0.4V(IOL=2mA).
The reference levels for measuring of output signals are 2.0V(VOH) and 0.8V(VOL).
8: Assumes that tRCD≥tRCD(max) and tASC≥tASC(max) and tCP≥tCP(max).
9: Assumes that tRCD≤tRCD(max) and tRAD≤tRAD(max). If tRCD or tRAD is greater than the maximum recommended value shown in this table, tRAC will
increase by amount that tRCD exceeds the value shown.
10: Assumes that tRAD≥tRAD(max) and tASC≤tASC(max).
11: Assumes that tCP≤tCP(max) and tASC≥tASC(max).
12: tOEZ (max), tWEZ(max), tOFF(max) and tREZ(max) defines the time at which the output achieves the high impedance state(IOUT≤| ±10µA |) and is
not reference to VOH(min) or VOL(max).
13: Output is disabled after both RAS and CAS go to high.
Access time from CAS
Access time from RAS
Column address access time
Access time from CAS precharge
Access time from OE
Output hold time from CAS
Output hold time from RAS
Output low impedance time from CAS low
Output disable time after OE high
Output disable time after WE low
Output disable time after CAS high
Output disable time after RAS high
(Note 7,8)
(Note 7,9)
(Note 7,10)
(Note 7,11)
(Note 13)
(Note 12,13)
(Note 12,13)
5
5
Limits
Unit
ns
ns
ns
ns
ns
5
5
5
ns
ns
ns
ns
ns
ns
ns
4
MITSUBISHI LSIs
Parameter
Parameter
(Note 21)
(Note 16)
(Note 17)
(Note 18)
16.445300401350
205101510
10
(Note 19)
(Note 20)
(Note 19)
(Note 20)
15
15
16.450350501350
205131510
10
20
20
RCDtCRPtRPCtCPNtRAD
RAHtCAH
CDD
(Note 22)
(Note 22)
RC
CSHtRSHtRCStRCHtRRHtRAL
CAL
(Note 20)
15
20
RDD
Transition time
M5M4V4405CJ,TP-6,-7,-6S,-7S
EDO (HYPER PAGE MODE) 4194304-BIT(1048576-WORD BY 4-BIT) DYNAMIC RAM
TIMING REQUIREMENTS
(For Read, Write, Read-Modify-Write, Refresh, and Hyper-Page Mode Cycles)
RAS high pulse width
Delay time, RAS low to CAS low
Delay time, CAS high to RAS low
Delay time, RAS high to CAS low
CAS high pulse width
Column address delay time from RAS low
tASR
tASC
t
Row address setup time before RAS low
Column address setup time before CAS low
Row address hold time after RAS low
0
0
Column address hold time after CAS low
tDZC
tDZO
t
t
tODD
tT
Note 14: The timing requirements are assumed tT =2ns.
Å@ 15: VIH(min) and VIL(max)are reference levels for measuring timing of input signals.
Å@ 16: tRCD(max)is specified as a reference point only. If tRCDis less than tRCD(max), access time is tRAC. If tRCDis greater than tRCD(max), access time is
controlled exclusively by tCACor tAA.Å@ 17: tRAD(max)is specified as a reference point only. If tRAD≥tRAD(max)and tASC ≤tASC(max), access time is controlled exclusively bytAA.Å@ 18: tASC(max) is specified as a reference point only. If tRCD ≥tRCD(max)and tASC ≥tASC(max),access time is controlled exclusively by tCAC.Å@ 19:Either tDZCor tDZOmust be satisfied.
Å@ 20: Either tRDDor tCDDor tODDmust be satisfied.
Å@ 21: tTis measured between VIH(min)and VIL(max).
Delay time, data to CAS low
Delay time, data to OE low
Delay time, RAS high to data
Delay time, CAS high to data
Delay time, OE high to data
0
0
1
Read and Refresh Cycles
Symbol
t
tRAS
tCAS
t
t
tORH
tOCH
Note 22: Either tRCHor tRRH must be satisfied for a read cycle.
5
Read cycle time
RAS low pulse width
CAS low pulse width
CAS hold time after RAS low
RAS hold time after CAS low
Read Setup time before CAS low
Read hold time after CAS high
Read hold time after RAS high
Column address to RAS hold time
Column address to CAS hold time
RAS hold time after OE low
CAS hold time after OE low
M5M4V4405C-6,-6S M5M4V4405C-7,-7S
MinMaxMinMax
Limits
110
60
15
0
30
10
48
10000
10000
0
0
130
70
13
55
20
0
35
10000
10000
0
0
18 23
15
20
15 20
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
MITSUBISHI LSIs
Parameter
Parameter
(Note 24)
CSHtRSH
DH
CSHtRSHtRCS
M5M4V4405CJ,TP-6,-7,-6S,-7S
EDO (HYPER PAGE MODE) 4194304-BIT(1048576-WORD BY 4-BIT) DYNAMIC RAM
Write Cycle (Early Write and Delayed Write)
10000
10000
10000
10000
Limits
Limits
130
70
13
55
13
13
13
13
161
107
57
107
57
0
42
92
57
13
13
0
0
10000
10000
10000
10000
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns 15 20
Symbol
M5M4V4405C-6,-6S M5M4V4405C-7,-7S
MinMaxMinMax
tWC
tRAS
tCAS
t
tWCS
tWCH
tCWL
tRWL
tWP
tDS
t
Write cycle time
RAS low pulse width
CAS low pulse width
CAS hold time after RAS low
RAS hold time after CAS low
Write setup time before CAS low
Write hold time after CAS low
CAS hold time after W low
RAS hold time after W low
Write pulse width
Data setup time before CAS low or W low
Data hold time after CAS low or W low
110
60
10
48
10
0
10
10
10
10
0
10
Read-Write and Read-Modify-Write Cycles
Symbol
tRWC
tRAS
tCAS
t
Read write/read modify write cycle time
RAS low pulse width
CAS low pulse width
CAS hold time after RAS low
(Note 23)
RAS hold time after CAS low
Read setup time before0 CAS low
tCWD
tRWD
tAWD
tOEH
Note 23: tRWCis specified as tRWC(min )=tRAC(max)+tODD(min)+tRWL(min)+tRP(min)+4tT.
Å@ 24: tWCS, tCWD, tRWD, tAWD, and tCPWDare specified as reference points only. If tWCS≥tWCS(min)the cycle is an early write cycle and the DQ pins will
remain high impedance throughout the entire cycle. IftCWD≥tCWD(min), tRWD≥tRWD(min), tAWD≥tAWD(min) and tCPWD≥tCPWD (min) (for fast page
mode cycle only), the cycle is a read-modify-write cycle and the DQ will contain the data read from the selected address. If neither of the above
condition (delayed write) of the DQ (at access time and until CAS or OE goes back to VIH) is indeterminate.
Delay time, CAS low to W low
Delay time, RAS low to W low
Delay time, address to W low
OE hold time after W low
(Note 24)
(Note 24)
(Note 24)
M5M4V4405C-6,-6S M5M4V4405C-7,-7S
MinMaxMinMax
133
89
44
89
44
0
32
77
47
6
M5M4V4405CJ,TP-6,-7,-6S,-7S
28:
EDO (HYPER PAGE MODE) 4194304-BIT(1048576-WORD BY 4-BIT) DYNAMIC RAM
Hyper page Mode Cycle
(Read, Early Write, Read-Write, Read-Modify-Write Cycle, Read Write Mix Cycle, Hi-Z control by
Hyper page mode read/write cycle time
Hyper Page Mode read write / read modify write cycle time
Output hold time from CAS low
RAS low pulse width for read or write cycle
CAS high pulse width
RAS hold time after CAS precharge
Delay time, CAS precharge to W low
Hold time to maintain the data Hi-Z until CAS access
OE Pulse Width (Hi-Z control)
W Pulse Width (Hi-Z control)
Delay time, CAS low to W low after read
Delay time, Address to W low after read
Delay time, CAS precharge to W low after read
Delay time, CAS low to OE high after read
Delay time, Address to OE high after read
Delay time, CAS precharge to OE high after read
All previously specified timing requirements and switching characteristics are applicable to their respective Hyper page mode cycle.
tHPC(min) is specified in the case of read-only and early write-only in Hyper page Mode.
26:
tRAS(min)is specified as two cycles of CAS input are performed.
27:
tCP(max)) is specified as a reference point only.
Parameter
(Note 26)
(Note 27)
(Note 28)
(Note 24)
M5M4V4405C-6,-6S M5M4V4405C-7,-7S
MinMaxMinMax
25
66
5
77
10
33
50
7
7
7
32 42
47 57
50 60
15 20
30 35
33 38
MITSUBISHI LSIs
OE or W) (Note 25)
30
79
5
100000
92
13
38
60
7
7
7
16
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
CAS before RAS Refresh Cycle (Note 29)
Symbol
tCSR
tCHR
tRSR
tRHP
tCAS
Note 29: Eight or more CAS before RAS cycles instead of eight RAS cycles are necessary for proper operation of CAS before RAS refresh mode.
Self Refresh Cycle
Symbol
tRASS
tRPS
tCHS
tRSR
tRHR
CAS setup time before RAS low
CAS hold time after RAS low
Read setup time before RAS low
Read hold time after RAS low
CAS low pulse width
*
(Note 30)
CBR self refresh RAS low pulse width
CBR self refresh RAS high precharge time
CBR self refresh CAS hold time
Read setup time before RAS low
Read hold time after RAS low
Parameter
Parameter
M5M4V4405C-6,-6S M5M4V4405C-7,-7S
MinMaxMinMax
5
10
10
10
17
M5M4V4405C-6,-6S M5M4V4405C-7,-7S
MinMaxMinMax
100
110
-50
10
10
Limits
5
15
10
Limits
100
130
-50
15
22
10
15
Unit
ns
ns
ns
ns
ns
Unit
µs
ns
ns
ns
ns
7
MITSUBISHI LSIs
Parameter
Parameter
Parameter
(Note 3,4,5)
85
CC4(AV)
(Note 3,5)
(Note 3,4,5)
(Note 3)
8575857575
65
75
CACtRAC
3538652040437525202520
1151553
35
6525 135
1860 40
75
CSHtRSHtRALtRC
20
2025 2549 1384994
37
9462166
62
112
47
10000
112
10000
10000
82
5297 62
CSHtRSH
CAL
23
28
M5M4V4405CJ,TP-6,-7,-6S,-7S
EDO (HYPER PAGE MODE) 4194304-BIT(1048576-WORD BY 4-BIT) DYNAMIC RAM
Test Mode Specification (Note 31)
ELECTRICAL CHARACTERISTICS
Symbol
ICC1 (AV)
Average supply current
from VCC
operating
Average supply current
ICC3 (AV)
I
ICC6(AV)
Note 31: All previously specified electrical characteristics, switing characteristics, and timing requirements are applicable to that of test mode.
from VCC
refreshing
Average supply current
from VCC
Hyper-Page-Mode
Average supply current
from VCC
CAS before RAS refresh
mode
Parameter
SWITCHING CHARACTERISTICS(Ta=0~70˚C, VCC=3.3V±0.3V, VSS=0V, unless otherwise noted, see notes 6,14,15)
Symbol
t
tAA
tCPA
tOEA
Access time from CAS
Access time from RAS
Column address access time
Access time from CAS precharge
Access time from OE
CAS before RAS refresh cycling
tRC=min.
output open
Limits
M5M4V4405C-6,-6S M5M4V4405C-7,-7S
MinMaxMinMax
(Note 7,8)
(Note 7,9)
(Note 7,10)
(Note 7,11)
(Note 7)
Typ
Unit
mA
mA
mA
mA
Unit
ns
ns
ns
ns
ns
TIMING REQUIREMENTS (Ta=0~70˚C, VCC=3.3V±0.3V, VSS=0V, unless otherwise noted, see notes 14,15)
Read and Refresh Cycles
Symbol
Read cycle time
tRAS
tCAS
t
RAS low pulse width
CAS low pulse width
CAS hold time after RAS low
RAS hold time after CAS low
Column address to RAS hold time
t
tORH
tOCH
Column address to CAS hold time
RAS hold time after OE low
CAS hold time after OE low
Read-Write and Read-Modify-Write Cycles
Symbol
tRWC
tRAS
tCAS
t
Read write/read modify write cycle time
RAS low pulse width
CAS low pulse width
CAS hold time after RAS low
(Note 23)
RAS hold time after CAS low
tCWD
tRWD
tAWD
Delay time, CAS low to W low
Delay time, RAS low to W low
Delay time, address to W low
(Note 24)
(Note 24)
(Note 24)
8
M5M4V4405C-6,-6S M5M4V4405C-7,-7S
MinMaxMinMax
1000010000
Limits
10000
10000
Limits
M5M4V4405C-6,-6S M5M4V4405C-7,-7S
MinMaxMinMax
10000
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
Unit
ns
ns
ns
ns
ns
ns
ns
ns
MITSUBISHI LSIs
Parameter
101010
15
(Note 26)
(Note 27)
HPCtHPRWC
CPRH
(Note 24)
HCWD
HCOD
383082
55
7143359765
84374752625565202535403843
Parameter
M5M4V4405CJ,TP-6,-7,-6S,-7S
EDO (HYPER PAGE MODE) 4194304-BIT(1048576-WORD BY 4-BIT) DYNAMIC RAM
Hyper page Mode Cycle
(Read, Early Write, Read-Write, Read-Modify-Write Cycle, Read Write Mix Cycle, Hi-Z control by
Limits
100000
Symbol
t
tRAS
t
tCPWD
t
tHAWD
tHPWD
t
tHAOD
tHPOD
M5M4V4405C-6,-6S M5M4V4405C-7,-7S
MinMaxMinMax
Hyper page mode read/write cycle time
Hyper Page Mode read write / read modify write cycle time
RAS low pulse width for read or write cycle
RAS hold time after CAS precharge
Delay time, CAS precharge to W low
Delay time, CAS low to W low after read
Delay time, Address to W low after read
Delay time, CAS precharge to W low after read
Delay time, CAS low to OE high after read
Delay time, Address to OE high after read
Delay time, CAS precharge to OE high after read
Test Mode Set Cycle
Limits
Symbol
tWSR
tWHR
M5M4V4405C-6,-6S M5M4V4405C-7,-7S
MinMaxMinMax
Write setup time before RAS low
Write hold time after RAS low
OE or W) (Note 25)
Unit
100000
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
9
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