Leica DVM User Manual
Leica DVM - 3D Visualisation
Vertical resolution in the balance between numerical aperture and
depth of field
Living up to Life
Vertical resolution in the balance between
numerical aperture and depth of field
Digital microscopy offers clear advantages for a wide variety of industrial quality inspections, particularly surface
analyses. Fracture analyses, analyses of inclined or vertical surfaces or onsite inspections of large parts such as turbine
rotors are just a few examples in which the strengths of digital microscopes make the biggest difference. But what are
the key criteria for successful use of digital microscopes and which parameters affect the three-dimensional imaging to
be expected for these specimens?
One of the main features of a digital microscope is the speed and ease with which it enables surface models to be created
of macroscopic and microscopic structures. In a qualitative evaluation, these provide better understanding and documentation of the specimen. In addition, quantification of the surface provides valuable information about the composition of
the surface and its wear. Which specimens are suitable for use with a Leica digital microscope, and what are the limitations of the method used?
The three-dimensional imaging of the Leica DVM series is based on the principle of focus variation. The limited depth of
field of the optics is utilized to determine depth information for the specimen. Vertical movement of the specimen relative
to the objective determines the focus information along with the distance to the optics. For each vertical position, the area
of the image that is in sharp focus is separated from the blurry area, and both are processed by the software to create a
surface model. One of the advantages of this method is that in addition to the height information, the texture of the specimen is also documented.
Which influencing factors are determinative for successful creation of a 3-D surface model and how do these
variables influence lateral and vertical resolution?
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