We warrant each of our products to be free from defects in material
and workmanship. Our obligation under this warranty is to repair
or replace any instrument or part thereof which, within a year after
shipment, proves defective upon examination. We will pay local
domestic surface freight costs.
To exercise this warranty, write or call your local Keithley repre-
sentative, or contact Keithley headquarters in Cleveland, Ohio.
You will be given prompt assistance and shipping instructions.
repairs and calibration
Keithley Instruments maintains a complete repair and calibration
service as well as a standards laboratory in Cleveland, Ohio. A
service facility is also located in Los Angeles for our west coast
customers.
A Keithley service facility at our Munich, Germany office is
available for our customers throughout Europe. Service in the
United Kingdom can be handled at our office in Reading. Addition-
ally, Keithley representatives in most countries maintain service
and calibration facilities.
To insure prompt repair or recalibration service, please contact
your local field representative or Keithley headquarters directly
before returning the instrument. Estimates for repairs, normal
recalibrations and calibrations traceable to the National Bureau of
Keithley Model 225 Current Source
Keithley Model 163 Digital Voltmeter
Keithley Model 530 Type-All Switching
Keithley Model '3201 Cable Assembly
SUPPLIED ACCESSOKY:
Model 5301 Test Lead (two pieces).
to 104 OHM-CM
1074
HODEL 530
GENERAL DESCRIPTION
SECTION 1.
GENERAL. The Keithley Model 530 Type-All System
1-l.
is an electronic system designed for measurement of
resisriviry and determination of conductivity rype of
a semiconductor.
cision current source, digital microvoltmeter, and
other circuitry needed for resisrivity and typing determinations.
ard four-point in-line probe co make contact to the
sample.
RESlSTIVITY MFASUREMENT. Resistivity of a semi-
1-z.
conductor material can be easily determined by applying a known current through the sample.
voltage drop across the sample is the” measured using
a sensitive microvoltmeter. However, since the resistiviry is a function of slice geometry and probe
spacing, several correction factors must be used.
These correction factors are explained in ASTM Desig-
nation: F84-70*.
considered are:
Slice diameter
Average probe separation 3 mm
Specimen thickness k’ mm
NOTE: All dimensions are assumed to be in metric
The Keithley ?!odel 530 System provides the convenience
of selectable current so that the voltage reading can
be scaled to read directly in terms of OIL’,-CX (where
1 mv - 1 OH%-C?!)
(see Table 2-l) are provided in rhe Appendix of this
Instruction ?:anual for calculating the proper current
using BASIC language.
l-3. COh.DCCTIV’ITY TYPE DETH“‘INATI0~. The conducriviry type, or sign of the najoriry carrier is a fundamental property of a semiconductor sample. The
Model 530 Sysrelr utilizes two methods for quickly
derermining the semiconductor type. This srsrem is
basically described in a” arricle entitled “‘Type-All
sysrea fC
Type” fron, Solid Slate TechnologylYarch, 1971*. The
Sysrea incor~orares rectification and rhernoelectric
typing rechr.iques in a sysfen that makes the two methods
coupatibl.
Contact the sample.
units unless otherwise specified.
Dertrnining SerLconductar ConducCiviry
The Keithley System contains B pre-
The Model 530 must be used with a stand-
The resultant
The basic factors which need ro be
D mm
A computer program and prinrout
A four-point in-line probe is used to
GENERAL DESCRIPTION
semiconductor, then a dc voltage between points B and
D will result.
pends on the conductfviry type of the material.
biasing is achieved on a metal-to-n-type semiconductor
diode when the semiconductor is at a positive potential
with respect to the metal.
stilts in a back-biased junction for p-type semiconductor.
tion of the polarity of the voltage monitored by the
m~c~o~oltmete~. For certain resistivities the quality
of rectification degenerates such that the usefulness
of this mode decreases.
action occurs for voltage readings above 0.5 m,‘.
voltages less than 0.5 mV the thermoelectric mode
should be used.
b.
impressed across the input probe points increases the
temperature “ear the point oi contact by joule bearing of the semiconductor.
erated bewee” a hot and cold probe point where bP
is the voltage generated across rwo regions of mar-
erial whose temperatures differ by AT. The physical
process that generares the Seebeck voltage is the dif-
fusion of the thermally generated carriers fror: the
hot zegio” of the material fo the cold region. The
carriers vi11 diffuse iron high-to-lo,-concenrration
regions, in particular from the hot to the cold probe.
This diffusion creates a “on-equilibrium carrier con-
centration in the cold region which generates a” electric field, opposing further diffusion. This diffu-
soon oi carriers from the hot to the cold probe con-
LX”U~S U”LII the generared electric field is sufficient to overcome the tendency oi the carriers fo oiffuse. For example, in p-type material, the thermally
generated holes diffuse to the cold probe, building
up a positive space charge which retards further diffusion. As a result, the cold probe is more pasirive
than the hot probe.
mits a separation of the ai power source and tht volr-
age-detection functions.
sensing is performed by the ?lodel 163 digiral volrmeter
which provides speed and convenience of a digiral dis-
play virh auromaric polarity indication.
electric mode utilizes all four probe points as show
in Figure 3e.
Thus, the semiconductor type is simply a func-
Thermoelectric node.
The polarity of the recrificaria” de-
Back
A negative potential re-
An acceptable rectification
For
In this mode the ac voltage
A Seebeck voltage is gen-
The use of four probe painrr per-
In the Lfodel 530 rhe voltage
The rherno-
a. Recrir~cat~on Qde. Reccificaria” is the node
of operation initially used. A” ac voltage is imposed
across two of the grabe points as show” in Figure 3d.
A second ser of probe points is used to sense the polariry of rhe generated volrage. The polarity depends
on how the voltage 15 generated and o” the conducririry
type of rhe material.
ing a rectification effect at the contact paint re the
0274
It the probe poinrs are provid-
GENERAL DESCRIPTION
MODEL 530
Control
POWER Switch
PROBE Switch
FUNCTION sa
STANDBY Position
CLmRF.NT position
VF~Q Position
VREv Position
TYPE (RECT)
TYPE (THERM)
CURRENT
SHUNT
HI Terminal
LO Terminal
Switch
Sumarv of Model 530 Controls.
TABLE I-1.
Functional Description
Applies
power to Model 530 System including awtiliery
power receptacles.
Selects eirher
“A”
or “Et” probe inputs on the rear panel.
Selects function for resistivity or fyping determination.
No connections are made to probe.
Connects current source to enable a calibration check.
Connects probe to measure resistivity.
Connects probe to measure resistivity.
(reversed polarity)
Connects probe for typing using RectificationMethod.
connects probe for typing using Thermal Method.
Sets resistivity range.
Volmeter High Input
Voltmeter Low Input
circuit Desip,.
SlOl
s105
s103
JlOb
3107
2
0274
MODEL 530
0274
GENERAL DESCRIPTION
INPUT FOR -
P-POINT PROBE
MODEL 530
-LINE SWITCH
5102
MATING CONNECTOR
FURNISHED
COAXIAL CABLE-
FURNISHED
* y
4
\
:
-FUSE FlOl
-AC POWER
FOR SYSTEM
PlOl
i
6
:
i
P
:
0 6
LINK
BETWEEN
LOW & GND
:
i
i
i
i
_I
FIGURE 2. Rear Panel connections.
‘
0276
SECTION 2. OPERATION
OPERAT,ON
2-l. Keslstivity Determination: The measuremenf of
resistivity ir; accomplished through the “se of 1) a
constant current source, 2) a mirrovolt meter and 3)
a four-point resist,\~iry probe.
to give a direct reading in ““Y-CC: on 6 100 mV scale
(1 Ill,’ -
23:; (Set line witch S102 to proper position).
fuse FlOl for proper rating. The Model lb3 and 225
line cords should be connected to auxiliary power receptacles 3104 and JlO5.
b. Control Settings.
1 OH:-CN) Procedure:
Power.
1.
2. Set the Hodel 163 es follows:
3. Set the ?iodel 530 as follows:
Connect the Model 530 to either 117 or
Set rhe Model 225 as follws:
“L’TPUT SELECTOR -- STASDBY
FILTER -- OFF
I’OLTAGE CO\lPLIAKE -- 50
Decade Switches -- o-o-o
Range -- 100 PA
Power On
Range
power On
PROBE -- A
CURRENT SHUZ‘: -- 1K
POWER
Resistivitv is scaled
Check
-- O!<
-- 100.0 mv
-- ox
-- OK
the reading could also be interpreted as 173.1 OHM-CM,
If the Model 163 does not indicare fhe proper
currenl the probe is probably not making proper
contact to rhe slice.
lamp is lighted then rhe probe connections are
probably open.
f. Resistivity ?leasurement.
Vm function (Position 3) and record the reading on
the Model 163.
directly in ferms of OK+C?I resistivity (1 mV = 1 OK!:c?:) . Since the resistivity measurement is dependent
on slice geometry (thickness, etc.) the scaling is
valid far the particular current selected from Table
2-l. If the slice dimensions are changed, a new CUTrent should be dialed our on the blodel 225 to provide
direct reading in OHM-CM.
function (Position 4) to obtain a reading wirh opposite
polarity applied.
any position since it does not affecr the resistivity
UE%“remW,t.
Type Determination: The conductivity type can
2-2.
be determined by 1 of 2 methods: Rectification Mode
or hermoelectric Mode.
a. Rectification Mode.
(RICT) (Position 5). If the Model 163 indicates
greater than 0.5 mV rhen the material type is deter-
mined by the polarity indicated on the Model 163.
If the reading is less than 0.5 mV then proceed to
the Thermoelectric Mode.
d. Calibration.
rent depending on the slice dimensions of the sample.
Table 2-l gives the current serring for particular
slice thickness and diameter (with probe rip spacing =
1.60 H3, or 0.0630 inch).
Cannecrian Check. Connect the probe and lower
e.
onto slice.
(Position 2).
Switch to give the maximum on-scale reading on the
Model 163. The volrage displayed on the 163 is B
function of the current x RSHmT. The Model 163 should
indicate the output which has bee” set on the Model
225 decade dials.
set to 173.1 !JA, the Model 163 should indicate 173.1 mV
with the Model 530 Shunt Resistor set to 1K.
Model 163 is scaled for direct reading of resistiviey,
Set the Model 530 to TYPE
The Model 163 should indicate
The material type is determined
0.4 0.5
5
1
I
ClKCLllT DESCRIPTION
MODEL 53Cl
SECTION 3.
3-1. GENERAL. The “ode1 530 provides all the co”trols,
interconnections,
sistivity and semiLonductor typing determinations using
the “Type-All” system.
3-2. EQLIIPNENT USED. The Model 530 utilizes a Keithley
Model 225 Current Source,
hltmeter, and auxiliary ac paver source. Separate
circuit descriptions are provided in the individual
Instruction Manuals for Models 163 and 225. The remaining circuits are described in the following paragraph.
3-3. SWITCHING OPERATION
a. Standby Position.
terminals are completely disconnected from the Model
530 circuitry.
Current Position. In this position the Model
b.
163 and 225 are connected such that the Model 163 will
indicate the voltage drop across one of the Shunt Resisters. For euamle. with the Model 225 set at 100 UA
and a 1 kilohm Shunt Resistor selected, the Model 163
should indicate 100 mV if the probe points are making
satisfactory contact.
and
circuits necessary for making re-
a Model I60 or 163 Digital
In this position the probe
CIRCUIT DESCRIPTION
FWD Position.
c. v
is connected so as to read the volraee dram across the
semiconductor sample.
directly in terms of OHM-CM when the current setting
is scaled properly.
RPV Position. In this position the Model 225
d. V
polarity is reversed autom~ticaily so as to permit a
reverse voltage across rtle sample.
dicares the resisrivity in terms of OHM-CM when the
current setting is scaled properly.
Type (Rect) Position.
e.
voltage is impressed between terminals A and 8.
Model 163 is connected between pins S and D.
Type (Therm) Position. In this position the
i.
Model 163 is connected between terminals C and D. The
voltage which results from the Seebeck effect is meas-
ured at points separate from the impressed ac voltage
points.
3-4. AC POWER SUPPLY. An ac voltage is provided by
the 12.6V secondary windine of transformer TlOl. The
primary windings are connected in parallel or in series
depending on the position of the Line Switch S102.
sister RiOl provides short circuit protection for the
Fuse, Slo-Blo, l/h,, 3AG
Receptacle, BNC
Receptacle
Locking Ring, used with 5102
NuC, used with 3102
Receptacle
Locking Ring, used with 3103
NUf , used vith 3103
Receptacle, Power
Receptacle, power
Binding Post, Red
Binding Past, Biack
Line Cord
Svi tch, Toggle
Svirch, Slide (117-234,~)
Switch, Rotary
Switch, Rotary
Switch, Toggle
Connector Body, used with CS-162
Locking Ring, used with CS-162
Connector, Mate of JlO2
Connector Body, used with CS-162
Locking Ring, used with CS-162
Cover Assembly (225)
NODIFICATIONS:
The Model 160 or 163 as supplied with the Model 530
has been modified as follows:
Resistors R112 and RI15 have bee” removed to increase
the input resistance of the voltmeter on the 100 mV
range.
1074
Note: If the Model 160 is supplied the ohms function
will not be useable on the 1 megohm and 10 megohm
ranges unless the resistors (R112 and R115) are replaced.
7
APPEh’DIX
MODEL 530
I: #.I# #RYY.I #YLX.I #“##.I *I#*.* ***Y.Y YYYY.I #I##.# I###.# ###I.#
2: INCHES
3: DIAM SLICE THICKNESS IN MlLS
4:
51 TO G,“E DIRECT READtNG OF RESISTIVITY ,N
61 OHM-CM CN THE 100 MF SCALE <I M” = 1 BHM-CM)
71 PRBBE TIP SPACING = #la” NILS (=##*.I# MM)
8:ENTER PRCBE TIP SPACING IN NILS
9:SLICE THICKNESS IN MILS.
1O:SLlCE DIAMETER IN INCHES. START, FINISH> STEP c.01 MINIMUM STEP,
II DIM P(25)
20 DATA 0.997.0.992,0.9P2,0.966r0.944r0.921
2, F0R K= 0 T0 5
22 READ Q(K)
23 NEXT K
30 DATA 4.532,4.53~,4.526,4.524,4.5,7~4.5D~,4.49?,4.4~5,4.470
3, DATA 4.454,4.436,4.417.4.395.4.372,4.348,4.322,4.294,4.265,4.235
32 DATA 4.204,4.171
33 F0R K=O T0 20
34 READ P(K)
35 NEXT K
100 PRINT USING 8
110 INPUT S
120 PRINT USING 9
130 INPUT T,rT2rT3
140 PRINT USING IO
150 INPUT Dl.D2.D3
160 LET 5,s S*25.4/1000
170 PRINT
180 PRINT USING 4
190 PRINT USING 5
200 PRINT USING 6
210 PRINT USING 7rS1Sl
220 PRINT
230 PRINT
239 PRINT USING 3