IS62WV12816ALL |
ISSI |
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IS62WV12816ALL |
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IS62WV12816BLL |
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128K x 16 LOW VOLTAGE,
ULTRA LOW POWER CMOS STATIC RAM
JUNE 2005
FEATURES
•High-speed access time: 45ns, 55ns, 70ns
•CMOS low power operation
–36 mW (typical) operating
–9 µW (typical) CMOS standby
•TTL compatible interface levels
•Single power supply
–1.65V--2.2V VDD (62WV12816ALL)
–2.5V--3.6V VDD (62WV12816BLL)
•Fully static operation: no clock or refresh required
•Three state outputs
•Data control for upper and lower bytes
•Industrial temperature available
•2CS Option Available
•Lead-free available
DESCRIPTION
The ISSI IS62WV12816ALL/ IS62WV12816BLL are highspeed, 2M bit static RAMs organized as 128K words by 16 bits. It is fabricated using ISSI's high-performance CMOS technology. This highly reliable process coupled with innovative circuit design techniques, yields highperformance and low power consumption devices.
When CS1 is HIGH (deselected) or when CS2 is LOW (deselected) or when CS1 is LOW, CS2 is HIGH and both LBand UBare HIGH, the device assumes a standby mode at which the power dissipation can be reduced down with CMOS input levels.
Easy memory expansion is provided by using Chip Enable and Output Enable inputs. The active LOW Write Enable (WE) controls both writing and reading of the memory. A data byte allows Upper Byte (UB) and Lower Byte (LB) access.
TheIS62WV12816ALLandIS62WV12816BLLarepackaged in the JEDEC standard 48-pin mini BGA (6mm x 8mm) and 44-Pin TSOP (TYPE II).
FUNCTIONAL BLOCK DIAGRAM
A0-A16 |
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DECODER |
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128K x 16 |
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MEMORY ARRAY |
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VDD |
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GND |
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I/O0-I/O7 |
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I/O |
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Lower Byte |
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COLUMN I/O |
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DATA |
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I/O8-I/O15 |
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CIRCUIT |
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Upper Byte |
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CS2 |
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CS1 |
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CONTROL |
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OE |
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WE |
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CIRCUIT |
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UB |
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LB |
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Copyright © 2005 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this speci fication and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 |
1 |
Rev. E
06/08/05
IS62WV12816ALL, IS62WV12816BLL |
ISSI® |
PIN CONFIGURATIONS
48-Pin mini BGA (6mm x 8mm) (Package Code B)
1 |
2 |
3 |
4 |
5 |
6 |
A |
LB |
OE |
A0 |
A1 |
A2 |
N/C |
B |
I/O8 |
UB |
A3 |
A4 |
CSI |
I/O0 |
C |
I/O9 |
I/O10 |
A5 |
A6 |
I/O1 |
I/O2 |
D |
GND |
I/O11 |
NC |
A7 |
I/O3 |
VDD |
E |
VDD |
I/O12 |
NC |
A16 |
I/O4 |
GND |
F |
I/O14 |
I/O13 |
A14 |
A15 |
I/O5 |
I/O6 |
G |
I/O15 |
NC |
A12 |
A13 |
WE |
I/O7 |
H |
NC |
A8 |
A9 |
A10 |
A11 |
NC |
48-Pin mini BGA (6mm x 8mm)
2 CS Option (Package Code B2)
1 |
2 |
3 |
4 |
5 |
6 |
A |
LB |
OE |
A0 |
A1 |
A2 |
CS2 |
B |
I/O8 |
UB |
A3 |
A4 |
CS1 |
I/O0 |
C |
I/O9 |
I/O10 |
A5 |
A6 |
I/O1 |
I/O2 |
D |
GND |
I/O11 |
NC |
A7 |
I/O3 |
VDD |
E |
VDD |
I/O12 |
NC |
A16 |
I/O4 |
GND |
F |
I/O14 |
I/O13 |
A14 |
A15 |
I/O5 |
I/O6 |
G |
I/O15 |
NC |
A12 |
A13 |
WE |
I/O7 |
H |
NC |
A8 |
A9 |
A10 |
A11 |
NC |
44-Pin mini TSOP (Type II) (Package Code T)
A4 |
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1 |
44 |
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A5 |
A3 |
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2 |
43 |
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A6 |
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A2 |
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3 |
42 |
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A7 |
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A1 |
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4 |
41 |
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OE |
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A0 |
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5 |
40 |
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UB |
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CS1 |
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6 |
39 |
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LB |
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I/O0 |
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7 |
38 |
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I/O15 |
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I/O1 |
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8 |
37 |
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I/O14 |
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I/O2 |
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9 |
36 |
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I/O13 |
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I/O3 |
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10 |
35 |
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I/O12 |
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VDD |
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34 |
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GND |
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11 |
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GND |
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33 |
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VDD |
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12 |
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I/O4 |
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13 |
32 |
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I/O11 |
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I/O5 |
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14 |
31 |
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I/O10 |
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I/O6 |
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15 |
30 |
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I/O9 |
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I/O7 |
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16 |
29 |
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I/O8 |
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WE |
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17 |
28 |
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NC |
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A16 |
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18 |
27 |
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A8 |
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A15 |
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26 |
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A9 |
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A14 |
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20 |
25 |
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A10 |
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A13 |
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21 |
24 |
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A11 |
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A12 |
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22 |
23 |
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NC |
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PIN DESCRIPTIONS
A0-A16 |
Address Inputs |
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I/O0-I/O15 |
Data Inputs/Outputs |
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CS1, CS2 |
Chip Enable Input |
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OE |
Output Enable Input |
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WE |
Write Enable Input |
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LB |
Lower-byte Control (I/O0-I/O7) |
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UB |
Upper-byte Control (I/O8-I/O15) |
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NC |
No Connection |
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VDD |
Power |
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GND |
Ground |
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2 Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. E
06/08/05
IS62WV12816ALL, |
IS62WV12816BLL |
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ISSI® |
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TRUTH TABLE |
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I/O PIN |
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Mode |
WE |
CS1 |
CS2 |
OE |
LB |
UB |
I/O0-I/O7 |
I/O8-I/O15 |
VDD Current |
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Not Selected |
X |
H |
X |
X |
X |
X |
High-Z |
High-Z |
ISB1, ISB2 |
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X |
X |
L |
X |
X |
X |
High-Z |
High-Z |
ISB1, ISB2 |
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X |
X |
X |
X |
H |
H |
High-Z |
High-Z |
ISB1, ISB2 |
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Output Disabled |
H |
L |
H |
H |
L |
X |
High-Z |
High-Z |
ICC |
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H |
L |
H |
H |
X |
L |
High-Z |
High-Z |
ICC |
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Read |
H |
L |
H |
L |
L |
H |
DOUT |
High-Z |
ICC |
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H |
L |
H |
L |
H |
L |
High-Z |
DOUT |
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H |
L |
H |
L |
L |
L |
DOUT |
DOUT |
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Write |
L |
L |
H |
X |
L |
H |
DIN |
High-Z |
ICC |
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L |
L |
H |
X |
H |
L |
High-Z |
DIN |
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L |
L |
H |
X |
L |
L |
DIN |
DIN |
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ABSOLUTE MAXIMUM RATINGS(1)
Symbol |
Parameter |
Value |
Unit |
VTERM |
Terminal Voltage with Respect to GND |
–0.2 to VDD+0.3 |
V |
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TSTG |
Storage Temperature |
–65 to +150 |
°C |
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PT |
Power Dissipation |
1.0 |
W |
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Note:
1.Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
OPERATING RANGE (VDD)
Range |
Ambient Temperature |
IS62WV12816ALL |
IS62WV12816BLL |
Commercial |
0°C to +70°C |
1.65V - 2.2V |
2.5V - 3.6V |
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Industrial |
–40°C to +85°C |
1.65V - 2.2V |
2.5V - 3.6V |
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Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 |
3 |
Rev. E
06/08/05
IS62WV12816ALL, IS62WV12816BLL |
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ISSI® |
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DC ELECTRICAL CHARACTERISTICS (Over Operating Range) |
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Symbol |
Parameter |
Test Conditions |
VDD |
Min. |
Max. |
Unit |
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VOH |
Output HIGH Voltage |
IOH = -0.1 mA |
1.65-2.2V |
1.4 |
— |
V |
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IOH = -1 mA |
2.5-3.6V |
2.2 |
— |
V |
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VOL |
Output LOW Voltage |
IOL = 0.1 mA |
1.65-2.2V |
— |
0.2 |
V |
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IOL = 2.1 mA |
2.5-3.6V |
— |
0.4 |
V |
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VIH |
Input HIGH Voltage |
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1.65-2.2V |
1.4 |
VDD + 0.2 |
V |
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2.5-3.6V |
2.2 |
VDD + 0.3 |
V |
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VIL(1) |
Input LOW Voltage |
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1.65-2.2V |
–0.2 |
0.4 |
V |
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2.5-3.6V |
–0.2 |
0.6 |
V |
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ILI |
Input Leakage |
GND ≤ VIN ≤ VDD |
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–1 |
1 |
µA |
ILO |
Output Leakage |
GND ≤ VOUT ≤ VDD, Outputs Disabled |
–1 |
1 |
µA |
Notes:
1. VIL (min.) = –1.0V for pulse width less than 10 ns.
CAPACITANCE(1)
Symbol |
Parameter |
Conditions |
Max. |
Unit |
CIN |
Input Capacitance |
VIN = 0V |
8 |
pF |
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COUT |
Input/Output Capacitance |
VOUT = 0V |
10 |
pF |
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Note:
1. Tested initially and after any design or process changes that may affect these parameters.
4 Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. E
06/08/05
IS62WV12816ALL, |
IS62WV12816BLL |
|
ISSI® |
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IS62WV12816ALL, POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range) |
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Symbol |
Parameter |
TestConditions |
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Max. |
Unit |
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70 |
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ICC |
VDDDynamicOperating |
VDD=Max., |
Com. |
15 |
mA |
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SupplyCurrent |
IOUT =0mA,f=fMAX |
Ind. |
20 |
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ICC1 |
OperatingSupply |
VDD=Max., |
Com. |
3 |
mA |
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Current |
IOUT = 0 mA, f = 0 |
Ind. |
3 |
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ISB1 |
TTLStandbyCurrent |
VDD=Max., |
Com. |
0.3 |
mA |
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(TTLInputs) |
VIN =VIH orVIL |
Ind. |
0.3 |
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CS1=VIH ,CS2=VIL, |
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f = 1 MHZ |
OR |
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ULB Control |
VDD =Max.,VIN =VIH orVIL |
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CS1=VIL, f = 0,UB=VIH, LB=VIH |
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ISB2 |
CMOSStandby |
VDD=Max., |
Com. |
5 |
µA |
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Current(CMOSInputs) |
CS1≥ VDD –0.2V, |
Ind. |
10 |
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CS2 ≤ 0.2V, |
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VIN ≥ VDD –0.2V,or |
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VIN ≤ 0.2V, f = 0 |
OR |
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ULB Control |
VDD = Max., CS1 = VIL, CS2=VIH |
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VIN ≤ 0.2V,f=0; UB/ LB=VDD –0.2V |
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IS62WV12816BLL, POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
Symbol |
Parameter |
TestConditions |
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Max. |
Max. |
Unit |
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45 |
55 |
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ICC |
VDDDynamicOperating |
VDD=Max., |
Com. |
35 |
25 |
mA |
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SupplyCurrent |
IOUT =0mA,f=fMAX |
Ind. |
40 |
30 |
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typ.(2) |
25 |
20 |
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ICC1 |
OperatingSupply |
VDD=Max., |
Com. |
3 |
3 |
mA |
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Current |
IOUT = 0 mA, f = 0 |
Ind. |
3 |
3 |
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ISB1 |
TTLStandbyCurrent |
VDD=Max., |
Com. |
0.3 |
0.3 |
mA |
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(TTLInputs) |
VIN =VIH orVIL |
Ind. |
0.3 |
0.3 |
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CS1=VIH ,CS2=VIL, |
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f = 1 MHZ |
OR |
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ULB Control |
VDD =Max.,VIN =VIH orVIL |
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CS1=VIL, f = 0,UB=VIH, LB=VIH |
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ISB2 |
CMOSStandby |
VDD=Max., |
Com. |
10 |
10 |
µA |
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Current(CMOSInputs) |
CS1≥ VDD –0.2V, |
Ind. |
10 |
10 |
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CS2 ≤ 0.2V, |
typ.(2) |
3 |
3 |
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VIN ≥ VDD –0.2V,or |
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VIN ≤ 0.2V, f = 0 |
OR |
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ULB Control |
VDD = Max., CS1 = VIL, CS2=VIH |
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VIN ≤ 0.2V,f=0; UB/ LB=VDD –0.2V |
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Note:
1.At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
2.Typical values are measured at VDD = 3.0V, TA = 25oC and not 100% tested.
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 |
5 |
Rev. E
06/08/05
IS62WV12816ALL, |
IS62WV12816BLL |
ISSI® |
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AC TEST CONDITIONS |
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Parameter |
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62WV12816ALL |
62WV12816BLL |
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(Unit) |
(Unit) |
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Input Pulse Level |
0.4V to VDD-0.2V |
0.4V to VDD-0.3V |
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Input Rise and Fall Times |
5 ns |
5ns |
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Input and Output Timing |
VREF |
VREF |
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and Reference Level |
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Output Load |
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See Figures 1 and 2 |
See Figures 1 and 2 |
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1.65-2.2V |
2.5V - 3.6V |
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R1(Ω) |
3070 |
3070 |
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R2(Ω) |
3150 |
3150 |
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VREF |
0.9V |
1.5V |
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VTM |
1.8V |
2.8V |
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AC TEST LOADS
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R1 |
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R1 |
VTM |
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VTM |
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OUTPUT |
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OUTPUT |
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30 pF |
R2 |
5 pF |
R2 |
Including |
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Including |
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jig and |
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jig and |
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scope |
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scope |
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Figure 1 |
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Figure 2 |
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6 Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. E
06/08/05