HP usb3.0 cable connector schematic
Agilent Technologies
USB 3.0 Cable-Connector
Assembly Compliance Test
Test Solution Overview Using
the Agilent E5071C ENA
Option TDR
Last Update 2012/12/20 (TH)
Purpose
• This slide will show how to make measurements of USB 3.0 cable &
connector assemblies Compliance Tests by using the Agilent E5071C
ENA Option TDR.
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Agilent Digital Standards Program
Our solutions are driven and supported by Agilent
experts involved in international standards committees:
• Joint Electronic Devices Engineering Council (JEDEC)
• PCI Special Interest Group (PCI-SIG®)
• Video Electronics Standards Association (VESA)
• Serial ATA International Organization (SATA-IO)
• USB-Implementers Forum (USB-IF)
• Mobile Industry Processor Interface (MIPI) Alliance
• Optical Internetworking Forum (OIF)
We’re active in standards meetings, workshops, plugfests,
and seminars
Our customers test with highest confidence and achieve
compliance faster
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USB 3.0 – Agilent Total Solution Coverage
SW
HW
Signal
Conditioning
Fixture
DUT
Transmitter Test
N8805A USB3.0
Protocol decode &
triggering SW
DSOX90000A
Infiniium
real time scope
or
DSO91304A
Infiniium
real time scope
U7242A
USB 3.0
Test Fixture
U7243A USB
Compliance Test
Software
Tx
Interconnect
Test
Receiver Test
N5990A Automatic
SW for USB
compliance
Protocol
Test
(link/transaction
layers)
E5071C ENA
U4612A
Jammer
Option TDR
Bit-USB-
CBL-0001
from BitifEye
Cable
USB3ET
from
USB-IF
N4903B J-BERT
High-Perf
Serial BERT
with
De-emph
N4916A or
N4916B or
N4903B-002
U7242A
Test Fixture
Tx
Tx
Rx
Rx
U4611A/B
USB 3¥2¥1.1
Analyzer
Tx
Rx
Tx
Rx
USB Design and Test - A Better Way
(http://cp.literature.agilent.com/litweb/pdf/5990-4640EN.pdf)
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Reference Document
• Universal Serial Bus 3.0 Specification
• Universal Serial Bus 3.0 Connectors and Cable Assemblies
Compliance Document
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USB 3.0 Cable/Connector Compliance Test Solution
Cable Assembly
Host CabCon
2
SS USB Pair
Full Simplex
2
SS USB Pair
Full Simplex
2
USB 2.0 Pair
Half-Duplex
PWR (1), GND (1)
Device
SuperSpeeed USB Developers Conference Presentation, Taipei, Taiwan (April 1-2, 2010), “SuperSpeed USB Physical Layer”,
Howard Heck, Intel Corporation http://www.usb.org/developers/presentations/pres0410
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USB 3.0 Cable/Connector Compliance Test Solution
Measurement Parameters
Host CabCon
2
SS USB Pair
Full Simplex
2
SS USB Pair
Full Simplex
2
USB 2.0 Pair
Half-Duplex
PWR (1), GND (1)
Device
Time Domain Measurements
Mated Connector Impedance
Raw Cable Impedance
Intra-Pair Skew
D+/D- Pair Skew (USB 2.0)
D+/D- Propagation Delay (USB 2.0)
Diferential Near End Crosstalk (NEXT)
Differential Crosstalk Between D+/D- and Super
Speed
Frequency Domain Measurements
Differential Insertion Loss (Sdd21)
Differential-to-common Mode Conversion
(Scd21)
D+/D- Pair Attenuation (USB 2.0)
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USB 3.0 Cable/Connector Compliance Test Solution
Solution Overview
•USB 3.0 cable/connector compliance testing requires parametric measurements in
both time and frequency domains
Traditional
Frequency Domain
•Insertion Loss (Sdd21)
•Mode Conversion
(Scd21)
Time Domain
•Mated Connector
Impedance Profile (TDR)
•Crosstalk (NEXT, FEXT)
(TDT)
Solution
Vector
Network
Analyzer
(VNA)
TDR
Scope
New Solution
•ALL parameters can
be measured with
ENA Option TDR
One-box
Solution !!
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USB 3.0 Cable/Connector Compliance Test Solution
Developers Conference (Taiwan, April 2010)
ENA Option TDR introduced
as recommended solution for
CabCon compliance test.
“SuperSpeed USB Compliance: Overview”,
Rahman Ismail, Intel Corporation
http://www.usb.org/developers/ssusb
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USB 3.0 Cable/Connector Compliance Test Solution
Certification Test Centers Supporting ENA Option TDR
ENA option TDR is used by USB-IF certified test centers to perform USB
3.0 connectors and cable assemblies compliance tests
(In the process of certification)
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(In the process of certification)
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