The MBM29SL800TD/BD are a 8 M-bit, 1.8 V-only Flash memory organized as 1 Mbytes of 8 bits each or 512
Kwords of 16 bits each. The MBM29SL800TD/BD are offered in a 48-pin TSOP (I) , 48-ball FBGA and 48-ball
SCSP packages. These devices are designed to be programmed in-system with the standard system 3.0 V V
supply. 12.0 V VPP and 5.0 V VCC are not required for write or erase operations. The devices can also be reprogrammed in standard EPROM programmers.
PRODUCT LINE UP
■
DS05-20871-5E
16) BIT
-10/12
CC
(Continued)
Part No.MBM29SL800TD/MBM29SL800BD
Ordering Part No.V
Max Address Access Time (ns) 100120
Max CE
Max OE
The standard MBM29SL800TD/BD offer access times 100 ns and 120 ns, allowing operation of high-speed
microprocessors without wait states. To eliminate bus contention the devices have separate chip enable (CE
write enable (WE
The MBM29SL800TD/BD are pin and command set compatible with JEDEC standard E
are written to the command register using standard microprocessor write timings. Register contents serve as
input to an internal state-machine which controls the erase and programming circuitry . Write cycles also internally
latch addresses and data needed for the programming and erase operations. Reading data out of the devices
is similar to reading from 5.0 V and 12.0 V Flash or EPROM devices.
The MBM29SL800TD/BD are programmed by executing the program command sequence. This will inv oke the
Embedded Program Algorithm which is an internal algorithm that automatically times the program pulse widths
and verifies proper cell margin. Typically, each sector can be programmed and ver ified in about 0.5 seconds.
Erase is accomplished by executing the erase command sequence. This will invoke the Embedded Erase
Algorithm which is an internal algorithm that automatically preprograms the array if it is not already programmed
before executing the erase operation. During erase, the devices automatically time the erase pulse widths and
verify proper cell margin.
A sector is typically erased and verified in 1.5 second. (If already completely preprogrammed.)
The devices also feature a sector erase architecture. The sector mode allows each sector to be erased and
reprogrammed without affecting other sectors. The MBM29SL800TD/BD are erased when shipped from the
fac to r y.
) , and output enable (OE) controls.
-10/12
/MBM29SL800BD
-10/12
2
PROMs. Commands
) ,
The devices f eature single 1.8 V po wer supply oper ation for both read and write functions. Internally generated
and regulated voltages are provided for the program and erase operations. A low V
inhibits write operations on the loss of power. The end of program or erase is detected by Data
by the Toggle Bit feature on DQ
completed, the devices internally reset to the read mode.
Fujitsu’s Flash technology combines years of EPROM and E
of quality, reliability, and cost effectiveness. The MBM29SL800TD/BD memor ies electrically erase the entire
chip or all bits within a sector simultaneously via Fowler-Nordhiem tunneling. The b ytes/words are prog rammed
one byte/word at a time using the EPROM programming mechanism of hot electron injection.
6, or the RY/BY output pin. Once the end of a program or erase cycle has been
2
PROM experience to produce the highest levels
CC detector automatically
Polling of DQ7,
2
MBM29SL800TD
FEATURES
■
•
Single 1.8 V read, program, and erase
Minimizes system level power requirements
•
Compatible with JEDEC-standard commands
2
Uses same software commands as E
•
Compatible with JEDEC-standard world-wide pinouts
48-pin TSOP (I) (Package suffix : TN − Normal Bend Type, TR − Reversed Bend Type)
48-ball FBGA (Package suffix : PBT)
48-ball SCSP (Package suffix : PW)
• Minimum 100,000 program/erase cycles
•
High performance
100 ns maximum access time
•
Sector erase architecture
One 8 Kword, two 4 Kwords, one 16 Kword, and fifteen 32 Kwords sectors in word mode
One 16 Kbyte, two 8 Kbytes, one 32 Kbyte, and fifteen 64 Kbytes sectors in byte mode
Any combination of sectors can be concurrently erased. Also supports full chip erase
•
Boot Code Sector Architecture
T = Top sector
B = Bottom sector
•
Embedded Erase
Automatically pre-programs and erases the chip or any sector
•
Embedded Program
Automatically writes and verifies data at specified address
•Data
•
•
•
•
• Sector Protection set function by Extended sector Protect command
• Fast programming Function by Extended Command
•
Polling and Toggle Bit feature for detection of program or erase cycle completion
Ready/Busy output (RY/BY
Hardware method for detection of program or erase cycle completion
Automatic sleep mode
When addresses remain stable, automatically switch themselves to low power mode
Erase Suspend/Resume
Suspends the erase operation to allow a read in another sector within the same device
Sector protection
Hardware method disables any combination of sectors from program or erase operations
Temporary sector unprotection
Temporary sector unprotection via the RESET
TM
Algorithms
TM
Algorithms
)
PROMs
-10/12
pin
/MBM29SL800BD
-10/12
Embedded Erase
TM
and Embedded ProgramTM are trademarks of Advanced Micro Devices, Inc.
StandbyHXXXXXXXHigh-Z H
Output DisableLHHXXXXXHigh-Z H
Write (Program/Erase) LHLAEnable Sector Protection *
Verify Sector Protection *
2, *4
2, *4
Temporary Sector Unprotection *
LVIDLLHLVIDXH
LLHLLHLVIDCodeH
5
XXXXXXXXXVID
1A0A1A6A9DINH
Reset (Hardware) /StandbyXXXXXXXXHigh-Z L
Legend : L = V
IL, H = VIH, X = VIL or VIH, = Pulse input. See “■DC CHARACTERISTICS” for voltage levels.
*1: Manufacturer and device codes may also be accessed via a command register write sequence. See
“MBM29SL800TD/800BD Standard Command Definitions Table”.
*2: Refer to the section on Sector Protection.
*3: WE
*4: V
can be VIL if OE is VIL, OE at VIH initiates the write operations.
CC= 2.0 V ± 10%
*5: It is also used for the extended sector protection.
8
MBM29SL800TD
MBM29SL800TD/800BD Standard Command Definitions Table
-10/12
/MBM29SL800BD
-10/12
Command
Sequence
Read/
Reset
Read/
Reset
Autoselect
Program
Chip
Erase
Sector
Erase
Sector Erase SuspendErase can be suspended during sector erase with Addr. (“H” or “L”) . Data (B0h)
Sector Erase ResumeErase can be resumed after suspend with Addr. (“H” or “L”) . Data (30h)
Word
Byte
Word
ByteAAAh555hAAAh
Word
ByteAAAh555hAAAh
Word
ByteAAAh555hAAAh
Word
ByteAAAh555hAAAhAAAh555hAAAh
Word
ByteAAAh555hAAAhAAAh555h
Bus
Write
Cycles
Req’d
First Bus
Write Cycle
Addr. Data Addr. Data Addr. Data Addr. Data Addr. Data Addr. Data
1XXXhF0h
555h
3
555h
3
555h
4
555h
6
555h
6
AAh
AAh
AAh
AAh
AAh
Second Bus
Write Cycle
2AAh
55h
2AAh
55h
2AAh
55h
2AAh
55h
2AAh
55h
Third Bus
Write Cycle
555h
555h
555h
555h
555h
Fourth Bus
Read/Write
Cycle
F0hRARD
90h
A0hPAPD
555h
80h
555h
80h
AAh
AAh
Fifth Bus
Write Cycle
2AAh
55h
2AAh
55hSA30h
Sixth Bus
Write Cycle
555h
10h
Notes : • Address bits A
Sector Address (SA)
• Bus operations are defined in “MBM29SL800TD/800BD User Bus Operations Tables (BYTE
BYTE
= VIL)”.
• RA = Address of the memory location to be read
PA = Address of the memory location to be programmed
Addresses are latched on the falling edge of the WE
SA = Address of the sector to be erased. The combination of A
uniquely select any sector.
• RD = Data read from location RA during read operation.
PD = Data to be programmed at location PA. Data is latched on the rising edge of WE
• The system should generate the following address patterns :
Word Mode : 555h or 2AAh to addresses A
Byte Mode : AAAh or 555h to addresses A-1 and A0 to A10
• Both Read/Reset commands are functionally equivalent, resetting the device to the read mode.
• The command combinations not described in “MBM29SL800TD/800BD Standard Command Definitions
Table” and “MBM29SL800TD/BD Extended Command Definitions Table” are illegal.
11 to A18= X = “H” or “L” for all address commands except or Program Address (PA) and
SA00000XXX00000h to 0FFFFh00000h to 07FFFh
SA10001XXX10000h to 1FFFFh08000h to 0FFFFh
SA20010XXX20000h to 2FFFFh10000h to 17FFFh
SA30011XXX30000h to 3FFFFh18000h to 1FFFFh
SA40100XXX40000h to 4FFFFh20000h to 27FFFh
SA50101XXX50000h to 5FFFFh28000h to 2FFFFh
SA60110XXX60000h to 6FFFFh30000h to 37FFFh
SA70111XXX70000h to 7FFFFh38000h to 3FFFFh
SA81000XXX80000h to 8FFFFh40000h to 47FFFh
SA91001XXX90000h to 9FFFFh48000h to 4FFFFh
SA10 1010XXXA0000h to AFFFFh50000h to 57FFFh
SA11 1011XXXB0000h to BFFFFh58000h to 5FFFFh
SA12 1100XXXC0000h to CFFFFh60000h to 67FFFh
SA13 1101XXXD0000h to DFFFFh68000h to 6FFFFh
SA14 1110XXXE0000h to EFFFFh70000h to 77FFFh
SA15 11110XXF0000h to F7FFFh78000h to 7BFFFh
18
A
17
A
16
A
15
A
14
A
13
A
12
A
Address Range (
××××
8) Address Range (
××××
16)
SA16 1111100F8000h to F9FFFh7C000h to 7CFFFh
SA17 1111101FA000h to FBFFFh7D000h to 7DFFFh
SA18 111111XFC000h to FFFFFh7E000h to 7FFFFh
12
MBM29SL800TD
Sector Address Table (MBM29SL800BD)
-10/12
/MBM29SL800BD
-10/12
Sector
Address
SA0000000X00000h to 03FFFh00000h to 01FFFh
SA1000001004000h to 05FFFh02000h to 02FFFh
SA2000001106000h to 07FFFh03000h to 03FFFh
SA300001XX08000h to 0FFFFh04000h to 07FFFh
SA40001XXX10000h to 1FFFFh08000h to 0FFFFh
SA50010XXX20000h to 2FFFFh10000h to 17FFFh
SA60011XXX30000h to 3FFFFh18000h to 1FFFFh
SA70100XXX40000h to 4FFFFh20000h to 27FFFh
SA80101XXX50000h to 5FFFFh28000h to 2FFFFh
SA90110XXX60000h to 6FFFFh30000h to 37FFFh
SA10 0111XXX70000h to 7FFFFh38000h to 3FFFFh
SA11 1000XXX80000h to 8FFFFh40000h to 47FFFh
SA12 1001XXX90000h to 9FFFFh48000h to 4FFFFh
SA13 1010XXXA0000h to AFFFFh50000h to 57FFFh
SA14 1011XXXB0000h to BFFFFh58000h to 5FFFFh
SA15 1100XXXC0000h to CFFFFh60000h to 67FFFh
18
A
17
A
16
A
15
A
14
A
13
A
12
A
Address Range (
××××
8) Address Range (
××××
16)
SA16 1101XXXD0000h to DFFFFh68000h to 6FFFFh
SA17 1110XXXE0000h to EFFFFh70000h to 77FFFh
SA18 1111XXXF0000h to FFFFFh78000h to 7FFFFh
13
MBM29SL800TD
FUNCTIONAL DESCRIPTION
■
-10/12
/MBM29SL800BD
-10/12
Read Mode
The MBM29SL800TD/BD have two control functions which m ust be satisfied in order to obtain data at the outputs.
CE
is the power control and should be used for a device selection. OE is the output control and should be used
to gate data to the output pins if a device is selected.
Address access time (t
access time (t
CE) is the delay from stable addresses and stable CE to valid data at the output pins. The output
enable access time is the delay from the falling edge of OE
ACC) is equal to the delay from stable addresses to valid output data. The chip enable
to valid data at the output pins. (Assuming the
addresses have been stab le for at least tACC-tOE time.) When reading out a data without changing addresses after
power-up, it is necessary to input hardware reset or change CE
pin from “H” to “L”
Standby Mode
There are two ways to implement the standby mode on the MBM29SL800TD/BD devices, one using both the
CE
and RESET pins; the other via the RESET pin only.
When using both pins, a CMOS standby mode is achieved with CE and RESET inputs both held at VCC± 0.3 V.
Under this condition the current consumed is less than 5 µA. The device can be read with standard access time
(t
CE) from either of these standby modes. During Embedded Algorithm operation, VCC active current (ICC2) is
required even CE
= “H”.
When using the RESET pin only, a CMOS standby mode is achieved with RESET input held at VSS± 0.3 V
(CE
= “H” or “L”) . Under this condition the current is consumed is less than 5 µA. Once the RESET pin is taken
high, the device requires t
RH of wake up time before outputs are valid for read access.
In the standby mode the outputs are in the high impedance state, independent of the OE input.
Automatic Sleep Mode
There is a function called automatic sleep mode to restrain power consumption during read-out of
MBM29SL800TD/800BD data. This mode can be used effectively with an application requested low power
consumption such as handy terminals.
To activate this mode, MBM29SL800TD/800BD automatically switch themselves to low power mode when
MBM29SL800TD/800BD addresses remain stably during access fine of 150 ns. It is not necessary to control
CE
, WE, and OE on the mode. Under the mode, the current consumed is typically 1 µA (CMOS Level) .
Since the data are latched during this mode, the data are read-out continuously. If the addresses are changed,
the mode is canceled automatically and MBM29SL800TD/800BD read-out the data for changed addresses.
Output Disable
With the OE
input at a logic high level (VIH) , output from the devices are disabled. This will cause the output
pins to be in a high impedance state.
Autoselect
The autoselect mode allows the reading out of a binary code from the devices and will identify its manufacturer
and type. This mode is intended for use by programming equipment for the purpose of automatically matching
the devices to be programmed with its corresponding prog ramming algorithm. This mode is functional over the
entire temperature range of the devices.
To activate this mode, the programming equipment m ust force V
bytes may then be sequenced from the de vices outputs b y toggling address A
DON’T CARES except A
0, A1, A6, and A-1. (See “MBM29SL800TD/800BD Sector Protection Verify Autoselect
ID (10 V to 11 V) on address pin A9. Two identifier
0 from VIL to VIH. All addresses are
Codes Table” in ■DEVICE BUS OPERATION.)
The manufacturer and device codes may also be read via the command register, for instances when the
MBM29SL800TD/BD are erased or programmed in a system without access to high vo ltage on the A
command sequence is illustrated in “MBM29SL800TD/800BD Standard Command Definitions Table” (in ■DE-
VICE BUS OPERATION). (Refer to Autoselect Command section.)
Byte 0 (A
0= VIL) represents the manufacturer’ s code (Fujitsu = 04h) and (A0= VIH) represents the device identifier
code (MBM29SL800TD = EAh and MBM29SL800BD = 6Bh for ×8 mode; MBM29SL800TD = 22EAh and
MBM29SL800BD = 226Bh for ×16 mode) . These two bytes/words are giv en in “MBM29SL800TD/800BD Sector
Protection V erify Autoselect Codes T able and Extended Autoselect Code Table (in ■DEVICE BUS OPERA TION”).
14
9 pin. The
MBM29SL800TD
-10/12
/MBM29SL800BD
-10/12
All identifiers for manufactures and device will exhibit odd parity with DQ
read the proper device codes when executing the autoselect, A
1 must be VIL. (See “MBM29SL800TD/800BD
7 defined as the parity bit. In order to
Sector Protection Verify Autoselect Codes Table and Extended Autoselect Code Table in ■DEVICE BUS OPERATION”.)
Write
Device erasure and progr amming are accomplished via the command register. The contents of the register serve
as inputs to the internal state machine. The state machine outputs dictate the function of the device.
The command register itself does not occupy any addressab le memory location. The register is a latch used to
store the commands, along with the address and data information needed to execute the command. The command register is written by bringing WE
falling edge of WE
or CE, whichever happens later; while data is latched on the rising edge of WE or CE,
to VIL, while CE is at VIL and OE is at VIH. Addresses are latched on the
whichever happens first. Standard microprocessor write timings are used.
Refer to AC Write Characteristics and the Erase/Programming Waveforms for specific timing parameters.
Sector Protection
The MBM29SL800TD/BD feature hardware sector protection. This feature will disable both program and erase
operations in any number of sectors (0 through 18) . The sector protection f eature is enabled using programming
equipment at the user’s site. The devices are shipped with all sectors unprotected.
To activate this mode, the programming equipment must force V
CE
= VIL, and A6= VIL. The sector addresses (A18, A17, A16, A15, A14, A13, and A12) should be set to the sector to
ID on address pin A9 and control pin OE,
be protected. “Sector Address Tables (MBM29SL800TD/BD)” in ■FLEXIBLE SECTOR-ERASE ARCHITECTURE define the sector address for each of the nineteen (19) individual sectors.
Programming of the protection circuitry begins on the falling edge of the WE
rising edge of the same. Sector addresses must be held constant during the WE
pulse and is terminated with the
pulse. See “(13) Sector
Protection Timing Diagram” in ■TIMING DIAGRAM and “(5) Sector Protection Algor ithm” in ■FLOW CHART
for sector protection waveforms and algorithm.
To verify programming of the protection circuitry, the programming equipment must f orce V
ID on address pin A9
with CE and OE at VIL and WE at VIH. Scanning the sector addresses (A18, A17, A16, A15, A14, A13, and A12) while
(A
6, A1, A0) = (0, 1, 0) will produce a logical “1” code at device output DQ0 for a protected sector. Otherwise the
devices will read 00h for unprotected sector. In this mode, the lower order addresses, except for A
0, A1, and A6
are DON’T CARES. Address locations with A1= VIL are reserved for A utoselect manuf acturer and de vice codes.
A-
1 requires to apply to VIL on byte mode.
Temporary Sector Unprotection
This feature allows tempor ary unprotection of previously protected sectors of the MBM29SL800TD/BD devices
in order to change data. The Sector Unprotection mode is activated by setting the RESET
pin to high voltage
(VID) . During this mode, formerly protected sectors can be programmed or erased by selecting the sector
addresses. Once the V
ID is taken awa y from the RESET pin, all the prev iously protected sectors will be protected
again. See “(14) Temporary Sector Unprotection Timing Diagram” in ■TIMING DIAGRAM and “(6) Temporar y
Sector Unprotection Algorithm” in ■FLOW CHART.
RESET
Hardware Reset
The MBM29SL800TD/BD devices may be reset by driving the RESET pin to VIL. The RESET pin has a pulse
requirement and has to be kept low (V
IL) for at least 500 ns in order to properly reset the internal state machine.
Any operation in the process of being executed will be ter minated and the inter nal state machine will be reset
to the read mode 20 µs after the RESET
devices require an additional t
RH before it will allow read access. When the RESET pin is low, the devices will
pin is driven low. Fur thermore, once the RESET pin goes high, the
be in the standby mode for the duration of the pulse and all the data output pins will be tri-stated. If a hardware
reset occurs during a program or erase operation, the data at that particular location will be corrupted. Please
note that the RY/BY
output signal should be ignored during the RESET pulse. See “(9) RESET, RY/BY Timing
Diagram” in ■TIMING DIAGRAM for the timing diagram. Refer to Temporary Sector Unprotection for additional
functionality.
15
MBM29SL800TD
COMMAND DEFINITIONS
■
Device operations are selected by writing specific address and data sequences into the command register.
“MBM29SL800TD/800BD Standard Command Definitions Table” in ■DEVICE BUS OPERATION defines the
valid register command sequences. Note that the Erase Suspend (B0h) and Erase Resume (30h) commands
are valid only while the Sector Erase operation is in progress. Moreover both Read/Reset commands are
functionally equivalent, resetting the device to the read mode. Please note that commands are always written
at DQ
0 to DQ7 and DQ8 to DQ15 bits are ignored.
Read/Reset Command
In order to return from Autoselect mode or Exceeded Timing Limits (DQ
operation is initiated by writing the Read/Reset command sequence into the command register . Microprocessor
read cycles retrieve array data from the memor y. The devices remain enabled for reads until the command
register contents are altered.
The devices will automatically power-up in the read/reset state . In this case, a command sequence is not required
to read data. Standard microprocessor read cycles will retrieve array data. This default value ensures that no
spurious alteration of the memory content occurs during the power transition. Refer to the AC Read Characteristics and Waveforms for the specific timing parameters.
Autoselect Command
Flash memories are intended for use in applications where the local CPU alters memory contents. As such,
manufacture and device codes must be accessible while the devices reside in the target system. PROM programmers typically access the signature codes by raising A
onto the address lines is not generally desired system design practice.
-10/12
/MBM29SL800BD
5= 1) to read/reset mode, the read/reset
9 to a high voltage. How ever, multiple xing high voltage
-10/12
The device contains an A utoselect command operation to supplement tr aditional PR OM programming methodology. The operation is initiated by writing the Autoselect command sequence into the command register.
Following the command write, a read cycle from address XX00h retriev es the man ufacture code of 04h. A read
cycle from address XX01h for ×16 (XX02h for ×8) returns the device code (MBM29SL800TD = EAh and
MBM29SL800BD = 6Bh for ×8 mode; MBM29SL800TD = 22EAh and MBM29SL800BD = 226Bh for ×16
mode) . (See “MBM29SL800TD/800BD Sector Protection Verify Autoselect Codes Table and Extended
Autoselect Code Table in ■DEVICE BUS OPERATION”.) All manufacturer and device codes will exhibit odd
parity with DQ
XX02h for ×16 (XX04h for ×8) .
Scanning the sector addresses (A
logical “1” at device output DQ
mode on the protected sector. (See “MBM29SL800TD/800BD User Bus Oper ations T able (BYTE
= VIL)” in ■DEVICE BUS OPERATION.)
To terminate the operation, it is necessary to write the Read/Reset command sequence into the register, and
also to write the Autoselect command during the operation, execute it after writing Read/Reset command
sequence.
Byte/Word Programming
The devices are programmed on a byte-by-byte (or word-by-word) basis. Programming is a four bus cycle
operation. There are two “unlock” write cycles. These are followed by the program set-up command and data
write cycles. Addresses are latched on the falling edge of CE
latched on the rising edge of CE
happens first) begins programming. Upon executing the Embedded Program Algorithm command sequence,
the system is not required to provide further controls or timings. The device will automatically provide adequate
internally generated program pulses and verify the programmed cell margin.
The automatic programming operation is completed when the data on DQ
bit at which time the devices return to the read mode and addresses are no longer latched. (See “Hardware
Sequence Flags Table”.) Therefore, the devices require that a valid address to the devices be supplied by the
7 defined as the parity bit. Sector state (protection or unprotection) will be informed by address
18, A17, A16, A15, A14, A13, and A12) while (A6, A1, A0) = (0, 1, 0) will produce a
0 for a protected sector. The programming verification should be perform margin
= VIH and BYTE
or WE, whichever happens later and the data is
or WE, whichever happens first. The r ising edge of CE or WE (whichever
7 is equivalent to data written to this
16
MBM29SL800TD
-10/12
/MBM29SL800BD
-10/12
system at this particular instance of time. Hence, Data
is being programmed.
If hardware reset occurs during the programming operation, it is impossible to guarantee the data are being
written.
Programming is allowed in any sequence and across sector boundar ies. Beware that a data “0” cannot be
programmed back to a “1”. Attempting to do so may either hang up the device or result in an apparent success
according to the data polling algorithm but a read from read/reset mode will show that the data is still “0”. Only
erase operations can convert “0”s to “1”s.
“(1) Embedded Program
typical command strings and bus operations.
Chip Erase
Chip erase is a six bus cycle operation. There are two “unlock” wr ite cycles. These are followed by writing the
“set-up” command. Two more “unlock” write cycles are then followed by the chip erase command.
Chip erase does not require the user to program the de vice prior to erase. Upon ex ecuting the Embedded Erase
Algorithm command sequence the devices will automatically program and ver ify the entire memory for an all
zero data pattern prior to electrical erase (Preprogram function) . The system is not required to provide any
controls or timings during these operations.
The automatic erase begins on the rising edge of the last WE
when the data on DQ
mode.
Chip Erase Time; Sector Erase Time × All sectors + Chip Program Time (Preprogramming)
“(2) Embedded Erase
command strings and bus operations.
TM
Algorithm” in ■FLOW CHART illustrates the Embedded ProgramTM Algorithm using
7 is “1” (See Write Operation Status section.) at which time the device returns to read the
TM
Algorithm” in ■FLOW CHART illustr ates the Embedded EraseTM Algorithm using typical
Polling m ust be perf ormed at the memory location which
pulse in the command sequence and terminates
Sector Erase
Sector erase is a six bus cycle operation. There are two “unloc k” write cycles. These are followed by writing the
“set-up” command. Two more “unlock” write cycles are then follo wed b y the Sector Erase command. The sector
address (any address location within the desired sector) is latched on the falling edge of WE
(Data = 30h) is latched on the rising edge of WE
erase command, the sector erase operation will begin.
Multiple sectors may be erased concurrently b y writing the six bus cycle operations on “MBM29SL800TD/800BD
Standard Command Definitions Table” in ■DEVICE BUS OPERATION. This sequence is followed with writes
of the Sector Erase command to addresses in other sectors desired to be concurrently erased. The time between
writes must be less than 50 µs otherwise that command will not be accepted and erasure will start. It is recommended that processor interrupts be disabled during this time to guarantee this condition. The interrupts can be
re-enabled after the last Sector Erase command is written. A time-out of 50 µs from the rising edge of the last
WE
will initiate the ex ecution of the Sector Er ase command (s) . If another falling edge of the WE occurs within
the 50 µs time-out window the timer is reset. (Monitor DQ
open, see section DQ
data in the sector. In that case, restart the erase on those sectors and allow them to complete. (Refer to the
Write Operation Status section for Sector Erase Timer operation.) Loading the sector erase b uff er may be done
in any sequence and with any number of sectors (0 to 18) .
Sector erase does not require the user to program the de vices prior to erase. The devices automatically progr am
all memory locations in the sector (s) to be erased prior to electrical erase (Preprogram function) . When erasing
a sector or sectors the remaining unselected sectors are not affected. The system is not required to provide an y
controls or timings during these operations.
The automatic sector erase begins after the 50 µs time out from the rising edge of the WE
sector erase command pulse and terminates when the data on DQ
at which time the devices return to the read mode. Data
3, Sector Erase Timer.) Resetting the devices once execution has begun will corrupt the
. After time-out of 50 µs from the rising edge of the last sector
3 to determine if the sector erase timer window is still
7 is “1” (See Write Operation Status section.)
polling must be performed at an address within any of
, while the command
pulse for the last
17
Loading...
+ 39 hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.