Diodes AP2213 User Manual

Data Sheet
500mA LOW NOISE LDO REGULATOR AP2213
General Description
The AP2213 is a 500mA output current fixed voltage regulator which provides low noise, very low dropout voltage (typically 350mV at 500mA), very low standby current (1μA maximum) and excellent power supply ripple rejection (PSRR 75dB at 100Hz) in bat­tery powered applications, such as handsets and PDAs and in noise sensitive applications, such as RF elec­tronics.
The AP2213 features individual logic compatible enable/shutdown control inputs, a low power shut­down mode for extended battery life, over current pro­tection, over temperature protection, as well as reversed-battery protection.
The AP2213 has 2.5V, 3.0V and 3.3V versions.
The AP2213 is available in TO-252-2 (1), TO-252-2 (3), SOIC-8 and SOT-223 packages.
Features
· Up to 500mA Output Current
· Low Standby Current
· Low Dropout Voltage: V
· High Output Accuracy: ±1%
· Good Ripple Rejection Ability: 75dB at 100Hz
OUT
=100μA
and I
· Tight Load and Line Regulation
· Low Temperature Coefficient
· Over Current Protection
· Thermal Protection
· Reversed-battery Protection
· Logic-controlled Enable
=350mV at 500mA
DROP
Applications
· Laptop, Notebook, and Palmtop Computer
· CD-ROM, CD-R/RW, DVD Driver
· Portable Electronic
· PC Peripheral
SOIC-8TO-252-2 (1) SOT-223TO-252-2 (3)
Figure 1. Package Types of AP2213
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
1
Data Sheet
VOUT
GND
VIN
1
2
3
1
2
3
4
8
7
6
5
VOUT
GND
VIN
GND
GND
GND
BYP
EN
VIN
VOUT
GND
1
2
3
1
2
3
VIN
VOUT
GND
500mA LOW NOISE LDO REGULATOR AP2213
Pin Configuration
D Package
(TO-252-2 (1))
(TO-252-2 (3))
H Package
(SOT-223)
Figure 2. Pin Configuration of AP2213 (Top View)
Pin Description
Pin Number
TO-252-2 (1)/
TO-252-2 (3)
3 3 2 VOUT Regulated output voltage
2 5, 6, 7, 8 1 GND Ground
SOIC-8 SOT-223
Pin Name Function
M Package
(SOIC-8)
1 2 3 VIN Input Voltage
1EN
4 BYP Bypass capacitor for low noise operation
Enable input: CMOS or TTL compatible input. Logic high=enable, logic low=shutdown
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
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Data Sheet
+
-
Bandgap
Ref.
Current Limit
Thermal Shutdown
V
IN
BYP
EN
GND
V
OUT
500mA LOW NOISE LDO REGULATOR AP2213
Functional Block Diagram
1 (2) (3)
(4)
(1)
2 (5, 6, 7, 8) (1)
Figure 3. Functional Block Diagram of AP2213
3 (3) (2)
A (B) (C) A for TO-252-2 (1)/(3)
B for SOIC-8 C for SOT-223
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Data Sheet
500mA LOW NOISE LDO REGULATOR AP2213
Ordering Information
AP2213 -
E1: Lead Free
Circuit Type
Package
D: TO-252-2 (1)/TO-252-2 (3) M: SOIC-8 H: SOT-223
G1: Green
TR: Tape and Reel
Blank: Tube
2.5: Fixed Output 2.5V
3.0: Fixed Output 3.0V
3.3: Fixed Output 3.3V
Package
TO-252-2 (1)/
TO-252-2 (3)
SOIC-8
SOT-223
Temperature
Range
o
-40 to 125
-40 to 125
-40 to 125
C
o
C
o
C
Lead Free Green Lead Free Green
AP2213D-2.5E1 AP2213D-2.5G1 AP2213D-2.5E1 AP2213D-2.5G1 Tube
AP2213D-2.5TRE1 AP2213D-2.5TRG1 AP2213D-2.5E1 AP2213D-2.5G1 Tape & Reel
AP2213D-3.0E1 AP2213D-3.0G1 AP2213D-3.0E1 AP2213D-3.0G1 Tube
AP2213D-3.0TRE1 AP2213D-3.0TRG1 AP2213D-3.0E1 AP2213D-3.0G1 Tape & Reel
AP2213D-3.3E1 AP2213D-3.3G1 AP2213D-3.3E1 AP2213D-3.3G1 Tube
AP2213D-3.3TRE1 AP2213D-3.3TRG1 AP2213D-3.3E1 AP2213D-3.3G1 Tape & Reel
AP2213M-2.5E1 AP2213M-2.5G1 2213M-2.5E1 2213M-2.5G1 Tube
AP2213M-2.5TRE1 AP2213M-2.5TRG1 2213M-2.5E1 2213M-2.5G1 Tape & Reel
AP2213M-3.0E1 AP2213M-3.0G1 2213M-3.0E1 2213M-3.0G1 Tube
AP2213M-3.0TRE1 AP2213M-3.0TRG1 2213M-3.0E1 2213M-3.0G1 Tape & Reel
AP2213M-3.3E1 AP2213M-3.3G1 2213M-3.3E1 2213M-3.3G1 Tube
AP2213M-3.3TRE1 AP2213M-3.3TRG1 2213M-3.3E1 2213M-3.3G1 Tape & Reel
AP2213H-2.5TRE1 AP2213H-2.5TRG1 EH13C GH13C Tape & Reel
AP2213H-3.0TRE1 AP2213H-3.0TRG1 EH13E GH13E Tape & Reel
AP2213H-3.3TRE1 AP2213H-3.3TRG1 EH13F GH13F Tape & Reel
Part Number Marking ID
Packing Type
BCD Semiconductor's Pb-free products, as designated with "E1" suffix in the part number, are RoHS compliant. Products with "G1" suffix are available in green packages.
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
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Data Sheet
500mA LOW NOISE LDO REGULATOR AP2213
Absolute Maximum Ratings (Note 1)
Parameter Symbol Value Unit
Supply Input Voltage V
Enable Input Voltage V
Power Dissipation P
Lead Temperature (Soldering, 10sec) T
LEAD
Junction Temperature T
Storage Temperature T
IN
EN
D
J
STG
Internally Limited (Thermal Protection) W
20 V
20 V
260
150
-65 to 150
o
C
o
C
o
C
ESD (Machine Model) ESD 300 V
TO-252-2 (1)/TO-252-2 (3) 90
o
Thermal Resistance (No Heatsink)
θ
JA
SOIC-8 160
C/W
SOT-223 108
Note 1: Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "Recommended Operating Conditions" is not implied. Exposure to "Absolute Max­imum Ratings" for extended periods may affect device reliability.
Recommended Operating Conditions
Parameter Symbol Min Max Unit
Supply Input Voltage V
Enable Input Voltage V
Operating Junction Temperature T
IN
EN
J
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
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2.5 18 V
018V
-40 125
o
C
Data Sheet
500mA LOW NOISE LDO REGULATOR AP2213
Electrical Characteristics AP2213-2.5 Electrical Characteristics
VIN=3.5V, I
otherwise specified.
unless
Parameter Symbol Conditions Min Typ Max Unit
Output Voltage Accuracy
Output Voltage Temperature Coefficient (Note 3)
Line Regulation
Load Regulation (Note 4)
Dropout Voltage (Note 5)
Standby Current
Ground Pin Current (Note 6)
=100μA, CIN=1.0μF, C
OUT
ΔV
ΔV
(ΔV
OUT/VOUT
=2.2μF, VEN≥
OUT
OUT/VOUT
/ΔT 120
OUT
2.0V, TJ=25oC,
Bold
typeface applies over -40oC≤TJ≤
Variation from specified V
OUT
)/ΔT 48
V
RLINE
V
RLOAD
V
DROP
I
STD
I
GND
VIN=3.5V to 13.2V
I
=0.1mA to 500mA
OUT
I
=100μA
OUT
I
=50mA
OUT
I
=100mA
OUT
=150mA
I
OUT
I
=300mA
OUT
=500mA
I
OUT
VEN≤0.4V (shutdown) 0.01 1
V
0.18V (shutdown) 5
EN
VEN≥2.0V, I
2.0V, I
V
EN
VEN≥2.0V, I
2.0V, I
V
EN
2.0V, I
V
EN
OUT
OUT
OUT
OUT
OUT
=100μA
=50mA
=150mA
=300mA
=500mA
-1 1
-2 2
1.5 4.5
17
15 50
110 150
230
140 250
300
165 275
350
250 400
500
350 600
700
100 150
180
350 600
800
1.3 1.9
410
11 20
125oC (Note 2),
%
μV/
ppm/
12
17
mV
mV
70
mV
μA
μA
2.5
mA
15
28
o
C
o
C
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
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Data Sheet
HznV /
500mA LOW NOISE LDO REGULATOR AP2213
Electrical Characteristics (Continued) AP2213-2.5 Electrical Characteristics
VIN=3.5V, I
unless
otherwise specified.
Parameter Symbol Conditions Min Typ Max Unit
Ripple Rejection PSRR f=100Hz, I
Current Limit I
Output Noise
=100μA, CIN=1.0μF, C
OUT
=2.2μF, VEN≥
OUT
LIMIT
e
no
2.0V, TJ=25oC,
OUT
V
=0V 700 1000 mA
OUT
I
=50mA, C
OUT
100pF from BYP to GND
Bold
typeface applies over -40oC≤TJ≤
=100μA75dB
=2.2μF,
OUT
260
125oC (Note 2),
Enable Input Logic-low Voltage
Enable Input Logic-high Voltage V
Enable Input Logic-low Current
Enable Input Logic-high Current
V
I
IL
I
IH
Regulator shutdown
IL
Regulator enabled 2.0 V
IH
VIL≤0.4V 0.01 1
0.18V 2
V
IL
VIL≥2.0V 5 20
V
2.0V 25
IL
0.4
0.18
V
μA
μA
TO-252-2 (1)/TO-252-2 (3) 20
Thermal Resistance
θ
JC
SOIC-8 45
o
C/W
SOT-223 31
Note 2: Specifications in bold type are limited to
-40oC≤TJ≤
125oC. Limits over temperature are guaranteed by design, but not
tested in production. Note 3: Output voltage temperature coefficient is defined as the worst case voltage change divided by the total temperature range. Note 4: Regulation is measured at constant junction temperature using low duty cycle pulse testing. Parts are tested for load regulation in the load range from 0.1mA to 500mA. Changes in output voltage due to heating effects are covered by the thermal regulation specification.
Note 5: Dropout voltage is defined as the input to output differential at which the output voltage drops 1% (T
o
40
C≤TJ≤
125oC)
below its nominal value measured at 1V differential.
=25oC) or 2% (-
J
Note 6: Ground pin current is the regulator quiescent current plus pass transistor base current. The total current drawn from the
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
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Data Sheet
500mA LOW NOISE LDO REGULATOR AP2213
Electrical Characteristics (Continued) AP2213-3.0 Electrical Characteristics
VIN=4V, I
unless
Parameter Symbol Conditions Min Typ Max Unit
Output Voltage Accuracy
Output Voltage Temperature Coefficient (Note 3)
Line Regulation
Load Regulation (Note 4)
Dropout Voltage (Note 5)
Standby Current
Ground Pin Current (Note 6)
=100μA, CIN=1.0μF, C
OUT
otherwise specified.
ΔV
ΔV
(ΔV
OUT/VOUT
=2.2μF, VEN≥
OUT
OUT/VOUT
/ΔT 120
OUT
2.0V, TJ=25oC,
Bold
typeface applies over -40oC≤TJ≤
Variation from specified V
OUT
)/ΔT 40
V
RLINE
V
RLOAD
V
DROP
I
STD
I
GND
VIN=4V to 13.2V
I
=0.1mA to 500mA
OUT
I
=100μA
OUT
I
=50mA
OUT
=100mA
I
OUT
=150mA
I
OUT
=300mA
I
OUT
=500mA
I
OUT
VEN≤0.4V (shutdown) 0.01 1
V
0.18V (shutdown) 5
EN
VEN≥2.0V, I
2.0V, I
V
EN
VEN≥2.0V, I
2.0V, I
V
EN
VEN≥2.0V, I
OUT
OUT
OUT
OUT
OUT
=100μA
=50mA
=150mA
=300mA
=500mA
-1 1
-2 2
1.5 4.5
18
15 50
110 150
230
140 250
300
165 275
350
250 400
500
350 600
700
100 150
180
350 600
800
1.3 1.9
2.5
410
11
125oC (Note 2),
%
μV/
ppm/
12
17
mV
mV
70
mV
μA
μA
mA
15
20
28
o
C
o
C
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
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Data Sheet
HznV /
500mA LOW NOISE LDO REGULATOR AP2213
Electrical Characteristics (Continued) AP2213-3.0 Electrical Characteristics
VIN=4V, I
unless
Parameter Symbol Conditions Min Typ Max Unit
Ripple Rejection PSRR f=100Hz, I
Current Limit I
Output Noise
=100μA, CIN=1.0μF, C
OUT
otherwise specified.
=2.2μF, VEN≥
OUT
LIMIT
e
no
2.0V, TJ=25oC,
V
=0V 700 1000 mA
OUT
I
=50mA, C
OUT
100pF from BYP to GND
Bold
typeface applies over -40oC≤TJ≤
=100μA75dB
OUT
=2.2μF,
OUT
260
125oC (Note 2),
Enable Input Logic-low Voltage
Enable Input Logic-high Voltage V
Enable Input Logic-low Current
Enable Input Logic-high Current
V
IL
IH
I
IL
I
IH
Regulator shutdown
Regulator enabled 2.0 V
VIL≤0.4V 0.01 1
0.18V 2
V
IL
VIL≥2.0V 5 20
V
2.0V 25
IL
0.4
0.18
V
μA
μA
TO-252-2 (1)/TO-252-2 (3) 20
Thermal Resistance
θ
JC
SOIC-8 45
o
C/W
SOT-223 31
Note 2: Specifications in bold type are limited to
-40oC≤TJ≤
125oC. Limits over temperature are guaranteed by design, but not
tested in production. Note 3: Output voltage temperature coefficient is defined as the worst case voltage change divided by the total temperature range. Note 4: Regulation is measured at constant junction temperature using low duty cycle pulse testing. Parts are tested for load regulation in the load range from 0.1mA to 500mA. Changes in output voltage due to heating effects are covered by the thermal regulation specification.
Note 5: Dropout voltage is defined as the input to output differential at which the output voltage drops 1% (T
o
40
C≤TJ≤
125oC)
below its nominal value measured at 1V differential.
=25oC) or 2% (-
J
Note 6: Ground pin current is the regulator quiescent current plus pass transistor base current. The total current drawn from the supply is the sum of the load current plus the ground pin current.
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
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Data Sheet
500mA LOW NOISE LDO REGULATOR AP2213
Electrical Characteristics (Continued) AP2213-3.3 Electrical Characteristics
VIN=4.3V, I
otherwise specified.
unless
Parameter Symbol Conditions Min Typ Max Unit
Output Voltage Accuracy
Output Voltage Temperature Coefficient (Note 3)
Line Regulation
Load Regulation (Note 4)
Dropout Voltage (Note 5)
Standby Current
Ground Pin Current (Note 6)
=100μA, CIN=1.0μF, C
OUT
ΔV
(ΔV
=2.2μF, VEN≥
OUT
OUT/VOUT
ΔV
/ΔT 120
OUT
OUT/VOUT
V
V
V
)/ΔT 36.3
RLINE
RLOAD
DROP
I
STD
I
GND
2.0V, TJ=25oC,
Bold
typeface applies over -40oC≤TJ≤
Variation from specified V
OUT
VIN=4.3V to 13.2V
I
=0.1mA to 500mA
OUT
I
=100μA
OUT
I
=50mA
OUT
I
=100mA
OUT
I
=150mA
OUT
I
=300mA
OUT
I
=500mA
OUT
VEN≤0.4V (shutdown) 0.01 1
V
0.18V (shutdown) 5
EN
VEN≥2.0V, I
V
2.0V, I
EN
2.0V, I
V
EN
V
2.0V, I
EN
2.0V, I
V
EN
OUT
OUT
OUT
OUT
OUT
=100μA
=50mA
=150mA
=300mA
=500mA
-1 1
-2 2
1.5 4.5
19
15 50
110 150
230
140 250
300
165 275
350
250 400
500
350 600
700
100 150
180
350 600
800
1.3 1.9
410
11
125oC (Note 2),
%
μV/
ppm/
12
18
mV
mV
70
mV
μA
μA
2.5
mA
15
20
28
o
C
o
C
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
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Data Sheet
HznV /
500mA LOW NOISE LDO REGULATOR AP2213
Electrical Characteristics (Continued) AP2213-3.3 Electrical Characteristics
VIN=4.3V, I
unless
otherwise specified.
Parameter Symbol Conditions Min Typ Max Unit
Ripple Rejection PSRR f=100Hz, I
Current Limit I
Output Noise
=100μA, CIN=1.0μF, C
OUT
=2.2μF, VEN≥
OUT
LIMIT
e
no
2.0V, TJ=25oC,
OUT
V
=0V 700 1000 mA
OUT
I
=50mA, C
OUT
100pF from BYP to GND
Bold
typeface applies over -40oC≤TJ≤
=100μA75dB
=2.2μF,
OUT
260
125oC (Note 2),
Enable Input Logic-low Voltage
Enable Input Logic-high Voltage V
Enable Input Logic-low Current
Enable Input Logic-high Current
V
IL
IH
I
IL
I
IH
Regulator shutdown
Regulator enabled 2.0 V
VIL≤0.4V 0.01 1
0.18V 2
V
IL
VIL≥2.0V 5 20
V
2.0V 25
IL
0.4
0.18
V
μA
μA
TO-252-2 (1)/TO-252-2 (3) 20
Thermal Resistance
θ
JC
SOIC-8 45
o
C/W
SOT-223 31
Note 2: Specifications in bold type are limited to
-40oC≤TJ≤
125oC. Limits over temperature are guaranteed by design, but not
tested in production. Note 3: Output voltage temperature coefficient is defined as the worst case voltage change divided by the total temperature range. Note 4: Regulation is measured at constant junction temperature using low duty cycle pulse testing. Parts are tested for load regulation in the load range from 0.1mA to 500mA. Changes in output voltage due to heating effects are covered by the thermal regulation specification.
Note 5: Dropout voltage is defined as the input to output differential at which the output voltage drops 1% (T
o
40
C≤TJ≤
125oC)
below its nominal value measured at 1V differential.
=25oC) or 2% (-
J
Note 6: Ground pin current is the regulator quiescent current plus pass transistor base current. The total current drawn from the supply is the sum of the load current plus the ground pin current.
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
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Data Sheet
-60 -40 -20 0 20 40 60 80 100 120 140
2.484
2.486
2.488
2.490
2.492
2.494
2.496
2.498
2.500
2.502
Output Voltage (V)
Junction Temperature (oC)
AP2213-2.5 V
IN
=3.5V, I
OUT
=10mA
C
IN
=1μF, C
OUT
=2.2μF
-60 -40 -20 0 20 40 60 80 100 120 140
50
100
150
200
250
300
350
400
450
500
550
600
650
700
750
800
850
Dropout Voltage (mV)
Junction Temperature (oC)
I
OUT
=50mA
I
OUT
=100mA
I
OUT
=150mA
I
OUT
=300mA
I
OUT
=500mA
CIN=1μF, C
OUT
=2.2μF
0 100 200 300 400 500
0
1
2
3
4
5
6
7
8
9
10
Ground Pin Current (mA)
Output Current (mA)
TA=25oC
C
IN
=1μF, C
OUT
=2.2μF
-60 -40 -20 0 20 40 60 80 100 120 140
0
2
4
6
8
10
12
14
16
18
20
Ground Pin Current (mA)
Junction Temperature (0C)
I
OUT
=50mA
I
OUT
=100mA
I
OUT
=150mA
I
OUT
=300mA
I
OUT
=500mA
AP2213-2.5 V
IN
=3.5V, CIN=1μF, C
OUT
=2.2μF
500mA LOW NOISE LDO REGULATOR AP2213
Typical Performance Characteristics
Figure 4. Output Voltage vs. Junction Temperature Figure 5. Dropout Voltage vs. Junction Temperature
Figure 6. Ground Pin Current vs. Output Current Figure 7. Ground Pin Current vs. Junction Temperature
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
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Data Sheet
-60 -40 -20 0 20 40 60 80 100 120 140
2
3
4
5
6
7
8
9
10
11
12
13
VEN=1.8V
VEN=2V
VEN=3V
VEN=3.7V
Enable Current (μA)
Junction Temperature (oC)
AP2213-2.5, VIN=3.5V
C
IN
=1μF, C
OUT
=2.2μF, I
OUT
=100μA
-60 -40 -20 0 20 40 60 80 100 120 140
0.5
0.6
0.7
0.8
0.9
1.0
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
VEN=logic high
VEN=logic low
Enable Voltage (V)
Junction Temperature (oC)
AP2213-2.5 C
IN
=1μF, C
OUT
=2.2μF
I
OUT
=100μA, VIN=3.5V
10 10 0 1k 10k 100k 1M 10M
100
10
1
0.1
0.01
0.001
Frequency (Hz)
AP2213-2.5 I
OUT
=10mA, CIN=1μF, C
OUT
=2.2μF
V
IN
=3.5V, C
BYP
=100pF
0.0001
Output Noise ( )
500mA LOW NOISE LDO REGULATOR AP2213
Typical Performance Characteristics (Continued)
Figure 8. Enable Current vs. Junction Temperature
V/ Hz
μ
Figure 10. Output Noise vs. Frequency
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
Figure 9. Enable Voltage vs. Junction Temperature
5.5
4.5
3.5
(1V/Div)
IN
V
2.5
AP2213-2.5
10
0
(10m V/Div)
OUT
-10
ΔV
-20
Time (200μs/Div)
Figure 11. Line Transient
(Conditions: V
C
=3.4 to 4.4V, VEN=2V, I
IN
=100pF, C
BYP
OUT
=2.2μF)
OUT
=100μA,
13
Data Sheet
10 100 1k 10k 100k 1M
0
10
20
30
40
50
60
70
80
90
100
PSRR (dB)
Frequency (Hz)
AP2213-2.5 VIN=3.5V, V
RIPPLE
=1V
PP
I
OUT
=10mA, C
OUT
=2.2μF
25 50 75 100 125 150
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
Power Dissipation (W)
Ambient Temperature (oC)
TO-252-2(1)/(3) Package No Heatsink
500mA LOW NOISE LDO REGULATOR AP2213
Typical Performance Characteristics (Continued)
1
0.5
0
(0.5A/Div)
-0.5
OUT
I
(10mV/D iv)
OUT
ΔV
0
-10
-20
-30
10mA
Time (200μs/Div)
Figure 12. Load Transient
(Conditions: VIN=3.5V, C
I
=10 to 500mA, CIN=1μF, C
OUT
AP2213-2.5
=100pF, VEN=2V,
BYP
=2.2μF)
OUT
3
2
1
(1V/Div)
EN
0
V
2
1
(1V/Div)
OUT
0
V
-1
Time (40μs/Div)
Figure 13. VEN vs. V
(Conditions: VEN=0 to 2V, VIN=3.5V, I
C
=open, CIN=1μF, C
BYP
OUT
OUT
AP2213-2.5
=30mA,
OUT
=2.2μF)
Figure 14. PSRR vs. Frequency
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
Figure 15. Power Dissipation vs. Ambient Temperature
14
Data Sheet
0 50 100 150 200 250 300 350 400 450 500
0.01
0.1
1
10
100
1000
ESR (Ω)
Output Current (mA)
C
OUT
=1μF
No Bypass Capacitor
Stable Area
0 50 100 150 200 250 300 350 400 450 500
0.01
0.1
1
10
100
1000
ESR (Ω)
Output Current (mA)
C
OUT
=2.2μF
No Bypass Capacitor
Stable Area
25 50 75 100 125 150
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
Power Dissipation (W)
Ambient Temperature (oC)
SOIC-8 Package No Heatsink
0 50 100 150 200 250 300 350 400 450 500
0.01
0.1
1
10
100
1000
ESR (Ω)
Output Current (mA)
C
OUT
=4.7μF
No Bypass Capacitor
Stable Area
500mA LOW NOISE LDO REGULATOR AP2213
Typical Performance Characteristics (Continued)
Figure 16. Power Dissipation vs. Ambient Temperature
Figure 18. ESR vs. Output Current
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
Figure 17. ESR vs. Output Current
Figure 19. ESR vs. Output Current
15
Data Sheet
BYP
100pF
EN
GND
AP2213-2.5
VIN=3.5V
V
OUT
=2.5V
2.2μF1μF
V
IN
V
IN
V
OUT
V
OUT
C
OUT
C
BYP
C
IN
500mA LOW NOISE LDO REGULATOR AP2213
Typical Application
Figure 20. Typical Application of AP2213 (Note 7)
Note 7: Dropout voltage is 350mV when TA=25oC. In order to obtain a normal output voltage, V
+0.35V is the minimum
OUT
input voltage which will results a low PSRR, imposing a bad influence on system. Therefore, the recommended input voltage
+1V to 18V. For AP2213-2.5 version, its input voltage can be set from 3.5V(V
is V
OUT
+1V) to 18V.
OUT
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
16
Data Sheet
500mA LOW NOISE LDO REGULATOR AP2213
Application Information
Input Capacitor
A 1μF minimum capacitor is recommended to be placed between V
and GND.
IN
Output Capacitor
It is required to prevent oscillation. 1μF minimum is recommended when C
mum is recommended when C
is unused. 2.2μF mini-
BYP
is 100pF. The out-
BYP
put capacitor may be increased to improve transient response.
Noise Bypass Capacitor
Bypass capacitor is connected to the internal voltage reference. A small capacitor connected from BYP to GND make this reference quiet, resulting in a significant reduction in output noise, but the ESR stable area will be narrowed. In order to keep the output stability, it is recommended to use the bypass capacitor no more than 100pF.
The start-up speed of the AP2213 is inversely proportional to the value of reference bypass capacitor. In some cases, if output noise is not a major concern and rapid turn-on is necessary, omit C
and leave BYP open.
BYP
ture must be within the range specified under abso­lute maximum ratings to avoid thermal shutdown. To determine if the power dissipated in the regulator reaches the maximum power dissipation (see figure 16, 17), using: T
= PD*θJA + T
J
PD=(VIN-V
Where: TJ≤T
ings for the junction temperature; V
A
)*I
OUT
OUT+VIN*IGND
, T
J(max)
is absolute maximum rat-
J(max)
IN*IGND
can be
ignored due to its small value.
T
is 150oC, θJA is 90oC/W for TO-252-2 (1)/
J(max)
TO-252-2 (3) package and 160
o
C/W for SOIC-8
package.
Example: For 2.5V version packaged in SOIC-8,
I
=500mA, TA=50oC, V
OUT
o
(150
C-50oC)/(0.5A*160oC/W)+2.5V=3.75V
IN(Max)
is:
Therefore, for good performance, please make sure that input voltage is less than 3.75V without heatsink
when T
=50oC.
A
Power Dissipation
Thermal shutdown may take place if exceeding the maximum power dissipation in application. Under all possible operating conditions, the junction tempera-
Dec. 2012 Rev. 2. 0
BCD Semiconductor Manufacturing Limited
17
Data Sheet
1.350(0.053)
1.650(0.065)
0.600(0.024)
0.900(0.035)
4.500(0.177)
4.700(0.185)
3°
4°
3.800REF(0.150REF)
4.800(0.189)
6.500(0.256)
4.300(0.169)
5.400(0.213)
1.400(0.055)
1.780(0.070)
0.000(0.000)
0.127(0.005)
0.450(0.018)
0.580(0.023)
2.300TYP
9.500(0.374)
9.900(0.390)
0.700(0.028)
0.900(0.035)
0.500(0.020)
0.700(0.028)
5.200(0.205)
5.400(0.213)
6.450(0.254)
6.650(0.262)
2.550(0.100)
2.900(0.114)
5.450(0.215)
6.250(0.246)
2.200(0.087)
2.400(0.094)
5°
5°
8
°
0.450(0.018)
0.580(0.023)
500mA LOW NOISE LDO REGULATOR AP2213
Mechanical Dimensions
Unit: mm(inch)TO-252-2 (1)
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
18
Data Sheet
1.29±0.1
2.900REF
1
.400(0.05
5
)
1
.700(0.06
7
)
0.470(0. 019)
0.600(0.024)
5
9
0
8
9.800(0.386)
10.400(0.409)
2.200(0.087)
2.380(0. 094)
0.900(0.035)
1.100(0. 043)
4.700REF
6.500(0. 256)
6.700(0. 264)
5.130(0.202)
5.460(0.215)
0.150(0.006)
0.750(0.030)
6.000(0.236 )
6.200(0.244 )
0.720(0.0 28)
0.850( 0. 033)
2.286(0. 090) BSC
0.720(0.028)
0.900(0. 035)
0.900(0.035)
1.250(0.049)
1.800REF
8
0
0.600(0.
0
24)
1.000(0.039)
7
3
9
5
5.250REF
Option 1
Option 2
500mA LOW NOISE LDO REGULATOR AP2213
Mechanical Dimensions (Continued)
Unit: mm(inch)TO-252-2 (3)
Dec. 2012 Rev. 2. 0
19
BCD Semiconductor Manufacturing Limited
Data Sheet
0
°
8
°
1° 5°
R
0
.
1
5
0
(
0
.
0
0
6
)
R0.150(0.006)
1.000(0.039)
0.330(0.013)
0.510(0.020)
1.350(0.053)
1.750(0.069)
0.100(0.004)
0.300(0.012)
0.900(0.035)
0.800(0.031)
0.200(0.008)
3.800(0.150)
4.000(0.157)
7
°
7
°
2
0
:
1
D
1.270(0.050)
TYP
0.190(0.007)
0.250(0.010)
8
°
D
5.800(0.228)
6.200(0.244)
0.675(0.027)
0.725(0.029)
0.320(0.013)
8
°
0.450(0.017)
0.800(0.031)
4.700(0.185)
5.100(0.201)
Note: Eject hole, oriented hole and mold mark is optional.
500mA LOW NOISE LDO REGULATOR AP2213
Mechanical Dimensions (Continued)
SOIC-8 Unit: mm(inch)
φ
φ
Dec. 2012 Rev. 2. 0 BCD Semiconductor Manufacturing Limited
20
Data Sheet
3.300(0.130)
3.700(0.146)
6.700(0.264)
7.300(0.287)
2.900(0.114)
3.100(0.122)
0.610(0.024)
0.810(0.032)
2.300(0.091)
TYP
6.300(0.248)
6.700(0.264)
1.750(0.069)
TYP
4.500(0.177)
4.700(0.185)
0.020(0.001)
0.100(0.004)
1.520(0.060)
1.800(0.071)
1.500(0.059)
1.700(0.067)
0
.
2
5
0
(
0
.
0
1
0
)
0
.3
5
0
(
0
.
0
1
4
)
0.250(0.010)
0°
10°
0.900(0.035)
MIN
500mA LOW NOISE LDO REGULATOR AP2213
Mechanical Dimensions (Continued)
SOT-223 Unit: mm(inch)
Dec. 2012 Rev. 2. 0
21
BCD Semiconductor Manufacturing Limited
BCD Semiconductor Manufacturing Limited
IMPORTANT NOTICE
IMPORTANT NOTICE
BCD Semiconductor Manufacturing Limited reserves the right to make changes without further notice to any products or specifi-
BCD Semiconductor Manufacturing Limited reserves the right to make changes without further notice to any products or specifi-
cations herein. BCD Semiconductor Manufacturing Limited does not assume any responsibility for use of any its products for any
cations herein. BCD Semiconductor Manufacturing Limited does not assume any responsibility for use of any its products for any
particular purpose, nor does BCD Semiconductor Manufacturing Limited assume any liability arising out of the application or use
particular purpose, nor does BCD Semiconductor Manufacturing Limited assume any liability arising out of the application or use
of any its products or circuits. BCD Semiconductor Manufacturing Limited does not convey any license under its patent rights or
of any its products or circuits. BCD Semiconductor Manufacturing Limited does not convey any license under its patent rights or
other rights nor the rights of others.
other rights nor the rights of others.
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MAIN SITE
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BCD Semiconductor Manufacturing Limited
BCD Semiconductor Manufactur ing Limited
- Wafer Fab
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Tel: +86-21-24162266, Fax: +86-21-24162277
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Shenzhen Office
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Shanghai SIM-BCD Semiconductor Manufacturing Co., Ltd., Shenzhen Office
Shenzhen Office
Unit A Room 1203, Skyworth Bldg., Gaoxin Ave.1.S., Nanshan District, Shenzhen,
Shanghai SIM-BCD Semiconductor Manufacturing Co., Ltd. Shenzhen Office
China
Advanced Analog Circuits (Shanghai) Corporation Shenzhen Office
Tel: +86-755-8826 7951
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- Wafer Fab
BCD Semiconductor Manufacturing Limited
Shanghai SIM-BCD Semiconductor Manufacturing Co., Ltd.
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Advanced Analog Circuits (Shanghai) Corporation
Tel: +86-21-6485 1491, Fax: +86-21-5450 0008
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Taiwan Office
4F, 298-1, Rui Guang Road, Nei-Hu District, Taipei,
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Tai wan
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Tel: +886-2-2656 2808
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USA Office
30920 Huntwood Ave. Hayward,
BCD Semiconductor Corporation
CA 94544, USA
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