The SuperME SH™ series is obtained through an
extreme optimization of ST’s well established stripbased PowerMESH™ layout. In addition to pushing
on-resistance significantly down, special careis taken to ensure a very good dv/dt capability fo r the
most demanding applications. Such series com plements S T full range of hi gh voltage MOSFETs including revolutionary MDm es h™ products.
TO-220TO-220FP
3
1
D2PAK
INTERNAL SCHEMATIC DIAGRAM
3
2
1
APPLICATIONS
■ HIGH CURRENT, HIGH SPEED SWITCHING
■ IDEAL FOR OFF-LINE POWER SUPPLIES,
ADAPTORS AND PFC
■ LIGHTING
ORDERING INFORMATION
SALES TYPEMARKINGPACKAGEPACKAGING
STB11NK50ZT4B11NK50Z
STP11NK50ZP11NK50ZTO-220TUBE
STP11NK50ZFPP11NK50ZFPTO-220FPTUBE
2
PAK
D
TAPE & REEL
1/12June 2003
Page 2
STP11NK50Z - STP11NK50ZF P - STB11NK50Z
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
TO-220 / D2PAK
V
DS
V
DGR
V
GS
I
D
I
D
IDM()
P
TOT
Drain-source Voltage (VGS=0)
Drain-gate Voltage (RGS=20kΩ)
500V
500V
Gate- source Voltage± 30V
Drain Current (continuous) at TC= 25°C
Drain Current (continuous) at TC= 100°C
1010(*)A
6.36.3(*)A
Drain Current (pulsed)4040(*)A
Total Dissipation at TC= 25°C
12530W
Derating Factor10.24W/°C
V
ESD(G-S)
Gate source ESD(HBM-C=100pF, R=1.5KΩ)4000V
dv/dt (1)Peak Diode Recovery voltage slope4.5V/ns
VisoInsulation Withstand Voltage (DC)--2500V
T
j
T
stg
() Pulse width limited by safe operating area
(1) I
≤10A, di/dt ≤200A/µs,VDD≤ V
SD
(*) Limited only by maximum temperature allowed
Operating Junction Temperature
Storage Temperature
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by T
max)
j
Single Pulse Avalanche Energy
(starting T
= 25 °C, ID=IAR,VDD=50V)
j
10A
190mJ
GATE-SOURCE ZENER DIODE
SymbolParameterTest ConditionsMin.Typ.Max.Unit
BV
GSO
Gate-Source Breakdown
Igs=± 1mA (Open Drain)30V
Voltage
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be
applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and
cost-effective intervention to protect the device’s integrity. These integ rated Zener diodes thus avoid the
usage of external components.
2/12
Page 3
STP11NK50Z - S TP11NK50Z FP - STB11NK50Z
ELECTRICAL CHARACTERISTICS (TCASE =25°C UNLESS OT HERWISE SPECIFIED)
ON/OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
(BR)DSS
Drain-source
Breakdown Voltage
I
DSS
I
GSS
V
GS(th)
R
DS(on)
Zero Gate Voltage
Drain Current (V
GS
=0)
Gate-body Leakage
Current (V
DS
=0)
Gate Threshold Voltage
Static Drain-source On
Resistance
DYNAMIC
SymbolParameterTest ConditionsMin.Typ.Max.Unit
g
(1)Forward TransconductanceVDS=15V,ID= 5 A7.7S
fs
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
(3)Equivalent Output
C
oss eq.
C
iss
C
oss
C
rss
Capacitance
SWITCHING ON
SymbolParameterTest ConditionsMin.Typ.Max.Unit
t
d(on)
Q
Q
Q
t
r
g
gs
gd
Turn-on Delay Time
Rise Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the
consequences of u se of such inf ormat ion nor for any in fring ement of p aten ts or othe r ri ghts of th ird p arties whic h may resul t f rom
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or
systems without express written approval of STMicroelectronics.
Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco