Datasheet STD15NF10 Datasheet (SGS Thomson Microelectronics)

Page 1
N - CHANNEL 100V- 0.073Ω - 15A TO-252
LOW GATE CHARGE STripFET POWER MOSFET
TYPE V
DSS
ST D15N F 10 100 V < 0.08 15 A
TYPICALR
EXCEPTIONALdv/dtCAPABILITY
100%AVALANCHETESTED
APPLICATIONORIENTED
DS(on)
CHARACTERIZATION
SURFACE-MOUNTINGDPAK (TO-252)
POWERPACKAGEIN TAPE & REEL (SUFFIX”T4”)
DESCRIPTION
This MOSFET series realized with STMicroelectronicsunique STripFET process has specifically been designed to minimize input capacitance and gate charge. It is therefore suitable as primary switch in advanced high-efficiency, high-frequency isolated DC-DC converters for Telecom and Computer applications. It is also intended for any applicationswith low gate drive requirements.
R
DS(on)
I
D
STD15NF10
PRELIMINARY DATA
3
1
DPAK
TO-252
(Suffix ”T4”)
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
HIGH-EFFICIENCYDC-DC CONVERTERS
UPSAND MOTORCONTROL
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Uni t
V
V
V
I
DM
P
dv/ dt (
E
AS
T
() Pulse width limitedby safe operatingarea (2) starting Tj
April 2000
Dra in- sour c e Volta ge (VGS= 0) 100 V
DS
Drain- gate Voltage (RGS=20kΩ) 100 V
DGR
Gate-s ource Voltage ± 20 V
GS
Dra in Cu rr ent (cont inuous) at Tc=25oC15A
I
D
Dra in Cu rr ent (cont inuous) at Tc= 100oC10A
I
D
(•) Dra in Cu rr ent (pulsed) 60 A
Tot al Dissipation at Tc=25oC45W
tot
Der ati ng F a c tor 0.3 W/
1 ) Peak Diode R ecovery volt a ge slope 9 V/ ns
(2) Single Pulse Av alan c he En er gy 75 mJ
St orage T emperat ur e -65 to 175
stg
Max. Operating Jun c t ion Tem pe ra tur e 175
T
j
=25oC, ID=24A, VDD= 50V (1) ISD≤ 80 A, di/dt ≤ 300A/µs, VDD≤ V
(BR)DSS,Tj≤TJMA
o
C
o
C
o
C
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Page 2
STD15NF10
THERMAL DATA
R
thj-case
R
thj-amb
T
Ther mal Resistanc e Junct ion-case Max Ther mal Resistanc e Junct ion-ambient Max Maximum Lead Tempe ra t ure For Solder ing Purpose
l
3.33
62.5 300
o
C/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS
=25oC unless otherwisespecified)
(T
case
OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
Drain-source
ID=250µAVGS= 0 100 V
Break dow n Voltage
I
DSS
I
GSS
Zero Gate Voltage Drain Current (V
GS
Gat e- bod y Leak ag e Current (V
DS
=0)
=0)
V
=MaxRating
DS
=MaxRating Tc=125oC
V
DS
V
= ± 20 V ± 100 nA
GS
1
10
ON(∗)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
GS(th)
R
DS(on)
Gate Threshold Voltage VDS=VGSID= 250 µA 234V Sta t ic Drain-s ource On
VGS=10V ID= 7.5 A 0.073 0.08
Resistance
I
D(on)
On State Drain Current VDS>I
D(on)xRDS(on)max
15 A
VGS=10V
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
g
(∗)Forward
fs
Tr ansc on duc tance
C
C
C
Input Capaci t anc e
iss
Out put Capac it ance
oss
Reverse Transfer
rss
Capacit a nc e
VDS>I
D(on)xRDS(on)maxID
=7.5 A 20 S
VDS=25V f=1MHz VGS= 0 870
125
52
µA µ
pF pF pF
A
2/6
Page 3
STD15NF10
ELECTRICAL CHARACTERISTICS
(continued)
SWITCHINGON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(on)
Tur n-on Delay T ime Rise Tim e
t
r
VDD=50V ID=12A R
=4.7
G
VGS=10V
58 45
(Resis t iv e Load, s ee fig. 3 )
Q Q Q
Tot al Gate Charge
g
Gat e- Source Charge
gs
Gate-Drain Charge
gd
VDD=80V ID=15A VGS=10V 30
6
10
SWITCHINGOFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(off)
Tur n-of f Dela y T im e
t
Fall T ime
f
VDD=27V ID=12A
=4.7 VGS=10V
R
G
49 17
(Resis t iv e Load, s ee fig. 3 )
t
d(off)
Off-voltage Rise Time
t
Fall T ime
f
t
Cross-over Time
c
Vclamp = 80 V ID=15A
=4.7 VGS=10V
R
G
(Indu ct iv e Load , se e f ig. 5)
43 36 39
SOURCEDRAINDIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
V
SD
t
Q
I
RRM
()Pulsed:Pulse duration = 300 µs, duty cycle 1.5 % () Pulse width limited by safe operatingarea
Source-drain Current
(•)
Source-drain Current
15 60
(pulsed)
(∗)ForwardOnVoltage ISD=15A VGS=0 1.5 V
Reverse Recovery
rr
Time Reverse Recovery
rr
ISD= 15 A di/dt = 100 A/µs
=50V Tj=150oC
V
DD
(see test circuit, fig. 5)
100
375 Charge Reverse Recovery
7.5
Current
ns ns
nC nC nC
ns ns
ns ns ns
A A
ns
nC
A
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Page 4
STD15NF10
Fig. 1
: UnclampedInductive Load Test Circuit
Fig. 3: Switching Times Test Circuits For ResistiveLoad
Fig. 2
: UnclampedInductiveWaveform
Fig. 4: Gate Charge test Circuit
Fig. 5
: Test Circuit For Inductive Load Switching
And Diode Recovery Times
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Page 5
TO-252 (DPAK) MECHANICAL DATA
STD15NF10
DIM.
mm inch
MIN. TYP. MAX. MIN. TYP. MAX.
A 2.2 2.4 0.086 0.094 A1 0.9 1.1 0.035 0.043 A2 0.03 0.23 0.001 0.009
B 0.64 0.9 0.025 0.035 B2 5.2 5.4 0.204 0.212
C 0.45 0.6 0.017 0.023 C2 0.48 0.6 0.019 0.023
D 6 6.2 0.236 0.244
E 6.4 6.6 0.252 0.260
G 4.4 4.6 0.173 0.181
H 9.35 10.1 0.368 0.397
L2 0.8 0.031 L4 0.6 1 0.023 0.039
H
A
E
C2
L2
B2
==
==
DETAIL”A”
D
2
13
L4
A1
C
A2
DETAIL”A”
B
G
==
0068772-B
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Page 6
STD15NF10
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in thispublication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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