Datasheet NDS8426A Datasheet (Fairchild Semiconductor)

Page 1
NDS8426A Single N-Channel Enhancement Mode Field Effect Transistor
General Description Features
January 1998
SO-8 N-Channel enhancement mode power field effect transistors are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance and provide superior switching performance. These devices are particularly suited for low voltage
10.5 A, 20 V. R R
High density cell design for extremely low R
High power and current handling capability in a widely used surface mount package.
= 0.0135 @ V
DS(ON)
= 0.016 @ V
DS(ON)
= 4.5 V.
GS
= 2.7 V.
GS
.
DS(ON)
applications such as notebook computer power management and other battery powered circuits where fast switching, low in-line power loss, and resistance to transients are needed.
5
6
7
8
4
3
2
1
ABSOLUTE MAXIMUM RATINGS T
= 25°C unless otherwise noted
A
Symbol Parameter NDS8426A Units
V
DSS
V
GSS
I
D
Drain-Source Voltage 20 V
Gate-Source Voltage ±8 V
Drain Current - Continuous (Note 1a) 10.5 A
- Pulsed 30
P
D
TJ,T
Maximum Power Dissipation (Note 1a) 2.5 W
(Note 1b)
(Note 1c)
Operating and Storage Temperature Range -55 to 150 °C
STG
1.2 1
THERMAL CHARACTERISTICS
R
θJA
R
θJC
© 1998 Fairchild Semiconductor Corporation
Thermal Resistance, Junction-to-Ambient (Note 1a) 50 °C/W Thermal Resistance, Junction-to-Case (Note 1) 25 °C/W
NDS8426A Rev.B1
Page 2
ELECTRICAL CHARACTERISTICS (T
= 25°C unless otherwise noted)
A
Symbol Parameter Conditions Min Typ Max Units
OFF CHARACTERISTICS
BV
I
DSS
DSS
Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 µA 20 V Zero Gate Voltage Drain Current
VDS = 16 V, V
GS
= 0 V
1 µA
TJ= 55°C 10 µA
I
GSSF
I
GSSR
Gate - Body Leakage, Forward
VGS = 8 V, VDS = 0 V
Gate - Body Leakage, Reverse VGS = -8 V, VDS= 0 V -100 nA
100 nA
ON CHARACTERISTICS (Note 2)
V
GS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250 µA
0.4 0.6 1 V
TJ= 125°C 0.3 0.5 0.8
R
I g
DS(ON)
D(on)
FS
Static Drain-Source On-Resistance
On-State Drain Current Forward Transconductance
VGS = 4.5 V, ID = 10.5 A
TJ= 125°C VGS = 2.7 V, ID = 10 A VGS = 4.5 V, VDS = 5 V VDS = 5 V, ID = 10.5 A
0.012 0.0135
0.017 0.024
0.014 0.016
30 A
43 S
DYNAMIC CHARACTERISTICS
C
iss
C
oss
C
rss
Input Capacitance VDS = 10 V, V Output Capacitance 890 pF
f = 1.0 MHz
GS
= 0 V,
2150 pF
Reverse Transfer Capacitance 165 pF
SWITCHING CHARACTERISTICS (Note 2)
t t t t Q Q Q
D(on)
r
D(off)
f
Turn - On Delay Time Turn - On Rise Time 26 55 ns
VDD = 5 V, ID = 1 A, V
= 4.5 V, R
GEN
GEN
= 6
Turn - Off Delay Time 145 220 ns Turn - Off Fall Time 40 100 ns
g
gs
gd
Total Gate Charge Gate-Source Charge 7 nC Gate-Drain Charge 8 nC
VDS = 10 V, ID = 10.5 A, VGS = 4.5 V
11 30 ns
43 60 nC
NDS8426A Rev.B1
Page 3
ELECTRICAL CHARACTERISTICS (T
TJ−
T
TJ−
T
= 25°C unless otherwise noted)
A
Symbol Parameter Conditions Min Typ Max Units DRAIN-SOURCE DIODE CHARACTERISTICS
I
S
V
SD
Notes:
1. R
design while R
P
Typical R
Continuous Source Diode Current 2.1 A Drain-Source Diode Forward Voltage
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. R
JA
θ
D
is determined by the user's board design.
CA
θ
A
(t)
=
(t)
R
θ
JA
using the board layouts shown below on 4.5"x5" FR-4 PCB in a still air environment:
JA
θ
a. 50oC/W when mounted on a 1 in2 pad of 2oz copper.
b. 105oC/W when mounted on a 0.04 in2 pad of 2oz copper.
c. 125oC/W when mounted on a 0.006 in2 pad of 2oz copper.
1a
A
2
=
R
+R
θ
JC
(t)
= I
× R
DS(ON)@T
D
(t)
θ
CA
J
VGS = 0 V, IS = 2.1 A
1b
(Note 2)
1c
0.6 1.2 V
is guaranteed by
JC
θ
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%.
NDS8426A Rev.B1
Page 4
Typical Electrical Characteristics
40
30
20
V =4.5V
GS
3.5
2.7
2.5
2.0
1.5
10
D
I , DRAIN-SOURCE CURRENT (A)
0
0 0.5 1 1.5 2
V , DRAIN-SOURCE VOLTAGE (V)
DS
Figure 1. On-Region Characteristics.
1.6
I = 10.5A
D
V = 4.5V
GS
1.4
1.2
1
DS(ON)
R , NORMALIZED
0.8
DRAIN-SOURCE ON-RESISTANCE
0.6
-50 -25 0 25 50 75 100 125 150 T , JUNCTION TEMPERATURE (°C)
J
1.8
1.6
V = 2.0 V
GS
1.4
1.2
DS(on)
R , NORMALIZED
1
DRAIN-SOURCE ON-RESISTANCE
0.8 0 8 16 24 32 40
2.5
2.7
3.0
I , DRAIN CURRENT (A)
D
3.5
Figure 2. On-Resistance Variation
with Drain Current and Gate Voltage.
1.8
V =4.5V
GS
1.6
1.4
1.2
1
DS(on)
0.8
R , NORMALIZED
0.6
DRAIN-SOURCE ON-RESISTANCE
0.4 0 10 20 30 40
T = 125°C
J
25°C
-55°C
I , DRAIN CURRENT (A)
D
4.5
Figure 3. On-Resistance Variation
with Temperature.
40
V = 5V
DS
32
24
16
D
I , DRAIN CURRENT (A)
8
0
0 0.5 1 1.5 2 2.5
V , GATE TO SOURCE VOLTAGE (V)
GS
T = -55°C
J
25
125
Figure 5. Transfer Characteristics.
Figure 4. On-Resistance Variation
with Drain Current and Temperature.
1.3
1.2
1.1
1
0.9
0.8
0.7
0.6
GS(th)
V , NORMALIZED
0.5
0.4
GATE-SOURCE THRESHOLD VOLTAGE
0.3
-50 -25 0 25 50 75 100 125 150 T , JUNCTION TEMPERATURE (°C)
J
V = V
I = 250µA
D
Figure 6. Gate Threshold Variation
with Temperature.
DS
GS
NDS8426A Rev.B1
Page 5
Typical Electrical Characteristics (continued)
1.12
I = 250µA
D
1.08
1.04
1
DSS
BV , NORMALIZED
0.96
DRAIN-SOURCE BREAKDOWN VOLTAGE
0.92
-50 -25 0 25 50 75 100 125 150 T , JUNCTION TEMPERATURE (°C)
J
Figure 7. Breakdown Voltage Variation
with Temperature.
5000
3000
2000
1000
500
CAPACITANCE (pF)
f = 1 MHz
200
V = 0 V
GS
100
0.1 0.2 0.5 1 2 5 10 15 20 V , DRAIN TO SOURCE VOLTAGE (V)
DS
C
C
C
iss
oss
rss
30
V = 0V
GS
10
T = 125°C
1
0.1
0.01
0.001
S
I , REVERSE DRAIN CURRENT (A)
0.0001 0 0.3 0.6 0.9 1.2
J
25°C
-55°C
V , BODY DIODE FORWARD VOLTAGE (V)
SD
Figure 8. Body Diode Forward Voltage Variation
with Source Current and
Temperature.
4
I = 10.5A
D
3
2
1
GS
V , GATE-SOURCE VOLTAGE (V)
0
0 8 16 24 32 40
Q , GATE CHARGE (nC)
g
V = 5V
DS
15V
10V
Figure 9. Capacitance Characteristics. Figure 10. Gate Charge Characteristics.
V
DD
t
V
V
d(on)
OUT
IN
V
IN
V
GS
R
GEN
G
R
L
D
V
OUT
DUT
S
t t
on off
t
r
d(off)
90%
10%
50%
50%
10%
PULSE WIDTH
Figure 11. Switching Test Circuit. Figure 12. Switching Waveforms.
90%
10%
90%
tt
f
INVERTED
NDS8426A Rev.B1
Page 6
Typical Electrical and Thermal Characteristics (continued)
80
60
40
V = 5V
DS
T = -55°C
J
25°C
125°C
20
FS
g , TRANSCONDUCTANCE (SIEMENS)
0
0 6 12 18 24 30
I , DRAIN CURRENT (A)
D
Figure 13. Transconductance Variation with Drain
Current and Temperature.
11
10
9
1b
8
1c
4.5"x5" FR-4 Board
7
D
I , STEADY-STATE DRAIN CURRENT (A)
6
0 0.2 0.4 0.6 0.8 1
2oz COPPER MOUNTING PAD AREA (in )
T = 25 C
A
Still Air V = 4.5V
GS
2
o
1a
2.5
2
1.5
1b
1c
1
STEADY-STATE POWER DISSIPATION (W)
0.5 0 0.2 0.4 0.6 0.8 1
2oz COPPER MOUNTING PAD AREA (in )
4.5"x5" FR-4 Board T = 25 C
A
Still Air
2
Figure 14. SO-8 Maximum Steady-State Power
Dissipation versus Copper Mounting Pad Area.
60
30
RDS(ON) LIMIT
10
5
1
V = 4.5V
0.5
D
I , DRAIN CURRENT (A)
0.1
0.05
GS
SINGLE PULSE
R = See Note 1c
JA
θ
T = 25°C
A
A
0.1 0.2 0.5 1 3 5 10 20 40 V , DRAIN-SOURCE VOLTAGE (V)
DS
DC
1ms
10ms
100ms
1s
10s
1a
o
100µs
Figure 15. Maximum Steady-State Drain
Figure 16. Maximum Safe Operating Area. Current versus Copper Mounting Pad Area.
1
0.5
0.2
0.1
0.05
0.02
0.01
0.005
r(t), NORMALIZED EFFECTIVE
0.002
TRANSIENT THERMAL RESISTANCE
0.001
0.0001 0.001 0.01 0.1 1 10 100 300
D = 0.5
0.2
0.1
0.05
0.02
0.01
Single Pulse
t , TIME (sec)
1
Figure 17. Transient Thermal Response Curve.
Note: Thermal characterization performed using the conditions described in note 1c. Transient thermal response will change
depending on the circuit board design.
R (t) = r(t) * R
R = See Note 1c
P(pk)
T - T = P * R (t)
J
Duty Cycle, D = t / t
JA
θ
JA
θ
t
1
t
2
A
JA
θ
JA
θ
2
1
NDS8426A Rev.B1
Page 7
SO-8 Tape and Reel Data and Package Dimensions
SOIC(8lds) Packaging Configuration: Figure 1.0
ELECTROSTATIC
SENSITIVE DEVICES
DO NOT SHIP OR STORE NEAR STRONG ELECTROSTATIC ELECTROMAGNETIC, MAGNETIC OR RADIOACTIVE FIELDS
TNR DATE PT NUMBER PEEL STRENGTH MIN ______________gms
Customized Label
Packaging Option Packaging type
Qty per Reel/Tube/Bag Reel Size Box Dimension (mm) Max qty per Box Weight per unit (gm) Weight per Reel (kg)
Note/Comments
MAX _____________ gms
ESD Label
SOIC (8lds) Packaging Information
Standard
(no flow code)
2,500 95 4,000
13" Dia
343x64x343 530x130x83 343x64x343
5,000 30,000 8,000
0.0774 0.0774 0.0774 0.0774
0.6060 - 0.9696 0.1182
TNR
L86Z F011
Rail/Tube-TNR
13" Dia
Embossed Car rier Tape
Antistatic Cover Tape
Static Dissipative
F63TNR Label
D84Z TNR
500
7" Dia
184x18 7x47
1,000
F
NDS
9959
9959
852
SOIC-8 Unit Orientation
343mm x 342mm x 64mm
Stand a r d In t e rm ed iate box
Packaging Description:
SOIC-8 parts are shipped in tape. The carrier tape is made from a dissipative (carbon filled) polycarbonate resin. The cover tape is a multilayer film (Heat Activated Adhesive in nature) primarily composed of polyester film, adhesive layer, sealant, and anti-static sprayed agent. These reeled parts in standard option are shipped with 2,500 uni t s pe r 13" o r 33 0c m d ia met er reel . Th e reel s ar e dark blue in color and is made of polystyrene plastic (anti­static coated). Other option comes in 500 units per 7" or 177cm di ameter reel. This and some o ther options are further described in the Packaging Information table.
These full reels are individually barcode labeled and placed inside a standard intermediate box (illustrated in figure 1.0) made of recyclable corrugated brown paper. One box contains two reels maximum. And these boxes are placed inside a barcode labeled shipping box which comes in di ff ere nt siz es depe nd in g on th e num be r of pa rts shippe d.
F
NDS
9959
F
NDS
9959
F
NDS
852
852
852
F
NDS 9959
852
Pin 1
F63TNR Label sample
LOT: CBVK741B019
FSID: FDS9953A
D/C1: D9842 QTY1: SPEC REV: D/C2: QTY2: CPN:
QTY: 2500
SPEC:
N/F: F (F63TNR)3
SOIC(8lds) Tape Leader and Trailer Configuration: Figure 2.0
Carrier Tape
Cover Tape
Trailer Tape 640mm minimum or 80 empty pockets
F63TNLab el
ESD Label
Components
ESD Label
F63TNLabel
Leader Tape 1680mm minimum or 210 empty pockets
July 1999, Rev. B
Page 8
SO-8 Tape and Reel Data and Package Dimensions, continued
SOIC(8lds) Embossed Carrier Tape Configuration: Figure 3.0
T
K0
Wc
B0
P0
D0
E1
F
W
E2
Tc
A0
P1
D1
User Direction of Feed
Dimensions are in millimeter
Pkg type
(8lds)
SOIC
(12mm)
Notes: A0, B0, and K0 dimensions are determined with respect to the EIA/Jedec RS-481
SOIC(8lds) Reel Configuration: Figure 4.0
A0 B0 W D0 D1 E1 E2 F P1 P0 K0 T Wc Tc
6.50
5.30
12.0
1.55
1.60
1.75
10.25
+/-0.10
+/-0.10
+/-0.3
+/-0.05
+/-0.10
+/-0.10
rotational and lateral movement requirements (see sketches A, B, and C).
B0
20 deg maximum component rotation
Sketch A (Side or Front Sectional View)
Component Rotation
5.50
min
+/-0.05
20 deg maximum
A0
Sketch B (Top View)
Component Rotation
W1 Measured at Hub
8.0 +/-0.1
Typical component cavity center line
Typical component center line
Dim A
Max
4.0 +/-0.1
0.450
2.1 +/-0.10
0.5mm maximum
Sketch C (Top View)
Component lateral movement
+/-
0.150
9.2 +/-0.3
0.5mm maximum
0.06 +/-0.02
Dim A
max
Tape Size
12mm 7" Dia
12mm 13" Dia
1998 Fairchild Semiconductor Corporation
Reel
Option
Dim N
Diameter Option
7"
See detail AA
B Min
Dim C
13" Diameter Option
See detail AA
W2 max Measured at Hub
Dim D
W3
min
DETAIL AA
Dimensions are in inches and millimeters
Dim A Dim B Dim C Dim D Dim N Dim W1 Dim W2 Dim W3 (LSL-USL)
7.00
0.059
177.8
13.00 330
1.5
0.059
1.5
512 +0.020/-0.008 13 +0.5/-0.2
512 +0.020/-0.008 13 +0.5/-0.2
0.795
2.165550.488 +0.078/-0.000
20.2
0.795
7.00
20.2
178
12.4 +2/0
0.488 +0.078/-0.000
12.4 +2/0
0.724
18.4
0.724
18.4
0.469 – 0.606
11.9 – 15.4
0.469 – 0.606
11.9 – 15.4
July 1999, Rev. B
Page 9
SO-8 Tape and Reel Data and Package Dimensions, continued
SOIC-8 (FS PKG Code S1)
1 : 1
Scale 1:1 on letter size paper
Dimensions s how n below are in:
inches [millimeters]
Part Weight per unit (gram): 0.0774
9
September 1998, Rev. A
Page 10
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks.
ACEx™ CoolFET™ CROSSVOLT™
2
E
CMOS
TM
FACT™ FACT Quiet Series™
®
FAST FASTr™ GTO™ HiSeC™
ISOPLANAR™ MICROWIRE™ POP™ PowerTrench™ QFET™ QS™
Quiet Series™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8
TinyLogic™ UHC™ VCX™
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICA TION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROV AL OF FAIRCHILD SEMICONDUCTOR CORPORA TION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or
effectiveness.
PRODUCT STA TUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information
Preliminary
No Identification Needed
Obsolete
Formative or In Design
First Production
Full Production
Not In Production
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
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