Dual N & P-Channel Enhancement Mode Field Effect Transistor
General Description Features
February 1996
These dual N- and P-channel enhancement mode power
field effect transistors are produced using Fairchild's
proprietary, high cell density, DMOS technology. This
very high density process is especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulses in the
avalanche and commutation modes. These devices are
particularly suited for low voltage applications such as
notebook computer power management and other
N-Channel 3.7A, 30V, R
P-Channel -2.9A, -30V, R
High density cell design or extremely low R
=0.08Ω @ V
DS(ON)
=0.13Ω @ V
DS(ON)
=10V.
GS
=-10V.
GS
.
DS(ON)
High power and current handling capability in a widely used
surface mount package.
Dual (N & P-Channel) MOSFET in surface mount package.
battery powered circuits where fast switching, low in-line
power loss, and resistance to transients are needed.
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS
I
S
Maximum Continuous Drain-Source Diode Forward CurrentN-Ch1.2A
P-Ch-1.2
V
SD
t
rr
Notes:
1. R
P
design while R
D
Typical R
Drain-Source Diode Forward
Voltage
VGS = 0 V, IS = 1.25 A
VGS = 0 V, IS = -1.25 A
(Note 2)N-Ch0.81.3V
(Note 2)
P-Ch-0.8-1.3
Reverse Recovery TimeVGS = 0 V, IF = 1.25 A, dIF/dt = 100 A/µsN-Ch75ns
VGS = 0 V, IF = -1.25 A, dIF/dt = 100 A/µs
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. R
JA
θ
(t)
is determined by the user's board design.
CA
θ
T
=
R
θ
a. 78oC/W when mounted on a 0.5 in2 pad of 2oz cpper.
b. 125oC/W when mounted on a 0.02 in2 pad of 2oz cpper.
c. 135oC/W when mounted on a 0.003 in2 pad of 2oz cpper.
T
J−TA
=
(t)
R
θJ A
θJ C+RθCA
for single device operation using the board layouts shown below on 4.5"x5" FR-4 PCB in a still air environment:
-50-250255075100125150
T , JUNCTION TEMPERATURE (°C)
J
Figure 18. P-Channel Breakdown Voltage
Variation with Temperature.
1000
800
500
300
200
CAPACITANCE (pF)
100
f = 1 MHz
V = 0V
GS
50
0.10.20.51251030
-V , DRAIN TO SOURCE VOLTAGE (V)
DS
Figure 20. P-Channel Capacitance Characteristics.
10
V = 0V
5
GS
1
T = 125°C
0.5
0.1
0.01
S
-I , REVERSE DRAIN CURRENT (A)
0.001
J
25°C
-55°C
0.20.40.60.811.21.4
-V , BODY DIODE FORWARD VOLTAGE (V)
SD
Figure 19. P-Channel Body Diode Forward
Voltage Variation with Current and
Temperature.
10
I = -2.9A
D
8
C
iss
C
oss
C
rss
6
4
2
GS
-V , GATE-SOURCE VOLTAGE (V)
0
024681012
Q , GATE CHARGE (nC)
g
V = -10V
DS
-20V
-15V
Figure 21. P-Channel Gate Charge Characteristics.
6
V = -15V
DS
5
4
T = -55°C
J
25°C
125°C
3
2
1
FS
g , TRANSCONDUCTANCE (SIEMENS)
0
I , DRAIN CURRENT (A)
D
Figure 22. P-Channel Transconductance Variation
with Drain Current and Temperature.
-10-8-6-4-20
NDS9952A.SAM
Page 8
Typical Thermal Characteristics: N & P-Channel
2.5
2
1.5
1b
1
1c
0.5
STEADY-STATE POWER DISSIPATION (W)
00.20.40.60.81
2oz COPPER MOUNTING PAD AREA (in )
Total Power for Dual Operation
1a
Power for Single Operation
4.5"x5" FR-4 Board
T = 25 C
A
Still Air
o
2
Figure 23. SO-8 Dual Package Maximum
Steady-State Power Dissipation versus
Copper Mounting Pad Area.
5
4
3
1b
2
1c
D
I , STEADY-STATE DRAIN CURRENT (A)
1
00.10.20.30.40.5
2oz COPPER MOUNTING PAD AREA (in )
4.5"x5" FR-4 Board
o
T = 25 C
A
Still Air
V = -10V
GS
2
5
4
3
1b
1c
2
D
I , STEADY-STATE DRAIN CURRENT (A)
1
00.10.20.30.40.5
2oz COPPER MOUNTING PAD AREA (in )
4.5"x5" FR-4 Board
o
T = 25 C
A
Still Air
V = 10V
GS
2
1a
Figure 24. N-Ch Maximum Steady- State
Drain Current versus Copper Mounting
Pad Area.
30
10
3
RDS(ON) LIMIT
1
1a
0.3
0.1
D
I , DRAIN CURRENT (A)
0.03
0.01
V = 10V
GS
SINGLE PULSE
R = See Note 1c
JA
θ
T = 25°C
A
0.10.20.51251030 50
V , DRAIN-SOURCE VOLTAGE (V)
DS
DC
100us
1ms
10ms
100ms
1s
10s
Figure 25. P-Ch Maximum Steady- State
Drain Current versus Copper Mounting
Pad Area.
30
10
10s
DC
10ms
100ms
1s
3
RDS(ON) LIMIT
1
0.3
V = -10V
0.1
D
-I , DRAIN CURRENT (A)
0.03
0.01
0.10.20.51251030 50
GS
SINGLE PULSE
R = See Note 1c
JA
θ
T = 25°C
A
- V , DRAIN-SOURCE VOLTAGE (V)
DS
Figure 27. P-Channel Maximum Safe Operating
Area.
Figure 26. N-Channel Maximum Safe Operating
Area.
100us
1ms
NDS9952A.SAM
Page 9
Typical Thermal Characteristics: N & P-Channel
1
0.5
0.2
0.1
0.05
0.02
0.01
0.005
r(t), NORMALIZED EFFECTIVE
0.002
TRANSIENT THERMAL RESISTANCE
0.001
0.00010.0010.010.1110100300
D = 0.5
0.2
0.1
0.05
0.02
0.01
Single Pulse
t , TIME (sec)
1
Figure 28. Transient Thermal Response Curve.
Note: Thermal characterization performed using the conditions described in note 1c. Transient thermal response will change
depending on the circuit board design.
R (t) = r(t) * R
JA
θ
R = See Note 1c
JA
θ
P(pk)
t
1
t
2
T - T = P * R (t)
J
A
Duty Cycle, D = t / t
JA
θ
JA
θ
2
1
V
DD
t
d(on)
V
IN
V
GS
R
GEN
G
R
L
D
V
OUT
V
OUT
DUT
V
IN
S
tt
onoff
r
90%
10%
50%
10%
t
d(off)
90%
10%
90%
50%
PULSE WIDTH
Figure 29. N or P-Channel Switching Test Circuit.Figure 30. N or P-Channel Switching Waveforms.
tt
f
NDS9952A.SAM
Page 10
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
ACEx™
Bottomless™
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2
E
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TM
FACT™
FACT Quiet Series™
FAST
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GTO™
HiSeC™
ISOPLANAR™
MICROWIRE™
POP™
PowerTrench
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Quiet Series™
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DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
PRODUCT STA TUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Obsolete
Formative or
In Design
First Production
Full Production
Not In Production
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. E
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