NDS355N
N-Channel Logic Level Enhancement Mode Field Effect Transistor
General Description Features
March 1996
These N-Channel logic level enhancement mode power field
effect transistors are produced using Fairchild's proprietary,
high cell density, DMOS technology. This very high density
process is especially tailored to minimize on-state resistance.
These devices are particularly suited for low voltage
applications in notebook computers, portable phones, PCMICA
cards, and other battery powered circuits where fast switching,
and low in-line power loss are needed in a very small outline
surface mount package.
1.6A, 30V. R
= 0.125Ω @ VGS = 4.5V.
DS(ON)
Proprietary package design using copper lead frame for
superior thermal and electrical capabilities.
High density cell design for extremely low R
DS(ON)
.
Exceptional on-resistance and maximum DC current
capability.
Compact industry standard SOT-23 surface mount
package.
Maximum Continuous Source Current0.6A
Maximum Pulse Source Current (Note 2)6A
Drain-Source Diode Forward VoltageVGS = 0 V, IS = 1.6 A0.81.2V
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. R
JA
θ
(t)
is determined by the user's board design.
CA
θ
T
=
R
JA
θ
o
C/W when mounted on a 0.02 in2 pad of 2oz cpper.
b. 270oC/W when mounted on a 0.001 in2 pad of 2oz cpper.
T
J−TA
θJ A
1a
J−TA
=
(t)
R
θ
J C
using the board layouts shown below on 4.5"x5" FR-4 PCB in a still air environment:
2
= I
(t) × R
DS(ON ) T
D
+R
(t)
θ
CA
J
1b
is guaranteed by
JC
θ
NDS355N Rev. D1
Page 4
Typical Electrical Characteristics
12
V =10V
GS
9
6
6.0
5.0
4.5
4.0
3.5
3
D
I , DRAIN-SOURCE CURRENT (A)
0
01234
V , DRAIN-SOURCE VOLTAGE (V)
DS
3.0
2
V =3.5V
GS
1.5
4.0
4.5
1
DS(on)
R , NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
0.5
036912
I , DRAIN CURRENT (A)
D
Figure 1. On-Region CharacteristicsFigure 2. On-Resistance Variation with Gate Voltage
and Drain Current
1.6
I = 1.6A
D
1.4
1.2
DS(ON)
R , NORMALIZED
0.8
DRAIN-SOURCE ON-RESISTANCE
0.6
V =4.5V
GS
1
-50-250255075100125150
T , JUNCTION TEMPERATURE (°C)
J
Figure 3. On-Resistance Variation
with Temperature
3
V = 4.5V
GS
2.5
T = 125°C
2
1.5
DS(on)
R , NORMALIZED
1
DRAIN-SOURCE ON-RESISTANCE
0.5
024681012
J
25°C
I , DRAIN CURRENT (A)
D
-55°C
Figure 4. On-Resistance Variation with Drain
Current and Temperature
5.0
6.0
10
10
V = 10V
8
6
4
D
I , DRAIN CURRENT (A)
2
0
DS
123456
V , GATE TO SOURCE VOLTAGE (V)
GS
T = -55°C
J
25°C
125°C
Figure 5. Transfer CharacteristicsFigure 6. Gate Threshold Variation with
1.2
V = V
1.1
1
0.9
th
0.8
V , NORMALIZED
0.7
GATE-SOURCE THRESHOLD VOLTAGE (V)
0.6
-50-250255075100125150
T , JUNCTION TEMPERATURE (°C)
J
DSGS
I = 250µA
D
Temperature
NDS355N Rev. D1
Page 5
Pulse Width
Typical Electrical Characteristics (continued)
1.15
I = 250µA
D
1.1
1.05
1
DSS
BV , NORMALIZED
0.95
0.9
DRAIN-SOURCE BREAKDOWN VOLTAGE (V)
-50-250255075100 125 150 175
T , JUNCTION TEMPERATURE (°C)
J
Figure 7. Breakdown Voltage Variation
with Temperature
500
300
200
100
50
CAPACITANCE (pF)
30
f = 1 MHz
V = 0V
GS
0.10.20.51251030
V , DRAIN TO SOURCE VOLTAGE (V)
DS
C
C
20
10
V = 0V
GS
1
T= 125°C
J
0.1
0.01
S
I , REVERSE DRAIN CURRENT (A)
0.001
0.20.40.60.811.21.4
V , BODY DIODE FORWARD VOLTAGE (V)