•8-Bit bidirectional register with bus-oriented input-output
•Independent serial input-output to register
•Register bus comparator with ‘equal to’, ‘greater than’ and
‘less than’ outputs
•Cascadable in groups of 8-bits
•Open collector comparator outputs for AND-wired expansion
•Two’ s complement or magnitude compare
DESCRIPTION
The 74F524 is an 8-bit bidirectional register with parallel input and
output, plus serial input and output progressing from MSB to LSB.
All data inputs, serial and parallel, are loaded by the rising edge of
the clock. The device functions are controlled by two control lines
(S0, S1) to execute shift, load, hold and read out. An 8-bit
comparator examines the data stored in the registers and on the
data bus. Three true-High, open collector outputs representing
‘register equal to bus’, ‘register greater than bus’ and ‘register less
than bus’ are provided. These outputs can be disabled to the OFF
state by the use of Status Enable (SE
been provided to allow Two’s Complement as well as magnitude
compare. Linking inputs are provided for expansion to longer words.
). A mode control has also
PIN CONFIGURATION
S0
1
I/O0
2
3
I/O1
I/O2
4
I/O3
5
I/O4
6
I/O5
7
I/O6
8
I/O7
9
GNDCP
TYPETYPICAL f
TYPICAL SUPPL Y CURRENT
MAX
74F52465MHz110mA
20
19
18
17
16
15
14
13
12
1110
SF00970
V
CC
S1
SE
C/SI
C/SO
EQ
GT
LT
M
(TOTAL)
ORDERING INFORMATION
COMMERCIAL
DESCRIPTION
20-pin plastic DIPN74F524NSOT146-1
20-pin plastic SOLN74F524DSOT163-1
RANGE
V
= 5V ±10%,
CC
T
= 0°C to +70°C
amb
PKG DWG #
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINSDESCRIPTION
74F(U.L.)
HIGH/LOW
I/OnParallel data inputs3.5/1.070µA/0.6mA
S0, S1Mode select inputs1.0/1.020µA/0.6mA
C/SIStatus priority or serial data input1.0/1.020µA/0.6mA
CPClock pulse input (active rising edge)1.0/1.020µA/0.6mA
SEStatus enable input (active Low)1.0/1.020µA/0.6mA
MCompare mode select input1.0/1.020µA/0.6mA
I/On3-state parallel data outputs150/403.0mA/24mA
C/SOStatus priority or serial data output50/331.0mA/20mA
LTRegister less than bus outputOC/33OC/20mA
EQRegister equal to bus outputOC/33OC/20mA
GTRegister greater than bus outputOC/33OC/20mA
NOTE:
One (1.0) FAST Unit Load (U.L.) is defined as 20µA in the High state and 0.6mA in the Low state.
OC=Open Collector
The 74F524 contains eight D-type flip-flops connected as a shift
register with provision for either parallel or serial loading. Parallel
data may be read from or loaded into the registers via the data bus
I/O0–I/O7. Serial data is loaded into the register from the C/SI input
and may be shifted through the register and out through the C/SO
output. Both parallel and serial data entry occurs on the rising edge
of the clock (CP). The operation of the shift register is controlled by
two signals, S0 and S1, according to the Select Function Table. The
3-State parallel output buffers are enabled only in the READ mode.
SELECT FUNCTION TABLE
S0S1OPERATION
LLHOLD–Retains data in shift register
LHREAD–Read contents in register onto data bus
HLSHIFT–Allows serial shifting on next rising clock
edge
HHLOAD–Load data on bus into register
H = High voltage level
L = Low voltage level
One port of an 8-bit comparator is attached to the data bus while the
other port is tied to the outputs of the internal register. Three
active-OFF Open Collector outputs indicate whether the contents
held in the shift register are ‘greater than’ (GT). ‘less than’ (LT), or
‘equal to’ (EQ) the data on the input bus. A High signal on the Status
Enable (SE
) input disables these outputs to the OFF state. A mode
control (M) input allows selection between a straightforward
magnitude compare or a comparison between Two’s complement
numbers.
NUMBER REPRESENTA TION SELECT TABLE
MOPERATION
LMagnitude compare
HTwo’s Complement compare
H = High voltage level
L = Low voltage level
For ‘greater than’ or ‘less than’ detection, the C/SI input must be
held High, as indicated in the Function Table. The internal logic is
arranged such that a Low signal on the C/SI input places the
‘greater than’ and ‘less than’ outputs in their off state. (Note that this
off state serves also as the active state when C/SI is High. It is
intended for use in expansion to word lengths greater than 8 bits
using multiple 74S524s as explained in the next 3 paragraphs.) The
C/SO output will be forced High if the ‘equal to’ status condition
exists; otherwise, C/SO will be held Low.
Word length expansion (in groups of 8 bits) can be achieved by
connecting the C/SO output of the more significant byte to the C/SI
input of the next less significant byte and also to its own SE
(see Application Figure 1). The CS/I input of the most significant
device is held High while the SE
input of the least significant device
is held Low. The corresponding status outputs are AND-wired
together. In the case of two’s complement number compare, only the
Mode input to the most significant device should be High. the Mode
inputs to all other cascaded devices are held Low.
Suppose that an inequality condition is detected in the most
significant device. Assuming that the byte stored in the register is
greater than the byte on the data bus, then the EQ and LT outputs
will be pulled Low, whereas the GT output will float High. Also, the
CS/O output of the most significant device will be forced Low,
disabling the subsequent devices but enabling its own status
outputs. The corrected status condition is thus indicated. The same
applies if the register byte is less than the data byte, only in this
case the EQ and GT outputs go Low, whereas the LT output floats
High.
If an equality condition is detected in the most significant device, its
C/SO output is forced High. This enables the next less significant
APPLICATION
GREATER THAN
EQUAL TO
LESS THAN
H = TWO’s COMPLEMENT
L = MAGNITUDE
H
RD
WR
MGTEQLT
C/SI
S0S1I/O
C/SO
SE
C/SI
device and disables its own status outputs. In this way, the status
output proximity is handed down to the next less significant device
which now effectively becomes the most significant byte. The worst
case propagation delay for a compare operation involving ‘n’
cascaded 74F524s will be when an equality condition is detected in
all but the least significant byte. In this case, the status priority has
to ripple all the way down the chain before the correct status output
is established. Typically, this will take 35+6(n–2) ns.
LL
MGTEQLT
SE
C/SO
S0S1I/O
MGTEQLT
C/SI
S0S1I/O
SE
C/SO
V
CC
L
MSB
8
88LSB
Figure 1. Cascading 74F524s for Comparing Longer Words
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
V
V
I
IN
V
OUT
T
T
CC
IN
OUT
amb
stg
Supply voltage–0.5 to +7.0V
Input voltage –0.5 to +7.0V
Input current–30 to +5mA
Voltage applied to output in High output state–0.5 to +V
pp
p
Operating free-air temperature range0 to +70°C
Storage temperature range–65 to +150°C
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
MINTYP
I
OH
V
V
I
I
IH
I
IL
I
OZH
I
OZL
I
OS
I
CC
OH
IK
High-level output current
LT, EQ, GT
only
C/SO only
High-level output voltage
p
Input clamp voltageVCC = MIN, II = I
Input current at maximum
input voltage
High-level input current
Low-level input current
I/OnVCC = MAX, VI = 5.5V1mA
Except I/OnVCC = MAX, VI = 7.0V100µA
p
Off-state output current
High-level voltage applied
Off-state output current
Low-level voltage applied
Short-circuit output
3
current
Except LT,
EQ, GT
Supply current (total)VCC = MAX110150mA
VCC = MIN, VIL = MAX,
y
V
= MIN, V
IH
=
VIL = MAX,
=
IH
VCC = MIN,
=
IL
V
= MIN
IH
,
,
= MAX
OH
IOH=MAX
OL
IK
=
±10%V
±10%V
±5%V
±10%V
±5%V
2.5V
CC
2.4V
CC
2.73.4V
CC
CC
CC
VCC = MAX, VI = 2.7V20µA
VCC = MAX, VI = 0.5V–0.6mA
VCC = MAX, VO = 2.7V70µA
y
VCC = MAX, VO = 0.5V–0.6mA
VCC = MAX–60–150mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
= 5V, T
CC
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
amb
= 25°C.
, the use of high-speed test apparatus and/or sample-and-hold
OS
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
[1]
74F524
[1] Please consult the most recently issued datasheet before initiating or completing a design.
Definitions
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury . Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 94088–3409
Telephone 800-234-7381
Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
print codeDate of release: 10-98
Document order number:9397-750-05131
yyyy mmm dd
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