The M40SZ100Y/W NVRAM controller is a self-contained device which converts a standard
low-power SRAM into a non-volatile memory. A precision voltage reference and comparator
monitors the V
When an invalid V
inactive to write protect the stored data in the SRAM. During a power failure, the SRAM is
switched from the V
the 16-lead SOIC) to provide the energy required for data retention. On a subsequent
power-up, the SRAM remains write protected until a valid power condition returns.
input for an out-of-tolerance condition.
CC
condition occurs, the conditioned chip enable output (E
CC
pin to the lithium cell within the SNAPHAT® (or external battery for
CC
) is forced
CON
The 28-pin, 330 mil SOIC provides sockets with gold plated contacts for direct connection to
a separate SNAPHAT
®
housing containing the battery. The SNAPHAT housing has gold
plated pins which mate with the sockets, ensuring reliable connection. The housing is keyed
to prevent improper insertion. This unique design allows the SNAPHAT battery package to
be mounted on top of the SOIC package after the completion of the surface mount process
which greatly reduces the board manufacturing process complexity of either directly
soldering or inserting a battery into a soldered holder. Providing non-volatility becomes a
“SNAP.” This feature is also available in the “topless” 16-pin SOIC package (MQ).
Insertion of the SNAPHAT housing after reflow prevents potential battery damage due to the
high temperatures required for device surface-mounting. The SNAPHAT housing is also
keyed to prevent reverse insertion.
The 28-pin SOIC and battery packages are shipped separately in plastic anti-static tubes or
in tape & reel form. For the 28-lead SOIC, the battery/crystal package (e.g., SNAPHAT) part
number is M4Z28-BR00SH (for 48 mAh battery)
or M4Z32-BR00SH (for 120 mAh battery).
Caution:Do not place the SNAPHAT battery top in conductive foam, as this will drain the lithium
button-cell battery.
Figure 1.Logic diagram
(1)
V
V
CC
BAT
RSTIN
1. For 16-pin SOIC package only.
V
OUT
E
PFI
Doc ID 7528 Rev 35/24
M40SZ100Y
M40SZ100W
V
SS
BL
E
CON
PFO
RST
AI03933
Page 6
DescriptionM40SZ100Y, M40SZ100W
Table 1.Signal names
EChip enable input
E
CON
Conditioned chip enable output
RSTReset output (open drain)
RSTINReset input
BLBattery low output (open drain)
V
V
V
BAT
OUT
CC
(1)
Supply voltage output
Supply voltage
Backup supply voltage
PFIPower fail input
PFOPower fail output
V
SS
Ground
NCNot connected internally
1. For SO16 only.
Figure 2.SOIC16 connections
NC
NC
RST
NC
RSTIN
PFO
V
BAT
V
SS
V
1
2
3
4
M40SZ100Y
M40SZ100W
5
6
710
8
16
15
14
13
12
11
CC
NC
V
OUT
NC
PFI
BL
E
9
E
CON
AI03935
6/24Doc ID 7528 Rev 3
Page 7
M40SZ100Y, M40SZ100WDescription
Figure 3.SOIC28 connections
Figure 4.Block diagram
V
CC
V
BAT
BL
NC
NC
NC
NC
NC
NC
NC
RSTIN
NC
NC
PFO
V
SS
VBL= 2.5V
1
2
3
4
5
6
7
M40SZ100Y
M40SZ100W
8
9
10
11
12
13
14
COMPARE
28
27
26
25
24
23
22
21
20
19
18
17
16
15
V
CC
NC
NC
V
OUT
NC
NC
PFI
NC
E
NC
RST
NCNC
NC
E
CON
V
BL
AI03934
OUT
(1)
RSTIN
E
PFI
1.25V
1. Open drain output
V
V
PFD
= 2.5V
SO
= 4.4V
(2.65V for SZ100W)
COMPARE
COMPARE
COMPARE
POR
RST
E
CON
PFO
(1)
AI04766
Doc ID 7528 Rev 37/24
Page 8
DescriptionM40SZ100Y, M40SZ100W
Figure 5.Hardware hookup
3.0V, 3.3V or 5V
Unregulated
Voltage
R1
R2
Regulator
V
IN
1. User supplied for the 16-pin package
V
CC
0.1µF
From Microprocessor
V
CC
E
RSTIN
PFI
V
SS
V
BAT
V
OUT
M40SZ100Y
M40SZ100W
E
CON
PFO
RST
(1)
BL
V
CC
0.1µF
To Microprocessor NMI
To Microprocessor Reset
To Battery Monitor Circuit
1Mb or 4Mb
LPSRAM
E
AI04767
8/24Doc ID 7528 Rev 3
Page 9
M40SZ100Y, M40SZ100WOperation
2 Operation
The M40SZ100Y/W, as shown in Figure 5 on page 8, can control one (two, if placed in
parallel) standard low-power SRAM. This SRAM must be configured to have the chip enable
input disable all other input signals. Most slow, low-power SRAMs are configured like this,
however many fast SRAMs are not. During normal operating conditions, the conditioned
chip enable (E
Table2 on page11. An internal switch connects V
of less than 0.3 V (I
When V
degrades during a power failure, E
CC
situation, the SRAM is unconditionally write protected as V
threshold (V
V
is shown in Table 7 on page 17.
PFD
If chip enable access is in progress during a power fail detection, that memory cycle
continues to completion before the memory is write protected. If the memory cycle is not
terminated within time t
A power failure during a WRITE cycle may corrupt data at the currently addressed location,
but does not jeopardize the rest of the SRAM's contents. At voltages below V
user can be assured the memory will be write protected within the Write Protect Time (t
provided the V
As V
continues to degrade, the internal switch disconnects VCC and connects the internal
CC
battery to V
provides a voltage V
page 17).
) output pin follows the chip enable (E) input pin with timing shown in
CON
).
OUT1
). For the M40SZ100Y/W the power fail detection value associated with
PFD
, E
WPT
fall time does not exceed tF (see Table 2 on page 11).
CC
. This occurs at the switchover voltage (VSO). Below the VSO, the battery
OUT
to the SRAM and can supply current I
OHB
is unconditionally driven high, write protecting the SRAM.
CON
to V
CC
is forced inactive independent of E. In this
CON
. This switch has a voltage drop
OUT
falls below an out-of-tolerance
CC
PFD
(see Ta b le 7 o n
OUT2
(min), the
WPT
)
When V
held inactive for t
independent of the E
rises above VSO, V
CC
(120ms maximum) after the power supply has reached V
CER
input, to allow for processor stabilization (see Figure 7 on page 11).
is switched back to the supply voltage. Output E
OUT
2.1 Data retention lifetime calculation
Most low power SRAMs on the market today can be used with the M40SZ100Y/W NVRAM
Controller. There are, however some criteria which should be used in making the final
choice of which SRAM to use. The SRAM must be designed in a way where the chip enable
input disables all other inputs to the SRAM. This allows inputs to the M40SZ100Y/W and
SRAMs to be “Don't care” once V
SRAM should also guarantee data retention down to V
time must be sufficient to meet the system needs with the chip enable propagation delays
included.
If data retention lifetime is a critical parameter for the system, it is important to review the
data retention current specifications for the particular SRAMs being evaluated. Most SRAMs
specify a data retention current at 3.0 V. Manufacturers generally specify a typical condition
for room temperature along with a worst case condition (generally at elevated
temperatures). The system level requirements will determine the choice of which value to
use. The data retention current value of the SRAMs can then be added to the I
the M40SZ100Y/W to determine the total current requirements for data retention. The
available battery capacity for the SNAPHAT
then be divided by this current to determine the amount of data retention available.
falls below V
CC
®
of your choice (see Table 13 on page 22) can
PFD
(min) (see Figure 6 on page 10). The
PFD
= 2.0 V. The chip enable access
CC
CCDR
is
CON
,
value of
Doc ID 7528 Rev 39/24
Page 10
OperationM40SZ100Y, M40SZ100W
Caution:Take care to avoid inadvertent discharge through V
attached.
For a further more detailed review of lifetime calculations, please see application note
AN1012.
Figure 6.Power down timing
V
CC
V
(max)
PFD
V
PFD
V
(min)
PFD
VSO
tF
tFB
E
E
tWPT
CON
V
OHB
OUT
and E
after battery has been
CON
RST
PFO
VAL ID
AI03936
10/24Doc ID 7528 Rev 3
Page 11
M40SZ100Y, M40SZ100WOperation
Figure 7.Power up timing
V
CC
V
(max)
PFD
V
PFD
V
(min)
PFD
VSO
tR
E
E
CON
RST
PFO
tRB
V
OHB
tCER
tEPDtEPD
tREC
VAL ID
Table 2.Power down/up AC characteristics
SymbolParameter
(2)
t
F
t
FB
t
PFD
t
t
EPD
t
RB
t
CER
t
REC
t
WPT
1. Valid for ambient operating temperature: TA = –40 to 85 °C; VCC = 2.7 to 3.6 V or 4.5 to 5.5 V(except where noted).
2. V
PFD
V
CC
3. V
PFD
V
(3)
(max) to V
PFD
V
(min) to VSS VCC fall time10µs
PFD
(min) VCC fall time300µs
PFD
PFI to PFO propagation delay1525µs
V
R
(min) to V
PFD
(max) VCC rise time10µs
PFD
Chip enable propagation delay (low or high)
VSS to V
(min) VCC rise time1µs
PFD
Chip enable recovery40120ms
V
(max) to RST high40200ms
PFD
Write protect time40200µs
(max) to V
passes V
(min) to VSS fall time of less than tFB may cause corruption of RAM data.
(min) fall time of less than tF may result in deselection/write protection not occurring until 200 µs after
PFD
(min).
PFD
(1)
MinMaxUnit
M40SZ100Y10ns
M40SZ100W15ns
AI03937
Doc ID 7528 Rev 311/24
Page 12
OperationM40SZ100Y, M40SZ100W
2.2 Power-on reset output
All microprocessors have a reset input which forces them to a known state when starting.
The M40SZ100Y/W has a reset output (RST
) pin which is guaranteed to be low by V
PFD
(see Table 7 on page 17). This signal is an open drain configuration. An appropriate pull-up
resistor to V
voltage conditions, even when V
Once V
for t
CC
to allow the power supply to stabilize.
REC
should be chosen to control the rise time. This signal will be valid for all
CC
exceeds the power failure detect voltage V
equals VSS (with valid battery voltage).
CC
, an internal timer keeps RST low
PFD
2.3 Reset input (RSTIN)
The M40SZ100Y/W provides one independent input which can generate an output reset.
The duration and function of this reset is identical to a reset generated by a power cycle.
Ta bl e 3 and Figure 8 illustrate the AC reset characteristics of this function. Pulses shorter
than t
100 kΩ resistor.
will not generate a reset condition. RSTIN is internally pulled up to VCC through a
RLRH
Figure 8.RSTIN
RSTIN
(1)
RST
1. With pull-up resistor
timing waveform
Table 3.Reset AC characteristics
SymbolParameter
(2)
t
RLRH
(3)
t
R1HRH
1. Valid for ambient operating temperature: TA = –40 to 85 °C; VCC = 2.7 to 3.6 V or 4.5 to 5.5 V (except
where noted).
2. Pulse width less than 50 ns will result in no RESET (for noise immunity).
3. CL = 5 pF (see Figure 10 on page 16).
RSTIN low to RSTIN high200ns
RSTIN high to RST high40200ms
2.4 Battery low pin
tRLRH
tR1HRH
(1)
AI04768
MinMaxUnit
The M40SZ100Y/W automatically performs battery voltage monitoring upon power-up, and
at factory-programmed time intervals of at least 24 hours. The Battery Low (BL
asserted if the battery voltage is found to be less than approximately 2.5 V. The BL
remain asserted until completion of battery replacement and subsequent battery low
monitoring tests, either during the next power-up sequence or the next scheduled 24-hour
interval.
12/24Doc ID 7528 Rev 3
) pin will be
pin will
Page 13
M40SZ100Y, M40SZ100WOperation
If a battery low is generated during a power-up sequence, this indicates that the battery is
below 2.5 V and may not be able to maintain data integrity in the SRAM. Data should be
considered suspect, and verified as correct. A fresh battery should be installed.
If a battery low indication is generated during the 24-hour interval check, this indicates that
the battery is near end of life. However, data is not compromised due to the fact that a
nominal V
is supplied. In order to insure data integrity during subsequent periods of
CC
battery back-up mode, the battery should be replaced.
The M40SZ100Y/W only monitors the battery when a nominal V
Thus applications which require extensive durations in the battery back-up mode should be
powered-up periodically (at least once every few months) in order for this technique to be
beneficial. Additionally, if a battery low is indicated, data integrity should be verified upon
power-up via a checksum or other technique. The BL
appropriate pull-up resistor to V
CC
2.5 Power-fail input/output
The power-fail input (PFI) is compared to an internal reference voltage (independent from
the V
output (PFO)
signal a failing power supply. Typically PFI is connected through an external voltage divider
(see Figure 5 on page 8) to either the unregulated DC input (if it is available) or the
regulated output of the V
voltage at PFI falls below V
M40SZ100Y/W or the microprocessor drops below the minimum operating voltage.
During battery backup, the power-fail comparator turns off and PFO
This occurs after V
irrespective of V
the inputs are recognized. At the end of this time, the power-fail comparator is enabled and
PFO
unconnected.
comparator). If PFI is less than the power-fail threshold (V
PFD
will go low. This function is intended for use as an undervoltage detector to
regulator. The voltage divider can be set up such that the
CC
several milliseconds before the regulated VCC input to the
PFI
drops below V
CC
for the write protect time (t
PFI
follows PFI. If the comparator is unused, PFI should be connected to VSS and PFO left
is applied to the device.
CC
pin is an open drain output and an
should be chosen to control the rise time.
), the power-fail
PFI
goes (or remains) low.
(min). When power returns, PFO is forced high,
PFD
), which is the time from V
REC
(max) until
PFD
2.6 VCC noise and negative going transients
ICC transients, including those produced by output switching, can produce voltage
fluctuations, resulting in spikes on the V
capacitors are used to store energy which stabilizes the V
bypass capacitors will be released as low going spikes are generated or energy will be
absorbed when overshoots occur. A ceramic bypass capacitor value of 0.1 µF (as shown in
Figure 9 on page 14) is recommended in order to provide the needed filtering.
In addition to transients that are caused by normal SRAM operation, power cycling can
generate negative voltage spikes on V
one volt. These negative spikes can cause data corruption in the SRAM while in battery
backup mode. To protect from these voltage spikes, STMicroelectronics recommends
connecting a Schottky diode from V
Schottky diode 1N5817 is recommended for through hole and MBRS120T3 is
recommended for surface mount.
Doc ID 7528 Rev 313/24
bus. These transients can be reduced if
CC
CC
that drive it to values below VSS by as much as
CC
to VSS (cathode connected to VCC, anode to VSS).
CC
bus. The energy stored in the
Page 14
OperationM40SZ100Y, M40SZ100W
Figure 9.Supply voltage protection
V
CC
V
CC
0.1µFDEVICE
V
SS
AI00622
14/24Doc ID 7528 Rev 3
Page 15
M40SZ100Y, M40SZ100WMaximum ratings
3 Maximum ratings
Stressing the device above the rating listed in the absolute maximum ratings table may
cause permanent damage to the device. These are stress ratings only and operation of the
device at these or any other conditions above those indicated in the operating sections of
this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Table 4.Absolute maximum ratings
SymbolParameterValueUnit
T
STG
T
SLD
V
IO
V
CC
I
O
P
D
1. For SO package, Lead-free (Pb-free) lead finish: reflow at peak temperature of 260 °C (the time above
255 °C must not exceed 30 seconds).
Storage temperature (VCC off)
(1)
Lead solder temperature for 10 seconds260°C
Input or output voltages–0.3 to VCC +0.3V
Supply voltage
Output current20mA
Power dissipation1W
SNAPHAT–40 to 85°C
SOIC–55 to 125°C
M40SZ100Y–0.3 to 7V
M40SZ100W–0.3 to 4.6V
Caution:Negative undershoots below –0.3 V are not allowed on any pin while in the battery backup
mode.
Caution:Do NOT wave solder SOIC to avoid damaging SNAPHAT sockets.
Doc ID 7528 Rev 315/24
Page 16
DC and AC parametersM40SZ100Y, M40SZ100W
4 DC and AC parameters
This section summarizes the operating and measurement conditions, as well as the DC and
AC characteristics of the device. The parameters in the following DC and AC characteristic
tables are derived from tests performed under the measurement conditions listed in Tab le 5 :
DC and AC measurement conditions. Designers should check that the operating conditions
in their projects match the measurement conditions when using the quoted parameters.
Table 5.DC and AC measurement conditions
ParameterM40SZ100YM40SZ100W
VCC supply voltage4.5 to 5.5 V2.7 to 3.6 V
Ambient operating temperature–40 to 85 °C–40 to 85 °C
Load capacitance (C
Input rise and fall times≤ 5 ns≤ 5 ns
Input pulse voltages0.2 to 0.8V
Input and output timing ref. voltages0.3 to 0.7V
Figure 10. AC testing load circuit
)100 pF50 pF
L
CC
CC
0.2 to 0.8V
0.3 to 0.7V
CC
CC
DEVICE
UNDER
TEST
CL includes JIG capacitance
333Ω
CL = 100pF
or 50pF
Note:CL = 100 pF for M40SZ100Y and 50 pF for M40SZ100W.
Figure 11. AC testing input/output waveforms
0.8V
CC
0.2V
CC
Table 6.Capacitance
SymbolParameter
C
IN
C
OUT
1. Sampled only, not 100% tested.
2. At 25 °C, f = 1 MHz.
3. Outputs deselected.
Input capacitance -7pF
(3)
Output capacitance-10pF
(1)(2)
1.73V
0.7V
CC
0.3V
CC
MinMaxUnit
AI02393
AI02568
16/24Doc ID 7528 Rev 3
Page 17
M40SZ100Y, M40SZ100WDC and AC parameters
Table 7.DC characteristics
SymParameterTest condition
Supply currentOutputs open10.5mA
I
CC
I
CCDR
Data retention mode
(2)
current
Input leakage current0 V ≤ VIN ≤ V
(3)
I
LI
Input leakage current
(PFI)
(4)
I
I
OUT1
I
OUT2
V
V
V
Output leakage current0 V ≤ V
LO
(5)
V
current (active)V
OUT
V
current (battery
OUT
backup)
Battery voltage2.53.03.5
BAT
V
Input high voltage0.7V
IH
Input low voltage–0.30.3V
V
IL
Output high voltage
OH
OHBVOH
battery backup
V
(7)
(8)
OUT
> VCC – 0.3175100mA
OUT
> V
OUT
IOH = –1.0 mA2.42.4V
I
= –1.0 µA2.52.93.52.52.93.5V
OUT2
Output low voltageIOL = 3.0 mA0.40.4V
V
OL
V
Output low voltage
(open drain)
Power-fail deselect
PFD
voltage
(9)
IOL = 10 mA0.40.4V
(1)
M40SZ100YM40SZ100W
MinTypMaxMinTypMax
5020050200nA
CC
±1±1µA
–25225–25225nA
≤ V
CC
– 0.3100100µA
BAT
CC
4.20
4.4
0
±1±1µA
(6)
2.53.03.5
VCC + 0.30.7V
CC
–0.30.3V
CC
(6)
VCC + 0.3V
CC
4.502.552.602.70V
Unit
V
V
V
PFI input threshold
PFI
VCC = 5 V(Y)
VCC = 3 V(V)
1.225
1.2
50
1.2751.225
1.25
0
1.275V
PFI hysteresisPFI rising20702070mV
V
1. Valid for ambient operating temperature: TA = –40 to 85 °C; VCC = 2.7 to 3.6 V or 4.5 to 5.5 V(except where noted).
2. Measured with V
3. RSTIN
4. Outputs deselected.
5. External SRAM must match SUPERVISOR chip V
6. For rechargeable backup, V
7. For PFO
8. Chip enable output (E
9. For RST
Battery backup
SO
switchover voltage
and E
OUT
internally pulled-up to VCC through 100 kΩ resistor.
pin (CMOS).
will reduce battery life.
& BL pins (open drain).
CON
open.
CON
(max) may be considered VCC – 0.5 V.
BAT
) can only sustain CMOS leakage currents in the battery backup mode. Higher leakage currents
specification (3 V or 5 V).
CC
2.52.5V
Doc ID 7528 Rev 317/24
Page 18
Package mechanical dataM40SZ100Y, M40SZ100W
5 Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK
®
packages, depending on their level of environmental compliance. ECOPACK®
®
is an ST trademark.
Figure 12. SO16 – 16-lead plastic small package outline
B
Note:Drawing is not to scale.
Table 8.SO16 – 16-lead plastic small outline package mechanical data
Figure 14.SH – 4-pin SNAPHAT housing for 48 mAh battery, package outline
Note:Drawing is not to scale.
Table 10.SH – 4-pin SNAPHAT housing for 48 mAh battery, package mechanical data
Symbol
TypMinMaxTypMinMax
A9.780.385
A16.737.240.2650.285
A26.486.990.2550.275
A30.380.015
B0.460.560.0180.022
D21.2121.840.8350.860
E14.2214.990.5600.590
eA15.5515.950.6120.628
eB3.203.610.1260.142
L2.032.290.0800.090
eA
A1
A
B
D
E
eB
A3
mminches
A2
L
SHZP-A
20/24Doc ID 7528 Rev 3
Page 21
M40SZ100Y, M40SZ100WPackage mechanical data
Figure 15.SH – 4-pin SNAPHAT housing for 120 mAh battery, package outline
Note:Drawing is not to scale.
Table 11.SH – 4-pin SNAPHAT housing for 120 mAh battery, package mechanical data
Symbol
TypMi nMa xTypMinMax
A10.540.415
A18.008.510.3150.335
A27.248.000.2850.315
A30.380.015
B0.460.560.0180.022
D21.2121.840.8350.860
E17.2718.030.6800.710
eA15.5515.950.6120.628
eB3.203.610.1260.142
L2.032.290.0800.090
A1
eA
A
B
D
E
eB
A3
mminches
A2
L
SHZP-A
Doc ID 7528 Rev 321/24
Page 22
Part numberingM40SZ100Y, M40SZ100W
6 Part numbering
Table 12.Ordering information scheme
Example:M40SZ100YMQ6E
Device type
M40SZ
Supply voltage and write protect voltage
(1)
= VCC = 4.5 to 5.5 V; V
100Y
100W = VCC = 2.7 to 3.6 V; V
Package
MQ = SO16
(1)(2)
MH
= SOH28
= 4.2 to 4.5 V
PFD
= 2.6 to 2.7 V
PFD
Temperature range
6 = –40 to 85 °C
Shipping method
(1)
= Lead-free ECOPACK® package, tubes
E
F = Lead-free ECOPACK® package, tape & reel
1. Contact local ST sales office for availability.
2. The SOIC package (SOH28) requires the battery package (SNAPHAT®) which is ordered separately
under the part number “M4ZXX-BR00SHX” in plastic tube or “M4ZXX-BR00SHXTR” in tape & reel form.
Caution:Do not place the SNAPHAT battery package “M4Zxx-BR00SH” in conductive foam as it will
drain the lithium button-cell battery.
For a list of available options (e.g., speed, package) or for further information on any aspect
of this device, please contact the ST sales office nearest to you.
Table 13.SNAPHAT
Part numberDescriptionPackage
M4Z28-BR00SH SNAPHAT housing for 48 mAh batterySH
M4Z32-BR00SH SNAPHAT housing for 120 mAh batterySH
®
battery table
22/24Doc ID 7528 Rev 3
Page 23
M40SZ100Y, M40SZ100WRevision history
7 Revision history
Table 14.Document revision history
DateRevisionChanges
Dec-20011.0First issue
13-May-20021.1Modify reflow time and temperature footnote (Tab l e 4 )
01-Aug-20021.2Add marketing status (cover page; Ta bl e 12 )
15-Sep-20031.3
20-Nov-20072
25-Oct-20103
Remove reference to M68xxx (obsolete) part (Figure 5); update
disclaimer
Reformatted document; added lead-free second level interconnect
information to cover page and Section 5: Package mechanical data;
updated Ta bl e 4 and 12.
®
Updated cover page, Section 3, Tab l e 1 2 , ECOPACK
Section 5; reformatted document; minor textual changes.
text in
Doc ID 7528 Rev 323/24
Page 24
M40SZ100Y, M40SZ100W
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