The note in the chart means items calculated and approved in design not the items proven by actual test result.
8
Page 9
KA3084D
Application Informations
1. A DIAGRAM SUMMARIZING THE ENTIRE SYSTEM
I
V
TSD
C
AMP.DRIVE
4I
REG
HALL+
HALL−
V
CTL
Hall_IN
V / I
Converter
I
C
I
4I
C
C
2I
C
I
f
G
M
O
R2
FG_OUT
PG_OUT
FG_IN
PG_IN
R1
AMP &
COMP
AMP &
COMP
Figure 1.
Figure 1 is a conceptual d iagram of the KA3084D. It shows that it turns on or off depen ding on the signal of the hall sensor
used for sensing the rotor position of motor.
The AMP, G
(Feedback) and output blocks are circuits used to determine current gain of KA3084D.
M
Furthermore, HallIN represents the hall signal switch.
It supplies stable bias to each V
block. The TSD block is a thermal shutdown circuit that protects the IC during an high
REG
temperature inside the IC.
Moreover, FG. and PG. blocks output individual signals generated in the motor using the amplifier and comparator.
These signals transmit motor speed and position data to controller of external servo etc. for their control.
2. CURRENT CONTROL
Figure 2 simplifies figure 1.
The supplied I
Figure 3 is a graph of I
current drives the motor and the Ic current controls the motor speed.
O
vs. IO.
CTL
9
Page 10
I
CTL
I
Omax
KA3084D
I
O
A
T
Figure 2.
I
O
A
T
I
COmax
Figure 3.
3. VOLTAGE CONTROL
Even though KA3084D command uses Ic to control the magnitude of I
age control and has option to use current control.
I
V
CTL
V / I
Converter
CTLI
Figure 4.
Figure 4 shows the principle of the voltage control.
The V
is the motor speed control voltage, and the I
CTL
Figure 5 shows the graph of V
CTL
vs. IO.
is converted to current through the V / I converter.
CTL
I
CTL
, it can also use voltage. KA3084D mainly uses volt-
O
A
T
O
I
Omax
I
O
A
0.48 × V
T
REG
(TYP)
G
M
V
CTL
Figure 5.
10
Page 11
KA3084D
Typical Performance Characteristics
5.0
4.0
(V)
3.0
REG
V
2.0
1.0
0.0
0 2 4 6 8 101214161820
V
(V)
CC
1.VCC vs V
12
10
8
(mA)
6
CC
I
4
2
0
8 1012141618
(V)
V
CC
3.VCC vs I
CC
V
REG
V
CTL
V
CTL
RL = 10KΩ
RL = 10 KΩ
= 0V
CTL
= 3.5V
= 3.5V
5
4
(V)
3
REG
V
2
V
= 0V
1
0
-30-20-10 0 10 20 30 40 50 60 70 80 90
Temperature(°C)
Temperature(℃)
2.Temp. vs V
0.63
0.58
0.53
0.48
GM1(A/V)
0.43
0.38
8 1012141618
(V)
V
CC
V
REG
CTL
CC
V
= 12V
CTL
= 3.5V
4.VCC vs GM1
900
850
800
750
700
(mA)
O
I
650
V
600
550
500
8 1012141618
VCC(V)
5.V
vs IOA
CC
= 3.5V
CTL
V
= 3.5V
CTL
RL = 10KΩ
RL = 10KΩ
11
900
850
800
750
700
(mA)
O
I
650
600
550
500
8 1012141618
(V)
V
CC
6.V
CC
V
RL = 10KΩ
vs IOB
= 3.5V
CTL
V
= 3.5V
CTL
RL = 10KΩ
Page 12
Test Circuits
SW24
KA3084D
2mA
3
2
1
A
FG_OUT
1
GND (Signal)
V
CC
I
CC
1
2
10Ω(20W)
1
2
1
2
SW1
SW2
SW3
2
3
4
5
6
V
CC2
OUT2P
GND2(Power)
OUT2N
OUT1P
FGOUT
FGAMPOUT
K
A
3
0
8
4
D
10Ω(20W)
1
2
SW4
7
8
9
GND1(Power)
OUT1N
V
CC1
PGAMPOUT
PGOUT
V
FGIN
V
REG
PGIN
V
CTL
22
SW22
21
25
20
SW19
19
SW18
18
17
16
SW17
15
14
2
1
2
1
SW13
SW15
SW23
3
2
1
I
REG
1
2
3
V
CTL
1
2
2
1
=−20µA
1
2
3
SW16
A
PG_OUT
2mA
500µA
FG_AMPOUT
SW21
2
SW20
1
V
REG
1
−500µA
2
−500µA
−500µA
V
2
1
~
FG_IN
SW14
1
2
PG_AMPOUT
25
PG_IN
V
HALL_1P
V
HALL_1N
SW7
+
−
SW8
~
1
SW5
2
1
SW6
2
H1P
10
H1N
1112
H2N
H2P
SW10
13
SW9
1
2
1
2
SW12
SW11
V
HALL_2N
V
HALL_2P
−
+
~
12
Page 13
KA3084D
Typical Application Circuits
V
M
REG
1
2
3
4
5
6
7
8
GND(Signal)
V
CC2
OUT2P
GND2(Power)
OUT2N
OUT1P
GND1(Power)
OUT1N
FGAMPOUT
K
A
3
0
8
4
D
PGAMPOUT
FGOUT
V
FGIN
V
REG
PG_IN
PGOUT
22
21
25
20
19
18
PG
17
16
15
HALL
HALL
V
CC1
9
H1P
10
H1N
11
V
H2N
CTL
H2P
V
14
13
12
CTL
13
Page 14
KA3084D
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURT HER NOTICE TO ANY
PRODUCTS HEREI N TO IMPROVE RELIABILITY, FUNCTIO N OR DESIGN. FAIRCH IL D DOES NOT ASSUME ANY
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER
DOES IT CONVEY ANY LICENSE UNDER IT S PATENT RIGHTS, NOR THE RIGHTS OF OTHE RS.
LIFE SUPPORT POL I CY
FAIRCHILD’S PR ODUCTS ARE NOT AUTH ORIZED FOR USE AS C RITICAL COMPONENT S IN LIFE SUPPORT DE VICES
OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR
INTERNATIONAL. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body,
or (b) support or sustain life, and (c) whose failure to
perform when properly used in accordance with
2. A critical component in any component of a life support
device or sy stem whose fai lure to perform can be
reasonably expec ted to cause the failur e of the life support
device or system, or to affect its safety or effec t iv ene ss .
instructions for use provided in the labeling, can be
reasonably expected to result in a significant injury of the
user.
www.fairchildsemi.com
12/1/00 0.0m 001
2000 Fairchild Semiconductor International
Stock#DSxxxxxxxx
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