FSTUD16450
Configurable 4-Bit to 20-Bit Bus Switch with
-2V Undershoot Protection and Selectable Level Shifting
FSTUD16450 Configurable 4-Bit to 20-Bit Bus Switch with -2V Undershoot Protection and Selectable Level
Shifting
General Description
The Fairchild Universal Bus Switch FSTUD16450 provides
4-bit, 5-bit, 8-bi t, 10-b it, 16- bit, 20 -bit of hig h-s peed CMOS
TTL-compatible bus switch ing. The low On Resistance of
the switch allows inputs to be conn ecte d to ou tpu ts witho ut
adding propagation de lay or generating additi onal ground
bounce noise.
The FSTUD16450 is designed to allow “customer” configuration control of the enable connections. The device is
organized as either a 4-bit, 5-bit, 10-bit or 20-bit bus switch.
8-bit and 16-bit configurations are also achievable (see
Functional Description). The device's bit configuration is
chosen through select pi n logic. (see Truth Table). When
OE
is LOW, Port Ax is connected to Port Bx. When OEx is
x
HIGH, the switch is OPEN.
The A and B Ports are “und ershoo t hardened ” with UHC
protection to support an extended range to 2.0V below
ground. Fairchild's integrated “Undershoot Hardened
Circuit” (UHC) senses undershoot at the I/O's, and
responds by preventing vo ltage differentia ls from develo ping and turning on the switch.
Another key device feature is the addition of a level shifting
select pin, “S
standard N-MOS switch. When S
is integrated into the circuit allowing for level shifting
between 5V inputs and 3.3V outputs.
”. When S2 is LOW, the device behaves as a
2
is HIGH, a diode to V
2
Features
■ Undershoot hardened to −2V (A and B Ports)
■ Voltage level shifting
■ 4
Ω switch connection between two ports
■ Minimal propagation delay through the switch
■ Low l
CC
■ Zero bounce in flow-through mode
■ Control inputs compatible with TTL level
■ See Applications Note AN-5008 for details
■ Also packaged in plastic Fine-Pitch Ball Grid Array
(FBGA) (Preliminary)
Applications Note
Select pins S0, S1, S2 are intended to be used as static
user configurable control pins. The AC performance of
these pins has not be en characterized or teste d. Swit ching
of these select pin s during system operation may temporarily disrupt output logic states and/or enable pin controls.
CC
Ordering Code:
Order NumberPackage NumberPackage Description
FSTUD16450GX
(Note 1)
FSTUD16450 MT DMTD5656-Lead Thin S hr in k Sm all Ou t li n e P ack a ge ( TS S OP ), JEDEC MO-153 , 6. 1mm W id e
Devices also availab l e in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering code.
Note 1: BGA package available in Tape and Reel only.
The device can a lso be configured as an 8 and 16-bit devi ce by grounding the u nused pins in Configu rations 2 and 1
respectively. The 8-bit configuration may also be achieved by tying two of the 4-bit enables from configuration together and
tying the remaining enabl e pin (OE
Absolute Maximum Ratings(Note 2)Recommended Operating
Supply Voltage (VCC)−0.5V to +7.0V
DC Switch Voltage (V
) (Note 3)−2.0V to +7.0V
S
DC Input Control Pin Voltage
(V
) (Note 4)−0.5V to +7.0V
IN
FSTUD16450
DC Input Diode Current (l
DC Output (I
DC V
CC
) Current 128 mA
OUT
/GND Current (ICC/I
Storage Temperature Range (T
) VIN < 0V−50 mA
IK
)+/− 100 mA
GND
)−65°C to +150 °C
STG
Conditions
Power Supply Operating (V
Input Voltage (V
Output Voltage (V
Free Air Operating Temperature (T
Note 2: The “Absolute Maximum Ratings” are those values bey ond which
the safety of the d evice cannot be guaranteed. The device sh ould not be
operated at these limit s. The parametric values defin ed in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The “Recomme nded O peratin g Cond itions ” table will defin e the condition s
for actual device operation.
is the voltage observed/applied at either the A or B Ports across
Note 3: V
S
the switch.
Note 4: The input and output ne gative vo ltage ra tings may be excee ded if
the input and output diode current ratings are observed.
Note 5: Unused control inputs must be held HIGH or LOW. They may not
float.
(Note 5)
CC)
)0V to 5.5V
IN
)0V to 5.5V
OUT
)-40 °C to +85 °C
A
DC Electrical Characteristics
SymbolParameter
V
V
V
V
I
I
R
Clamp Diode Voltage4.5−1.2VIIN =−18 mA
IK
HIGH Level Input Voltage4.0-5.52.0VIF S2 = HIGH 4.5V ≤ VCC ≤ 5.5V
HIGH Level Output Voltage4.5-5.5See Figure 4VS2 = V
OH
Input Leakage Current5.5±1.0µA0 ≤ VIN ≤ 5.5V
I
OFF-STATE Leakage Current5.5±1.0µA0 ≤ A, B ≤ V
OZ
Switch On Resistance4.547ΩVIN = 0V, IIN = 64 mA, S2 = 0V or V
ON
(V)Min
(Note 7)4.547ΩVIN = 0V, IIN = 30 mA, S2 = 0V or V
4.5812ΩVIN = 2.4V, IIN = 15 mA, S2 = 0V
4.01120ΩV
4.53550ΩV
V
I
Quiescent Supply Current
CC
5.5
∆ I
Increase in I
CC
per Input
CC
5.5
V
Voltage Undershoot5.5−2.0V0.0 mA ≥ IIN ≥−50 mA
IKU
Note 6: Typi c al values are at VCC = 5.0V and TA = +25°C
Note 7: Measured by the volta ge drop between A an d B pins at the indicated c urrent through the switch. On Resistance is determined by the lower of the
voltages on the two (A or B) pins.
TA =−40 °C to +85 °C
CC
Typ
(Note 6)
010µAV
UnitsConditions
Max
IN
IN
IN
3µAS2 = GND, VIN = VCC or GND, I
10µAS2 = VCC, OEx = VCC, VIN = VCC or GND, I
1.5mAS2 = VCC, OEx = GND, VIN = VCC or GND, I
2.5mA
4.0mA
One Input at 3.4V
Other Inputs at VCC or GND, S2 = 0V
One Input at 3.4V
Other Inputs at VCC or GND, S2 = V
Note 8: This par ameter is guaranteed by desi gn but is not test ed. The bus switch contribut es no propagati on delay other than the RC dela y of the typical On
Resistance of the sw it c h and the 50pF load capa citance, when drive n by an ideal voltage sourc e (zero output impe dance).
Note 9: This parameter is guaranteed by design but is not tested. This bus switch contributes no propagation delay other than the RC delay of the typical On
Resistance of the sw it c h and the 50pF load capa citance, when drive n by an ideal voltage sourc e (zero output impe dance).
ConditionsFigure
PZL
PZH
PLZ
PHZ
PZL
PZH
PLZ
= OPEN for t
I
PHZ
Number
Figures
Figures
Figures
Figures
FSTUD16450
2, 3
2, 3
2, 3
2, 3
2, 3
2, 3
2, 3
2, 3
2, 3
2, 3
Capacitance (Note 10)
SymbolParameterTypMaxUnitsConditions
C
IN
C
I/O
Note 10: TA =+25°C, f = 1 MHz, Capacitance is characterized but not tested.
Control Pin Input Capacitance4pFVCC = 5.0V, VIN = 0V
Input/Output Capacitance “OFF State”8pFV
, OE = 5.0V, VIN = 0V
CC
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Page 8
Undershoot Characteristic (Note 11)
SymbolParameterMinTypMaxUnitsConditions
V
OUTU
Note 11: This test is intended to characterize the device’s protective capabilities by maintaining output signal integrity during an input transient volt age
undershoot event.
FSTUD16450
Output Voltage During Undershoot2.5VOH − 0.3VS2 = 0V, Figure 1
TBDTBDVS
= V
2
CC
FIGURE 1.
Device Test ConditionsTransie nt
ParameterValueUnits
V
IN
R1 = R
V
TRI
V
CC
see WaveformV
2
100KΩ
11.0V
5.5V
Input Voltage (V
) Waveform
IN
AC Loading and Waveforms
FIGURE 2. AC Test Circuit
FIGURE 3. AC Waveforms
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Note: Input driven by 50Ω source terminated in 50Ω
FSTUD16450 Configurable 4-Bit to 20-Bit Bus Switch with -2V Undershoot Protection and Selectable Level
Shifting
56-Lead Thin Shrin k Small Ou tlin e Pack age (TSSOP), JEDEC MO-153, 6.1mm Wide
Package Number MTD56
Technology Description
The Fairchild Switch family derives from and embodies Fairchild’s proven switch t echnology used for several years in it s
74LVX3L384 (FST3384) bus switch product.
Fairchild does not assume any responsibility for use of any circuitry described , no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are dev ic es or syste ms
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provide d in the l abe ling, can be reasonably expected to result in a significant injury to the
user.
2. A critical compo nent in any com ponen t of a life s upp ort
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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