The Fairchild Switch FSTU162211 provides 24-bits of highspeed CMOS TTL-compatible bus switching. The low On
Resistance of the switch allows inputs to be connected to
outputs without adding propagation delay or generating
additional ground bounce noise.
The device is organ ized as a 12-bit or 24-bit b us switch.
When OE
nected to Port 1B. When OE
to Port 2B. The A and B Ports are protected against under-
shoot to support an extend ed rang e to 2.0V be low gr ound.
Fairchild’s integrated Undershoot Hardened Circuit
(UHC
preventing voltage differentials from developing and turning the switch on.
The FSTU162211 has equivalent 25
reduce signal-reflection noise, eliminating the need for
external terminating resistors.
Ω Series Resistors in Outputs (Preliminary)
is LOW, the switch is ON and Port 1A is con-
1
) senses undershoot at the I/O and responds by
is LOW, Port 2A is connected
2
Ω series resistors to
−2V Undershoot Protection
Features
■ Undershoot hardened to −2V (A and B Ports)
■ Slower output enable times to prevent signal disruption
Absolute Maximum Ratings(Note 1)Recommended Operating
Supply Voltage (VCC)−0.5V to +7.0V
DC Switch Voltage (V
) (Note 2)−0.5V to +7.0V
S
DC Input Control
Pin Voltage (V
DC Input Diode Current (l
DC Output Current (I
/GND Current (ICC/I
DC V
CC
Storage Temperature Range (T
) (Note 3)−0.5V to +7.0V
IN
) V
< 0V−50 mA
IK
IN
)128 mA
OUT
)+/− 100 mA
GND
) −65°C to +150 °C
STG
Conditions
Power Supply Operating (V
Input Voltage (V
Output Voltage (V
Input Rise and Fall Time (t
Switch Control Input0 ns/V to 5 ns/V
Switch I/O0 ns/V to DC
Free Air Operating Temperature (T
Note 1: The “Absolute Maximum Ratings” are those value s beyond which
the safety of the d evice cannot b e guaranteed . The device sh ould not be
operated at these limit s. The parametric values defi ned in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The “Recomm ended O peratin g Cond itions ” table will defin e the condition s
for actual device operation.
is the volt age observed / applied at either the A or B Ports acros s
Note 2: V
S
the switch.
Note 3: The input and output negative voltage ratings may be exceeded if
the input and ou t put diode curre nt ratings are observed.
Note 4: Unused control inputs must be held HIGH or LOW. They may not
float.
(Note 4)
CC)
)0V to 5.5V
IN
)0V to 5.5V
OUT
, tf)
r
)-40 °C to +85 °C
A
4.0V to 5.5V
DC Electrical Characteristics
V
SymbolParameter
V
IK
V
IH
V
IL
I
I
I
OZ
R
ON
I
CC
∆ I
CC
V
IKU
Note 5: Typical values are at VCC = 5.0V and TA = +25°C
Note 6: Measured by the voltage drop between A and B pins at the indicated c urrent through the switch. On Resistanc e is determined by the lower of the
voltages on the two (A or B) pins.
Clamp Diode Voltage4.5−1.2VIIN =−18 mA
HIGH Level Input Voltage4.0–5.52.0V
LOW Level Input Voltage4.0–5.50.8V
Input Leakage Current5.5±1.0µA0 ≤ VIN ≤ 5.5V
OFF-STATE Leakage Current5.5±1.0µA0 ≤ A, B ≤ V
Switch On Resistance4.5202638ΩVIN = 0V, IIN = 64 mA
(Note 6)4.5202740ΩV
Quiescent Supply Current5.53µAVIN = VCC or GND, I
Increase in I
Voltage Undershoot5.5−2.0V0.0 mA ≥ IIN ≥−50 mA
per Input5.52.5mAOne Input at 3.4V
CC
CC
(V)
010µAV
4.5 202848ΩV
4.0 203048ΩVIN = 2.4V, IIN = 15 mA
TA =−40 °C to +85 °C
MinTyp
(Note 5)
UnitsConditions
Max
= 5.5V
IN
CC
= 0V, IIN = 30 mA
IN
= 2.4V, IIN = 15 mA
IN
OUT
Other Inputs at VCC or GND
= 5.5v
OE
1,2
FSTU162211
= 0
3www.fairchildsemi.com
Page 4
Preliminary
AC Electrical Characteristics
=−40 °C to +85 °C,
T
A
C
= 50pF, RU = RD = 500Ω
SymbolParameter
FSTU162211
t
, t
PHL
t
PZH
t
PHZ
Note 7: This parameter is guaranteed by design but is not tested. The bus switch contributes no propagation delay other than the RC delay of the typical On
Resistance of the s witch and the 50pF load capacitance, wh en driven by an ideal volt age source (zero output impedance).
Propagation Delay Bus to Bus
PLH
(Note 7)
, t
Output Enable Time1.56.06.5nsVI = 7V for t
PZL
, t
Output Disable Time1.57.07.2nsVI = 7V for t
PLZ
L
= 4.5 – 5.5VVCC = 4.0V
V
CC
MinMaxMinMax
1.251.25nsVI = OPENF igures 2,
UnitsConditions
VI = OPEN for t
VI = OPEN for t
PZL
PZH
PLZ
PHZ
Capacitance (Note 8)
SymbolParameterTypMaxUnitsConditions
C
IN
C
I/O
Note 8: TA =+25°C, f = 1 MHz, Capacitance is characterized but not tested.
Note 9: This test is intended to charac t erize the device’s protect iv e c apabilities by maintaining output signal integrity during an input tran s ient voltage under-
shoot event.
Output Voltage During Undershoot2.5VOH − 0.3V
Figure
Number
3
Figures 2,
3
Figures 2,
3
FIGURE 1.
Device Test ConditionsTransient
ParameterValueUnits
V
R1 = R
V
TRI
V
CC
IN
see WaveformV
2
100KΩ
11.0V
5.5V
www.fairchildsemi.com4
Input Voltage (V
) Waveform
IN
Page 5
AC Loading and Waveforms
Note: Input driven by 50 Ω source terminated in 50 Ω
The Fairchild Switch family derives from and embodies Fairchild’s proven s witch technol ogy used for several years i n its
2V Undershoot Protection and 25
−
74LVX3L384 (FST3384) bus switch product.
Fairchild does not assume any responsibility for use of any circuitr y described, no circuit patent licenses are implied a nd
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
FSTU162211 24-Bit Bus Switch with
1. Life support devices o r syste ms are device s or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant inju ry to the
user.
2. A critical com ponent in any compon ent of a l ife supp ort
device or system whose failu re to perform can be reasonably expected to cause the failure of the li fe su pp ort
device or system, or to affect its safety or effectiveness.
www.fairchildsemi.com
www.fairchildsemi.com6
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