Datasheet FDA032N08 Datasheet (Fairchild)

Page 1
tm
FDA032N08
N-Channel PowerTrench® MOSFET
75V, 235A, 3.2mΩ
FDA032N08 N-Channel PowerTrench
January 2009
Features
•R
• Fast Switching Speed
• Low Gate Charge
• High Performance Trench Technology for Extremely Low
• High Power and Current Handling Capability
• RoHS Compliant
= 2.5mΩ ( Typ.)@ VGS = 10V, ID = 75A
DS(on)
R
DS(on)
GSD
TO-3PN
Description
This N-Channel MOSFET is produced using Fairchild Semicon­ductor’s adcanced PowerTrench process that has been espe­cially tailored to minimize the on-state resistance and yet maintain superior switching performance.
Application
• DC to DC Convertors / Synchronous Rectification
®
MOSFET
D
G
S
MOSFET Maximum Ratings T
Symbol Parameter FDA032N08 Units
V
DSS
V
GSS
I
D
I
DM
E
AS
dv/dt Peak Diode Recovery dv/dt (Note 3) 5.5 V/ns P
D
, T
T
J
STG
T
L
*Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 120A.
Drain to Source Voltage 75 V Gate to Source Voltage ±20 V
D r a i n C urrent
Drain Current - Pulsed (Note 1) 940 A Single Pulsed Avalanche Energy (Note 2) 1995 mJ
Power Dissipation Operating and Storage Temperature Range -55 to +175
Maximum Lead Temperature for Soldering Purpose, 1/8” from Case for 5 Seconds
= 25oC unless otherwise noted*
C
-Continuous (T
-Continuous (T
(T
= 25oC) 375 W
C
- Derate above 25
= 25oC, Silicon Limited) 235*
C
= 100oC, Silicon Limited) 165*
C
= 25oC, Package Limited) 120
C
o
C2.5W/
300
Thermal Characteristics
Symbol Parameter Ratings Units
R
θJC θCS
R
θJA
©2009 Fairchild Semiconductor Corporation FDA032N08 Rev. A
Thermal Resistance, Junction to Case 0.4 Thermal Resistance, Case to Sink Typ. 0.24 Thermal Resistance, Junction to Ambient 40
A-Continuous (T
o
C
o
C
o
C
o
C/WR
Page 2
FDA032N08 N-Channel PowerTrench
Package Marking and Ordering Information T
= 25oC unless otherwise noted
C
Device Marking Device Package Reel Size Tape Width Quantity
FDA032N08
FDA032N08 TO-3PN - - 30
Electrical Characteristics
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BV
DSS
ΔBV
DSS
ΔT
J
I
DSS
I
GSS
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Dynamic Characteristics
C
iss
C
oss
C
rss
Q
g(tot)
Q
gs
Q
gd
Drain to Source Breakdown Voltage ID = 250μA, VGS = 0V, TC = 25oC75 - - V Breakdown Voltage Temperature
Coefficient Zero Gate Voltage Drain Current Gate to Body Leakage Current VGS = ±20V, V
I
= 250μA, Referenced to 25oC - 0.05 - V/oC
D
V
= 75V, V
DS
= 75V, TC = 150oC - - 500
V
DS
= 0V - - 1
GS
= 0V - - ±100 nA
DS
Gate Threshold Voltage VGS = VDS, ID = 250μA2.53.54.5V Static Drain to Source On Resistance VGS = 10V, ID = 75A - 2.5 3.2 mΩ Forward Transconductance VDS = 20V , ID = 75A (Note 4) - 180 - S
Input Capacitance Output Capacitance - 1360 1810 pF Reverse Transfer Capacitance - 595 800 pF
= 25V, VGS = 0V
V
DS
f = 1MHz
Total Gate Charge at 10V
V
= 60V, ID = 75A
Gate to Source Gate Charge - 60 - nC Gate to Drain “Miller” Charge - 47 - nC
DS
V
= 10V
GS
(Note 4, 5)
- 11400 15160 pF
- 169 220 nC
μA
®
MOSFET
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Turn-On Delay Time Turn-On Rise Time - 191 392 ns Turn-Off Delay Time - 335 680 ns Turn-Off Fall Time - 121 252 ns
Drain-Source Diode Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
Notes:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 0.71mH, IAS = 75A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C
3. ISD 75A, di/dt 200A/μs, VDD BV
4. Pulse Test: Pulse width 300μs, Duty Cycle 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
Maximum Continuous Drain to Source Diode Forward Current - - 235 A Maximum Pulsed Drain to Source Diode Forward Current - - 940 A Drain to Source Diode Forward Voltage V Reverse Recovery Time Reverse Recovery Charge - 77 - nC
, Starting TJ = 25°C
DSS
= 37.5V, ID = 75A
V
DD
R
= 25Ω, VGS = 10V
GEN
(Note 4, 5)
= 0V, I
GS
V
= 0V, I
GS
dI
/dt = 100A/μs (Note 4)
F
= 75A - - 1.3 V
SD
= 75A
SD
- 230 470 ns
-53-ns
FDA032N08 Rev. A
2
www.fairchildsemi.com
Page 3
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
3000
V
= 15.0 V
GS
10.0 V
1000
8.0 V
7.0 V
6.5 V
6.0 V
100
5.5 V
5.0 V
10
,Drain Current[A]
D
I
1
0.1
0.01 0.1 1
*Notes:
1. 250
2. T
μs Pulse Test
= 25oC
C
VDS,Drain-Source Voltage[V]
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperature
0.0030
500
100
175oC
10
,Drain Current[A]
D
I
1
2468
-55oC
25oC
*Notes:
1. V
2. 250
= 20V
DS
μs Pulse Test
VGS,Gate-Source Voltage[V]
400
FDA032N08 N-Channel PowerTrench
®
MOSFET
100
VGS = 10V
175oC
[Ω],
0.0025
DS(ON)
R
VGS = 20V
Drain-Source On-Resistance
0.0020 0 100 200 300 400
*Note: TC = 25oC
ID, Drain Current [A]
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
100000
C
iss
C
= Cgs + Cgd (Cds = shorted
iss
C
= Cds + C
oss
C
rss
= C
gd
gd
10
, Reverse Drain Current [A]
S
I
1
0.0 0.5 1.0 1.5
VSD, Body Diode Forward Voltage [V]
)
10
VDS = 15V
= 37.5V
V
8
DS
= 60V
V
DS
25oC
*Notes:
1. VGS = 0V
2. 250
μs Pulse Test
10000
*Note:
= 0V
1. V
GS
2. f = 1MHz
1000
C
oss
C
rss
Capacitances [pF]
, Gate-Source Voltage [V]
GS
V
6
4
2
100
FDA032N08 Rev. A
0.1 1 10 VDS, Drain-Source Voltage [V]
80
0
0 50 100 150 200
*Note: ID = 75A
Qg, Total G a te C harge [n C]
3
www.fairchildsemi.com
Page 4
Typical Performance Characteristics (Continued)
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation vs. vs. Temperature
1.2
1.1
Temperature
3.0
2.5
2.0
FDA032N08 N-Channel PowerTrench
1.0
, [Normalized]
DSS
BV
0.9
Drain-Source Breakdown Voltage
0.8
-100 -50 0 50 100 150 200
*Notes:
1. V
2. I
TJ, Junction Temperature [oC]
= 0V
GS
= 10mA
D
1.5
, [Normalized]
1.0
DS(on)
R
Drain-Source On-Resistance
0.5
0.0
-100 -50 0 50 100 150 200
*Notes:
1. V
2. I
TJ, Junction Temperature [oC]
GS
= 75A
D
= 10V
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs. Case Temperature
3000 1000
100
Operation in This Area
10
is Limited by R
1
, Drain Current [A]
D
I
0.1
0.01 1 10 100
DS(on)
*Notes:
= 25oC
1. T
C
2. T
= 175oC
J
3. Single Pulse
VDS, Drain-Source Voltage [V]
10μs
100μs 1ms
10ms
DC
250
200
150
100
, Drain Current [A]
D
I
Limited by package
50
0
25 50 75 100 125 150 175
TC, Case Temperature
o
[
C
]
Figure 11. Transient Thermal Response Curve
®
MOSFET
FDA032N08 Rev. A
]
JC
θ
Z
[
Thermal Response
0.5
0.1
0.01
0.005
0.5
0.2
0.1
0.05
0.02
0.01 Single pulse
-5
10
P
DM
t
1
t
2
*Notes:
1. Z
(t) = 0.4oC/W Max.
θ
JC
2. Duty Fact or, D= t
3. TJM - TC = PDM * Z
-4
10
-3
10
-2
10
-1
10
1/t2
θ
JC
0
10
Rectangular Pulse Duration [sec]
4
(t)
1
10
www.fairchildsemi.com
Page 5
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
FDA032N08 N-Channel PowerTrench
®
MOSFET
FDA032N08 Rev. A
Unclamped Inductive Switching Test Circuit & Waveforms
5
www.fairchildsemi.com
Page 6
Peak Diode Recovery dv/dt Test Circuit & Waveforms
g
p
g
p
+
+
V
V
DS
DS
_
_
L
LL
Sam e Type
Sam e Type
as DU T
as DU T
• dv/dt controlled by R
• dv/dt controlled by R
•ISDcontrolled by pulse period
•ISDcontrolled by pulse period
G
G
V
V
GS
GS
R
R
Driver
Driver
G
G
DUT
DUT
I
I
SD
SD
V
V
DD
DD
FDA032N08 N-Channel PowerTrench
®
MOSFET
V
V
GS
GS
( D rive r )
( D rive r )
I
I
SD
SD
( D U T )
( D U T )
V
V
DS
DS
( DUT )
( DUT )
G ate Pulse W idth
G ate Pulse W idth
G ate Pulse W idth
--------------------------
--------------------------
--------------------------
D =
D =
D =
Gate Pulse Period
Gate Pulse Period
Gate Pulse Period
IFM, Body Diode Forw ard Current
IFM, Body Diode Forw ard Current
I
I
RM
RM
Body Diode Reverse Current
Body Diode Reverse Current
Body Diode R ecovery dv/dt
Body Diode R ecovery dv/dt
V
V
SD
SD
Body Diode
Body Diode
Forward Volta
Forward Volta
e Dro
e Dro
di/dt
di/dt
10V
10V
V
V
DD
DD
FDA032N08 Rev. A
6
www.fairchildsemi.com
Page 7
Mechanical Dimensions
FDA032N08 N-Channel PowerTrench
TO-3PN
®
MOSFET
FDA032N08 Rev. A
Dimensions in Millimeters
7
www.fairchildsemi.com
Page 8
TRADEMARKS
tm
®
tm
tm
The following includes registered and unregister ed trademarks and se rvice marks, owned by Fairchild Semiconductor an d/or its glo bal subsidiaries, and is not intended to be an exhaustive list of all such trademarks.
Build it Now™ CorePLUS™ CorePOWER™ CROSSVOLT™ CTL™ Current Transfer Logic™ EcoSPARK EfficentMax™ EZSWITCH™ *
Fairchild Fairchild Semiconductor FACT Quiet Series™ FACT FAST FastvCore™ FlashWriter FPS™ F-PFS™
®
®
®
®
®
*
®
* EZSWITCH™ and FlashWriter
®
are trademarks of System General Corporation, used under license by Fairchild Semiconductor.
®
FRFET Global Power Resource Green FPS™ Green FPS™ e-Series™ GTO™ IntelliMAX™ ISOPLANAR™ MegaBuck™ MICROCOUPLER™ MicroFET™ MicroPak™ MillerDrive™ MotionMax™ Motion-SPM™ OPTOLOGIC OPTOPLANAR
®
®
®
PDP SPM™ Power-SPM™ PowerTrench PowerXS™
®
SM
Programmable Active Droop™
®
QFET QS™ Quiet Series™ RapidConfigure™
Saving our world, 1mW /W /kW at a time™ SmartMax™ SMART START™
®
SPM STEALTH™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SupreMOS™ SyncFET™
®
The Power Franchise
®
TinyBoost™ TinyBuck™ TinyLogic TINYOPTO™ TinyPower™ TinyPWM™ TinyWire™ μSerDes™
UHC Ultra FRFET™ UniFET™ VCX™ VisualMax™ XS™
®
®
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
FDA032N08 N-Channel PowerTrench
®
MOSFET
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the b ody or (b) support or su stain lif e, and (c) whose failure to perform when properly used in acco rdance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user.
ANTI-COUNTERFEITING POLICY
Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Farichild’s Anti-Counterfeiting Policy is also stated on our external website, www.fairchildsemi.com, under Sales Support
Counterfeiting of semiconductor parts is a growing problem i n the industry. Al l manufactures of semiconductor products are experiencing counte rfeiting of their parts. Customers who inadvertently purchase counterfeit par ts experience many problems such as loss of brand reputation, substandard perfor mance, fa iled application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the proliferation of counterfeit parts. Farichild stro ngly encourages customers to purchase Farichi ld parts either directly from Fairchild or from Auth orized Fairchild Distributors who are listed by country on our web page cited above. Products customers buy either from fairchild directly or from Authorized Fairchild Distributors are genuine parts, have full traceability, meet Fairchild’s quality standards for handing and storage and provide access to Farichild’s full range of up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Farichild is committed to combat this global problem and encourage o ur customers to do thei r part in stopping this p ractice by buying d irect or from authorized distributors.
PRODUCT STATUS DEFINITIONS Definition of Terms
.
2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
Datasheet Identification Product Status Definition
Advance Information Formative / In Design
Preliminary First Production
No Identification Needed Full Production
Obsolete Not In Production
Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.
Rev. I37
FDA032N08 Rev. A
8
www.fairchildsemi.com
Loading...