• High Performance Trench Technology for Extremely Low
• High Power and Current Handling Capability
• RoHS Compliant
= 2.5mΩ ( Typ.)@ VGS = 10V, ID = 75A
DS(on)
R
DS(on)
GSD
TO-3PN
Description
This N-Channel MOSFET is produced using Fairchild Semiconductor’s adcanced PowerTrench process that has been especially tailored to minimize the on-state resistance and yet
maintain superior switching performance.
Application
• DC to DC Convertors / Synchronous Rectification
®
MOSFET
D
G
S
MOSFET Maximum RatingsT
SymbolParameterFDA032N08Units
V
DSS
V
GSS
I
D
I
DM
E
AS
dv/dtPeak Diode Recovery dv/dt (Note 3)5.5V/ns
P
D
, T
T
J
STG
T
L
*Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 120A.
Drain to Source Voltage75V
Gate to Source Voltage±20V
D r a i n C urrent
Drain Current - Pulsed (Note 1)940A
Single Pulsed Avalanche Energy (Note 2)1995mJ
Power Dissipation
Operating and Storage Temperature Range-55 to +175
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
5. Essentially Independent of Operating Temperature Typical Characteristics
Maximum Continuous Drain to Source Diode Forward Current--235A
Maximum Pulsed Drain to Source Diode Forward Current--940A
Drain to Source Diode Forward VoltageV
Reverse Recovery Time
Reverse Recovery Charge-77- nC
, Starting TJ = 25°C
DSS
= 37.5V, ID = 75A
V
DD
R
= 25Ω, VGS = 10V
GEN
(Note 4, 5)
= 0V, I
GS
V
= 0V, I
GS
dI
/dt = 100A/μs (Note 4)
F
= 75A- -1.3V
SD
= 75A
SD
-230470ns
-53-ns
FDA032N08 Rev. A
2
www.fairchildsemi.com
Page 3
Typical Performance Characteristics
Figure 1. On-Region CharacteristicsFigure 2. Transfer Characteristics
3000
V
= 15.0 V
GS
10.0 V
1000
8.0 V
7.0 V
6.5 V
6.0 V
100
5.5 V
5.0 V
10
,Drain Current[A]
D
I
1
0.1
0.010.11
*Notes:
1. 250
2. T
μs Pulse Test
= 25oC
C
VDS,Drain-Source Voltage[V]
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation vs.
vs. Temperature
1.2
1.1
Temperature
3.0
2.5
2.0
FDA032N08 N-Channel PowerTrench
1.0
, [Normalized]
DSS
BV
0.9
Drain-Source Breakdown Voltage
0.8
-100-50050100150200
*Notes:
1. V
2. I
TJ, Junction Temperature [oC]
= 0V
GS
= 10mA
D
1.5
, [Normalized]
1.0
DS(on)
R
Drain-Source On-Resistance
0.5
0.0
-100-50050100150200
*Notes:
1. V
2. I
TJ, Junction Temperature [oC]
GS
= 75A
D
= 10V
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
vs. Case Temperature
3000
1000
100
Operation in This Area
10
is Limited by R
1
, Drain Current [A]
D
I
0.1
0.01
110100
DS(on)
*Notes:
= 25oC
1. T
C
2. T
= 175oC
J
3. Single Pulse
VDS, Drain-Source Voltage [V]
10μs
100μs
1ms
10ms
DC
250
200
150
100
, Drain Current [A]
D
I
Limited by package
50
0
255075100125150175
TC, Case Temperature
o
[
C
]
Figure 11. Transient Thermal Response Curve
®
MOSFET
FDA032N08 Rev. A
]
JC
θ
Z
[
Thermal Response
0.5
0.1
0.01
0.005
0.5
0.2
0.1
0.05
0.02
0.01
Single pulse
-5
10
P
DM
t
1
t
2
*Notes:
1. Z
(t) = 0.4oC/W Max.
θ
JC
2. Duty Fact or, D= t
3. TJM - TC = PDM * Z
-4
10
-3
10
-2
10
-1
10
1/t2
θ
JC
0
10
Rectangular Pulse Duration [sec]
4
(t)
1
10
www.fairchildsemi.com
Page 5
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
FDA032N08 N-Channel PowerTrench
®
MOSFET
FDA032N08 Rev. A
Unclamped Inductive Switching Test Circuit & Waveforms
5
www.fairchildsemi.com
Page 6
Peak Diode Recovery dv/dt Test Circuit & Waveforms
g
p
g
p
+
+
V
V
DS
DS
_
_
L
LL
Sam e Type
Sam e Type
as DU T
as DU T
• dv/dt controlled by R
• dv/dt controlled by R
•ISDcontrolled by pulse period
•ISDcontrolled by pulse period
G
G
V
V
GS
GS
R
R
Driver
Driver
G
G
DUT
DUT
I
I
SD
SD
V
V
DD
DD
FDA032N08 N-Channel PowerTrench
®
MOSFET
V
V
GS
GS
( D rive r )
( D rive r )
I
I
SD
SD
( D U T )
( D U T )
V
V
DS
DS
( DUT )
( DUT )
G ate Pulse W idth
G ate Pulse W idth
G ate Pulse W idth
--------------------------
--------------------------
--------------------------
D =
D =
D =
Gate Pulse Period
Gate Pulse Period
Gate Pulse Period
IFM, Body Diode Forw ard Current
IFM, Body Diode Forw ard Current
I
I
RM
RM
Body Diode Reverse Current
Body Diode Reverse Current
Body Diode R ecovery dv/dt
Body Diode R ecovery dv/dt
V
V
SD
SD
Body Diode
Body Diode
Forward Volta
Forward Volta
e Dro
e Dro
di/dt
di/dt
10V
10V
V
V
DD
DD
FDA032N08 Rev. A
6
www.fairchildsemi.com
Page 7
Mechanical Dimensions
FDA032N08 N-Channel PowerTrench
TO-3PN
®
MOSFET
FDA032N08 Rev. A
Dimensions in Millimeters
7
www.fairchildsemi.com
Page 8
TRADEMARKS
tm
®
tm
tm
The following includes registered and unregister ed trademarks and se rvice marks, owned by Fairchild Semiconductor an d/or its glo bal subsidiaries, and is not
intended to be an exhaustive list of all such trademarks.
Build it Now™
CorePLUS™
CorePOWER™
CROSSVOLT™
CTL™
Current Transfer Logic™
EcoSPARK
EfficentMax™
EZSWITCH™ *
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY
PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY
THEREIN, WHICH COVERS THESE PRODUCTS.
FDA032N08 N-Channel PowerTrench
®
MOSFET
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE
EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are
intended for surgical implant into the b ody or (b) support or su stain lif e,
and (c) whose failure to perform when properly used in acco rdance with
instructions for use provided in the labeling, can be reasonably
expected to result in a significant injury of the user.
ANTI-COUNTERFEITING POLICY
Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Farichild’s Anti-Counterfeiting Policy is also stated on our external website,
www.fairchildsemi.com, under Sales Support
Counterfeiting of semiconductor parts is a growing problem i n the industry. Al l manufactures of semiconductor products are experiencing counte rfeiting of their
parts. Customers who inadvertently purchase counterfeit par ts experience many problems such as loss of brand reputation, substandard perfor mance, fa iled
application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the
proliferation of counterfeit parts. Farichild stro ngly encourages customers to purchase Farichi ld parts either directly from Fairchild or from Auth orized Fairchild
Distributors who are listed by country on our web page cited above. Products customers buy either from fairchild directly or from Authorized Fairchild
Distributors are genuine parts, have full traceability, meet Fairchild’s quality standards for handing and storage and provide access to Farichild’s full range of
up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and
warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Farichild is
committed to combat this global problem and encourage o ur customers to do thei r part in stopping this p ractice by buying d irect or from authorized distributors.
PRODUCT STATUS DEFINITIONS
Definition of Terms
.
2. A critical component in any component of a life support, device, or
system whose failure to perform can be reasonably expected to cause
the failure of the life support device or system, or to affect its safety or
effectiveness.
Datasheet IdentificationProduct StatusDefinition
Advance InformationFormative / In Design
PreliminaryFirst Production
No Identification NeededFull Production
ObsoleteNot In Production
Datasheet contains the design specifications for product development. Specifications
may change in any manner without notice.
Datasheet contains preliminary data; supplementary data will be published at a later
date. Fairchild Semiconductor reserves the right to make changes at any time without
notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild
Semiconductor. The datasheet is for reference information only.
Rev. I37
FDA032N08 Rev. A
8
www.fairchildsemi.com
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