These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary, planar
stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficient switched mode power supplies and active power factor
correction.
Figure 7. Breakdown Voltage VariationFigure 8. On-Resistance Variation
vs. Temperature vs. Temperature
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
1.2
1.1
1.0
, (Normalized)
DSS
BV
0.9
Drain-Source Breakdow n Vol t age
0.8
-100-50050100150200
* Notes :
1. V
2. I
TJ, Junction Temperature [oC]
= 0 V
GS
= 250 µA
D
3.0
2.5
2.0
1.5
, (Normalized)
1.0
DS(ON)
R
0.5
Drain-Source On-Resistance
0.0
-100-50050100150200
TJ, Junction Temperature [oC]
* Notes :
1. V
= 10 V
GS
2. I
= 8.3 A
D
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
vs. Case Temperature
10
10
10
2
1
0
Operation in This Area
is Limited by R
DS(on)
20
10 µs
100 ms
DC
100 µs
1 ms
10 ms
15
10
, Drain Current [A]
I
D
-1
10
-2
10
0
10
1
10
* Notes :
= 25 oC
1. T
C
2. T
= 150 oC
J
3. Single Pulse
2
10
VDS, Drain-Source Voltage [V]
, Drain Current [A]
D
I
5
0
255075100125150
TC, Case Temperature [oC]
Figure 11. Transient Thermal Response Curve
0
10
D=0.5
0.2
-1
10
0.1
0.05
0.02
(t), Thermal Response
0.01
θJC
Z
-2
10
-5
10
-4
10
single pulse
10
-3
t1, Square Wave Pulse Duration [sec]
* Notes :
(t) = 0.6 oC/W Max.
1. Z
θJC
2. D u ty F a c to r, D = t
3. TJM - TC = PDM * Z
-2
10
-1
10
1/t2
(t)
θJC
0
10
1
10
FDA16N50 / FDA16N50_F109 Rev. B1
4www.fairchildsemi.com
Page 5
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
FDA16N50 / FDA16N50_F109 Rev. B1
Unclamped Inductive Switching Test Circuit & Waveforms
5www.fairchildsemi.com
Page 6
Peak Diode Recovery dv/dt Test Circuit & Waveforms
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
FDA16N50 / FDA16N50_F109 Rev. B1
6www.fairchildsemi.com
Page 7
Mechanical Dimensions
0
0
ø
5
5
5
5
15.60
13.60
3.20
±0.10
9.60
±0.20
±0.20
±0.20
TO-3P
±0.20
3.80
4.80
1.50
±0.2
+0.1
–0.0
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
±0.20
18.70
±0.20
±0.20
12.76
±0.20
19.90
±0.20
23.40
13.90
2.00
±0.20
3.00
1.00
±0.20
±0.20
±0.20
3.50
±0.30
1.40
±0.2
16.50
5.45TYP
[5.45
±0.30
]
5.45TYP
[5.45
±0.30
]
0.60
+0.1
–0.0
FDA16N50 / FDA16N50_F109 Rev. B1
7www.fairchildsemi.com
Dimensions in Millimeters
Page 8
Mechanical Dimensions
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
TO-3PN
FDA16N50 / FDA16N50_F109 Rev. B1
Dimensions in Millimeters
8www.fairchildsemi.com
Page 9
TRADEMARKS
®
The following are registered and unregistered trademarks and service marks Fairchild Semiconductor owns or is authorized to use and
is not intended to be an exhaustive list of all such trademarks.
®
ACEx
Build it Now™
CorePLUS™
CROSSVOLT™
CTL™
Current Transfer Logic™
EcoSPARK
Fairchild
®
®
Fairchild Semiconductor
FACT Quiet Series™
®
FACT
®
FAST
FastvCore™
FPS™
®
FRFET
Global Power Resource
Green FPS™
Green FPS™ e-Series™
GTO™
i-Lo™
IntelliMAX™
ISOPLANAR™
MegaBuck™
MICROCOUPLER™
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS
HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF
THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE
UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF
FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE
PRODUCTS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR
SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body, or
(b) support or sustain life, and (c) whose failure to perform
when properly used in accordance with instructions for use
2. A critical component is any component of a life support
device or system whose failure to perform can be reasonably
expected to cause the failure of the life support device or
system, or to affect its safety or effectiveness.
provided in the labeling, can be reasonably expected to result
in significant injury to the user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance InformationFormative or In Design
This datasheet contains the design specifications for product development.
Specifications may change in any manner without notice.
This datasheet contains preliminary data; supplementary data will be pub-
PreliminaryFirst Production
lished at a later date. Fairchild Semiconductor reserves the right to make
changes at any time without notice to improve design.
No Identification NeededFull Production
This datasheet contains final specifications. Fairchild Semiconductor reserves
the right to make changes at any time without notice to improve design.
This datasheet contains specifications on a product that has been discontin-
ObsoleteNot In Production
ued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. I30
www.fairchildsemi.com9
FDA16N50 / FDA16N50_F109 Rev. B1
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