Datasheet FDA16N50, FDA16N50-F109 Datasheet (Fairchild)

Page 1
FDA16N50 / FDA16N50_F109
500V N-Channel MOSFET
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
July 2007
TM
UniFET
• 16.5A, 500V, R
• Low gate charge ( typical 32 nC)
•Low C
•Fast switching
• 100% avalanche tested
• Improved dv/dt capability
( typical 20 pF)
rss
= 0.38Ω @VGS = 10 V
DS(on)
GSD
TO-3P
FDA Series
Description
These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology.
This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient switched mode power supplies and active power factor correction.
D
G
S
Absolute Maximum Ratings
Symbol Parameter FDA16N50 Unit
V
DSS
I
D
I
DM
V
GSS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt P
D
T
J, TSTG
T
L
Drain-Source Voltage 500 V Drain Current - Continuous (TC = 25°C)
- Continuous (T Drain Current - Pulsed Gate-Source voltage ±30 V Single Pulsed Avalanche Energy Avalanche Current (Note 1) 16.5 A Repetitive Avalanche Energy (Note 1) 20.5 mJ
Power Dissipation (TC = 25°C)
- Derate above 25°C Operating and Storage Temperature Range -55 to +150 °C Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
= 100°C)
C
(Note 1)
(Note 2)
(Note 3) 4.5 V/ns
16.5
9.9 66 A
780 mJ
205
2.1
300 °C
A A
W
W/°C
Thermal Characteristics
Symbol Parameter Typ Max Unit
R
θJC
R
θCS
R
θJA
©2007 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com
FDA16N50 / FDA16N50_F109 Rev. B1
Thermal Resistance, Junction-to-Case -- 0.6 °C/W Thermal Resistance, Case-to-Sink Typ. 0.24 -- °C/W Thermal Resistance, Junction-to-Ambient -- 40 °C/W
Page 2
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDA16N50 FDA16N50 TO-3P - - 30 FDA16N50 FDA16N50_F109 TO-3PN - - 30
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
Electrical Characteristics T
= 25°C unless otherwise noted
C
Symbol Parameter Conditions Min. Typ. Max Units
Off Characteristics
BV
DSS
∆BV / ∆T
I
DSS
I
GSSF
I
GSSR
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Dynamic Characteristics
C
iss
C
oss
C
rss
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
Drain-Source Diode Characteristics and Maximum Ratings
I
S
I
SM
V
SD
t
rr
Q
rr
Drain-Source Breakdown Voltage VGS = 0V, ID = 250µA 500 -- -- V Breakdown Voltage Temperature
DSS
Coefficient
J
Zero Gate Voltage Drain Current VDS = 500V, VGS = 0V
I
= 250µA, Referenced to 25°C--0.5--V/°C
D
V
= 400V, TC = 125°C
DS
--
--
--
--
1
10
µA µA
Gate-Body Leakage Current, Forward VGS = 30V, VDS = 0V -- -- 100 nA Gate-Body Leakage Current, Reverse VGS = -30V, VDS = 0V -- -- -100 nA
Gate Threshold Voltage VDS = VGS, ID = 250µA3.0--5.0V Static Drain-Source
On-Resistance Forward Transconductance VDS = 40V, ID = 8.3A
Input Capacitance VDS = 25V, VGS = 0V, Output Capacitance -- 235 310 pF
V
= 10V, ID = 8.3A -- 0.31 0.38 Ω
GS
(Note 4)
-- 23 -- S
-- 1495 1945 pF
f = 1.0MHz
Reverse Transfer Capacitance -- 20 30 pF
Turn-On Delay Time VDD = 250V, ID = 16A
R
= 25Ω
Turn-On Rise Time -- 150 310 ns
G
-- 40 90 ns
Turn-Off Delay Time -- 65 140 ns Turn-Off Fall Time -- 80 170 ns Total Gate Charge VDS = 400V, ID = 16A
V
= 10V
Gate-Source Charge -- 8.5 -- nC
GS
Gate-Drain Charge -- 14 -- nC
(Note 4, 5)
-- 32 45 nC
(Note 4, 5)
Maximum Continuous Drain-Source Diode Forward Current -- -- 9.2 A Maximum Pulsed Drain-Source Diode Forward Current -- -- 37 A Drain-Source Diode Forward Voltage VGS = 0V, IS = 16.5A -- -- 1.4 V Reverse Recovery Time VGS = 0V, IS = 16A
dI
/dt =100A/µs (Note 4)
Reverse Recovery Charge -- 5.0 -- µC
F
-- 490 -- ns
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 5.1mH, IAS = 16.5A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C
3. ISD ≤ 16.5A, di/dt ≤ 200A/µs, VDD ≤ BV
4. Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
, Starting TJ = 25°C
DSS
FDA16N50 / FDA16N50_F109 Rev. B1
2 www.fairchildsemi.com
Page 3
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
-55oC
, Drain Current [A] I
10
10
10
D
-1
10
V
2
Top : 15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
1
Bottom : 5.5 V
0
-1
10
GS
0
10
VDS, Drain-Source Voltage [V]
* Notes :
1. 250
2. T
1
10
µs Pulse Test
= 25oC
C
1
10
150oC
25oC
, Drain Current [A]
D
I
0
10
24681012
VGS, Gate-Source Voltage [V]
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperatue
VGS = 10V
1
10
0.6
0.5
0.4
* Notes :
1. V
2. 250
= 40V
DS
µs Pulse Test
0.3
[Ω], Drain-Source On-Resistance
DS(ON)
0.2
R
0 5 10 15 20 25 30 35 40
VGS = 20V
* Note : TJ = 25oC
ID, Drain Current [A]
, Reverse Drain Current [A]
DR
I
0
10
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4
150oC
25oC
VSD, Source-Drain voltage [V]
* Notes :
1. V
2. 250
= 0V
GS
µs Pulse Test
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
4000
3000
C
oss
2000
Capacitanc es [pF]
1000
0
-1
10
C
iss
C
rss
VDS, Drain-Source Voltage [V]
C
= Cgs + Cgd (Cds = shorted)
iss
= Cds + C
C
oss
gd
C
= C
rss
gd
* Note ;
1. V
= 0 V
GS
2. f = 1 MHz
0
10
1
10
12
10
8
6
4
, Gate-Source Voltage [V]
2
GS
V
0
0 10203040
VDS = 100V VDS = 250V
VDS = 400V
* Note : ID = 16A
QG, Total Gate Charge [nC]
FDA16N50 / FDA16N50_F109 Rev. B1
3 www.fairchildsemi.com
Page 4
Typical Performance Characteristics (Continued)
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation
vs. Temperature vs. Temperature
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
1.2
1.1
1.0
, (Normalized)
DSS
BV
0.9
Drain-Source Breakdow n Vol t age
0.8
-100 -50 0 50 100 150 200
* Notes :
1. V
2. I
TJ, Junction Temperature [oC]
= 0 V
GS
= 250 µA
D
3.0
2.5
2.0
1.5
, (Normalized)
1.0
DS(ON)
R
0.5
Drain-Source On-Resistance
0.0
-100 -50 0 50 100 150 200
TJ, Junction Temperature [oC]
* Notes :
1. V
= 10 V
GS
2. I
= 8.3 A
D
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs. Case Temperature
10
10
10
2
1
0
Operation in This Area is Limited by R
DS(on)
20
10 µs
100 ms
DC
100 µs
1 ms
10 ms
15
10
, Drain Current [A] I
D
-1
10
-2
10
0
10
1
10
* Notes :
= 25 oC
1. T
C
2. T
= 150 oC
J
3. Single Pulse
2
10
VDS, Drain-Source Voltage [V]
, Drain Current [A]
D
I
5
0
25 50 75 100 125 150
TC, Case Temperature [oC]
Figure 11. Transient Thermal Response Curve
0
10
D=0.5
0.2
-1
10
0.1
0.05
0.02
(t), Thermal Response
0.01
θJC
Z
-2
10
-5
10
-4
10
single pulse
10
-3
t1, Square Wave Pulse Duration [sec]
* Notes :
(t) = 0.6 oC/W Max.
1. Z
θJC
2. D u ty F a c to r, D = t
3. TJM - TC = PDM * Z
-2
10
-1
10
1/t2
(t)
θJC
0
10
1
10
FDA16N50 / FDA16N50_F109 Rev. B1
4 www.fairchildsemi.com
Page 5
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
FDA16N50 / FDA16N50_F109 Rev. B1
Unclamped Inductive Switching Test Circuit & Waveforms
5 www.fairchildsemi.com
Page 6
Peak Diode Recovery dv/dt Test Circuit & Waveforms
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
FDA16N50 / FDA16N50_F109 Rev. B1
6 www.fairchildsemi.com
Page 7
Mechanical Dimensions
0
0
ø
5 5
5
5
15.60
13.60
3.20
±0.10
9.60
±0.20
±0.20
±0.20
TO-3P
±0.20
3.80
4.80
1.50
±0.2
+0.1 –0.0
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
±0.20
18.70
±0.20
±0.20
12.76
±0.20
19.90
±0.20
23.40
13.90
2.00
±0.20
3.00
1.00
±0.20
±0.20
±0.20
3.50
±0.30
1.40
±0.2
16.50
5.45TYP
[5.45
±0.30
]
5.45TYP
[5.45
±0.30
]
0.60
+0.1 –0.0
FDA16N50 / FDA16N50_F109 Rev. B1
7 www.fairchildsemi.com
Dimensions in Millimeters
Page 8
Mechanical Dimensions
FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
TO-3PN
FDA16N50 / FDA16N50_F109 Rev. B1
Dimensions in Millimeters
8 www.fairchildsemi.com
Page 9
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®
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FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
provided in the labeling, can be reasonably expected to result in significant injury to the user.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information Formative or In Design
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
This datasheet contains preliminary data; supplementary data will be pub-
Preliminary First Production
lished at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
No Identification Needed Full Production
This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
This datasheet contains specifications on a product that has been discontin-
Obsolete Not In Production
ued by Fairchild semiconductor. The datasheet is printed for reference infor­mation only.
Rev. I30
www.fairchildsemi.com9
FDA16N50 / FDA16N50_F109 Rev. B1
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