CATALYST CAT1161-2 Service Manual

CAT1161/2 (16K)
Supervisory Circuits with I2C Serial CMOS EEPROM, Precision Reset Controller and Watchdog Timer
FEATURES
Watchdog monitors SDA signal (CAT1161)
400kHz I
2
C bus compatible
2.7V to 6.0V operation
Low power CMOS technology
16-Byte page write buffer
— VCC lock out — Write protect pin, WP
DESCRIPTION
The CAT1161/2 is a complete memory and supervisory solution for microcontroller-based systems. A serial EEPROM memory (16K) with hardware memory write protection, a system power supervisor with brown out protection and a watchdog timer are integrated together in low power CMOS technology. Memory interface is via an I2C bus.
The 1.6-second watchdog circuit returns a system to a known good state if a software or hardware glitch halts or “hangs” the system. The CAT1161 watchdog monitors the SDA line, making an additional PC board trace unnecessary. The lower cost CAT1162 does not have a watchdog timer.
Active high or low reset
— Precision power supply voltage monitor — 5V, 3.3V and 3V systems — Five threshold voltage options
1,000,000 Program/Erase cycles
Manual Reset
100 Year data retention
8-pin DIP or 8-pin SOIC
Commercial and industrial temperature ranges
voltages support 5V, 3.3V and 3V systems. If power supply voltages are out of tolerance reset signals become active, preventing the system microcontroller, ASIC or peripherals from operating. Reset signals become inactive typically 200 ms after the supply voltage exceeds the reset threshold level. With both active high and low reset signals, interface to microcontrollers and other ICs is simple. In addition, a reset pin can be used as a debounced input for push-button manual reset capability.
The CAT1161/2 memory features a 16-byte page. In addition, hardware data protection is provided by a write protect pin WP and by a VCC sense circuit that prevents writes to memory whenever VCC falls below the reset threshold or until VCC reaches the reset threshold during power up.
The power supply monitor and reset circuit protects memory and system controllers during power up/down and against brownout conditions. Five reset threshold
PIN CONFIGURATION
DC
RESET
CAT1161/2
WP
GND
DC = Do not connect
Part Dash Minimum Maximum Number Threshold Threshold
-45 4.50 4.75
-42 4.25 4.50
-30 3.00 3.15
-28 2.85 3.00
-25 2.55 2.70
© 2002 by Catalyst Semiconductor, Inc. Characteristics subject to change without notice
V
CC
RESET SCL SDA
Available packages include an 8-pin DIP and a surface mount, 8-pin SO package.
BLOCK DIAGRAM
EXTERNAL LOAD
V
CC
GND
SDA
WP
Only for
CAT1161
D
WORD ADDRESS
BUFFERS
START/STOP
LOGIC
CONTROL
LOGIC
RESET Controller
WATCHDOG
OUT
ACK
Precision
Vcc Monitor
RESET RESET
XDEC
SENSE AMPS
SHIFT REGISTERS
COLUMN
DECODERS
16K
EEPROM
DATA IN STORAGE
HIGH VOLT A GE/
TIMING CONTROL
STATE COUNTERS SLAVE
ADDRESS COMPARATORS
SCL
Doc No. 3002, Rev. D
CAT1161/2
ABSOLUTE MAXIMUM RATINGS
Temperature Under Bias ................. –55°C to +125°C
Storage Temperature....................... –65°C to +150°C
Voltage on any Pin with
Respect to Ground
VCC with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (TA = 25°C) ................................... 1.0W
Lead Soldering Temperature (10 secs)............ 300°C
Output Short Circuit Current Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specifica­tion is not implied. Exposure to any absolute maximum rating for extended periods may affect device perfor­mance and reliability.
(1)
............ –2.0V to +VCC +2.0V
(2)
........................ 100 mA
PIN FUNCTIONS
Pin No. Pin Name Function
1 DC Do Not Connect 2 RESET Active Low Reset I/O
3 WP Write Protect 4 GND Ground 5 SDA Serial Data/Address
6 SCL Clock Input 7 RESET Active High Reset I/O 8VCCPower Supply
RELIABILITY CHARACTERISTICS
Symbol Parameter Reference Test Method Min Max Units
(3)
N T V I
END DR ZAP
LTH
(3)
(3)
(3)(4)
Endurance MIL-STD-883, Test Method 1033 1,000,000 Cycles/Byte Data Retention MIL-STD-883, Test Method 1008 100 Years ESD Susceptibility MIL-STD-883, Test Method 3015 2000 Volts Latch-Up JEDEC Standard 17 100 mA
D.C. OPERATING CHARACTERISTICS
VCC = +2.7V to +6.0V, unless otherwise specified.
Symbol Parameter Test Conditions Min Typ Max Units
I
CC
I
SB
Power Supply Current f
= 100 KHz 3 mA
SCL
Standby Current VCC = 3.3V 40 µA
VCC = 5 50 µA
I
LI
I
LO
V
IL
V
IH
V
OL1
Input Leakage Current VIN = GND or V Output Leakage Current VIN = GND or V
CC CC
2 µA
10 µA Input Low Voltage -1 VCC x 0.3 V Input High Voltage V
X 0.7 V
CC
+ 0.5 V
CC
Output Low Voltage (SDA) IOL = 3 mA, VCC = 3.0V 0.4 V
Note: (1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is VCC +0.5V, which may overshoot to VCC +2.0V for periods of less than 20 ns. (2) Output shorted for no more than one second. No more than one output shorted at a time. (3) This parameter is tested initially and after a design or process change that affects the parameter. (4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V.
Doc. No. 3002, Rev. D
2
CAT1161/2
CAPACITANCE
TA = 25˚C, f = 1.0 MHz, VCC = 5V
Symbol Test Conditions Max Units
(1)
C
I/O
(1)
C
IN
A.C. CHARACTERISTICS
VCC=2.7V to 6.0V unless otherwise specified. Output Load is 1 TTL Gate and 100pF.
SYMBOL PARAMETER Min Max Min Max Units
Input/Output Capacitance (SDA) V
= 0V 8 pF
I/O
Input Capacitance (SCL) VIN = 0V 6 pF
VCC = 2.7V - 6V VCC = 4.5V - 5.5V
F
SCL
(1)
T
I
t
AA
t
BUF
t
HD:STA
t
LOW
t
HIGH
t
SU:STA
t
HD:DAT
t
SU:DAT
(1)
t
R
(1)
t
F
t
SU:STO
(1)
Clock Frequency 100 400 kHz Noise Suppresion Time 200 200 ns
Constant at SCL, SDA Inputs SLC Low to SDA Data Out 3.5 1 µs
and ACK Out Time the Bus Must be Free Before 4.7 1.2 µs
a New Transmission Can Start Start Condition Hold Time 4 0.6 µs Clock Low Period 4.7 1.2 µs Clock High Period 4 0.6 µs
Start Condition Setup Time 4.7 0.6 µs (for a Repeated Start Condition)
Data in Hold Time 0 0 ns Data in Setup Time 50 50 ns SDA and SCL Rise Time 1 0.3 µs SDA and SCL Fall Time 300 300 ns Stop Condition Setup Time 4 0.6 µs
t
DH
POWER-UP TIMING
Data Out Hold Time 100 100 ns
(1)(2)
Symbol Parameter Max Units
t
PUR
t
PUW
Power-up to Read Operation 1 ms Power-up to Write Operation 1 ms
WRITE CYCLE LIMITS
Symbol Parameter Min Typ Max Units
t
WR
The write cycle time is the time from a valid stop condition of a write sequence to the end of the internal program/erase cycle. During the write cycle, the bus interface circuits are disabled, SDA is allowed to remain high, and the device does not respond to its slave address.
NOTE: (1) This parameter is tested initially and after a design or process change that affects the parameter. (2) t
PUR
Write Cycle Time 10 ms
and t
are the delays required from the time V
PUW
is stable until the specific operation can be initiated.
CC
3
Doc No. 3002, Rev. D
CAT1161/2
RESET CIRCUIT CHARACTERISTICS
Symbol Parameter Min Typ Max Units
t
GLITCH
Glitch Reject Pulse Width 100 ns V V V
RT OLRS OHRS
Reset Threshold Hystersis 15 mV
Reset Output Low Voltage (I
=1mA) 0.4 V
OLRS
Reset Output High Voltage VCC-0.75 V
Reset Threshold (V
=5V) 4.50 4.75
CC
(CAT1161/2-45)
Reset Threshold (VCC=5V) 4.25 4.50
(CAT1161/2-42)
V
TH
Reset Threshold (VCC=3.3V) 3.00 3.15
(CAT1161/2-30)
Reset Threshold (V
=3.3V) 2.85 3.00
CC
V
(CAT1161/2-28)
Reset Threshold (VCC=3V) 2.55 2.70
(CAT1161/2-25) t
PURST
Power-Up Reset Timeout 130 270 ms twp Watchdog Period 1.6 sec t
RPD
V
RVALID
VTH to RESET Output Delay 5 µs
RESET Output Valid 1 V
Doc. No. 3002, Rev. D
4
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