Analog Devices OP467ARC-883C, OP467GP, OP467GS, OP467GS-REEL, OP467GBC, OP467AY-883C Datasheet
Specifications and Main Features
Frequently Asked Questions
User Manual
Quad Precision, High-Speed
1
2
3
4
5
6
7
8
OUT A
–IN A
+IN A
V+
+IN B
–IN B
OUT B
16
15
14
13
12
11
10
9
OUT D
–IN D
+IN D
V–
+IN C
–IN C
OUT C
NC
NC
OP467
NC = NO CONNECT
a
FEATURES
High Slew Rate – 170 V/s
Wide Bandwidth – 28 MHz
Fast Settling Time – <200 ns to 0.01%
Low Offset Voltage – <500 V
Unity-Gain Stable
Low Voltage Operation ⴞ5 V to ⴞ15 V
Low Supply Current – <10 mA
Drives Capacitive Loads
APPLICATIONS
High-Speed Image Display Drivers
High Frequency Active Filters
Fast Instrumentation Amplifiers
High-Speed Detectors
Integrators
Photo Diode Preamps
GENERAL DESCRIPTION
The OP467 is a quad, high-speed, precision operational amplifier. It offers the performance of a high-speed op amp combined
with the advantages of a precision operational amplifier all in a
single package. The OP467 is an ideal choice for applications
where, traditionally, more than one op amp was used to achieve
this level of speed and precision.
The OP467’s internal compensation ensures stable unity-gain
operation, and it can drive large capacitive loads without oscillation. With a gain bandwidth product of 28 MHz driving a 30 pF
load, output slew rate in excess of 170 V/µs, and settling time
to 0.01% in less than 200 ns, the OP467 provides excellent
dynamic accuracy in high-speed data-acquisition systems. The
channel-to-channel separation is typically 60 dB at 10 MHz.
The dc performance of OP467 includes less than 0.5 mV of
offset, voltage noise density below 6 nV/√Hz and total supply
current under 10 mA. Common-mode rejection and power
supply rejection ratios are typically 85 dB. PSRR is maintained
to better than 40 dB with input frequencies as high as 1 MHz.
The low offset and drift plus high speed and low noise, make the
OP467 usable in applications such as high-speed detectors and
instrumentation.
The OP467 is specified for operation from ±5 V to ±15 V over
the extended industrial temperature range (–40°C to +85°C) and
is available in 14-lead plastic and ceramic DIP, plus 16-lead
SOIC and 20-terminal LCC surface mount packages.
Contact your local sales office for MIL-STD-883 data sheet
and availability.
16-Lead SOIC
(S Suffix)
–IN
Operational Amplifier
OP467
PIN CONNECTIONS
14-Lead Ceramic DIP (Y Suffix) and
14-Lead Plastic DIP (P Suffix)
OUT A
–IN A
+IN A
+IN B
–IN B
OUT B
1
2
++
3
4
V+
OP467
5
++
6
7
+IN
14
OUT D
13
–IN D
+IN D
12
11
V–
10
+IN C
9
–IN C
8
OUT C
20-Terminal LCC
(RC Suffix)
–IN A
3
+IN A
4
NC
5
V+
NC
+IN B
OP467
6
(TOP VIEW)
7
8
9
10 11
–IN B
NC = NO CONNECT
OUT A
OUT B
NC
NC
OUT D
2012
12 13
OUT C
–IN D
19
+IN D
18
NC
17
16
V–
NC
15
14
+IN C
–IN C
V+
OUT
V–
REV. D
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
VIN = 5 V Step2.5MHz
To 0.01%, VIN = 5 V Step280ns
45Degrees
NOISE PERFORMANCE
Voltage NoiseeN p-pf = 0.1 Hz to 10 Hz0.15µV p-p
Voltage Noise Densitye
Current Noise Densityi
Specifications subject to change without notice.
N
N
f = 1 kHz7nV/√Hz
f = 1 kHz8pA/√Hz
REV. D
–3–
OP467
WAFER TEST LIMITS
1
(@ VS = ⴞ15.0 V, TA = 25ⴗC unless otherwise noted.)
ParameterSymbolConditionsLimitUnit
Offset VoltageV
Input Bias CurrentI
Input Offset CurrentI
Input Voltage Range
2
OS
B
OS
Common-Mode Rejection RatioCMRRV
VCM = 0 V600nA max
VCM = 0 V100nA max
= ±12 V80dB min
CM
±0.5mV max
±12V min/max
Power Supply Rejection RatioPSRRV = ±4.5 V to ±18 V96dB min
Large Signal Voltage GainA
Output Voltage RangeV
Supply CurrentI
NOTES
1
Electrical tests and wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard
product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.