Analog Devices AD7564BRS, AD7564BR, AD7564BN, AD7564ARS-B, AD7564AR-B Datasheet

LC2MOS

a

+3.3 V/+5 V, Low Power, Quad 12-Bit DAC

FEATURES
Four 12-Bit DACs in One Package
4-Quadrant Multiplication
Separate References
Single Supply Operation
Guaranteed Specifications with +3.3 V/+5 V Supply
Low Power
Versatile Serial Interface
Simultaneous Update Capability
Reset Function
28-Pin SOIC, SSOP and DIP Packages

APPLICATIONS
Process Control
Portable Instrumentation
General Purpose Test Equipment

FSIN

CLKIN

SDIN

AD7564

FUNCTIONAL BLOCK DIAGRAM

VDDDGND

AGND

NC

INPUT

LATCH A

INPUT

LATCH B

INPUT

LATCH C

INPUT

LATCH D

12

CONTROL LOGIC

+

INPUT SHIFT

REGISTER

A0 A1

SDOUT

V D

REF

DAC A

12

LATCH

DAC B

12

LATCH

DAC C

12

LATCH

DAC D

12

LATCH

V C

REF

12

12

12

12

V B

REF

AD7564

V A

REF

DAC A

DAC B

DAC C

DAC D

R A

FB

I A

OUT1

I A

OUT2

R B

FB

I B

OUT1

I B

OUT2

R C

FB

I C

OUT1

I C

OUT2

R D

FB

I D

OUT1

I D

OUT2

CLR

LDAC

GENERAL DESCRIPTION

The AD7564 contains four 12-bit DACs in one monolithic
device. The DACs are standard current output with separate

, I

, I

V

REF

OUT1

and RFB terminals. These DACs operate from

OUT2

a single +3.3 V to +5 V supply.
The AD7564 is a serial input device. Data is loaded using

FSIN, CLKIN and SDIN. Two address pins A0 and A1 set up
a device address, and this feature may be used to simplify device
loading in a multi-DAC environment. Alternatively, A0 and A1
can be ignored and the serial out capability used to configure a
daisy-chained system.

All DACs can be simultaneously updated using the asynchro-

LDAC input, and they can be cleared by asserting the

nous
asynchronous

CLR input.

The device is packaged in 28-pin SOIC, SSOP and DIP
packages.

PRODUCT HIGHLIGHTS

1. The AD7564 contains four 12-bit current output DACs with
separate V

REF

inputs.

2. The AD7564 can be operated from a single +3.3 V to +5 V
supply.

3. Simultaneous update capability and reset function are
available.

4. The AD7564 features a fast, versatile serial interface com­patible with modern 3 V and 5 V microprocessors and
microcomputers.

5. Low power, 50 µW at 5 V and 33 µW at 3.3 V.

REV. A

Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.

One Technology Way, P.O. Box 9106, Norwood. MA 02062-9106, U.S.A.
Tel: [phone] Fax: [phone]

AD7564–SPECIFICATIONS

(V

= +4.75 V to +5.25 V; I

Normal Mode

DD

unless otherwise noted)

Parameter B Grade

ACCURACY

Resolution 12 Bits 1 LSB = V
Relative Accuracy ±0.5 LSB max
Differential Nonlinearity ± 0.5 LSB max All Grades Guaranteed Monotonic Over Temperature
Gain Error

+25°C ±4 LSBs max

to T

T

MIN

MAX

Gain Temperature Coefficient

±5 LSBs max

2

2 ppm FSR/°C typ
5 ppm FSR/°C max

Output Leakage Current

I

OUT1

@ +25°C 10 nA max
T

MIN

to T

MAX

50 nA max

REFERENCE INPUT

Input Resistance 6 kΩ min Typical Input Resistance = 9.5 kΩ

13 kΩ max

Ladder Resistance Mismatch 2 % max Typically 0.6%

DIGITAL INPUTS

, Input High Voltage 2.4 V min

V

INH

, Input Low Voltage 0.8 V max

V

INL

, Input Current ±1 µA max

I

INH

CIN, Input Capacitance

2

10 pF max

OUT1

1

A to I

OUT1

D = I

OUT2

A = I

D = AGND = 0 V; V

OUT2

REF

Units Test Conditions/Comments

/212 = 2.44 mV when V

REF

= +10 V; TA = T

MIN

to T

MAX

REF

,

= 10 V

DIGITAL OUTPUT (SDOUT)

Output Low Voltage (V

) 0.4 V max Load Circuit as in Figure 2.

OL

Output High Voltage (VOH) 4.0 V min

POWER REQUIREMENTS

Range 4.75/5.25 V min/V max Part Functions from 3.3 V to 5.25 V

V

DD

Power Supply Rejection

∆Gain/∆V

I

DD

DD

2

–75 dB typ
10 µA max V

= VDD, V

INH

INL

= 0 V
At Input Levels of 0.8 V and 2.4 V, I
Typically 2 mA.

NOTES

1

Temperature range is as follows: B Version: –40°C to +85°C.

2

Not production tested. Guaranteed by characterization at initial product release.

Specifications subject to change without notice.

DD

is

–2–

REV. A

(V

Biased Mode

= +3 V to +5.5 V; V

DD

1

, unless otherwise noted)

T

MAX

IOUT1

= V

= 1.23 V; AGND = 0 V; V

IOUT2

Parameter A Grade

= 0 V to 2.45 V; TA = T

REF

2

Units Test Conditions/Comments

MIN

to

AD7564

ACCURACY

Resolution 12 Bits 1 LSB = (V

V

IOUT2

– V

IOUT2

= 1.23 V and V

REF

)/2

REF

12

= 0 V

= 300 µV when

Relative Accuracy ±1 LSB max
Differential Nonlinearity ±0.9 LSB max All Grades Guaranteed Monotonic Over

Temperature

Gain Error

+25°C ±4 LSBs max

to T

T

MIN

Gain Temperature Coefficient

MAX

3

±5 LSBs max
2 ppm FSR/°C typ
5 ppm FSR/°C max

Output Leakage Current See Terminology Section

I

OUT1

@ +25°C 10 nA max
T

MIN

to T

MAX

50 nA max

Input Resistance

@ I

Pins 6 kΩ min This Varies with DAC Input Code

OUT2

DIGITAL INPUTS

, Input High Voltage @ VDD = +5 V 2.4 V min

V

INH

, Input High Voltage @ VDD = +3.3 V 2.1 V min

V

INH

, Input Low Voltage @ VDD = +5 V 0.8 V max

V

INL

, Input Low Voltage @ VDD = +3.3 V 0.6 V max

V

INL

, Input Current ±1 µA max

I

INH

CIN, Input Capacitance

3

10 pF max

DIGITAL OUTPUT (SDOUT) Load Circuit as in Figure 2.

Output Low Voltage (V
Output Low Voltage (V
Output High Voltage (V
Output High Voltage (VOH)V

) 0.4 V max VDD = +5 V

OL

) 0.2 V max VDD = +3.3 V

OL

) 4.0 V min VDD = +5 V

OH

– 0.2 V min VDD = +3.3 V

DD

POWER REQUIREMENTS

Range 3/5.5 V min/V max

V

DD

Power Supply Sensitivity

∆Gain/∆V

I

DD

DD

3

–75 dB typ
10 µA max V

= VDD – 0.1 V min, V

INH

= 0.1 V max;

INL

SDOUT Open Circuit

is typically 2 mA with VDD = +5 V,

I

DD

= 2.4 V min, V

V

INH

= 0.8 V max;

INL

SDOUT Open Circuit

NOTES

1

These specifications apply with the devices biased up at 1.23 V for single supply applications. The model numbering reflects this by means of a "-B" suffix

(for example: AD7564AR-B). Figure 19 is an example of Biased Mode Operation.

2

Temperature ranges is as follows: A Version: –40°C to +85°C.

3

Not production tested. Guaranteed by characterization at initial product release.

Specifications subject to change without notice.

REV. A

–3–

AD7564

AC Performance Characteristics

(VDD = +4.75 V to +5.25 V; V

= T

to T

, unless otherwise noted. These characteristics are included for Design Guidance and are

MAX

Normal Mode

AD843; T

A

MIN

not subject to test.)

Parameter B Grade Units Test Conditions/Comments

DYNAMIC PERFORMANCE

Output Voltage Settling Time 550 ns typ To 0.01% of Full-Scale Range. DAC Latch Alternately Loaded

Digital-to-Analog Glitch Impulse 35 nV-s typ Measured with V

Multiplying Feedthrough Error –70 dB max V

Output Capacitance 60 pF max All 1s Loaded to DAC

30 pF max All 0s Loaded to DAC

Channel-to-Channel Isolation –76 dB typ Feedthrough from Any One Reference to the Others with

Digital Crosstalk 5 nV-s typ Effect of All 0s to All 1s Code Transition on Nonselected DACs
Digital Feedthrough 5 nV-s typ Feedthrough to Any DAC Output with

Total Harmonic Distortion –83 dB typ V
Output Noise Spectral Density

@ 1 kHz 30 nV/√

= V

IOUT1

= AGND = 0 V. V

IOUT2

= 6 V rms, 1 kHz sine wave; DAC output op amp is

REF

with All 0s and All 1s

with All 0s and All 1s

REF

= 20 V p-p, 10 kHz Sine Wave. DAC Latch Loaded

REF

with All 0s

20 V p-p, 10 kHz Sine Wave Applied

Wave Applied to SDIN and SCLK

= 6 V rms, 1 kHz Sine Wave

REF

Hz typ All 1s Loaded to the DAC. V

ADOP07

= 0 V. DAC Register Alternately Loaded

FSIN High and Square

= 0 V. Output Op Amp Is

REF

AC Performance Characteristics

(VDD = +3 V to +5.5 V; V
output op amp is AD820; T

Biased Mode

Guidance and are not subject to test.)

Parameter A Grade Units Test Conditions/Comments

DYNAMIC PERFORMANCE

Output Voltage Settling Time 3.5 µs typ To 0.01% of Full-Scale Range. V

Digital to Analog Glitch Impulse 35 nV-s typ Measured with V

Multiplying Feedthrough Error –70 dB max DAC Latch Loaded with all 0s.
Output Capacitance 100 pF max All 1s Loaded to DAC

40 pF max All 0s Loaded to DAC

Digital Feedthrough 5 nV-s typ Feedthrough to Any DAC Output with FSIN HIGH and a Square

Total Harmonic Distortion –76 dB typ
Output Noise Spectral Density

@ 1 kHz 20 nV/√Hz typ All 1s Loaded to DAC. V

IOUT1

= T

A

= V

= 1.23 V; AGND = 0 V. V

IOUT2

to T

MIN

, unless otherwise noted. These characteristics are included for Design

MAX

= 1 kHz, 2.45 V p-p, sine wave biased at 1.23 V; DAC

REF

= 0 V. DAC Latch Alter-

REF

nately Loaded with all 0s and all 1s.

= 0 V and V

IOUT2

REF

nately Loaded with all 0s and all 1s.

Wave Applied to SDIN and CLKIN

= 0 V; V

IOUT2

= 0 V. DAC Register Alter-

= 0 V

REF

–4–

REV. A

AD7564

Timing Specifications

1

(TA = T

MIN

to T

unless otherwise noted)

MAX

Limit at Limit at

Parameter V

t

1

t

2

t

3

t

4

t

5

t

6

t

7

2

t

8

t

9

NOTES

1

Not production tested. Guaranteed by characterization at initial product release. All input signals are specified with tr = tf = 5 ns (10% to 90% of VDD) and timed

from a voltage level of 1.6 V for a V

2

t8 is measured with the load circuit of Figure 2 and defined as the time required for the output to cross 0.8 V or 2.4 V with a V

of 3.3 V.

CLKIN(I)

FSIN(I)

SDIN(I)

= +3 V to +3.6 V VDD = +4.75 V to +5.25 V Units Description

DD

180 100 ns min CLKIN Cycle Time
80 40 ns min CLKIN High Time
80 40 ns min CLKIN Low Time
50 30 ns min FSIN Setup Time
50 30 ns min Data Setup Time
10 5 ns min Data Hold Time
125 90 ns min FSIN Hold Time
100 70 ns max SDOUT Valid After CLKIN Falling Edge
80 40 ns min LDAC, CLR Pulse Width

of 5 V and from a voltage level 1.35 V for a VDD of 3.3 V.

DD

t

5

DB15

t

1

t

t

t

4

t

6

2

3

DB0

t

7

of 5 V and 0.6 V or 2.1 V for a V

DD

3

DD

SDOUT(O)

LDAC, CLR

t

8

DB15

t

9

Figure 1. Timing Diagram

I

OL

+1.6V

I

OH

TO OUTPUT

PIN

C

L

50pF

1.6mA

200µA

Figure 2. Load Circuit for Digital Output Timing Specifications

DB0

REV. A

–5–