AD5390: 16-channel, 14-bit voltage output DAC
AD5391: 16-channel, 12-bit voltage output DAC
AD5392: 8-channel, 14-bit voltage output DAC
Guaranteed monotonic
INL: ±1 LSB max (AD5391)
±3 LSB max (AD5390-5/AD5392-5)
±4 LSB max (AD5390-3/AD5392-3)
On-chip 1.25 V/2.5 V, 10 ppm/°C reference
Temperature range: −40°C to +85°C
Rail-to-rail output amplifier
Power-down mode
Package types:
64-lead LFCSP (9 mm × 9 mm)
52-lead LQFP (10 mm × 10 mm)
User interfaces:
Serial SPI
(featuring data readback)
2
C®-compatible interface
I
®-, QSPI™-, MICROWIRE™-, and DSP-compatible
Supply, 12-/14-Bit Voltage Output DACs
AD5390/AD5391/AD5392
INTEGRATED FUNCTIONS
Channel monitor
Simultaneous output update via
Clear function to user-programmable code
Amplifier boost mode to optimize slew rate
User-programmable offset and gain adjust
Toggle mode enables square wave generation
Thermal monitor
APPLICATIONS
Instrumentation and industrial control
Power amplifier control
Level setting (ATE)
Control systems
Microelectromechanical systems (MEMs)
Variable optical attenuators (VOAs)
Optical transceivers (MSA 300, XFP)
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
Acknowledge Bit (ACK) ............................................................ 27
REVISION HISTORY
10/04: Data Sheet Changed from Rev. 0 to Rev. A
Changes to Features.......................................................................... 1
Changes to Table 1............................................................................ 3
Changes to Table 2............................................................................ 4
Changes to Table 3............................................................................ 6
Changes to Table 4............................................................................ 7
Changes to Figure 36...................................................................... 35
Rev. A | Page 2 of 44
Changes to Figure 37...................................................................... 36
Changes to Figure 38...................................................................... 36
Changes to Ordering Guide.......................................................... 41
4/04—Revision 0: Initial Version
AD5390/AD5391/AD5392
GENERAL DESCRIPTION
The AD5390/AD5391 are complete single-supply, 16-channel,
14-bit and 12-bit DACs, respectively. The AD5392 is a complete
single-supply, 8-channel, 14-bit DAC. Devices are available both
in 64-lead LFCSP and 52-lead LQFP packages. All channels
have an on-chip output amplifier with rail-to-rail operation. All
devices include an internal 1.25/2.5 V, 10 ppm/°C reference, an
on-chip channel monitor function that multiplexes the analog
outputs to a common MON_OUT pin for external monitoring,
and an output amplifier boost mode that optimizes the output
amplifier slew rate.
The AD5390/AD5391/AD5392 contain a 3-wire serial interface
with interface speeds in excess of 30 MHz that are compatible
Table 1. Additional High Channel Count, Low Voltage, Single-Supply DACs in Portfolio
Model
AD5380BST-5 14 Bits 4.5 V to 5.5 V 40 ±4 100-Lead LQFP ST-100
AD5380BST-3 14 Bits 2.7 V to 3.6 V 40 ±4 100-Lead LQFP ST-100
AD5384BBC-5 14 Bits 4.5 V to 5.5 V 40 ±4 100-Lead CSPBGA BC-100
AD5384BBC-3 14 Bits 2.7 V to 3.6 V 40 ±4 100-Lead CSPBGA BC-100
AD5381BST-5 12 Bits 4.5 V to 5.5 V 40 ±1 100-Lead LQFP ST-100
AD5381BST-3 12 Bits 2.7 V to 3.6 V 40 ±1 100-Lead LQFP ST-100
AD5382BST-5 14 Bits 4.5 V to 5.5 V 32 ±4 100-Lead LQFP ST-100
AD5382BST-3 14 Bits 2.7 V to 3.6 V 32 ±4 100-Lead LQFP ST-100
AD5383BST-5 12 Bits 4.5 V to 5.5 V 32 ±1 100-Lead LQFP ST-100
AD5383BST-3 12 Bits 2.7 V to 3.6 V 32 ±1 100-Lead LQFP ST-100
Resolution AVD D Ra nge
Output
Channels
with SPI, QSPI, MICROWIRE, and DSP interface standards
2
and an I
C-compatible interface supporting a 400 kHz data
transfer rate.
An input register followed by a DAC register provides doublebuffering, allowing DAC outputs to be updated independently
or simultaneously using the
input. Each channel has a
LDAC
programmable gain and offset adjust register, letting the user
fully calibrate any DAC channel.
Power consumption is typically 0.25 mA per channel.
Resolution 14 12 Bits
Relative Accuracy ±3 ±1 LSB max
Differential Nonlinearity −1/+2 ±1 LSB max Guaranteed monotonic over temperature.
Zero-Scale Error 4 4 mV max
Offset Error ±4 ±4 mV max Measured at code 32 in the linear region.
Offset Error TC ±5 ±5 µV/°C typ
Gain Error ±0.024 ± 0.024 % FSR max At 25°C T
±0.06 ±0.06 % FSR max
Gain Temperature Coefficient
DC Crosstalk2 0.5 0.5 LSB max
REFERENCE INPUT/OUTPUT
Reference Input2
Reference Input Voltage 2.5 2.5 V
DC Input Impedance 1 1 MΩ min Typically 100 MΩ.
Input Current ±1 ±1 µA max Typically ±30 nA.
Reference Range
Reference Output
3
Output Voltage 2.495/2.505 2.495/2.505 V min/max At ambient, optimized for 2.5 V operation.
1.22/1.28 1.22/1.28 V min/max At ambient when 1.25 V reference is selected.
Reference TC ±10 ±10 ppm max Temperature range: 25°C to 85°C.
±15 ±15 ppm max Temperature range: −40°C to +85°C.
Output Impedance 2.2 2.2 kΩ typ
OUTPUT CHARACTERISTICS2
Output Voltage Range4 0/AV
Short-Circuit Current 40 40 mA max
Load Current ±1 ±1 mA max
Capacitive Load Stability
RL = ∞ 200 200 pF max
RL = 5 kΩ 1,000 1,000 pF max
DC Output Impedance 0.5 0.5 Ω max
MONITOR OUTPUT PIN
Output Impedance 500 500 Ω typ
Three-State Leakage Current 100 100 nA typ
LOGIC INPUTS2 DVDD = 2.7 V to 5.5 V.
VIH, Input High Voltage 2 2 V min
VIL, Input Low Voltage 0.8 0.8 V max
Input Current ±10 ±10 µA max Total for all pins. TA = T
Pin Capacitance 10 10 pF max
= 2.7 V to 5.5 V; AGND = DGND = 0 V; REFIN = 2.5 V external.
DD
to T
, unless other wise noted.
MAX
AD5390-51
AD5392-5
2
2 2 ppm FSR/°C typ
1 V to
/2
AV
DD
AD5391-5
1
1 V to AV
1
Unit
/2 V min/max
DD
DD
0/AV
DD
V min/max
Test Conditions/Comments
to T
MAX
.
MIN
±1% for specified performance,
AV
= 2 × REFIN + 50 mV.
DD
Enabled via internal/external bit in control
register. REF select bit in control register
selects the reference voltage.
to T
MAX
.
MIN
Rev. A | Page 4 of 44
AD5390/AD5391/AD5392
Parameter
AD5390-51
AD5392-5
AD5391-5
1
1
Unit
Test Conditions/Comments
LOGIC INPUTS (SCL, SDA Only)
VIH, Input High Voltage 0.7 DV
VIL, Input Low Voltage 0.3 DV
DD
DD
0.7 DV
0.3 DV
DD
DD
V min SMBus-compatible at DVDD < 3.6 V.
V max SMBus-compatible at DVDD < 3.6 V.
IIN, Input Leakage Current ±1 ±1 µA max
V
, Input Hysteresis 0.05 DV
HYST
0.05 DV
DD
DD
V min
CIN, Input Capacitance 8 8 pF typ
Glitch Rejection 50 50 ns max
Input filtering suppresses noise spikes of
<50 ns.
LOGIC OUTPUTS (BUSY, SDO)2
Output Low Voltage 0.4 0.4 V max DVDD = 5 V ± 10%, sinking 200 µA.
Output High Voltage DVDD − 1 DVDD − 1 V min
= 5 V ± 10%, SDO only, sourcing
DV
DD
200 µA.
Output Low Voltage 0.4 0.4 V max DVDD = 2.7 V to 3.6 V, sinking 200 µA.
Output High Voltage DVDD − 0.5 DVDD − 0.5 V min
= 2.7 V to 3.6 V SDO only, sourcing
DV
DD
200 µA.
High Impedance Leakage Current ±1 ±1 µA max
High Impedance Output
5 5 pF typ
Capacitance
LOGIC OUTPUT (SDA)2
VOL, Output Low Voltage 0.4 0.4 V max I
0.6 0.6 V max I
= 3 mA.
SINK
= 6 mA.
SINK
Three-State Leakage Current ±1 ±1 µA max
Three-State Output Capacitance 8 8 pF typ
POWER REQUIREMENTS
AV
DV
DD
DD
4.5/5.5 4.5/5.5 V min/max
2.7/5.5 2.7/5.5 V min/max
Power Supply Sensitivity2
∆Midscale/∆AVDD −85 −85 dB typ
AI
AI
DI
DD
DD
DD
0.375 0.375
0.475 0.475
mA/channel
max
mA/channel
max
Outputs unloaded; boost off;
0.25 mA/channel typ.
Outputs unloaded; boost on;
0.325 mA/channel typ.
1 1 mA max VIH = DVDD, VIL = DGND.
AIDD (Power-Down) 1 1 µA max Typically 200 nA.
DIDD (Power-Down) 20 20 µA max Typically 3 µA.
Power Dissipation 35 35 mW max
20 20 mW max
AD5390/AD5391 with outputs unloaded;
= DVDD = 5 V; boost off.
AV
DD
AD5392 with outputs unloaded;
= DVDD = 5 V, boost off.
AV
DD
1
AD539x-5 products are calibrated with a 2.5 V reference. Temperature range for all versions: −40°C to +85°C.
2
Guaranteed by characterization, not production tested.
3
Programmable either to 1.25 V typ or 2.5 V typ via the AD539x control register. Operating the AD539x-5 products with a reference of 1.25 V leads to a degradation in
performance accuracy.
4
Accuracy guaranteed from VOUT = 10 mV to AVDD − 50 mV.
Rev. A | Page 5 of 44
AD5390/AD5391/AD5392
AD5390-5/AD5391-5/AD5392-5 AC CHARACTERISTICS
AVDD = 4.5 V to 5.5 V; DVDD = 2.7 V to 5.5 V; AGND = DGND = 0 V.
Table 3. AD5390-5/AD5391-5/AD5392-5 AC Characteristics
Parameter All1 Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time
AD5390/AD5392 8 µs typ ¼ scale to ¾ scale change settling to ±1 LSB.
10 µs max
AD5391 6 µs typ ¼ scale to ¾ scale change settling to ±1 LSB.
8 µs max
Slew rate
2
3 V/µs typ Boost mode on.
2 V/µs typ Boost mode off.
Digital-to-Analog Glitch Energy 12 nV-s typ
Glitch Impulse Peak Amplitude 15 mV typ
Channel-to-Channel Isolation 100 dB typ See Terminology section.
DAC-to-DAC Crosstalk 1 nV-s typ See Terminology section.
Digital Crosstalk 0.8 nV-s typ
Digital Feedthrough 0.1 nV-s typ Effect of input bus activity on DAC output under test.
Output Noise (0.1 Hz to 10 Hz)
15
40
µV p-p typ
µV p-p typ
Output Noise Spectral Density
@ 1 kHz 150 nV/(Hz)
@ 10 kHz 100 nV/(Hz)
1
Guaranteed by characterization, not production tested.
2
The slew rate can be adjusted via the current boost control bit in the DAC control register.
1
1/2
typ
1/2
typ
External reference midscale loaded to DAC.
Internal reference midscale loaded to DAC.
Rev. A | Page 6 of 44
AD5390/AD5391/AD5392
AD5390-3/AD5391-3/AD5392-3 SPECIFICATIONS
AVDD = 2.7 V to 3.6 V; DVDD = 2.7 V to 5.5 V; AGND = DGND = 0 V; REFIN = 1.25 V external. All specifications T
otherwise noted.
Table 4.
Parameter
AD5390-31
AD5392-3
1
AD5391-3
1
Unit
Test Conditions/Comments
ACCURACY
Resolution 14 12 Bits
Relative Accuracy ±4 ±1 LSB max
Differential Nonlinearity −1/+2 ±1 LSB max Guaranteed monotonic over temperature.
Zero-Scale Error 4 4 mV max
Offset Error ±4 ±4 mV max Measured at code 64 in the linear region.
Offset Error TC ±5 ±5 µV/°C typ
Gain Error ±0.024 ±0.024 % FSR max At 25°C.
±0.1 ±0.1 % FSR max T
MIN
to T
MAX
.
Gain Temperature Coefficient2 2 2 ppm FSR/°C typ
DC Crosstalk 0.5 0.5 mV max
REFERENCE INPUT/OUTPUT
Reference Input
2
Reference Input Voltage 1.25 1.25 V ±1% for specified performance.
DC Input Impedance 1 1 MΩ min Typically 100 MΩ.
Input Current ±1 ±1 µA max Typically ±30 nA.
Reference Range 1 V to AVDD/2 1 V to AVDD/2 V min/max
Reference Output
3
Enabled via internal/external bit in control
register. REF select bit in control register
selects the reference voltage.
Output Voltage 1.245/1.255 1.245/1.255 V min/max At ambient. Optimized for 1.25 V operation.
2.47/2.53 2.47/2.53 V min/max At ambient when 2.5 V reference is selected.
Reference TC ±10 ±10 ppm max Temperature range: 25°C to 85°C.
±15 ±15 ppm max Temperature range: −40°C to +85°C.
Output Impedance 2.2 2.2 kΩ typ
OUTPUT CHARACTERISTICS2
Output Voltage Range
4
0/AV
DD
0/AV
DD
V min/max
Short-Circuit Current 40 40 mA max
Load Current ±1 ±1 mA max
Capacitive Load Stability
RL = ∞ 200 200 pF max
RL = 5 kΩ 1,000 1,000 pF max
DC Output Impedance 0.5 0.5 Ω max
MONITOR OUTPUT PIN2
Output Impedance 500 500 Ω typ
Three-State Leakage Current 100 100 nA typ
LOGIC INPUTS2 DV
= 2.7 V to 5.5 V.
DD
VIH, Input High Voltage 2 2 V min
VIL, Input Low Voltage 0.8 0.8 V max
Input Current ±10 ±10 µA max Total for all pins. TA = T
Pin Capacitance 10 10 pF max
Logic Inputs (SCL, SDA Only)
VIH, Input High Voltage 0.7 DV
VIL, Input Low Voltage 0.3 DV
DD
DD
0.7 DV
0.3 DV
DD
DD
V min SMBus-compatible at DVDD < 3.6 V.
V max SMBus-compatible at DVDD < 3.6 V.
IIN, Input Leakage Current ±1 ±1 µA max
V
, Input Hysteresis 0.05 DV
HYST
DD
0.05 DV
DD
V min
MIN
MIN
to T
to T
MAX
MAX
.
, unless
Rev. A | Page 7 of 44
AD5390/AD5391/AD5392
Parameter
AD5390-31
AD5392-3
1
AD5391-3
1
Unit
Test Conditions/Comments
Glitch Rejection 50 50 ns max Input filtering suppresses noise spikes <50 ns.
Logic Outputs (BUSY, SDO)2
Output Low Voltage 0.4 0.4 V max DVDD = 2.7 V to 5.5 V, sinking 200 µA.
Output High Voltage DVDD − 0.5 DVDD − 0.5 V min
= 2.7 V to 3.6 V, SDO only,
DV
DD
sourcing 200 µA.
DVDD − 0.1 DVDD − 0.1 V min
= 4.5 V to 5.5 V, SDO only,
DV
DD
sourcing 200 µA.
High Impedance Leakage
±1 ±1 µA max
Current
High Impedance Output
5 5 pF typ
Capacitance
Logic Output (SDA)2
VOL, Output Low Voltage 0.4 0.4 V max I
0.6 0.6 V max I
= 3 mA.
SINK
= 6 mA.
SINK
Three-State Leakage Current ±1 ±1 µA max
Three-State Output
8 8 pF typ
Capacitance
POWER REQUIREMENTS
AV
DV
DD
DD
2.7/3.6 2.7/3.6 V min/max
2.7/5.5 2.7/5.5 V min/max
Power Supply Sensitivity2
∆Midscale/∆AVDD −85 −85 dB typ
AI
AI
DI
DD
DD
DD
0.375 0.375
0.475 0.475
mA/channel
max
mA/channel
max
Outputs unloaded; boost off;
0.25 mA/channel typ.
Outputs unloaded; boost on;
0.325 mA/channel typ.
1 1 mA max VIH = DVDD, VIL = DGND.
AIDD (Power-Down) 1 1 µA max
DIDD (Power-Down) 20 20 µA max
Power Dissipation 21 21 mW max
AD5390/AD5391 with outputs unloaded;
= DVDD = 3 V; boost off.
AV
DD
12 12 mW max
AD5392 with outputs unloaded;
= DVDD = 3 V; boost off.
AV
DD
1
AD539x-3 products are calibrated with a 1.25 V reference. Temperature range for all versions: −40°C to +85°C.
2
Guaranteed by characterization, not production tested.
3
Programmable either to 1.25 V typ or 2.5 V typ via the AD539x control register. Operating the AD539x-3 products with a reference of 2.5 V leads to a degradation in
performance accuracy.
4
Accuracy guaranteed from VOUT = 39 mV to AVDD − 50 mV.
Rev. A | Page 8 of 44
AD5390/AD5391/AD5392
AD5390-3/AD5391-3/AD5392-3 AC CHARACTERISTICS
AVDD = 2.7 V to 3.6 V; DVDD = 2.7 V to 5.5 V; AGND = DGND = 0 V; CL = 200 pF to AGND.
Table 5.
AD5390-3/AD5391-3/AD5392-3 AC Characteristics
Parameter All Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time
AD5390/AD5392 8 µs typ ¼ scale to ¾ scale change settling to ±1 LSB.
10 µs max
AD5391 6 µs typ ¼ scale to ¾ scale change settling to ±1 LSB.
8 µs max
Slew Rate
2
3 V/µs typ Boost mode on.
2 V/µs typ Boost mode off.
Digital-to-Analog Glitch Energy 12 nV-s typ
Glitch Impulse Peak Amplitude 15 mV typ
Channel-to-Channel Isolation 100 dB typ See Terminology section.
DAC-to-DAC Crosstalk 1 nV-s typ See Terminology section.
Digital Crosstalk 0.8 nV-s typ
Digital Feedthrough 0.1 nV-s typ Effect of input bus activity on DAC output under test.
OUTPUT NOISE (0.1 Hz to 10 Hz) 15 µV p-p typ External reference midscale loaded to DAC.
40 µV p-p typ Internal reference midscale loaded to DAC.
Output Noise Spectral Density
@ 1 kHz 150 nV/(Hz)
@ 10 kHz 100 nV/(Hz)
1
Guaranteed by design and characterization, not production tested.
2
The slew rate can be programmed via the current boost control bit in the AD539x control registers.
1
1/2
typ
1/2
typ
Rev. A | Page 9 of 44
AD5390/AD5391/AD5392
TIMING CHARACTERISTICS:
SERIAL SPI-, QSPI-, MICROWIRE-, AND DSP-COMPATIBLE INTERFACE
DVDD = 2 V to 5.5 V; AVDD = 2.7 V to 5.5 V; AGND = DGND = 0 V. All specifications T
Table 6. 3-Wire Serial Interface
Parameter
t
1
t
2
t
3
t
4
4
t
5
4
t
33 ns min
6
t
7
t
7A
t
8
t
9
4
t
10
t
11
4
t
20 ns min
12
t
13
t
14
t
15
t
16
t
17
t
17
t
18
t
19
5
t
20
4
t
5 ns min
21
4
t
8 ns min
22
4
t
23
2, 3
Limit at T
33 ns min SCLK cycle time
13 ns min SCLK high time
13 ns min SCLK low time
13 ns min
13 ns min
10 ns min
50 ns min
5 ns min Data setup time
4.5 ns min Data hold time
30 ns max
670 ns max
20 ns min
100 ns max
0 ns min
100 ns min
8 µs typ DAC output settling time, AD5390/AD5392
6 µs typ DAC output settling time, AD5391
20 ns min
12 µs max
20 ns max SCLK rising edge to SDO valid
20 ns min
1
MIN
, T
MAX
Unit Description
SYNC falling edge to SCLK falling edge setup time
th
SCLK falling edge to SYNC falling edge
24
Minimum
Minimum
Minimum
24
SYNC low time
SYNC high time
SYNC high time in readback mode
th
SCLK falling edge to BUSY falling edge
BUSY pulse width low (single channel update)
th
SCLK falling edge to LDAC falling edge
24
LDAC pulse width low
BUSY rising edge to DAC output response time
BUSY rising edge to LDAC falling edge
LDAC falling edge to DAC output response time
CLR pulse width low
CLR pulse activation time
SCLK falling edge to
SYNC rising edge to SCLK rising edge
SYNC rising edge to LDAC falling edge
MIN
to T
, unless otherwise noted.
MAX
SYNC rising edge
1
Guaranteed by design and characterization, not production tested.
2
All input signals are specified with tr = tf = 5 ns (10% to 90% of VCC) and timed from a voltage level of 1.2 V.
3
See , F, and . Figure 2 igure 3 Figure 4,Figure 5
4
Standalone mode only.
5
Daisy-chain mode only.
Rev. A | Page 10 of 44
AD5390/AD5391/AD5392
t
1
SCLK
SYNC
DIN
SDO
LDAC
t
t
9
UNDEFINED
3
t
7
t
4
t
8
DB23DB0 DB23
INPUT WORD FOR DAC NINPUT WORD FOR DAC N+1
2448
t
2
t
20
DB23
INPUT WORD FOR DAC N
t
DB0
DB0
22
t
23
t
13
03773-0-002
t
21
Figure 2. Serial Interface Timing Diagram (Daisy-Chain Mode)
t
1
1
2
t
4
t
7
t
t
3
t
6
8
t
9
2424
t
2
t
5
Rev. A | Page 11 of 44
AD5390/AD5391/AD5392
SCLK
SYNC
24
t
7A
48
DIN
SDO
DB23
INPUT WORD SPECIFIES
REGISTER TO BE READ
UNDEFINED
DB0
DB23'DB0
NOP CONDITION
DB23DB0
SELECTED REGISTER DATA
CLOCKED OUT
03773-0-006
Figure 4. Serial Interface Timing Diagram (Data Readback Mode)
200µA
TO
OUTPUT
PIN
C
L
50pF
200µA
Figure 5. Load Circuit for Digital Output Timing
I
OL
V
OR
OH (MIN)
V
OL (MAX)
I
OH
03773-0-003
Rev. A | Page 12 of 44
AD5390/AD5391/AD5392
A
TIMING CHARACTERISTICS: I2C SERIAL INTERFACE
Guaranteed by design and characterization, not production tested. DVDD = 2.7 V to 5.5 V; AVDD = 2.7 V to 5.5 V; AGND = DGND = 0 V.
to T
All specifications T
MIN
Table 7.
Parameter
F
SCL
t
1
t
2
t
3
t
4
t
5
2
t
6
1
0 µs min tHD,
t
7
t
8
t
9
t
10
0 ns min tR, rise time of SCL and SDA when receiving (CMOS-compatible)
t
11
0 ns min tF, fall time of SDA when receiving (CMOS-compatible)
300 ns max tF, fall time of SCL and SDA when receiving
20 + 0.1 C
3
C
B
1
See F. igure 6
2
A master device must provide a hold time of at least 300 ns for the SDA signal (referred to the VIH MIN of the SCL signal)
to bridge the undefined region of SCL’s falling edge.
3
CB is the total capacitance of one bus line in pF; tR and tF measured between 0.3 DVDD and 0.7 DVDD.
, unless other wise noted.
MAX
Limit at T
MIN
, T
MAX
Unit Description
400 kHz max SCL clock frequency
2.5 µs min SCL cycle time
0.6 µs min t
1.3 µs min t
0.6 µs min tHD,
100 ns min tSU,
0.9 µs max tHD,
0.6 µs min tSU,
0.6 µs min tSU,
1.3 µs min t
, SCL high time
HIGH
, SCL low time
LOW
, start/repeated start condition hold time
STA
, data setup time
DAT
data hold time
DAT
data hold time
DAT
setup time for repeated start
STA
stop condition setup time
STO
, bus free time between a stop and a start condition
BUF
300 ns max tF, fall time of SDA when transmitting
300 ns max tF, fall time of SDA when transmitting
B
ns min tF, fall time of SCL and SDA when transmitting
400 pF max Capacitive load for each bus line
SD
t
SCL
9
START
CONDITION
t
3
t
4
t
10
t
6
t
11
Figure 6. I
t
2
2
C Interface Timing Diagram
t
t
5
7
t
4
REPEATED
START
CONDITION
t
1
t
8
STOP
CONDITION
03773-0-007
Rev. A | Page 13 of 44
AD5390/AD5391/AD5392
ABSOLUTE MAXIMUM RATINGS
Transient currents of up to 100 mA do not cause SCR latch-up.
= 25°C, unless otherwise noted.
T
A
Table 8.
Parameter Rating
AVDD to AGND −0.3 V to +7 V
DVDD to DGND −0.3 V to +7 V
Digital Inputs to DGND −0.3 V to DVDD + 0.3 V
Digital Outputs to DGND −0.3 V to DVDD + 0.3 V
VREF to AGND −0.3 V to +7 V
REFOUT to AGND −0.3 V to +7 V
AGND to DGND −0.3 V to +0.3 V
VOUTX to AGND −0.3 V to AVDD + 0.3 V
Operating Temperature Range
Commercial (B Version) −40°C to +85°C
Storage Temperature Range −65°C to +150°C
Junction Temperature (TJ max) 150°C
64-Lead LFCSP Package, θ
52-lLad LQFP Package, θ
Reflow Soldering Peak
Temperature
JA
JA
22°C/W
38°C/W
230°C
Stresses above absolute maximum ratings may cause permanent
damage to the device. This is a stress rating only; functional
operation of the device at these or any other conditions above
those listed in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. A | Page 14 of 44
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