GE
Inspection Technologies
dynamic 41 digital detectors
GE’s superior image quality X-ray detectors for
2D radiographic inspection and 3D CT
dynamic 41|100 and 41|200
Key features & benets
• 16” X-ray detectors with 100 µm / 200 µm pixelsize
(16 or 4 MPixels) designed and optimized for longterm
reliability at industrial high-energy use
• High-resolution images for easy detection of subtle
indications (up to 50 µm /100 µm feature detection
with minifocus X-ray tubes)
• Next generation photodiode design for up to 10x
improvedeciencyandsensitivitycomparedto
state of the art 200 µm pixel DXR detectors allows
2x resolution increase without cycle time impact
(41|100) or 2-3x cycle time increase without
image quality impact (41|200)
• Detection of 2x smaller defects without increase of
geometricmagnicationallowsimagingoflarge
objects at higher resolution (41|100)
GE’s dynamic 41 detectors -
Powering the next generation of X-ray inspection and CT
The dynamic 41|100 and 200 detectors are the rst in GE’s next generation industrial X-ray at panel detector
platform. The 41|100 detector combines superior image quality with improved detection speed at 410 x 410 mm²
detection area and 100 μm pixel size. It achieves 100 micron results at 200 micron eciency and contrast-to-noise-
ratio, while the new 41|200 detector increases industrial inspection speed by factor 2-3, allowing high throughput
fully automated CT on the production oor.
Based on proprietary GE Healthcare X-ray detector technology, GE Inspection Technologies exclusively oers its
rst 100 μm, 16M pixel detector designed and optimized exclusively for rough and high-energy industrial X-ray ap-
plications to its radiography and CT customers. GE’s proprietary Endurance
tion and brightness compared to conventional GadOx or other powder based scintillators.
TM
CsI scintillator oers superior resolu-
100 µm imaging: See more to know more
The 5 US dollar bill comparison clearly visualizes the quality gain: at identical kV parameters, the new dynamic 41|100
detector provides doubled resolution at comparable signal-to-noise-ratio and dynamic range.
Conventional DXR250 200 µm pixel detector dynamic 41|100 detector
State of the art DXR at panel detector with
200 μm pixel size
Superior GE dynamic 41|100 detector providing 100 µm
pixel size for superior image quality and doubled
resolution to detect two times smaller defects