UTRON UT61256SC-15, UT61256LS-8, UT61256LS-15, UT61256LS-10, UT61256LS-12 Datasheet

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UTRON
UT61256
Rev. 1.1
UTRON TECHNOLOGY INC. P80020 1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
1
FEATURES
Fast access time : 8/10/12/15ns (max.)
Low operating power consumption:
80 mA (typical.)
Single5V power supply
All inputs and outputs are TTL compatible
Fully static operation
Three state outputs
Package : 28-pin 300 mil skinny PDIP
28-pin 300 mil SOJ 28-pin 330 mil SOP 28-pin 8mm×13.4 mm STSOP
FUNCTIONAL BLOCK DIAGRAM
COLUMN I/O
COLUMN DECODER
ROW
DECODER
I/O
CONTROL
LOGI C
CONTROL
A4
I/O1
VSS
VCC
WE
OE
CE
I/O8
.
.
.
.
. .
. .
.
A3
A
12
A7
A6
A5
A8
A9 A2 A1 A0 A
11
.
.
.
.
.
.
MEMORY ARRAY
512 ROWS × 512 COLUMNS
A
10
A14
A13
PIN DESCRIPTION
SYMBOL DESCRIPTION
A0 - A14 Address Inputs
I/O1 - I/O8 Data Inputs/Outputs
CE
Chip Enable Input
WE
Write Enable Input
OE
Output Enable Input
VCC Power Supply VSS Ground
GENERAL DESCRIPTION
The UT61256 is a 262,144-bit high speed CMOS static random access memory organized as 32,768 words by 8 bits. It is fabricated using high performance, high reliability CMOS technology.
The UT61256 is designed for high-speed system application. It is particularly suited for use in high speed and high density system applications.
The UT61256 operates from a signal 5V power supply and all inputs and outputs are fully TTL compatible
PIN CONFIGURATION
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O1
I/O2
Vcc
A8
A9
A11
A10
I/O8
I/O7
I/O6
I/O5
I/O4
I/O3
Vss
UT61256
PDIP/SOP/SOJ
28
14
13
12
11
10
9
8
7
6
5
4
3
2
1
17
16
15
20
19
18
22
23
24
25
26
27
21
CE
WE
OE
A13
A14
I/O4
A11
A9
A8
A13
I/O3
A10
A14
A12
A7
A6
A5
Vcc
I/O8
I/O7
I/O6
I/O5
Vss
I/O2
I/O1
A0
A1
A2
A4
A3
UT61256
STSOP
28
14
13
12
11
10
9
8
7
6
5
4
3
2
1
17
16
15
20
19
18
22
23
24
25
26
27
21
WE
OE
CE
UTRON
UT61256
Rev. 1.1
UTRON TECHNOLOGY INC. P80020 1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
2
ABSOLUTE MAXIMUM RATINGS
*
PARAMETER SYMBOL RATING UNIT
Terminal Voltage with Respect to VSS V
TERM
-0.5 to +7.0 V
Operating Temperature TA 0 to +70
Storage Temperature T
STG
-65 to +150
Power Dissipation PD 1 W DC Output Current I
OUT
50 mA
Soldering Temperature (under 10 sec) Tsolder 260
*Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a
stress rating only and functional operation of the device or any other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device
reliability.
TRUTH TABLE
MODE
CE
OE
WE
I/O OPERATION SUPPLY CURRENT
Standby H X X High - Z ISB, ISB1
Output Disable L H H High - Z ICC
Read L L H D
OUT
I
CC
Write L X L DIN I
CC
Note: H = VIH, L=VIL, X = Don't care.
DC ELECTRICAL CHARACTERISTICS
(VCC = 5V±10%, TA = 0℃ to 70℃)
PARAMETER SYMBOL TEST CONDITION MIN. MAX. UNIT
Input High Voltage VIH 2.2 VCC+0.5 V Input Low Voltage VIL -0.5 0.8 V Input Leakage Current ILI
V
SS
≦VIN ≦VCC
- 1 1
µ
A
Output Leakage
Current
ILO
V
SS
≦V
I/O
≦V
CC
CE
=V
IH
or
OE
=V
IH
or
WE
= VIL
- 1 1
µ
A
Output High Voltage VOH IOH= - 4mA 2.4 - V Output Low Voltage VOL IOL= 8mA - 0.4 V
- 8 - 190 mA
- 10 - 180 mA
- 12 - 160 mA
Operating Power
Supply Current
ICC
CE
= V
IL
,
I
I/O
= 0mA ,Cycle=Min.
- 15 - 140 mA
ISB
CE
=V
IH
- 30 mA
Standby Power Supply Current
I
SB1
CE
V
CC
-0.2V
- 5 mA
UTRON
UT61256
Rev. 1.1
UTRON TECHNOLOGY INC. P80020 1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
3
CAPACITANCE
(TA=25℃, f=1.0MHz)
PARAMETER SYMBOL MIN. MAX UNIT
Input Capacitance C
IN
-
8 pF
Input/Output Capacitance C
I/O
-
10 pF
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
Input Pulse Levels 0V to 3.0V Input Rise and Fall Times 3ns Input and Output Timing Reference Levels 1.5V Output Load CL = 30pF, IOH/IOL = -4mA/8mA
AC ELECTRICAL CHARACTERISTICS
(V
CC
= 5V±10%, TA = 0℃ to 70℃)
(1) READ CYCLE
PARAMETER
SYMBOL UT61256-8 UT61256-10 UT61256-12 UT61256-15 UNIT
MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX.
Read Cycle Time
tRC
8 - 10 - 12 - 15 - ns
Address Access Time
tAA
- 8 - 10 - 12 - 15 ns
Chip Enable Access Time
t
ACE
- 8 - 10 - 12 - 15 ns
Output Enable Access Time
tOE
- 4 - 5 - 6 - 7 ns
Chip Enable to Output in Low Z
t
CLZ*
2 - 2 - 3 - 4 - ns
Output Enable to Output in Low Z
t
OLZ*
0 - 0 - 0 - 0 - ns
Chip Disable to Output in High Z
t
CHZ*
- 4 - 5 - 6 - 7 ns
Output Disable to Output in High Z
t
OHZ*
- 4 - 5 - 6 - 7 ns
Output Hold from Address Change
tOH
3 - 3 - 3 - 3 - ns
(2) WRITE CYCLE PARAMETER
SYMBOL UT61256-8 UT61256-10 UT61256-12 UT61256-15 UNIT
MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX.
Write Cycle Time
tWC
8 - 10 - 12 - 15 - ns
Address Valid to End of Write
tAW
6.5 - 8 - 12 - 15 - ns
Chip Enable to End of Write
tCW
6.5 - 8 - 12 - 15 - ns
Address Set-up Time
tAS
0 - 0 - 0 - 0 - ns
Write Pulse Width
tWP
6.5 - 8 - 9 - 10 - ns
Write Recovery Time
tWR
0 - 0 - 0 - 0 - ns
Data to Write Time Overlap
tDW
5 - 6 - 7 - 8 - ns
Data Hold from End of Write Time
tDH
0 - 0 - 0 - 0 - ns
Output Active from End of Write
t
OW*
1.5 - 2 - 3 - 4 - ns
Write to Output in High Z
t
WHZ*
- 5 - 6 - 7 - 8 ns
*These parameters are guaranteed by device characterization, but not production tested.
UTRON
UT61256
Rev. 1.1
UTRON TECHNOLOGY INC. P80020 1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
4
TIMING WAVEFORMS
READ CYCLE 1
(Address Controlled)
(1,2,4)
t
RC
Address
DOUT Data Valid
t
AA
t
OH
t
OH
READ CYCLE 2
(CE and
OE
Controlled)
(1,3,5,6)
D
OUT
Address
CE
OE
t
RC
t
AA
t
ACE
t
OE
t
CLZ
t
OLZ
High-z
t
OHZ
t
CHZ
Data valid
High-Z
t
OH
Notes :
1.
WE
is HIGH for read cycle.
2. Device is continuously selected
CE
=V
IL.
3. Address must be valid prior to or coincident with
CE
transition; otherwise t
AA
is the limiting parameter.
4.
OE
is LOW.
5. t
CLZ
, t
OLZ
, t
CHZ
and t
OHZ
are specified with CL = 5pF. Transition is measured ±500mV from steady state.
6. At any given temperature and voltage condition, t
CHZ
is less than t
CLZ
, t
OHZ
is less than t
OLZ.
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