UTRON UT611024JC-10, UT611024LS-15, UT611024LS-12, UT611024LS-10, UT611024LC-12 Datasheet

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Rev. 1.5
UTRON
FEATURES
Fast access time : 10/12/15ns (max.) Low operating power consumption:
Single5V power supply All inputs and outputs are TTL compatible Fully static operation Three state outputs Package : 32-pin 288 mil skinny PDIP
FUNCTIONAL BLOCK DIAGRAM
A4 A5
A6
7 A8 A12
DECODER
A13 A14 A15
A16
I/O 1
.
.
.
.
.
CONTROL
.
I/O 8
1CE
CE2
CONTROL
WE
OE
PIN DESCRIPTION
SYMBOL DESCRIPTION
A0 - A16 Address Inputs
I/O1 - I/O8 Data Inputs/Outputs
100 mA (typical.)
32-pin 300 mil SOJ 32-pin 8mm×20mm TSOP-1 32-pin 8mm×13.4mm STSOP
.
MEMORY AR RAY
.
ROW
1024 RO WS × 1024 C O LU M N S
.
.
. .
I/O
.
.
.
LOGIC
,CE2
1CE
WE
OE VCC Power Supply VSS Ground
NC No Connection
C O L UMN I/O
COLUMN DECODER
11
9
3
10
2 A1 A0
Chip Enable Inputs Write Enable Input Output Enable Input
VCC
VSS
UT611024
128K X 8 BIT HIGH SPEED CMOS SRAM
GENERAL DESCRIPTION
The UT611024 is a 1,048,576-bit high speed CMOS static random access memory organized as 131,072 words b y 8 bits. It is fabricated usi ng high performance, high reliability CMOS technology.
The UT611024 is designed for high-sp eed s ystem application. It is particularly suited for use in high speed and high density system applications.
The UT611024 operates from a signal 5 V power supply and all inputs and outputs are fully TTL compatible
PIN CONFIGURATION
A11
A9 A8
A13
WE
CE2 A15
Vcc
NC A16 A14 A12
A7
A6
A5
A4 A3
NC
A16 A14
A12
A7 A6
A5 A4 A3 A2 A1
A0 I/O1 I/O2 I/O3 Vss
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
32
31
30
29
UT611024
28
27
26
25
24
23
22
21
20
19
18
1716
PDIP / SOJ
UT611024
STSOP / TSOP-1
A15 CE2
A13
A11
A10
I/O8 I/O7 I/O6 I/O5 I/O4
Vcc
WE
A8 A9
OE
1CE
32
OE
A10
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
1CE
I/O8
I/O7 I/O6 I/O5
I/O4
Vss I/O3 I/O2 I/O1
A0 A1
A2
UTRON TECHNOLOGY INC. P80048 1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
1
Rev. 1.5
UTRON
128K X 8 BIT HIGH SPEED CMOS SRAM
UT611024
ABSOLUTE MAXIMUM RATINGS
PARAMETER SYMBOL RATING UNIT
Terminal Voltage w ith Respect to VSS V Operating Temperature TA 0 to +70 Storage Temperature T Power Dissipation PD 1 W DC Output Current I Soldering Temperature (under 10 sec) Tsolder 260
*Stresses greater than those listed under “Absolute Maxim um Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability.
TRUTH TABLE
MODE
Standby H X X X High - Z ISB, ISB1 Standby X L X X High - Z ISB, ISB1
Output Disable L H H H High - Z ICC
Read L H L H D
Write L H X L DIN I
Note: H = VIH, L=VIL, X = Don't care.
CE
1
DC ELECTRICAL CHARACTERISTICS
PARAMETER SYMBOL TEST CONDITION MIN. MAX. UNIT
Input High Voltage VIH 2.2 VCC+0.5 V Input Low Voltage VIL -0.5 0.8 V Input Leakage Current ILI Output Leakage
Current
Output High Voltage VOH IOH= - 4mA 2.4 - V Output Low Voltage VOL IOL= 8mA - 0.4 V
Operating Power Supply Current
Standby Power Supply Current
Notes : VIL = -3.0V for pulse width less than 10ns.
ILO
ICC Cycle time =Min., I
ISB
I
SB1
*
CE2
≦VIN ≦VCC
V
SS
V
≦V
SS
or
OE
1CE
1CE
V
IN
1CE
V
IN
-0.5 to + 7.0 V
TERM
-65 to +150
STG
50 mA
OUT
I/O OPERATION SUPPLY CURRENT
OE
WE
(VCC = 5V±10%, TA = 0℃ to 70℃)
- 1 1
≦V
= V
=V
V
IH
V
CC
I/O
=V
IL
or V
V
CC,
or
WE
IH
,CE2= VIH
or CE2=V
IH
V
IN
-0.2V or CE2≦0.2V
CC
-0.2V or V
= V
I/O
IL
IN
or CE2=VIL
=V
1CE
IH
IL
= 0mA ,
IL
0.2V
℃ ℃
I
OUT
CC CC
- 1 1
- 10 - 180 mA
- 12 - 160 mA
- 15 - 140 mA
- 30 mA
- 5 mA
A
µ
A
µ
UTRON TECHNOLOGY INC. P80048 1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
2
Rev. 1.5
CAPACITANCE
PARAMETER SYMBOL MIN. MAX UNIT
Input Capacitance C Input/Output Capacitance C
Note : These parameters are guarant eed by devi ce characterization, but not production tested.
UTRON
(TA=25℃, f=1.0MHz)
128K X 8 BIT HIGH SPEED CMOS SRAM
I/O
IN
-
-
UT611024
8 pF
10 pF
AC TEST CONDITIONS
Input Pulse Levels 0V to 3.0V Input Rise and Fall Times 3ns Input and Output Timing Reference Levels 1.5V Output Load CL = 30pF, IOH/IOL = -1mA/4 mA
AC ELECTRICAL CHARACTERISTICS
(1) READ CYCLE
PARAMETER
Read Cycle Time Address Access Time Chip Enable Access Time Output Enable Access Time Chip Enable to Output in Low Z Output Enable to Output in Low Z Chip Disable to Output in High Z Output Disable to Output in High Z Output Hold from Address Change
(2) WRITE CYCLE PARAMETER
Write Cycle Time Address Valid to End of Write Chip Enable to End of Write Address Set-up Time Write Pulse Width Write Recovery Time Data to Write Time Overlap Data Hold from End of Write Time Output Active from End of Write Write to Output in High Z
*These parameters are guaranteed by device characterization, but not production tested.
SYMBOL UT611024-10 UT611024-12 UT611024-15 UNIT
tRC tAA t
ACE1, tACE2
tOE t
CLZ1*, tCLZ2*
t
OLZ*
t
CHZ*1,tCHZ*2
t
OHZ*
tOH
SYMBOL UT611024-10 UT611024-12 UT611024-15 UNIT
tWC tAW t
CW1, tCW2
tAS tWP tWR tDW tDH t
OW*
t
WHZ*
(V
= 5V±10%, TA = 0℃ to 70℃)
CC
MIN. MAX. MIN. MAX. MIN. MAX.
10 - 12 - 15 - ns
- 10 - 12 - 15 ns
- 10 - 12 - 15 ns
- 5 - 6 - 7 ns 2 - 3 - 4 - ns 0 - 0 - 0 - ns
- 5 - 6 - 7 ns
- 5 - 6 - 7 ns 3 - 3 - 3 - ns
MIN. MAX. MIN. MAX. MIN. MAX.
10 - 12 - 15 - ns
8 - 10 - 12 - ns 8 - 10 - 12 - ns 0 - 0 - 0 - ns 8 - 9 - 10 - ns 0 - 0 - 0 - ns 6 - 7 - 8 - ns 0 - 0 - 0 - ns 2 - 3 - 4 - ns
- 6 - 7 - 8 ns
UTRON TECHNOLOGY INC. P80048 1F, No. 11, R&D Rd. II, Science-Based Indus t ri a l P ark, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
3
A
UTRON
Rev. 1.5
TIMING WAVEFO RMS
READ CYCLE 1
(Address Controlled)
ddress
t
OH
D
OUT
READ CYCLE 2
(
CE2
1CE
128K X 8 BIT HIGH SPEED CMOS SRAM
(1,2,4)
t
RC
t
AA
Data Valid
OE
Controlled)
t
(1,3,5,6)
RC
and
UT611024
t
OH
Address
AA
t
ACE1
CE1
CE2
OE
CLZ1
t
CLZ2
t
, t
OLZ
HIGH-Z
, t
CHZ1
Dout
Notes :
1.
2. Device is continuousl y selected
3. Address must be val i d pri o r t o or coincident with
4.
5. t
6. At any given temperature and voltage condition, t
is HIGH for read cycle.
WE
is low.
OE
, t
CLZ1
CLZ2
, t
CHZ2
t
and t
t
ACE2
t
OLZ
=V
and CE2=V
IL
CE
1
are specified with CL=5pF. Transition is measured ±500mV from st eady state.
OHZ
CHZ1
OE
t
t
Data Valid
IH.
and CE2 transit i on; otherwise tAA is the limiting parameter.
CE
1
is less than t
CHZ1
CLZ1
, t
CHZ2
t
OHZ
t
OH
is less than t
t
CHZ2
CLZ2
, t
OHZ
HIGH-Z
is less than t
OLZ.
UTRON TECHNOLOGY INC. P80048 1F, No. 11, R&D Rd. II, Science-Based Indus t ri a l P ark, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
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