Texas Instruments TLV5614IPWR, TLV5614IPW, TLV5614IDR, TLV5614CPWR, TLV5614ID Datasheet

...
2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS
WITH POWER DOWN
SLAS188 – SEPTEMBER 1998
D
D
Programmable Settling Time of Either 3 µs or 9 µs Typ
D
TMS320, (Q)SPI, and Microwire Compatible Serial Interface
D
Internal Power-On Reset
D
Low Power Consumption:
8 mW, Slow Mode – 5-V Supply
3.6 mW, Slow Mode – 3-V Supply
D
Reference Input Buffer
D
Voltage Output Range ...2× the Reference Input Voltage
D
Monotonic Over Temperature
description
The TL V5614 is a quadruple 12-bit voltage output digital-to-analog converter (DAC) with a flexible 4-wire serial interface. The 4-wire serial interface allows glueless interface to TMS320, SPI, QSPI, and Microwire serial ports. The TLV5614 is programmed with a 16-bit serial word comprised of a DAC address, individual DAC control bits, and a 12-bit DAC value. The device has provision for two supplies: one digital supply for the serial interface (via pins DV
the DACs, reference buffers, and output buffers (via pins A VDD and AGND). Each supply is independent of the other, and can be any value between 2.7 V and 5.5 V. The dual supplies allow a typical application where the DAC will be controlled via a microprocessor operating on a 3 V supply (also used on pins DVDD and DGND), with the DACs operating on a 5 V supply. Of course, the digital and anlog supplies can be tied together.
and DGND), and one for
DD
D
Dual 2.7-V to 5.5-V Supply (Separate Digital and Analog Supplies)
D
Hardware Power Down (10 nA)
D
Software Power Down (10 nA)
D
Simultaneous Update
applications
D
Battery Powered Test Instruments
D
Digital Offset and Gain Adjustment
D
Industrial Process Controls
D
Machine and Motion Control Devices
D
Communications
D
Arbitrary Waveform Generation
D OR PW PACKAGE
(TOP VIEW)
DV
DD
PD
LDAC
DIN
SCLK
CS
FS
DGND
1 2 3 4 5 6 7 8
16 15 14 13 12 11 10
9
AV
DD
REFINAB OUTA OUTB OUTC OUTD REFINCD AGND
TLV5614
The resistor string output voltage is buffered by a x2 gain rail-to-rail output buffer . The buffer features a Class AB output stage to improve stability and reduce settling time. A rail-to-rail output stage and a power-down mode makes it ideal for single voltage, battery based applications. The settling time of the DAC is programmable to allow the designer to optimize speed versus power dissipation. The settling time is chosen by the control bits within the 16-bit serial input string. A high-impedance buffer is integrated on the REFINAB and REFINCD terminals to reduce the need for a low source impedance drive to the terminal. REFINAB and REFINCD allow DACs A and B to have a different reference voltage then DACs C and D.
The TLC5614 is implemented with a CMOS process and is available in a 16-terminal SOIC package. The TL V5614C is characterized for operation from 0°C to 70°C. The TLV5614I is characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright 1998, Texas Instruments Incorporated
1
TLV5614
2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS188 – SEPTEMBER 1998
AVAILABLE OPTIONS
PACKAGE
functional block diagram
T
A
0°C to 70°C TLV5614CD TLV5614CPW
–40°C to 85°C TLV5614ID TLV5614IPW
SOIC
(D)
TSSOP
(PW)
REFINAB
DIN
FS
SCLK
CS
AV
DD
15 16 1
+ _
12-Bit
DAC
Latch
2-Bit
Control
Data
Latch
DAC B
Serial
4
Input
Register
7
DAC Select/
5 6
Power-On
Reset
2
Control
Logic
14
14-Bit
Data
and
Control
Register
12
2
DV
DD
10
2
2
Power-Down/
Speed Control
DAC A
+ _
13
14
OUTA
OUTB
REFINCD
2
10
9
AGND
8
DGND
DAC C
DAC D
32
LDAC
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
PD
12
11
OUTC
OUTD
I/O
DESCRIPTION
2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS
Terminal Functions
TERMINAL
NAME NO.
AGND 9 Analog ground AV
DD
CS 6 I Chip select. This terminal is active low. DGND 8 Digital ground DIN 4 I Serial data input DV
DD
FS
PD
LDAC REFINAB 15 I Voltage reference input for DACs A and B.
REFINCD 10 I Voltage reference input for DACs C and D. SCLK 5 I Serial Clock input OUTA 14 O DACA output OUTB 13 O DACB output OUTC 12 O DACC output OUTD 11 O DACD output
16 Analog supply
1 Digital supply 7 I Frame sync input. The falling edge of the frame sync pulse indicates the start of a serial data frame shifted out to
the TLV5614.
2 I Power down pin. Powers down all DACs (overriding their individual power down settings), and all output stages.
This terminal is active low.
3 I Load DAC. When the LDAC signal is high, no DAC output updates occur when the input digital data is read into
the serial interface. The DAC outputs are only updated when LDAC
TLV5614
WITH POWER DOWN
SLAS188 – SEPTEMBER 1998
is low.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, (DV
Supply voltage difference, (AVDD to DVDD) –2.8 V to 2.8 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital input voltage range –0.3 V to DVDD + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Reference input voltage range –0.3 V to AVDD + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, T Storage temperature range, T
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
, AVDD to GND) 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DD
: TLV5614C 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A
TLV5614I –40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
stg
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
3
TLV5614
Suppl
oltage, AV
DV
V
Reference voltage, V
REFINAB, REFINCD terminal
V
Operating free-air temperature
°C
PSRR
Power supply rejection ratio
See Notes 8 and 9
2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS188 – SEPTEMBER 1998
recommended operating conditions
MIN NOM MAX UNIT
pp
y v
High-level digital input, V Low-level digital input, V
Load resistance, R Load capacitance, C Serial clock rate, SCLK 20 MHz
p
NOTE 1: Voltages greater than AVDD/2 will cause output saturation for large DAC codes.
DD
L
L
ref
,
DD
IH
IL
to
p
electrical characteristics over recommended operating free-air temperature range, supply voltages, and reference voltages (unless otherwise noted)
5-V supply 4.5 5 5.5 3-V supply 2.7 3 3.3 DVDD = 2.7 V to 5.5 V 2 V DVDD = 2.7 V to 5.5 V 0.8 V 5-V supply, See Note 1 0 2.048 VDD–1.5 3-V supply, See Note 1 0 1.024 VDD–1.5
2 10 k
100 pF
TLV5614C 0 70 TLV5614I –40 85
°
static DAC specifications
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Resolution 12 bits Integral nonlinearity (INL), end point adjusted See Note 2 ±1.5 ±4 LSB Differential nonlinearity (DNL) See Note 3 ±0.5 ±1 LSB
E
ZS
E
G
NOTES: 2. The relative accuracy or integral nonlinearity (INL) sometimes referred to as linearity error , is the maximum deviation of the output
Zero scale error (offset error at zero scale) See Note 4 ±12 mV Zero scale error temperature coefficient See Note 5 10 ppm/ °C
min
% of FS
voltage
).
Gain error See Note 6 ±0.6 Gain error temperature coefficient See Note 7 10 ppm/ °C
pp
from the line between zero and full scale excluding the effects of zero code and full-scale errors.
3. The differential nonlinearity (DNL) sometimes referred to as differential error, is the difference between the measured and ideal 1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains constant) as a change in the digital input code.
4. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.
5. Zero-scale-error temperature coefficient is given by: EZS TC = [EZS (T
6. Gain error is the deviation from the ideal output (2 V
7. Gain temperature coefficient is given by: EG TC = [EG(T
8. Zero-scale-error rejection ratio (EZS–RR) is measured by varying the AVDD from 5 ± 0.5 V and 3 ± 0.5 V dc, and measuring the proportion of this signal imposed on the zero-code output voltage.
9. Full-scale rejection ratio (EG-RR) is measured by varying the AVDD from 5 ± 0.5 V and 3 ±0.5 V dc and measuring the proportion of this signal imposed on the full-scale output voltage after subtracting the zero scale change.
Zero scale Full scale
) – EZS (T
– 1 LSB) with an output load of 10 k excluding the effects of the zero-error.
ref
max
) – EG (T
max
min
)]/V
× 106/(T
ref
min
)]/V
max
ref
– T
–80 dB –80 dB
× 106/(T
min
max
).
– T
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Reference input bandwidth
REFIN
V
1.024 V dc large signal
MH
No load, Clock
mA
IDDPower supply current
No load, Clock
mA
TLV5614
2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS
WITH POWER DOWN
SLAS188 – SEPTEMBER 1998
electrical characteristics over recommended operating free-air temperature range, supply voltages, and reference voltages (unless otherwise noted) (continued)
individual DAC output specifications
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
O
reference inputs (REFINAB, REFINCD)
V
I
R
I
C
I
NOTES: 10. Reference input voltages greater than VDD/2 will cause output saturation for large DAC codes.
Voltage output range RL = 10 k 0 AVDD–0.4 V Output load regulation accuracy RL = 2 k vs 10 k 0.1 0.25
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Input voltage range See Note 10 0 AVDD–1.5 V Input resistance 10 M Input capacitance 5 pF
Reference feed through
p
11. Reference feedthrough is measured at the DAC output with an input code = 000 hex and a V input = 1.024 Vdc + 1 Vpp at 1 kHz.
REFIN = 1 Vpp at 1 kHz + 1.024 V dc (see Note 11)
= 0.2
pp
+
–75 dB
Slow 0.5 Fast 1
ref (REFINAB or REFINCD)
% of FS
voltage
z
digital inputs (DIN, CS, LDAC, PD)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
I
IH
I
IL
C
I
High-level digital input current VI = V Low-level digital input current VI = 0 V ±1 µA Input capacitance 3 pF
power supply
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
pp
Power down supply current (see Figure 12) 10 nA
DD
5-V supply,
running,
All inputs 0 V or V 3-V supply,
running,
All inputs 0 V or DV
DD
DD
±1 µA
Slow 1.6 2.4 Fast 3.8 5.6 Slow 1.2 1.8 Fast 3.2 4.8
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
5
TLV5614
SR
Output slew rate
V
10% to 90%
tsOutput settling time
,
L
,
s
t
Output settling time, code to code
,
L
,
s
S,
f
s
400 KSPS
C
L
100 pF
R
L
2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS188 – SEPTEMBER 1998
electrical characteristics over recommended operating free-air temperature range, supply voltages, and reference voltages (unless otherwise noted) (continued)
analog output dynamic performance
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
p
p
s(c)
SNR Signal-to-noise ratio S/(N+D) Signal to noise + distortion THD Total harmonic Distortion
SFDR Spurious free dynamic range
NOTES: 12. Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change
p
Glitch energy Code transition from 7FF to 800 10 nV-sec
ofFFF hex to 080 hex for 080 hex to FFF hex.
13. Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change of one count.
14. Limits are ensured by design and characterization, but are not production tested.
CL = 100 pF, RL = 10 kΩ,
=
O
V
= 2.048 V, 1024 V
ref
To ± 0.5 LSB, C RL = 10 kΩ, See Notes 12 and 14
To ± 0.5 LSB, C RL = 10 kΩ, See Note 15
Sinewave generated by DAC, Reference voltage = 1.024 at 3 V and 2.048 at 5 V ,
= 400 KSP
=
f f
= 1.1 kHz sinewave,
OUT
=
BW = 20 kHz
p
,
,
,
= 100 pF,
= 100 pF,
= 10 k,
Fast 5 V/µs
Slow 1 V/µs
Fast 3 5.5
Slow 9 20
Fast 1
Slow 2
74 66
–68
70
µ
µ
dB
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV5614
2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS
WITH POWER DOWN
SLAS188 – SEPTEMBER 1998
electrical characteristics over recommended operating free-air temperature range, supply voltages, and reference voltages (unless otherwise noted) (continued)
digital input timing requirements
MIN NOM MAX UNIT
t
su(CS–FS)
t
su(FS–CK)
t
su(C16–FS)
t
su(C16–CS)
t
wH
t
wL
t
su(D)
t
h(D)
t
wH(FS)
Setup time, CS low before FS 10 ns Setup time, FS low before first negative SCLK edge 8 ns Setup time, sixteenth negative edge after FS low on which bit D0 is sampled before rising
edge of FS Setup time, sixteenth positive SCLK edge (first positive after D0 is sampled) before CS rising
edge. If FS is used instead of the sixteenth positive edge to update the DAC, then the setup time is between the FS rising edge and CS
Pulse duration, SCLK high 25 ns Pulse duration, SCLK low 25 ns Setup time, data ready before SCLK falling edge 8 ns
Hold time, data held valid after SCLK falling edge 5 ns Pulse duration, FS high 20 ns
rising edge.
10 ns
10 ns
SCLK
DIN
CS
FS
t
su(D)
PARAMETER MEASUREMENT INFORMATION
t
wL
123451516
t
h(D)
D15 D14 D13 D12 D1 D0
t
su(FS-CK)
t
su(CS-FS)
t
wH(FS)
Figure 1. Timing Diagram
t
wH
t
t
su(C16-FS)
su(C16-CS)
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
7
TLV5614
2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS188 – SEPTEMBER 1998
TYPICAL CHARACTERISTICS
0.2
0.18
0.16
0.14
0.12
0.10
– Output – V
0.08
O
V
0.06
0.04
0.02 0
4.01
LOAD REGULATION
VDD = 3 V, V
= 1 V,
ref
VO = Full Scale
3 V Slow Mode, Sink
3 V Fast Mode, Sink
0 0.01 0.02 0.05 0.1 0.2 0.5
Load Current – mA
Figure 2
LOAD REGULATION
5 V Slow Mode, Source
12
0.35 VDD = 5 V,
V
0.30
VO = Full Scale
0.25
0.20
– Output – V
0.15
O
V
0.10
0.05
0
0 0.02 0.04 0.1 0.2 0.4 1
2.001
2.001
ref
LOAD REGULATION
= 2 V,
5 V Slow Mode, Sink
5 V Fast Mode, Sink
24
Load Current – mA
Figure 3
LOAD REGULATION
3 V Slow Mode, Source
4.005
4
– Output – V
3.995
O
V
3.99
3.985
5 V Fast Mode, Source
VDD = 5 V, V
ref
VO = Full Scale
0 0.02 0.04 0.1 0.2 0.4 1
Load Current – mA
Figure 4
= 2 V,
24
2.000
2.000
1.999
1.999
– Output – V
1.998
O
V
1.998
1.997
1.997
1.996 0 0.01 0.02 0.05 0.1 0.2 0.5
3 V Fast Mode, Source
Load Current – mA
Figure 5
VDD = 3 V, V
= 1 V,
ref
VO = Full Scale
12
8
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV5614
2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS
WITH POWER DOWN
SLAS188 – SEPTEMBER 1998
TYPICAL CHARACTERISTICS
4
VDD = 3 V, V
= 1.024 V,
3.5
2.5
– Supply Current – mA
1.5
DD
I
0.5
ref
VO Full Scale (Worst Case For IDD)
3
2
1
–55 –40 –25 0 25 40 70
TOTAL HARMONIC DISTORTION
0
V
= 1 V dc + 1 V p/p Sinewave,
–10
ref
Output Full Scale
SUPPLY CURRENT
vs
TEMPERATURE
Fast Mode
Slow Mode
T – Temperature – °C
Figure 6
vs
FREQUENCY
85 125
4
3.5
3
2.5
2
– Supply Current – mA
DD
1.5
I
1
0.5 –55 –40 –25 0 25 40 70
TOTAL HARMONIC DISTORTION
0
V
= 1 V dc + 1 V p/p Sinewave,
–10
ref
Output Full Scale
SUPPLY CURRENT
vs
TEMPERATURE
Fast Mode
VDD = 5 V, V
= 1.024 V,
ref
VO Full Scale (Worst Case For IDD)
Slow Mode
T – Temperature – °C
Figure 7
vs
FREQUENCY
85 125
–20
–30
––40
–50
–60
THD – Total Harmonic Distortion – dB
–70
–80
0 5 10 20
f – Frequency – kHz
Figure 8
Fast Mode
–20
–30
––40
–50
–60
THD – Total Harmonic Distortion – dB
–70
30 50 100
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
–80
0 5 10 20
Slow Mode
30 50 100
f – Frequency – kHz
Figure 9
9
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