TEXAS INSTRUMENTS TLV5614 Technical data

TLV5614

2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS

WITH POWER DOWN

SLAS188B – SEPTEMBER 1998 – REVISED APRIL 2003

D Four 12-Bit D/A Converters
D Programmable Settling Time of Either 3 µs

or 9 µs Typ

D TMS320, (Q)SPI, and Microwire

Compatible Serial Interface

D Dual 2.7-V to 5.5-V Supply (Separate Digital

and Analog Supplies)

D Hardware Power Down (10 nA)
D Software Power Down (10 nA)
D Simultaneous Update

D Internal Power-On Reset
D Low Power Consumption:

8 mW, Slow Mode – 5-V Supply

3.6 mW, Slow Mode – 3-V Supply

D Reference Input Buffer
D Voltage Output Range ...2× the Reference

Input Voltage

D Monotonic Over Temperature

description

The TL V5614 is a quadruple 12-bit voltage output
digital-to-analog converter (DAC) with a flexible
4-wire serial interface. The 4-wire serial interface
allows glueless interface to TMS320, SPI, QSPI,
and Microwire serial ports. The TLV5614 is
programmed with a 16-bit serial word comprised
of a DAC address, individual DAC control bits, and
a 12-bit DAC value. The device has provision for
two supplies: one digital supply for the serial
interface (via pins DV
the DACs, reference buffers, and output buffers (via pins A V
other, and can be any value between 2.7 V and 5.5 V. The dual supplies allow a typical application where the
DAC is controlled via a microprocessor operating on a 3 V supply (also used on pins DV
the DACs operating on a 5 V supply. Of course, the digital and analog supplies can be tied together.

and DGND), and one for

DD

applications

D Battery Powered Test Instruments
D Digital Offset and Gain Adjustment
D Industrial Process Controls
D Machine and Motion Control Devices
D Communications
D Arbitrary Waveform Generation

D OR PW PACKAGE

(TOP VIEW)

DV

LDAC

SCLK

DGND

and AGND). Each supply is independent of the

DD

DD

PD

DIN

CS

FS

1
2
3
4
5
6
7
8

AV

16

DD

REFINAB

15

OUTA

14

OUTB

13

OUTC

12

OUTD

11

REFINCD

10

AGND

9

and DGND), with

DD

The resistor string output voltage is buffered by a x2 gain rail-to-rail output buffer . The buffer features a Class AB
output stage to improve stability and reduce settling time. A rail-to-rail output stage and a power-down mode
makes it ideal for single voltage, battery based applications. The settling time of the DAC is programmable to
allow the designer to optimize speed versus power dissipation. The settling time is chosen by the control bits
within the 16-bit serial input string. A high-impedance buffer is integrated on the REFINAB and REFINCD
terminals to reduce the need for a low source impedance drive to the terminal. REFINAB and REFINCD allow
DACs A and B to have a different reference voltage then DACs C and D.

The TLV5614 is implemented with a CMOS process and is available in a 16-terminal SOIC package. The
TL V5614C is characterized for operation from 0°C to 70°C. The TLV5614I is characterized for operation from
–40°C to 85°C.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.

PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.

Copyright  1998 – 2003, Texas Instruments Incorporated

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

1

TLV5614

2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS

WITH POWER DOWN

SLAS188B – SEPTEMBER 1998 – REVISED APRIL 2003

AVAILABLE OPTIONS

PACKAGE

T

A

0°C to 70°C TLV5614CD TLV5614CPW –––

–40°C to 85°C TLV5614ID TLV5614IPW TLV5614IYE

†

Wafer Scale Packaging, also called Bumped Dice. See Figure 17.

functional block diagram

SOIC

(D)

TSSOP

(PW)

WSP

(YE)

†

REFINAB

DIN

FS

SCLK

CS

AV

DD

15 16 1

+
_

12-Bit

DAC

Latch

2-Bit

Control

Data

Latch

DAC B

Serial

4

Input

Register

7

DAC Select/

5
6

Power-On

Reset

2

Control

Logic

14

14-Bit

Data

and

Control

Register

12

2

DV

DD

10

2

2

Power-Down/

Speed Control

DAC A

+
_

13

14

OUTA

OUTB

REFINCD

2

10

9

AGND

8

DGND

DAC C

DAC D

32

LDAC

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

PD

12

11

OUTC

OUTD

TLV5614

2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS

WITH POWER DOWN

SLAS188B – SEPTEMBER 1998 – REVISED APRIL 2003

Terminal Functions

TERMINAL

NAME NO.

AGND 9 Analog ground
AV

DD

CS 6 I Chip select. This terminal is active low.
DGND 8 Digital ground
DIN 4 I Serial data input
DV

DD

FS

PD

LDAC
REFINAB 15 I Voltage reference input for DACs A and B.

REFINCD 10 I Voltage reference input for DACs C and D.
SCLK 5 I Serial clock input
OUTA 14 O DACA output
OUTB 13 O DACB output
OUTC 12 O DACC output
OUTD 11 O DACD output

I/O

16 Analog supply

1 Digital supply
7 I Frame sync input. The falling edge of the frame sync pulse indicates the start of a serial data frame shifted out to

the TLV5614.

2 I Power down pin. Powers down all DACs (overriding their individual power down settings), and all output stages.

This terminal is active low.

3 I Load DAC. When the LDAC signal is high, no DAC output updates occur when the input digital data is read into

the serial interface. The DAC outputs are only updated when LDAC

DESCRIPTION

is low.

absolute maximum ratings over operating free-air temperature range (unless otherwise noted)

Supply voltage, (DV
Supply voltage difference, (AV
Digital input voltage range –0.3 V to DV
Reference input voltage range –0.3 V to AV
Operating free-air temperature range, T

Storage temperature range, T

Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

†

Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

, AVDD to GND) 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

DD

to DVDD) –2.8 V to 2.8 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

DD

: TLV5614C 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

A

TLV5614I –40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

stg

DD
DD

+ 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

+ 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

†

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3

TLV5614

2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS

WITH POWER DOWN

SLAS188B – SEPTEMBER 1998 – REVISED APRIL 2003

recommended operating conditions

MIN NOM MAX UNIT

Supply voltage, AVDD, DV

High-level digital input voltage, V

Low-level digital input voltage, V

Reference voltage, V
Load resistance, R

Load capacitance, C
Serial clock rate, SCLK 20 MHz

Operating free-air temperature

NOTE 1: Voltages greater than AVDD/2 cause output saturation for large DAC codes.

DD

IH

IL

to REFINAB, REFINCD terminal

ref

L

L

electrical characteristics over recommended operating free-air temperature range, supply
voltages, and reference voltages (unless otherwise noted)

5-V supply 4.5 5 5.5
3-V supply 2.7 3 3.3
DVDD = 2.7 V 2
DVDD = 5.5 V 2.4
DVDD = 2.7 V 0.6
DVDD = 5.5 V 1
5-V supply, See Note 1 0 2.048 VDD–1.5
3-V supply, See Note 1 0 1.024 VDD–1.5

2 10 kΩ

100 pF

TLV5614C 0 70
TLV5614I –40 85

V

V

V

V

°C

static DAC specifications

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

Resolution 12 bits
Integral nonlinearity (INL), end point adjusted See Note 2 ±1.5 ±4 LSB
Differential nonlinearity (DNL) See Note 3 ±0.5 ±1 LSB

E

ZS

E

G

PSRR Power supply rejection ratio

NOTES: 2. The relative accuracy or integral nonlinearity (INL) sometimes referred to as linearity error , is the maximum deviation of the output

Zero scale error (offset error at zero scale) See Note 4 ±12 mV
Zero scale error temperature coefficient See Note 5 10 ppm/°C

min

% of FS

voltage

).

Gain error See Note 6 ±0.6
Gain error temperature coefficient See Note 7 10 ppm/°C

Zero scale
Full scale

from the line between zero and full scale excluding the effects of zero code and full-scale errors.

3. The differential nonlinearity (DNL) sometimes referred to as differential error, is the difference between the measured and ideal
1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains
constant) as a change in the digital input code.

4. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.

5. Zero-scale-error temperature coefficient is given by: EZS TC = [EZS (T

6. Gain error is the deviation from the ideal output (2 V

7. Gain temperature coefficient is given by: EG TC = [EG(T

8. Zero-scale-error rejection ratio (EZS–RR) is measured by varying the AVDD from 5 ± 0.5 V and 3 ± 0.3 V dc, and measuring the
proportion of this signal imposed on the zero-code output voltage.

9. Full-scale rejection ratio (EG-RR) is measured by varying the AVDD from 5 ± 0.5 V and 3 ±0.3 V dc and measuring the proportion
of this signal imposed on the full-scale output voltage after subtracting the zero scale change.

See Notes 8 and 9

) – EZS (T

– 1 LSB) with an output load of 10 kΩ excluding the ef fects of the zero-error.

ref

max

) – EG (T

max

min

)]/V

× 106/(T

ref

min

)]/V

max

ref

– T

–80 dB
–80 dB

× 106/(T

min

max

).

– T

4

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

TLV5614

2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS

WITH POWER DOWN

SLAS188B – SEPTEMBER 1998 – REVISED APRIL 2003

electrical characteristics over recommended operating free-air temperature range, supply
voltages, and reference voltages (unless otherwise noted) (continued)

individual DAC output specifications

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

V

O

reference inputs (REFINAB, REFINCD)

V

I

R

I

C

I

NOTES: 10. Reference input voltages greater than VDD/2 cause output saturation for large DAC codes.

Voltage output range RL = 10 kΩ 0 AVDD–0.4 V
Output load regulation accuracy RL = 2 kΩ vs 10 kΩ 0.1 0.25

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

Input voltage range See Note 10 0 AVDD–1.5 V
Input resistance 10 MΩ
Input capacitance 5 pF

Reference feed through

Reference input bandwidth REFIN = 0.2 Vpp + 1.024 V dc large signal

11. Reference feedthrough is measured at the DAC output with an input code = 000 hex and a V
input = 1.024 Vdc + 1 Vpp at 1 kHz.

REFIN = 1 Vpp at 1 kHz + 1.024 V dc
(see Note 11)

–75 dB

Slow 0.5
Fast 1

ref (REFINAB or REFINCD)

% of FS

voltage

MHz

digital inputs (DIN, CS, LDAC, PD)

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

I

IH

I

IL

C

I

High-level digital input current VI = V
Low-level digital input current VI = 0 V ±1 µA
Input capacitance 3 pF

power supply

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

I

DD

Power supply current

Power down supply current (see Figure 12) 10 nA

DD

5-V supply,
No load, Clock running,
All inputs 0 V or V

3-V supply,
No load, Clock running,
All inputs 0 V or DV

DD

DD

±1 µA

Slow 1.6 2.4
Fast 3.8 5.6
Slow 1.2 1.8
Fast 3.2 4.8

mA

mA

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5

TLV5614

To ± 0.5 LSB

C

L

100 F

To ± 0.5 LSB

C

L

100 F

,

f

= 400 KSPS

2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS

WITH POWER DOWN

SLAS188B – SEPTEMBER 1998 – REVISED APRIL 2003

electrical characteristics over recommended operating free-air temperature range, supply
voltages, and reference voltages (unless otherwise noted) (continued)

analog output dynamic performance

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

CL = 100 pF, RL = 10 kΩ,

SR Output slew rate

t

s

t

s(c)

SNR Signal-to-noise ratio
S/(N+D) Signal to noise + distortion
THD Total harmonic distortion

SFDR Spurious free dynamic range

NOTES: 12. Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change

Output settling time

Output settling time, code to code
Glitch energy Code transition from 7FF to 800 10 nV-sec

ofFFF hex to 080 hex for 080 hex to FFF hex.

13. Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change
of one count.

14. Limits are ensured by design and characterization, but are not production tested.

VO = 10% to 90%,
V

= 2.048 V, 1024 V

ref

To ± 0.5 LSB, C
RL = 10 kΩ, See Notes 12 and 14

To ± 0.5 LSB, C
RL = 10 kΩ, See Note 13

Sinewave generated by DAC,
Reference voltage = 1.024 at 3 V and 2.048 at 5 V ,

= 400 KSPS

f

s

f

= 1.1 kHz sinewave,

OUT

CL = 100 pF, RL = 10 kΩ,
BW = 20 kHz

= 100 pF,

,

=

= 100 pF,

,

=

,

p

,

,

Fast 5 V/µs

Slow 1 V/µs

Fast 3 5.5

Slow 9 20

Fast 1

Slow 2

74
66

–68

70

µs

µs

dB

6

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TLV5614

2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS

WITH POWER DOWN

SLAS188B – SEPTEMBER 1998 – REVISED APRIL 2003

electrical characteristics over recommended operating free-air temperature range, supply
voltages, and reference voltages (unless otherwise noted) (continued)

digital input timing requirements

MIN NOM MAX UNIT

t

su(CS–FS)

t

su(FS–CK)

t

su(C16–FS)

t

su(C16–CS)

t

wH

t

wL

t

su(D)

t

h(D)

t

wH(FS)

Setup time, CS low before FS↓ 10 ns
Setup time, FS low before first negative SCLK edge 8 ns
Setup time, sixteenth negative SCLK edge after FS low on which bit D0 is sampled before

rising edge of FS
Setup time. The first positive SCLK edge after D0 is sampled before CS rising edge. If FS

is used instead of the SCLK positive edge to update the DAC, then the setup time is between
the FS rising edge and CS rising edge.

Pulse duration, SCLK high 25 ns
Pulse duration, SCLK low 25 ns
Setup time, data ready before SCLK falling edge 8 ns

Hold time, data held valid after SCLK falling edge 5 ns
Pulse duration, FS high 20 ns

10 ns

10 ns

SCLK

DIN

CS

FS

t

su(D)

PARAMETER MEASUREMENT INFORMATION

t

wL

123451516

t

h(D)

D15 D14 D13 D12 D1 D0

t

su(FS-CK)

t

su(CS-FS)

t

wH(FS)

Figure 1. Timing Diagram

t

wH

t

t

su(C16-FS)

su(C16-CS)

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TLV5614

2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS

WITH POWER DOWN

SLAS188B – SEPTEMBER 1998 – REVISED APRIL 2003

TYPICAL CHARACTERISTICS

LOAD REGULATION

0.2
VDD = 3 V,

0.18

V

= 1 V,

ref

VO = Full Scale

0.16

0.14

0.12

0.10

– Output – V

0.08

O

V

0.06

0.04

0.02
0

0 0.01 0.02 0.05 0.1 0.2 0.5 1 20.8

3 V Slow Mode, Sink

3 V Fast Mode, Sink

Load Current – mA

Figure 2

LOAD REGULATION

4.01
5 V Slow Mode, Source

LOAD REGULATION

0.35
VDD = 5 V,

V

= 2 V,

0.30

0.25

0.20

– Output – V

0.15

O

V

0.10

0.05

ref

VO = Full Scale

0

0 0.02 0.04 0.1 0.2 0.4 1 2 40.8

Load Current – mA

Figure 3

LOAD REGULATION

2.0015

2.001

3 V Slow Mode, Source

5 V Slow Mode, Sink

5 V Fast Mode, Sink

4.005

4

– Output – V

3.995

O

V

3.99

3.985
0 0.02 0.04 0.1 0.2 0.4 1 2 40.8

5 V Fast Mode, Source

Load Current – mA

Figure 4

VDD = 5 V,
V

= 2 V,

ref

VO = Full Scale

2.0005

1.9995

– Output – V

1.9985

O

V

1.9975

1.9965

2.000
3 V Fast Mode, Source

1.999

1.998

1.997

0 0.01 0.02 0.05 0.1 0.2 0.5 1 20.8

Load Current – mA

Figure 5

VDD = 3 V,
V

= 1 V,

ref

VO = Full Scale

8

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TLV5614

2.7-V TO 5.5-V 12-BIT 3-µS QUADRUPLE DIGITAL-TO-ANALOG CONVERTERS

WITH POWER DOWN

SLAS188B – SEPTEMBER 1998 – REVISED APRIL 2003

TYPICAL CHARACTERISTICS

SUPPLY CURRENT

vs

TEMPERATURE

4

VDD = 3 V,
V

= 1.024 V,

ref

VO Full Scale
(Worst Case For IDD)

3

2

1

–40 –20 0 20 40 60 80 100

Slow Mode

T – Temperature – °C

Fast Mode

– Supply Current – mA

DD

I

3.5

2.5

1.5

0.5

Figure 6

TOTAL HARMONIC DISTORTION

vs

FREQUENCY

0

V

= 1 V dc + 1 V p/p Sinewave,

–10

ref

Output Full Scale

SUPPLY CURRENT

vs

TEMPERATURE

4

3.5

3

2.5

2

– Supply Current – mA

DD

1.5

I

1

0.5
–40 –20 0 20 40 60 80 100

Slow Mode

T – Temperature – °C

Fast Mode

VDD = 5 V,
V

= 1.024 V,

ref

VO Full Scale
(Worst Case For IDD)

Figure 7

TOTAL HARMONIC DISTORTION

vs

FREQUENCY

0

V

= 1 V dc + 1 V p/p Sinewave,

–10

ref

Output Full Scale

THD – Total Harmonic Distortion – dB

–20

–30

––40

–50

–60

–70

–80

0 5 10 20

Fast Mode

30 50 100

f – Frequency – kHz

Figure 8

–20

–30

––40

–50

–60

THD – Total Harmonic Distortion – dB

–70

–80

0 5 10 20

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Slow Mode

30 50 100

f – Frequency – kHz

Figure 9

9