Texas Instruments TLV2332IDR, TLV2332ID, TLV2334IPWLE, TLV2334IPW, TLV2334IN Datasheet

...
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
D
Wide Range of Supply Voltages Over Specified Temperature Range:
T
A
= –40°C to 85°C...2 V to 8 V
D
Fully Characterized at 3 V and 5 V
D
Single-Supply Operation
D
Common-Mode Input-Voltage Range Extends Below the Negative Rail and up to V
DD
–1 V at TA = 25°C
D
Output Voltage Range Includes Negative Rail
D
High Input Impedance...10
12
Typ
D
ESD-Protection Circuitry
D
Designed-In Latch-Up Immunity
description
The TL V233x operational amplifiers are in a family of devices that has been specifically designed for use in low-voltage single-supply applications. Unlike the TLV2322 which is optimized for ultra-low power, the TLV233x is designed to provide a combination of low power and good ac performance. Each amplifier is fully functional down to a minimum supply voltage of 2 V, is fully characterized, tested, and specified at both 3-V and 5-V power supplies. The common-mode input-voltage range includes the negative rail and extends to within 1 V of the positive rail.
Having a maximum supply current of only 310 µA per amplifier over full temperature range, the TLV233x devices offer a combination of good ac performance and microampere supply currents. From a 3-V power supply, the amplifier’s typical slew rate is 0.38 V/µs and its bandwidth is 300 kHz.
AVAILABLE OPTIONS
PACKAGED DEVICES
T
A
VIOmax
AT 25°C
SMALL OUTLINE
(D)
PLASTIC DIP
(N)
PLASTIC DIP
(P)
TSSOP
(PW)
CHIP FORM
§
(Y)
°
°
9 mV TLV2332ID TLV2332IP TLV2332IPWLE TLV2332Y
40°C to 85°C
10 mV TLV2334ID TLV2334IN TLV2334IPWLE TLV2334Y
The D package is available taped and reeled. Add R suffix to the device type (e.g., TL V2332IDR).
The PW package is only available left-end taped and reeled (e.g., TLV2332IPWLE).
§
Chip forms are tested at 25°C only.
Copyright 1997, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
LinCMOS is a trademark of Texas Instruments Incorporated.
1 2 3 4
8 7 6 5
1OUT
1IN– 1IN+
V
DD–
/GND
V
DD
2OUT 2IN– 2IN+
1 2 3 4
8 7 6 5
1OUT
1IN–
1IN+
V
DD –
/GND
V
DD+
2OUT 2IN– 2IN+
TLV2332
D OR P PACKAGE
(TOP VIEW)
TLV2332
PW PACKAGE
(TOP VIEW)
1 2 3 4 5 6 7
14 13 12 11 10
9 8
1OUT
1IN– 1IN+
V
DD+
2IN+
2N–
2OUT
4OUT 4IN– 4IN+ V
DD–/GND
3IN+ 3IN– 3OUT
4OUT 4IN– 4IN+ V
DD–/GND
3IN+ 3IN– 3OUT
1OUT
1IN– 1IN+
V
DD+
2IN+ 2IN–
2OUT
1
78
14
TLV2334
D OR N PACKAGE
(TOP VIEW)
TLV2334
PW PACKAGE
(TOP VIEW)
TLV2332, TLV2332Y, TLV2334, TLV2334Y LinCMOS LOW-VOLTAGE MEDIUM-POWER OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
description (continued)
These amplifiers offer a level of ac performance greater than that of many other devices operating at comparable power levels. The TL V233x operational amplifiers are especially well suited for use in low-current or battery-powered applications.
Low-voltage and low-power operation has been made possible by using the Texas Instruments silicon-gate LinCMOS technology . The LinCMOS process also features extremely high input impedance and ultra-low bias currents making these amplifiers ideal for interfacing to high-impedance sources such as sensor circuits or filter applications.
T o facilitate the design of small portable equipment, the TL V233x is made available in a wide range of package options, including the small-outline and thin-shrink small-outline package (TSSOP). The TSSOP package has significantly reduced dimensions compared to a standard surface-mount package. Its maximum height of only
1.1 mm makes it particularly attractive when space is critical. The device inputs and outputs are designed to withstand –100-mA currents without sustaining latch-up. The
TLV233x incorporates internal ESD-protection circuits that prevents functional failures at voltages up to 2000 V as tested under MIL-STD 883C, Method 3015.2; however, care should be exercised in handling these devices as exposure to ESD may result in the degradation of the device parametric performance.
TLV2332Y chip information
This chip, when properly assembled, display characteristics similar to the TLV2332. Thermal compression or ultrasonic bonding may be used on the doped-aluminum bonding pads. Chips may be mounted with conductive epoxy or a gold-silicon preform.
BONDING PAD ASSIGNMENTS
CHIP THICKNESS: 15 MILS TYPICAL BONDING PADS: 4 × 4 MILS MINIMUM TJmax = 150°C TOLERANCES ARE ±10%. ALL DIMENSIONS ARE IN MILS. PIN (4) IS INTERNALLY CONNECTED
TO BACKSIDE OF CHIP.
+
1OUT
1IN+
1IN–
V
DD
V
DD–
/GND
(8)
(6)
(3)
(2)
(5)
(1)
+
(7)
2IN+
2IN–
2OUT
(4)
59
72
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV2334Y chip information
This chip, when properly assembled, displays characteristics similar to the TL V2334. Thermal compression or ultrasonic bonding may be used on the doped-aluminum bonding pads. Chips may be mounted with conductive epoxy or a gold-silicon preform.
BONDING PAD ASSIGNMENTS
+
1OUT
1IN+
1IN–
V
DD
(4)
(6)
(3)
(2)
(5)
(1)
2IN+
2IN–
2OUT
(11)
V
DD–
/GND
+
3OUT
3IN+
3IN–
(13)
(10)
(9)
(12)
(8)
+
(14)
4OUT
4IN+
4IN–
+
(7)
CHIP THICKNESS: 15 MILS TYPICAL BONDING PADS: 4 × 4 MILS MINIMUM TJmax = 150°C TOLERANCES ARE ±10%. ALL DIMENSIONS ARE IN MILS.
68
108
(1) (2) (3) (4) (5) (6) (7)
(8)(9)(10)(11)(12)(13)(14)
TLV2332, TLV2332Y, TLV2334, TLV2334Y LinCMOS LOW-VOLTAGE MEDIUM-POWER OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
equivalent schematic (each amplifier)
P1
P4
P5
P6
N3
N5
OUT
R6
V
DD
P3
P2
IN–
IN+
R1
R2
R5
C1
R3
D1
R4
N1
N2
D2
GND
N4
N6
R7
N7
ACTUAL DEVICE COMPONENT COUNT
COMPONENT TLV2332 TLV2334
Transistors 54 108 Resistors 14 28 Diodes 4 8 Capacitors 2 4
Includes both amplifiers and all ESD, bias, and trim circuitry.
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
Supply voltage, V
DD
(see Note 1) 8 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Differential input voltage, V
ID
(see Note 2) V
DD±
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, V
I
(any input) –0.3 V to V
DD
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input current, I
I
±5 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output current, I
O
±30 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Duration of short-circuit current at (or below) T
A
= 25°C (see Note 3) unlimited. . . . . . . . . . . . . . . . . . . . . . . . .
Continuous total dissipation See Dissipation Rating Table. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, T
A
–40°C to 85° C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltage values, except differential voltages, are with respect to network ground.
2. Differential voltages are at the noninverting input with respect to the inverting input.
3. The output may be shorted to either supply. Temperature and /or supply voltages must be limited to ensure that the maximum dissipation rating is not exceeded (see application section).
DISSIPATION RATING TABLE
T
25°C DERATING FACTOR T
= 85°C
PACKAGE
A
POWER RATING ABOVE TA = 25°C
A
POWER RATING
D–8 725 mW 5.8 mW/°C 377 mW
D–14 950 mW 7.6 mW/°C 494 mW
N 1575 mW 12.6 mW/°C 819 mW P 1000 mW 8.0 mW/°C 520 mW
PW–8 525 mW 4.2 mW/°C 273 mW
PW–14 700 mW 5.6 mW/°C 364 mW
recommended operating conditions
MIN MAX UNIT
Supply voltage, V
DD
2 8 V
p
VDD = 3 V –0.2 1.8
Common-mode input voltage, V
IC
VDD = 5 V –0.2 3.8
V
Operating free-air temperature, T
A
–40 85 °C
TLV2332, TLV2332Y, TLV2334, TLV2334Y LinCMOS LOW-VOLTAGE MEDIUM-POWER OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV2332I electrical characteristics at specified free-air temperature
TLV2332I
PARAMETER
TEST
T
A
VDD = 3 V VDD = 5 V
UNIT
CONDITIONS
A
MIN TYP MAX MIN TYP MAX
p
VO = 1 V, V
= 1 V,
25°C 0.6 9 1.1 9
VIOInput offset voltage
IC
,
RS = 50 , RL = 100 k
Full range 11 11
mV
α
VIO
Average temperature coefficient of input offset voltage
25°C to
85°C
1 1.7 µV/°C
p
V
= 1 V,
25°C 0.1 0.1
p
IIOInput offset current (see Note 4)
O
,
VIC = 1 V
85°C 22 1000 24 1000
pA
p
V
= 1 V,
25°C 0.6 0.6
p
IIBInput bias current (see Note 4)
O
,
VIC = 1 V
85°C 175 2000 200 2000
pA
°
–0.2
–0.3
–0.2
–0.3
Common-mode input
25°C
t
o 2
t
o
2.3
t
o 4
t
o
4.2
V
ICR
voltage range (see Note 5)
Full range
–0.2
to
1.8
–0.2
to
3.8
V
p
VIC = 1 V,
25°C 1.75 1.9 3.2 3.9
VOHHigh-level output voltage
V
ID
=
100 mV
,
IOH = –1 mA
Full range 1.7 3
V
p
VIC = 1 V,
25°C 115 150 95 150
VOLLow-level output voltage
V
ID
= –
100 mV
,
IOL = 1 mA
Full range 190 190
mV
Large-signal differential
VIC = 1 V,
25°C 25 83 25 170
A
VD
gg
voltage amplification
R
L
=
100 k
,
See Note 6
Full range 15 15
V/mV
VO = 1 V,
25°C 65 92 65 91
CMRR
Common-mode rejection ratio
V
IC
=
V
ICR
min,
RS = 50
Full range 60 60
dB
Supply-voltage rejection ratio
VIC = 1 V,
25°C 70 94 70 94
k
SVR
ygj
(VDD/VIO)
V
O
=
1 V
,
RS = 50
Full range 65 65
dB
pp
VO = 1 V,
25°C 160 500 210 560
IDDSupply current
V
IC
= 1 V,
No load
Full range 620 800
µ
A
Full range is –40°C to 85°C.
NOTES: 4. The typical values of input bias current and input offset current below 5 pA are determined mathematically .
5. This range also applies to each input individually.
6. At VDD = 5 V, VO = 0.25 V to 2 V; at VDD = 3 V, VO = 0.5 V to 1.5 V.
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
7
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV2332I operating characteristics at specified free-air temperature, VDD = 3 V
TLV2332I
PARAMETER
TEST CONDITIONS
T
A
MIN TYP MAX
UNIT
VIC = 1 V,
V
I(PP)
= 1 V,
p
25°C 0.38
SR
Slew rate at unity gain
R
L
=
100 k
,
See Figure 34
C
L
= 20 F,
85°C
0.29
V/µs
V
n
Equivalent input noise voltage
f =1 kHz, See Figure 35
RS = 20 ,
25°C 32
nV/Hz
p
V
= V
, C
= 20 pF,
25°C 34
BOMMaximum output-swing bandwidth
OOH
,
RL = 100 k,
L
,
See Figure 34
85°C
32
kH
z
V
= 10 mV, C
= 20 pF,
25°C 300
B1Unity-gain bandwidth
I
,
RL = 100 k,
L
,
See Figure 36
85°C 235
kH
z
V
= 10 mV
,
f = B
,
–40°C 42°
φ
m
Phase margin
V
I
10
mV,
CL = 20 pF,
f B1,
RL = 100 k,
25°C
39°
See Figure 36
85°C 36°
TLV2332I operating characteristics at specified free-air temperature, VDD = 5 V
TLV2332I
PARAMETER
TEST CONDITIONS
T
A
MIN TYP MAX
UNIT
25°C 0.43
V
IC
= 1 V,
RL = 100 k,
V
I(PP)
= 1
V
85°C 0.35
SR
Slew rate at unity gain
L
,
CL = 20 pF,
25°C 0.40
V/µs
See Figure 34
V
I(PP)
= 2.5
V
85°C 0.32
V
n
Equivalent input noise voltage
f =1 kHz, See Figure 35
RS = 20 ,
25°C 32
nV/Hz
p
V
= V
, C
= 20 pF,
25°C 55
BOMMaximum output-swing bandwidth
OOH
,
RL = 100 k,
L
,
See Figure 34
85°C
45
kH
z
V
= 10 mV, C
= 20 pF,
25°C 525
B1Unity-gain bandwidth
I
,
RL = 100 k,
L
,
See Figure 36
85°C
370
kH
z
V
= 10 mV
,
f = B
,
–40°C 43°
φ
m
Phase margin
V
I
10
mV,
CL = 20 pF,
f B1,
RL = 100 k,
25°C
40°
See Figure 36
85°C 38°
TLV2332, TLV2332Y, TLV2334, TLV2334Y LinCMOS LOW-VOLTAGE MEDIUM-POWER OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
8
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV2334I electrical characteristics at specified free-air temperature
TLV2334I
PARAMETER TEST CONDITIONS
T
A
VDD = 3 V VDD = 5 V
UNIT
A
MIN TYP MAX MIN TYP MAX
p
VO = 1 V, VIC = 1 V,
25°C 0.6 10 1.1 10
VIOInput offset voltage
R
S
=
50 Ω
,
RL = 100 k
Full range 12 12
mV
α
VIO
Average temperature coefficient of input offset voltage
25°C to
85°C
1 1.7 µV/°C
p
25°C 0.1 0.1
p
IIOInput offset current (see Note 4)
V
O
= 1 V,
V
IC
= 1
V
85°C 22 1000 24 1000
pA
p
25°C 0.6 0.6
p
IIBInput bias current (see Note 4)
V
O
=
1 V
,
V
IC
=
1 V
85°C 175 2000 200 2000
pA
°
–0.2
–0.3
–0.2
–0.3
Common-mode input voltage
25°C
t
o 2
t
o
2.3
t
o 4
t
o
4.2
V
V
ICR
g
range (see Note 5)
Full range
–0.2
to
1.8
–0.2
to
3.8
V
p
VIC = 1 V,
25°C 1.75 1.9 3.2 3.9
VOHHigh-level output voltage
V
ID
=
100 mV
,
IOH = –1 mA
Full range 1.7 3
V
p
VIC = 1 V,
25°C 115 150 95 150
VOLLow-level output voltage
V
ID
= –
100 mV
,
IOL = 1 mA
Full range 190 190
mV
Large-signal differential
VIC = 1 V,
25°C 25 83 25 170
A
VD
gg
voltage amplification
R
L
=
100 k
,
See Note 6
Full range 15 15
V/mV
VO = 1 V,
25°C 65 92 65 91
CMRR
Common-mode rejection ratio
V
IC
=
V
ICR
min,
RS = 50
Full range 60 60
dB
Supply-voltage rejection ratio
VDD = 3 V to 5 V,
25°C 70 94 70 94
k
SVR
ygj
(VDD/VIO)
V
IC
=
1 V
,
V
O
=
1 V
,
RS = 50
Full range 65 65
dB
pp
VO = 1 V, VIC = 1 V,
25°C 320 1000 420 1120
IDDSupply current
OIC
No load
Full range 1200 1600
µ
A
Full range is –40°C to 85°C.
NOTES: 4. The typical values of input bias current and input offset current below 5 pA are determined mathematically.
5. This range also applies to each input individually.
6. At VDD = 5 V, VO = 0.25 V to 2 V; at VDD = 3 V, VO = 0.5 V to 1.5 V.
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
9
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV2334I operating characteristics at specified free-air temperature, VDD = 3 V
TLV2334I
PARAMETER
TEST CONDITIONS
T
A
MIN TYP MAX
UNIT
VIC = 1 V,
V
I(PP)
= 1 V,
p
25°C 0.38
SR
Slew rate at unity gain
R
L
=
100 k
,
See Figure 34
C
L
= 20 F,
85°C
0.29
V/µs
V
n
Equivalent input noise voltage
f = 1 kHz, See Figure 35
RS = 20 ,
25°C 32
nV/Hz
p
V
= V
, C
= 20 pF,
25°C 34
BOMMaximum output-swing bandwidth
OOH
,
RL = 100 k,
L
,
See Figure 34
85°C
32
kH
z
V
= 10 mV, C
= 20 pF,
25°C 300
B1Unity-gain bandwidth
I
,
RL = 100 k,
L
,
See Figure 36
85°C
235
kH
z
V
= 10 mV
,
–40°C 42°
φ
m
Phase margin
V
I
10
mV,
CL = 20 pF,
f
=
B
1
,
=
25°C 39°
See Figure 36
R
L
=
100 k
,
85°C 36°
TLV2334I operating characteristics at specified free-air temperature, VDD = 5 V
TLV2334I
PARAMETER
TEST CONDITIONS
T
A
MIN TYP MAX
UNIT
25°C 0.43
V
IC
= 1 V,
RL = 100 k,
V
I(PP)
= 1
V
85°C 0.35
SR
Slew rate at unity gain
L
,
CL = 20 pF,
25°C 0.40
V/µs
See Figure 34
V
I(PP)
= 2.5
V
85°C 0.32
V
n
Equivalent input noise voltage
f = 1 kHz, See Figure 35
RS = 20 ,
25°C 32
nV/Hz
p
V
= V
, C
= 20 pF,
25°C 55
BOMMaximum output-swing bandwidth
OOH
,
RL = 100 k,
L
,
See Figure 34
85°C
45
kH
z
V
= 10 mV, C
= 20 pF,
25°C 525
B1Unity-gain bandwidth
I
,
RL = 100 k,
L
,
See Figure 36
85°C
370
kH
z
V
= 10 mV
,
f = B
,
–40°C 43°
φ
m
Phase margin
V
I
10
mV,
CL = 20 pF,
f B1,
RL = 100 k,
25°C 40°
See Figure 36
85°C 38°
TLV2332, TLV2332Y, TLV2334, TLV2334Y LinCMOS LOW-VOLTAGE MEDIUM-POWER OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
10
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV2332Y electrical characteristics, T
A
= 25°C
TLV2332Y
PARAMETER TEST CONDITIONS
VDD = 3 V VDD = 5 V
UNIT
MIN TYP MAX MIN TYP MAX
V
IO
Input offset voltage
VO = 1 V, RS = 50 ,
VIC = 1 V, RL = 100 k
0.6 1.1 mV
I
IO
Input offset current (see Note 4) VO = 1 V, VIC = 1 V 0.1 0.1 pA
I
IB
Input bias current (see Note 4) VO = 1 V, VIC = 1 V 0.6 0.6 pA
V
ICR
Common-mode input voltage range (see Note 5)
–0.3
to
2.3
–0.3
to
4.2
V
V
OH
High-level output voltage
VIC = 1 V, IOH = –1 mA
VID = 100 mV ,
1.9 3.9 V
V
OL
Low-level output voltage
VIC = 1 V, IOL = 1 mA
VID = 100 mV ,
115 95 mV
A
VD
Large-signal differential voltage amplification
VIC = 1 V, See Note 6
RL = 100 k,
83 170 V/mV
CMRR Common-mode rejection ratio
VO = 1 V, RS = 50
VIC = V
ICR
min,
92 91 dB
k
SVR
Supply-voltage rejection ratio (VDD/VID)
VO = 1 V, RS = 50
VIC = 1 V,
94 94 dB
I
DD
Supply current
VO = 1 V, No load
VIC = 1 V,
160 210 µA
NOTES: 4. The typical values of input bias current and input offset current below 5 pA are determined mathematically .
5. This range also applies to each input individually.
6. At VDD = 5 V, VO = 0.25 V to 2 V; at VDD = 3 V, VO = 0.5 V to 1.5 V.
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TLV2334Y electrical characteristics, T
A
= 25°C
TLV2334Y
PARAMETER TEST CONDITIONS
VDD = 3 V VDD = 5 V
UNIT
MIN TYP MAX MIN TYP MAX
V
IO
Input offset voltage
VO = 1 V, RS = 50 ,
VIC = 1 V RL = 100 k
0.6 1.1 mV
I
IO
Input offset current (see Note 4) VO = 1 V, VIC = 1 V 0.1 0.1 pA
I
IB
Input bias current (see Note 4) VO = 1 V, VIC = 1 V 0.6 0.6 pA
V
ICR
Common-mode input voltage range (see Note 5)
–0.3
to
2.3
–0.3
to
4.2
V
V
OH
High-level output voltage
VIC = 1 V, IOH = –1 mA
VID = 100 mV ,
1.9 3.9 V
V
OL
Low-level output voltage
VIC = 1 V, IOL = 1 mA
VID = –100 mV,
115 95 mV
A
VD
Large-signal differential voltage amplification
VIC = 1 V, See Note 6
RL = 100 k,
83 170 V/mV
CMRR Common-mode rejection ratio
VO = 1 V, RS = 50
VIC = V
ICR
min,
92 91 dB
k
SVR
Supply-voltage rejection ratio (VDD/VID)
VIC = 1 V, RS = 50
VO = 1 V,
94 94 dB
I
DD
Supply current
VO = 1 V, No load
VIC = 1 V,
320 420 µA
NOTES: 4. The typical values of input bias current offset current below 5 pA are determined mathematically.
5. This range also applies to each input individually.
6. At VDD = 5 V, VO = 0.25 V to 2 V; at VDD = 3 V, VO = 0.5 V to 1.5 V.
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TYPICAL CHARACTERISTICS
Table of Graphs
FIGURE
V
IO
Input offset voltage Distribution 1 – 4
α
VIO
Input offset voltage temperature coefficient Distribution 5 – 8
I
IB
Input bias current vs Free-air temperature 9
I
IO
Input offset current vs Free-air temperature 9
V
IC
Common-mode input voltage vs Supply voltage 10
V
OH
High-level output voltage
vs High-level output current vs Supply voltage vs Free-air temperature
11 12 13
V
OL
Low-level output voltage
vs Common-mode input voltage vs Free-air temperature vs Differential input voltage vs Low-level output current
14
15, 16
17 18
A
VD
Large-signal differential voltage amplification
vs Supply voltage vs Free-air temperature vs Frequency
19 20
21, 22
I
DD
Supply current
vs Supply voltage vs Free-air temperature
23 24
SR Slew rate
vs Supply voltage vs Free-air temperature
25 26
V
O(PP)
Maximum peak-to-peak output voltage vs Frequency 27
B
1
Unity-gain bandwidth
vs Supply voltage vs Free-air temperature
28 29
φ
m
Phase margin
vs Supply voltage vs Free-air temperature vs Load capacitance
30 31 32
Phase shift vs Frequency 21, 22
V
n
Equivalent input noise voltage vs Frequency 33
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TYPICAL CHARACTERISTICS
Figure 1
–5 –4 –3 –2 –1 0 1 2 3 4 5
50
40
20
10
0
30
Percentage of Units – %
DISTRIBUTION OF TLV2332
INPUT OFFSET VOLTAGE
VIO – Input Offset Voltage – mV
VDD = 3 V TA = 25°C P Package
Figure 2
–5 –4 –3 –2 –1 0 1 2 3 4 5
50
40
20
10
30
60
Percentage of Units – %
DISTRIBUTION OF TLV2332
INPUT OFFSET VOLTAGE
0
VIO – Input Offset Voltage – mV
VDD = 5 V TA = 25°C P Package
Figure 3
50
40
20
10
0
30
–1 0 1
Percentage of Units – %
2345
DISTRIBUTION OF TLV2334
INPUT OFFSET VOLTAGE
VIO – Input Offset Voltage – mV
VDD = 3 V TA = 25°C N Package
–5 –4 –3 –2
Figure 4
–5 –4 –3 –2
50
40
20
10
0
30
–1 0 1602345
Percentage of Units – %
VIO – Input Offset Voltage – mV
DISTRIBUTION OF TLV2334
INPUT OFFSET VOLTAGE
VDD = 5 V TA = 25°C N Package
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TYPICAL CHARACTERISTICS
Figure 5
–10–8–6–4–2 0 2 4 6 8 10
50
40
20
10
0
30
Percentage of Units – %
VDD = 3 V TA = 25°C to 85°C P Package
DISTRIBUTION OF TLV2332
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
α
VIO
– Temperature Coefficient – µV/°C
Figure 6
10–8–6–4–20246810
50
40
20
10
30
60
0
Percentage of Units – %
VDD = 5 V TA = 25°C to 85°C P Package Outliers: (1) 33 mV/°C
DISTRIBUTION OF TLV2332
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
α
VIO
– Temperature Coefficient – µV/°C
Figure 7
–10 –2 0 2
Percentage of Units – %
46810
α
VIO
– Temperature Coefficient – µV/°C
50
40
20
10
0
30
VDD = 3 V TA = 25°C to 85°C N Package
DISTRIBUTION OF TLV2334
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
–8 –6 –4
Figure 8
–8 –6 –4
α
VIO
– Temperature Coefficient – µV/°C
Percentage of Units – %
–10 –2 0 2 4 6 8 10
50
40
20
10
0
30
60
DISTRIBUTION OF TLV2334
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
VDD = 5 V TA = 25°C to 85°C N Package Outliers: (1) 33 mV/°C
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TYPICAL CHARACTERISTICS
Figure 9
INPUT BIAS CURRENT AND INPUT OFFSET CURREN
T
vs
FREE-AIR TEMPERATURE
TA – Free-Air Temperature – °C
IIB and IIO – Input Bias and Input Offset Currents – pA
I
IB
I
IO
10
4
10
3
10
2
10
1
1
0.1 25 45 65 85 105 125
VDD = 3 V VIC = 1 V See Note A
I
IB
I
IO
NOTE: The typical values of input bias current and input offset
current below 5 pA were determined mathematically.
Figure 10
COMMON-MODE INPUT VOLTAGE
vs
SUPPLY VOLTAGE
4
2
0
8
6
02468
V
DD
– Supply Voltage – V
VIC – Common-Mode Input Voltage – V
IC
V
TA = 25°C Positive Limit
Figure 11
V0H – High-Level Output Voltage – V
V
OH
3
2
1
0
0
4
5
IOH – High-Level Output Current – mA
HIGH-LEVEL OUTPUT VOLTAGE
vs
HIGH-LEVEL OUTPUT CURRENT
VIC = 1 V VID = 100 mV TA = 25°C
VDD = 3 V
VDD = 5 V
–2 –4 –6 –8
Figure 12
V0H – High-Level Output Voltage – V
V
OH
4
2
0
8
6
02468
HIGH-LEVEL OUTPUT VOLTAGE
vs
SUPPLY VOLTAGE
VDD – Supply Voltage – V
VIC = 1 V VID = 100 mV RL = 100 k TA = 25°C
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TYPICAL CHARACTERISTICS
Figure 13
1.8
1.2
0.6
0
2.4
3
HIGH-LEVEL OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
–75 –50 –25 0 25 50 75 100 125
TA – Free-Air Temperature – °C
V0H – High-Level Output Voltage – V
V
OH
VDD = 3 V VIC = 1 V VID = 100 mV
IOH = –500 µA IOH = –1 mA IOH = –2 mA IOH = –3 mA IOH = –4 mA
Figure 14
VOL – Low-Level Output V oltage – mV
V
OL
500
400
350
300
0 0.5 1 1.5 2 2.5
600
650
700
3 3.5 4
550
450
LOW-LEVEL OUTPUT VOLTAGE
vs
COMMON-MODE INPUT VOLTAGE
VIC – Common-Mode Input Voltage – V
VID = –100 mV
VID = –1 V
VDD = 5 V IOL = 5 mA TA = 25°C
Figure 15
–75 –50 –25 0 25 50 75 100 125
125
110
80 65 50
185
95
155
140
170
200
LOW-LEVEL OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
TA – Free-Air Temperature – °C
VOL – Low-Level Output V oltage – mV
V
OL
VDD = 3 V VIC = 1 V VID = –100 mV IOL = 1 mA
Figure 16
400
200
100
0
600
700
800
500
300
LOW-LEVEL OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
900
–75 –50 –25 0 25 50 75 100 125
TA – Free-Air Temperature – °C
VOL – Low-Level Output V oltage – mV
V
OL
VDD = 5 V VIC = 0.5 V VID = –1 V IOL = 5 mA
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TYPICAL CHARACTERISTICS
Figure 17
400
200
100
0
0–1–2–3–4–5
600
700
800
–6 –7 –8
500
300
LOW-LEVEL OUTPUT VOLTAGE
vs
DIFFERENTIAL INPUT VOLTAGE
VOL – Low-Level Output V oltage – mV
V
OL
VID – Differential Input Voltage – V
VDD = 5 V VIC = |VID/2| IOL = 5 mA TA = 25°C
Figure 18
0.5
0.4
0.2
0.1 0
0.9
0.3
0123456
0.7
0.6
0.8
1
78
LOW-LEVEL OUTPUT VOLTAGE
vs
LOW-LEVEL OUTPUT CURRENT
VOL – Low-Level Output Voltage – V
V
OL
IOL – Low-Level Output Current – mA
VDD = 3 V
VDD = 5 V
VIC = 1 V VID = –100 mV TA = 25°C
Figure 19
02468
LARGE-SIGNAL
DIFFERENTIAL VOLTAGE AMPLIFICATION
vs
SUPPLY VOLTAGE
VDD – Supply Voltage – V
200 150
350
0
300
450
500
100
400
250
50
RL = 100 k
TA = –40°C
TA = 25°C
TA = 85°C
– Large-Signal Differential Voltage A
VD
Amplification – V/mV
Figure 20
200 150
350
300
450
500
100
400
250
50
LARGE-SIGNAL
DIFFERENTIAL VOLTAGE AMPLIFICATION
vs
FREE-AIR TEMPERATURE
–75 –50 –25 0 25 50 75 100 125
VDD = 3 V
RL = 100 k
0
VDD = 5 V
TA – Free-Air Temperature – °C
– Large-Signal Differential Voltage A
VD
Amplification – V/mV
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TYPICAL CHARACTERISTICS
10
7
10
6
10
5
10
4
10
3
10
2
10
1
1
0.1 1 10 100 1 k 10 k 100 k
f – Frequency – Hz
LARGE-SIGNAL DIFFERENTIAL VOLTAGE
AMPLIFICATION AND PHASE SHIFT
vs
FREQUENCY
1 M
Phase Shift
60°
30°
90°
–60°
–30°
0°
120°
150°
180°
Phase Shift
A
VD
VDD = 3 V RL = 100 k CL = 20 pF TA = 25°C
– Large-Signal Differential Voltage Amplification A
VD
Figure 21
1 10 100 1 k 10 k 100 k 1 M
10
7
10
6
10
5
10
4
10
3
10
2
10
1
0.1
LARGE-SIGNAL DIFFERENTIAL VOLTAGE
AMPLIFICATION AND PHASE SHIFT
vs
FREQUENCY
f – Frequency – Hz
Phase Shift
VDD = 5 V RL = 100 k CL = 20 pF TA = 25°C
1
60°
30°
90°
–60°
–30°
0°
120°
150°
180°
Phase Shift
A
VD
– Large-Signal Differential Voltage Amplification A
VD
Figure 22
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TYPICAL CHARACTERISTICS
Figure 23
02468
200
100
50
0
350
400
450
250
150
VIC = 1 V VO = 1 V No Load
TA = –40°C
TA = 25°C
TA = 85°C
SUPPLY CURRENT
vs
SUPPLY VOLTAGE
VDD – Supply Voltage – V
300
IDD – Supply Current – uA
DD
IAµ
Figure 24
1007550250–25–50–75
200
100
50
0
300
350
400
250
150
125
SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
TA – Free-Air Temperature – °C
VIC = 1 V VO = 1 V No Load
VDD = 5 V
IDD – Supply Current – uA
DD
IAµ
V
DD
= 3 V
Figure 25
02468
0.7
0.5
0.4
0.3
0.9
0.6
SR – Slew Rate – V/us
0.8
sµV/
VIC = 1 V V
I(PP)
= 1 V AV = 1 RL = 100 k CL = 20 pF TA = 25°C
VDD – Supply Voltage – V
SLEW RATE
vs
SUPPLY VOLTAGE
Figure 26
0.7
0.5
0.4
0.3
0.9
0.6
0.8
–75 –50 –25 0 25 50 75 100 125
VDD = 5 V
VDD = 3 V
VIC = 1 V V
I(PP)
= 1 V AV = 1 RL = 100 k CL = 20 pF
0.2
TA – Free-Air Temperature – °C
SLEW RATE
vs
FREE-AIR TEMPERATURE
SR – Slew Rate – V/us
sµV/
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TYPICAL CHARACTERISTICS
Figure 27
1 10 100 1000
3
2
1
0
4
5
f – Frequency – kHz
MAXIMUM PEAK-TO-PEAK OUTPUT VOLTAGE
vs
FREQUENCY
RL = 100 k
VDD = 3 V
TA = 85°C
TA = 25°C
VDD = 5 V
– Maximum Peak-to-Peak Output Voltage – V
V
O(PP)
TA = – 40°C
Figure 28
600
400
300
200
800
900
700
500
1000
012345678
B1 – Unity-Gain Bandwidth – kHz
B
1
VI = 10 mV RL = 100 k CL = 20 pF TA = 25°C
UNITY-GAIN BANDWIDTH
vs
SUPPLY VOLTAGE
VDD – Supply Voltage – V
Figure 29
–75 –50 –25 0 25 50 75 100 125
B1 – Unity-Gain Bandwidth – kHz
600
400
300
200
800
900
1000
700
500
B
1
VDD = 5 V
VDD = 3 V
VI = 10 mV RL = 100 k CL = 20 pF
UNITY-GAIN BANDWIDTH
vs
FREE-AIR TEMPERATURE
TA – Free-Air Temperature – °C
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TYPICAL CHARACTERISTICS
Figure 30
VDD – Supply Voltage – V
xm – Phase Margin
0123456
PHASE MARGIN
vs
SUPPLY VOLTAGE
78
V
I
= 10 mV RL = 100 k CL = 20 pF TA = 25°C
φ
m
50°
48° 46° 44° 42° 40° 38° 36°
34° 32° 30°
Figure 31
TA – Free-Air Temperature – °C
– 75 – 25 0 50 100 125–50 25 75
VDD = 3 V
VI = 10 mV RL = 100 k CL = 20 pF
PHASE MARGIN
vs
FREE-AIR TEMPERATURE
xm – Phase Margin
φ
m
45°
43°
43°
39°
37°
35°
VDD = 5 V
Figure 32
CL – Load Capacitance – pF
0204060
PHASE MARGIN
vs
LOAD CAPACITANCE
80 100
VI = 10 mV RL = 100 K TA = 25°C
VDD = 3 V
VDD = 5 V
xm – Phase Margin
φ
m
44°
42°
40°
38°
36°
34°
32°
30°
28°
Figure 33
Vn – Equivalent Input Noise Voltage – nVxHz
200
150
100
0
110
250
f – Frequency – Hz
EQUIVALENT INPUT NOISE VOLTAGE
vs
FREQUENCY
300
1000100
V
n
nV/
Hz
RS = 20 TA = 25°C
VDD = 3 V
50
VDD = 5 V
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PARAMETER MEASUREMENT INFORMATION
single-supply versus split-supply test circuits
Because the TL V233x is optimized for single-supply operation, circuit configurations used for the various tests often present some inconvenience since the input signal, in many cases, must be offset from ground. This inconvenience can be avoided by testing the device with split supplies and the output load tied to the negative rail. A comparison of single-supply versus split-supply test circuits is shown below. The use of either circuit gives the same result.
– +
– +
V
DD
V
O
R
L
C
L
V
I
R
L
C
L
V
O
V
DD+
V
I
V
DD–
(a) SINGLE SUPPLY (b) SPLIT SUPPLY
Figure 34. Unity-Gain Amplifier
– +
– +
V
DD
V
DD+
V
DD–
V
O
V
O
(a) SINGLE SUPPLY (b) SPLIT SUPPLY
20
20
20
20
1/2 V
DD
2 k
2 k
Figure 35. Noise-Test Circuit
– +
– +
10 k
1/2 V
DD
100
V
O
V
DD
V
I
V
I
100
(a) SINGLE SUPPLY (b) SPLIT SUPPLY
10 k
V
DD+
V
DD–
C
L
C
L
V
O
Figure 36. Gain-of-100 Inverting Amplifier
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PARAMETER MEASUREMENT INFORMATION
input bias current
Because of the high input impedance of the TL V233x operational amplifier , attempts to measure the input bias current can result in erroneous readings. The bias current at normal ambient temperature is typically less than 1 pA, a value that is easily exceeded by leakages on the test socket. Two suggestions are offered to avoid erroneous measurements:
Isolate the device from other potential leakage sources. Use a grounded shield around and between the
device inputs (see Figure 37). Leakages that would otherwise flow to the inputs are shunted away.
Compensate for the leakage of the test socket by actually performing an input bias current test (using a
picoammeter) with no device in the test socket. The actual input bias current can then be calculated by subtracting the open-socket leakage readings from the readings obtained with a device in the test socket.
Many automatic testers as well as some bench-top operational amplifier testers use the servo-loop technique with a resistor in series with the device input to measure the input bias current (the voltage drop across the series resistor is measured and the bias current is calculated). This method requires that a device be inserted into a test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method.
V = V
IC
8
5
14
Figure 37. Isolation Metal Around Device Inputs (P package)
low-level output voltage
To obtain low-level supply-voltage operation, some compromise is necessary in the input stage. This compromise results in the device low-level output voltage being dependent on both the common-mode input voltage level as well as the differential input voltage level. When attempting to correlate low-level output readings with those quoted in the electrical specifications, these two conditions should be observed. If conditions other than these are to be used, please refer to the Typical Characteristics section of this data sheet.
input offset voltage temperature coefficient
Erroneous readings often result from attempts to measure temperature coefficient of input offset voltage. This parameter is actually a calculation using input offset voltage measurements obtained at two different temperatures. When one (or both) of the temperatures is below freezing, moisture can collect on both the device and the test socket. This moisture results in leakage and contact resistance which can cause erroneous input offset voltage readings. The isolation techniques previously mentioned have no effect on the leakage since the moisture also covers the isolation metal itself, thereby rendering it useless. These measurements should be performed at temperatures above freezing to minimize error.
full-power response
Full-power response, the frequency above which the operational amplifier slew rate limits the output voltage swing, is often specified two ways: full-linear response and full-peak response. The full-linear response is
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PARAMETER MEASUREMENT INFORMATION
generally measured by monitoring the distortion level of the output while increasing the frequency of a sinusoidal input signal until the maximum frequency is found above which the output contains significant distortion. The full-peak response is defined as the maximum output frequency , without regard to distortion, above which full peak-to-peak output swing cannot be maintained.
Because there is no industry-wide accepted value for significant distortion, the full-peak response is specified in this data sheet and is measured using the circuit of Figure 34. The initial setup involves the use of a sinusoidal input to determine the maximum peak-to-peak output of the device (the amplitude of the sinusoidal wave is increased until clipping occurs). The sinusoidal wave is then replaced with a square wave of the same amplitude. The frequency is then increased until the maximum peak-to-peak output can no longer be maintained (Figure 38). A square wave is used to allow a more accurate determination of the point at which the maximum peak-to-peak output is reached.
(d) f > B
OM
(c) f = B
OM
(b) BOM > f > 100 Hz(a) f = 100 Hz
Figure 38. Full-Power-Response Output Signal
test time
Inadequate test time is a frequent problem, especially when testing CMOS devices in a high-volume, short-test-time environment. Internal capacitances are inherently higher in CMOS than in bipolar and BiFET devices and require longer test times than their bipolar and BiFET counterparts. The problem becomes more pronounced with reduced supply levels and lower temperatures.
APPLICATION INFORMATION
single-supply operation
While the TLV233x performs well using dual­power supplies (also called balanced or split supplies), the design is optimized for single­supply operation. This includes an input common­mode voltage range that encompasses ground as well as an output voltage range that pulls down to ground. The supply voltage range extends down to 2 V, thus allowing operation with supply levels commonly available for TTL and HCMOS.
Many single-supply applications require that a voltage be applied to one input to establish a reference level that is above ground. This virtual ground can be generated using two large resistors, but a preferred technique is to use a virtual-ground generator such as the TLE2426 (see Figure 39).
– +
TLE2426
V
O
V
I
R1
R2
V
DD
Figure 39. Inverting Amplifier With Voltage
Reference
V
O
+ ǒ
VDD–V
I
2
Ǔ
R2 R1
)
V
DD
2
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APPLICATION INFORMATION
single-supply operation (continued)
The TLE2426 supplies an accurate voltage equal to VDD/2, while consuming very little power and is suitable for supply voltages of greater than 4 V . The TL V233x works well in conjunction with digital logic; however , when powering both linear devices and digital logic from the same power supply, the following precautions are recommended:
Power the linear devices from separate bypassed supply lines (see Figure 40); otherwise, the linear
device supply rails can fluctuate due to voltage drops caused by high switching currents in the digital logic.
Use proper bypass techniques to reduce the probability of noise-induced errors. Single capacitive
decoupling is often adequate; however, RC decoupling may be necessary in high-frequency applications.
– +
Logic Logic Logic
Power Supply
– +
Logic Logic Logic
Power Supply
(a) COMMON-SUPPLY RAILS
(b) SEPARATE-BYPASSED SUPPLY RAILS (preferred)
Figure 40. Common Versus Separate Supply Rails
input characteristics
The TL V233x is specified with a minimum and a maximum input voltage that, if exceeded at either input, could cause the device to malfunction. Exceeding this specified range is a common problem, especially in single-supply operation. The lower the range limit includes the negative rail, while the upper range limit is specified at V
DD
– 1 V at TA = 25°C and at VDD – 1.2 V at all other temperatures.
The use of the polysilicon-gate process and the careful input circuit design gives the TL V233x very good input offset voltage drift characteristics relative to conventional metal-gate processes. Offset voltage drift in CMOS devices is highly influenced by threshold voltage shifts caused by polarization of the phosphorus dopant implanted in the oxide. Placing the phosphorus dopant in a conductor (such as a polysilicon gate) alleviates the polarization problem, thus reducing threshold voltage shifts by more than an order of magnitude. The offset voltage drift with time has been calculated to be typically 0.1 µV/month, including the first month of operation.
Because of the extremely high input impedance and resulting low bias-current requirements, the TLV233x is well suited for low-level signal processing; however, leakage currents on printed-circuit boards and sockets can easily exceed bias-current requirements and cause a degradation in device performance.
– +
Figure 42. Compensation for Input Capacitance
TLV2332, TLV2332Y, TLV2334, TLV2334Y LinCMOS LOW-VOLTAGE MEDIUM-POWER OPERATIONAL AMPLIFIERS
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input characteristics (continued)
It is good practice to include guard rings around inputs (similar to those of Figure 37 in the Parameter Measurement Information section). These guards should be driven from a low-impedance source at the same voltage level as the common-mode input (see Figure 41).
The inputs of any unused amplifiers should be tied to ground to avoid possible oscillation.
– +
– +
– +
V
O
V
I
V
I
V
O
V
I
V
O
(a) NONINVERTING AMPLIFIER (b) INVERTING AMPLIFIER (c) UNITY-GAIN AMPLIFIER
Figure 41. Guard-Ring Schemes
noise performance
The noise specifications in operational amplifiers circuits are greatly dependent on the current in the first-stage differential amplifier . The low input bias-current requirements of the TLV233x results in a very low noise current, which is insignificant in most applications. This feature makes the device especially favorable over bipolar devices when using values of circuit impedance greater than 50 k, since bipolar devices exhibit greater noise currents.
feedback
Operational amplifiers circuits nearly always employ feedback, and since feedback is the first prerequisite for oscillation, caution is appropriate. Most oscillation problems result from driving capacitive loads and ignoring stray input capacitance. A small-value capacitor connected in parallel with the feedback resistor is an effective remedy (see Figure 42). The value of this capacitor is optimized empirically.
electrostatic-discharge protection
The TLV233x incorporates an internal electrostatic-discharge (ESD)-protection circuit that prevents functional failures at voltages up to 2000 V as tested under MIL-PRF-38535. Method 3015.2. Care should be exercised, however, when handling these devices as exposure to ESD may result in the degradation of the device parametric performance. The protection circuit also causes the input bias currents to be temperature dependent and have the characteristics of a reverse-biased diode.
Figure 43. Resistive Pullup to Increase V
OH
– +
RP+
VDD*
V
O
IF)
IL)
I
P
IP = Pullup Current Required by the Operational Amplifier (typically 500 µA)
V
O
V
DD
R
P
I
P
I
F
I
L
R
L
V
I
R1
R2
– +
V
O
C
L
V
I
2.5 V
TA = 25°C f = 1 kHz V
I(PP)
= 1 V
–2.5 V
Figure 44. Test Circuit for Output Characteristics
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
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latch-up
Because CMOS devices are susceptible to latch-up due to their inherent parasitic thyristors, the TL V233x inputs and outputs are designed to withstand –100-mA surge currents without sustaining latch-up; however, techniques should be used to reduce the chance of latch-up whenever possible. Internal-protection diodes should not by design be forward biased. Applied input and output voltage should not exceed the supply voltage by more than 300 mV . Care should be exercised when using capacitive coupling on pulse generators. Supply transients should be shunted by the use of decoupling capacitors (0.1 µF typical) located across the supply rails as close to the device as possible.
The current path established if latch-up occurs is usually between the positive supply rail and ground and can be triggered by surges on the supply lines and/or voltages on either the output or inputs that exceed the supply voltage. Once latch-up occurs, the current flow is limited only by the impedance of the power supply and the forward resistance of the parasitic thyristor and usually results in the destruction of the device. The chance of latch-up occurring increases with increasing temperature and supply voltages.
output characteristics
The output stage of the TLV233x is designed to sink and source relatively high amounts of current (see Typical Characteristics). If the output is subjected to a short-circuit condition, this high­current capability can cause device damage under certain conditions. Output current capability increases with supply voltage.
Although the TLV233x possesses excellent high-level output voltage and current capability, methods are available for boosting this capability if needed. The simplest method involves the use of a pullup resistor (R
P
) connected from the output to the positive supply rail (see Figure 43). There are two disadvantages to the use of this circuit. First, the NMOS pulldown transistor N4 (see equivalent schematic) must sink a comparatively large amount of current. In this circuit, N4 behaves like a linear resistor with an on resistance between approximately 60 and 180 , depending on how hard the operational amplifier input is driven. With very low values of R
P
, a voltage offset from 0 V at the output occurs. Secondly , pullup resistor R
P
acts as a drain load to N4 and the gain of the operational amplifier is reduced at output voltage levels where N5 is not supplying the output current.
All operating characteristics of the TLV233x are measured using a 20-pF load. The device drives higher capacitive loads; however, as output load capacitance increases, the resulting response pole occurs at lower frequencies thereby causing ringing, peaking, or even oscillation (see Figure 44 and Figure 45). In many cases, adding some compensation in the form of a series resistor in the feedback loop alleviates the problem.
TLV2332, TLV2332Y, TLV2334, TLV2334Y LinCMOS LOW-VOLTAGE MEDIUM-POWER OPERATIONAL AMPLIFIERS
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output characteristics (continued)
(a) CL = 20 pF, RL = NO LOAD (b) CL = 170 pF, RL = NO LOAD (c) CL = 190 pF, RL = NO LOAD
Figure 45. Effect of Capacitive Loads
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
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MECHANICAL INFORMATION
D (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE
14 PIN SHOWN
4040047/B 03/95
0.228 (5,80)
0.244 (6,20)
0.069 (1,75) MAX
0.010 (0,25)
0.004 (0,10)
1
14
0.014 (0,35)
0.020 (0,51)
A
0.157 (4,00)
0.150 (3,81)
7
8
0.044 (1,12)
0.016 (0,40)
Seating Plane
0.010 (0,25)
PINS **
0.008 (0,20) NOM
A MIN
A MAX
DIM
Gage Plane
0.189
(4,80)
(5,00)
0.197
8
(8,55)
(8,75)
0.337
14
0.344
(9,80)
16
0.394
(10,00)
0.386
0.004 (0,10)
M
0.010 (0,25)
0.050 (1,27)
0°–8°
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice. C. Body dimensions do not include mold flash or protrusion, not to exceed 0.006 (0,15). D. Four center pins are connected to die mount pad.
E. Falls within JEDEC MS-012
TLV2332, TLV2332Y, TLV2334, TLV2334Y LinCMOS LOW-VOLTAGE MEDIUM-POWER OPERATIONAL AMPLIFIERS
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MECHANICAL INFORMATION
N (R-PDIP-T**) PLASTIC DUAL-IN-LINE PACKAGE
20
0.975
(24,77)
0.940
(23,88)
18
0.920
0.850
14
0.775
0.745
(19,69)
(18,92)
16
0.775
(19,69)
(18,92)
0.745
A MIN
DIM
A MAX
PINS **
0.310 (7,87)
0.290 (7,37)
(23.37)
(21.59)
Seating Plane
0.010 (0,25) NOM
14/18 PIN ONL Y
4040049/C 08/95
9
8
0.070 (1,78) MAX
A
0.035 (0,89) MAX
0.020 (0,51) MIN
16
1
0.015 (0,38)
0.021 (0,53)
0.200 (5,08) MAX
0.125 (3,18) MIN
0.240 (6,10)
0.260 (6,60)
M
0.010 (0,25)
0.100 (2,54)
0°–15°
16 PIN SHOWN
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice. C. Falls within JEDEC MS-001 (20 pin package is shorter then MS-001.)
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
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MECHANICAL INFORMATION
P (R-PDIP-T8) PLASTIC DUAL-IN-LINE PACKAGE
4040082/B 03/95
0.310 (7,87)
0.290 (7,37)
0.010 (0,25) NOM
0.400 (10,60)
0.355 (9,02)
58
41
0.020 (0,51) MIN
0.070 (1,78) MAX
0.240 (6,10)
0.260 (6,60)
0.200 (5,08) MAX
0.125 (3,18) MIN
0.015 (0,38)
0.021 (0,53)
Seating Plane
M
0.010 (0,25)
0.100 (2,54)
0°–15°
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice. C. Falls within JEDEC MS-001
TLV2332, TLV2332Y, TLV2334, TLV2334Y LinCMOS LOW-VOLTAGE MEDIUM-POWER OPERATIONAL AMPLIFIERS
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MECHANICAL INFORMATION
PW (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE
4040064/D 10/95
14 PIN SHOWN
Seating Plane
0,10 MIN
1,20 MAX
1
A
7
14
0,19
4,50 4,30
8
6,10
6,70
0,32
0,75 0,50
0,25
Gage Plane
0,15 NOM
0,65
M
0,13
0°–8°
0,10
PINS **
A MIN
A MAX
DIM
2,90
3,10
8
4,90
5,10
14
6,60
6,404,90
5,10
16
7,70
20
7,90
24
9,60
9,80
28
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice. C. Body dimensions do not include mold flash or protrusion not to exceed 0,15. D. Falls within JEDEC MO-153
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