Wide Range of Supply Voltages Over
Specified Temperature Range:
T
= –40°C to 85°C...2 V to 8 V
A
D
Fully Characterized at 3 V and 5 V
D
Single-Supply Operation
D
Common-Mode Input-Voltage Range
Extends Below the Negative Rail and up to
V
–1 V at TA = 25°C
DD
D
Output Voltage Range Includes Negative
Rail
12
D
High Input Impedance...10
D
ESD-Protection Circuitry
D
Designed-In Latch-Up Immunity
Ω Typ
description
The TL V233x operational amplifiers are in a family
of devices that has been specifically designed for
use in low-voltage single-supply applications.
Unlike the TLV2322 which is optimized for
ultra-low power, the TLV233x is designed to
provide a combination of low power and good ac
performance. Each amplifier is fully functional
down to a minimum supply voltage of 2 V, is fully
characterized, tested, and specified at both 3-V
and 5-V power supplies. The common-mode
input-voltage range includes the negative rail and
extends to within 1 V of the positive rail.
Having a maximum supply current of only 310 µA
per amplifier over full temperature range, the
TLV233x devices offer a combination of good ac
performance and microampere supply currents.
From a 3-V power supply, the amplifier’s typical
slew rate is 0.38 V/µs and its bandwidth is
300 kHz.
V
DD –
V
DD–
1OUT
/GND
1OUT
/GND
1IN–
1IN+
1OUT
1IN–
1IN+
V
DD+
2IN+
2IN–
2OUT
TLV2332
D OR P PACKAGE
(TOP VIEW)
1
1IN–
1IN+
1OUT
1IN–
1IN+
V
2IN+
2OUT
2
3
4
TLV2332
PW PACKAGE
(TOP VIEW)
1
2
3
4
TLV2334
D OR N PACKAGE
(TOP VIEW)
1
2
3
4
DD+
5
2N–
6
7
TLV2334
PW PACKAGE
(TOP VIEW)
1
78
8
7
6
5
8
7
6
5
14
13
12
11
10
9
8
14
V
DD
2OUT
2IN–
2IN+
V
DD+
2OUT
2IN–
2IN+
4OUT
4IN–
4IN+
V
DD–/GND
3IN+
3IN–
3OUT
4OUT
4IN–
4IN+
V
DD–/GND
3IN+
3IN–
3OUT
T
A
°
–
†
The D package is available taped and reeled. Add R suffix to the device type (e.g., TL V2332IDR).
‡
The PW package is only available left-end taped and reeled (e.g., TLV2332IPWLE).
§
Chip forms are tested at 25°C only.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
LinCMOS is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
These amplifiers offer a level of ac performance greater than that of many other devices operating at
comparable power levels. The TL V233x operational amplifiers are especially well suited for use in low-current
or battery-powered applications.
Low-voltage and low-power operation has been made possible by using the Texas Instruments silicon-gate
LinCMOS technology . The LinCMOS process also features extremely high input impedance and ultra-low bias
currents making these amplifiers ideal for interfacing to high-impedance sources such as sensor circuits or filter
applications.
T o facilitate the design of small portable equipment, the TLV233x is made available in a wide range of package
options, including the small-outline and thin-shrink small-outline package (TSSOP). The TSSOP package has
significantly reduced dimensions compared to a standard surface-mount package. Its maximum height of only
1.1 mm makes it particularly attractive when space is critical.
The device inputs and outputs are designed to withstand –100-mA currents without sustaining latch-up. The
TLV233x incorporates internal ESD-protection circuits that prevents functional failures at voltages up to
2000 V as tested under MIL-STD 883C, Method 3015.2; however, care should be exercised in handling these
devices as exposure to ESD may result in the degradation of the device parametric performance.
TLV2332Y chip information
This chip, when properly assembled, display characteristics similar to the TLV2332. Thermal compression or
ultrasonic bonding may be used on the doped-aluminum bonding pads. Chips may be mounted with conductive
epoxy or a gold-silicon preform.
BONDING PAD ASSIGNMENTS
59
(7)
(5)
(6)
(4)
(8)
72
(3)
(2)
(1)
V
DD
(3)
1IN+
(2)
1IN–
2OUT
CHIP THICKNESS: 15 MILS TYPICAL
BONDING PADS: 4 × 4 MILS MINIMUM
TJmax = 150°C
TOLERANCES ARE ±10%.
ALL DIMENSIONS ARE IN MILS.
PIN (4) IS INTERNALLY CONNECTED
TO BACKSIDE OF CHIP.
(7)
(8)
+
–
V
DD–
(4)
+
–
/GND
(1)
(5)
(6)
1OUT
2IN+
2IN–
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
TLV2334Y chip information
This chip, when properly assembled, displays characteristics similar to the TL V2334. Thermal compression or
ultrasonic bonding may be used on the doped-aluminum bonding pads. Chips may be mounted with conductive
epoxy or a gold-silicon preform.
68
BONDING PAD ASSIGNMENTS
(8)(9)(10)(11)(12)(13)(14)
(1)(2)(3)(4) (5)(6)(7)
108
V
DD
V
+
–
+
–
+
–
+
–
DD–
(4)
(11)
/GND
(1)
(7)
(8)
(14)
1OUT
2OUT
3OUT
4OUT
(3)
1IN+
(2)
1IN–
(5)
2IN+
(6)
2IN–
(10)
3IN+
(9)
3IN–
(12)
4IN+
(13)
4IN–
CHIP THICKNESS: 15 MILS TYPICAL
BONDING PADS: 4 × 4 MILS MINIMUM
TJmax = 150°C
TOLERANCES ARE ±10%.
ALL DIMENSIONS ARE IN MILS.
Includes both amplifiers and all ESD, bias, and trim
circuitry.
†
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV2332, TLV2332Y, TLV2334, TLV2334Y
PACKAGE
A
A
Common-mode input voltage, V
V
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
Supply voltage, V
Differential input voltage, V
Input voltage range, V
Input current, I
Output current, I
Duration of short-circuit current at (or below) T
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltage values, except differential voltages, are with respect to network ground.
2. Differential voltages are at the noninverting input with respect to the inverting input.
3. The output may be shorted to either supply. Temperature and /or supply voltages must be limited to ensure that the maximum
dissipation rating is not exceeded (see application section).
Because the TL V233x is optimized for single-supply operation, circuit configurations used for the various tests
often present some inconvenience since the input signal, in many cases, must be offset from ground. This
inconvenience can be avoided by testing the device with split supplies and the output load tied to the negative
rail. A comparison of single-supply versus split-supply test circuits is shown below. The use of either circuit gives
the same result.
V
1/2 V
V
DD
–
+
I
(a) SINGLE SUPPLY(b) SPLIT SUPPLY
C
L
V
O
R
L
V
I
V
–
+
V
DD+
DD–
V
O
C
L
R
L
Figure 34. Unity-Gain Amplifier
2 kΩ
20 Ω
V
–
+
V
DD+
DD–
V
O
DD
20 Ω
20 Ω
2 kΩ
V
DD
–
+
V
O
20 Ω
22
1/2 V
DD
(a) SINGLE SUPPLY(b) SPLIT SUPPLY
Figure 35. Noise-Test Circuit
10 kΩ
V
DD
100 Ω
V
I
(a) SINGLE SUPPLY(b) SPLIT SUPPLY
–
+
V
O
C
L
100 Ω
V
I
10 kΩ
V
DD+
–
+
V
DD–
V
O
C
L
Figure 36. Gain-of-100 Inverting Amplifier
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
PARAMETER MEASUREMENT INFORMATION
input bias current
Because of the high input impedance of the TL V233x operational amplifier , attempts to measure the input bias
current can result in erroneous readings. The bias current at normal ambient temperature is typically less than
1 pA, a value that is easily exceeded by leakages on the test socket. Two suggestions are offered to avoid
erroneous measurements:
•Isolate the device from other potential leakage sources. Use a grounded shield around and between the
device inputs (see Figure 37). Leakages that would otherwise flow to the inputs are shunted away.
•Compensate for the leakage of the test socket by actually performing an input bias current test (using a
picoammeter) with no device in the test socket. The actual input bias current can then be calculated by
subtracting the open-socket leakage readings from the readings obtained with a device in the test
socket.
Many automatic testers as well as some bench-top operational amplifier testers use the servo-loop
technique with a resistor in series with the device input to measure the input bias current (the voltage
drop across the series resistor is measured and the bias current is calculated). This method requires
that a device be inserted into a test socket to obtain a correct reading; therefore, an open-socket reading
is not feasible using this method.
8
5
V = V
IC
14
Figure 37. Isolation Metal Around Device Inputs (P package)
low-level output voltage
To obtain low-level supply-voltage operation, some compromise is necessary in the input stage. This
compromise results in the device low-level output voltage being dependent on both the common-mode input
voltage level as well as the differential input voltage level. When attempting to correlate low-level output
readings with those quoted in the electrical specifications, these two conditions should be observed. If
conditions other than these are to be used, please refer to the Typical Characteristics section of this data sheet.
input offset voltage temperature coefficient
Erroneous readings often result from attempts to measure temperature coefficient of input offset voltage. This
parameter is actually a calculation using input offset voltage measurements obtained at two different
temperatures. When one (or both) of the temperatures is below freezing, moisture can collect on both the device
and the test socket. This moisture results in leakage and contact resistance which can cause erroneous input
offset voltage readings. The isolation techniques previously mentioned have no effect on the leakage since the
moisture also covers the isolation metal itself, thereby rendering it useless. These measurements should be
performed at temperatures above freezing to minimize error.
full-power response
Full-power response, the frequency above which the operational amplifier slew rate limits the output voltage
swing, is often specified two ways: full-linear response and full-peak response. The full-linear response is
generally measured by monitoring the distortion level of the output while increasing the frequency of a sinusoidal
input signal until the maximum frequency is found above which the output contains significant distortion. The
full-peak response is defined as the maximum output frequency , without regard to distortion, above which full
peak-to-peak output swing cannot be maintained.
Because there is no industry-wide accepted value for significant distortion, the full-peak response is specified
in this data sheet and is measured using the circuit of Figure 34. The initial setup involves the use of a sinusoidal
input to determine the maximum peak-to-peak output of the device (the amplitude of the sinusoidal wave is
increased until clipping occurs). The sinusoidal wave is then replaced with a square wave of the same
amplitude. The frequency is then increased until the maximum peak-to-peak output can no longer be maintained
(Figure 38). A square wave is used to allow a more accurate determination of the point at which the maximum
peak-to-peak output is reached.
(b) BOM > f > 100 Hz(a) f = 100 Hz
(c) f = B
OM
(d) f > B
Figure 38. Full-Power-Response Output Signal
test time
Inadequate test time is a frequent problem, especially when testing CMOS devices in a high-volume,
short-test-time environment. Internal capacitances are inherently higher in CMOS than in bipolar and BiFET
devices and require longer test times than their bipolar and BiFET counterparts. The problem becomes more
pronounced with reduced supply levels and lower temperatures.
APPLICATION INFORMATION
single-supply operation
While the TLV233x performs well using dualpower supplies (also called balanced or split
supplies), the design is optimized for singlesupply operation. This includes an input commonmode voltage range that encompasses ground as
well as an output voltage range that pulls down to
ground. The supply voltage range extends down
to 2 V, thus allowing operation with supply levels
commonly available for TTL and HCMOS.
Many single-supply applications require that a
voltage be applied to one input to establish a
reference level that is above ground. This virtual
ground can be generated using two large
resistors, but a preferred technique is to use a
virtual-ground generator such as the TLE2426
(see Figure 39).
R1
V
I
TLE2426
Figure 39. Inverting Amplifier With Voltage
V
DD
R2
–
+
V
Reference
O
+ǒ
VDD–V
2
V
O
I
Ǔ
R2
R1
)
OM
V
DD
2
24
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
APPLICATION INFORMATION
single-supply operation (continued)
The TLE2426 supplies an accurate voltage equal to VDD/2, while consuming very little power and is suitable
for supply voltages of greater than 4 V . The TL V233x works well in conjunction with digital logic; however , when
powering both linear devices and digital logic from the same power supply, the following precautions are
recommended:
•Power the linear devices from separate bypassed supply lines (see Figure 40); otherwise, the linear
device supply rails can fluctuate due to voltage drops caused by high switching currents in the digital
logic.
•Use proper bypass techniques to reduce the probability of noise-induced errors. Single capacitive
decoupling is often adequate; however, RC decoupling may be necessary in high-frequency
applications.
–
+
–
+
LogicLogicLogic
(a) COMMON-SUPPLY RAILS
LogicLogicLogic
(b) SEPARATE-BYPASSED SUPPLY RAILS (preferred)
Power
Supply
Power
Supply
Figure 40. Common Versus Separate Supply Rails
input characteristics
The TL V233x is specified with a minimum and a maximum input voltage that, if exceeded at either input, could
cause the device to malfunction. Exceeding this specified range is a common problem, especially in
single-supply operation. The lower the range limit includes the negative rail, while the upper range limit is
specified at V
The use of the polysilicon-gate process and the careful input circuit design gives the TL V233x very good input
offset voltage drift characteristics relative to conventional metal-gate processes. Offset voltage drift in CMOS
devices is highly influenced by threshold voltage shifts caused by polarization of the phosphorus dopant
implanted in the oxide. Placing the phosphorus dopant in a conductor (such as a polysilicon gate) alleviates the
polarization problem, thus reducing threshold voltage shifts by more than an order of magnitude. The offset
voltage drift with time has been calculated to be typically 0.1 µV/month, including the first month of operation.
– 1 V at TA = 25°C and at VDD – 1.2 V at all other temperatures.
DD
Because of the extremely high input impedance and resulting low bias-current requirements, the TLV233x is
well suited for low-level signal processing; however, leakage currents on printed-circuit boards and sockets can
easily exceed bias-current requirements and cause a degradation in device performance.
It is good practice to include guard rings around inputs (similar to those of Figure 37 in the Parameter
Measurement Information section). These guards should be driven from a low-impedance source at the same
voltage level as the common-mode input (see Figure 41).
The inputs of any unused amplifiers should be tied to ground to avoid possible oscillation.
The noise specifications in operational amplifiers circuits are greatly dependent on the current in the first-stage
differential amplifier . The low input bias-current requirements of the TLV233x results in a very low noise current,
which is insignificant in most applications. This feature makes the device especially favorable over bipolar
devices when using values of circuit impedance greater than 50 kΩ, since bipolar devices exhibit greater noise
currents.
feedback
Operational amplifiers circuits nearly always
employ feedback, and since feedback is the first
prerequisite for oscillation, caution is appropriate.
Most oscillation problems result from driving
capacitive loads and ignoring stray input
capacitance. A small-value capacitor connected
in parallel with the feedback resistor is an effective
remedy (see Figure 42). The value of this
capacitor is optimized empirically.
–
+
V
O
electrostatic-discharge protection
Figure 42. Compensation for Input Capacitance
The TLV233x incorporates an internal electrostatic-discharge (ESD)-protection circuit that prevents functional
failures at voltages up to 2000 V as tested under MIL-PRF-38535. Method 3015.2. Care should be exercised,
however, when handling these devices as exposure to ESD may result in the degradation of the device
parametric performance. The protection circuit also causes the input bias currents to be temperature dependent
and have the characteristics of a reverse-biased diode.
26
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
APPLICATION INFORMATION
latch-up
Because CMOS devices are susceptible to latch-up due to their inherent parasitic thyristors, the TL V233x inputs
and outputs are designed to withstand –100-mA surge currents without sustaining latch-up; however,
techniques should be used to reduce the chance of latch-up whenever possible. Internal-protection diodes
should not by design be forward biased. Applied input and output voltage should not exceed the supply voltage
by more than 300 mV. Care should be exercised when using capacitive coupling on pulse generators. Supply
transients should be shunted by the use of decoupling capacitors (0.1 µF typical) located across the supply rails
as close to the device as possible.
The current path established if latch-up occurs is usually between the positive supply rail and ground and can
be triggered by surges on the supply lines and/or voltages on either the output or inputs that exceed the supply
voltage. Once latch-up occurs, the current flow is limited only by the impedance of the power supply and the
forward resistance of the parasitic thyristor and usually results in the destruction of the device. The chance of
latch-up occurring increases with increasing temperature and supply voltages.
output characteristics
V
I
P
I
F
I
L
2.5 V
–
+
DD
R
P
R
L
RP+
V
O
IP = Pullup Current
Required by the
Operational Amplifier
(typically 500 µA)
–2.5 V
VDD*
IF)
C
L
The output stage of the TLV233x is designed to
sink and source relatively high amounts of current
(see Typical Characteristics). If the output is
subjected to a short-circuit condition, this highcurrent capability can cause device damage
under certain conditions. Output current capability
increases with supply voltage.
Although the TLV233x possesses excellent
high-level output voltage and current capability,
methods are available for boosting this capability
if needed. The simplest method involves the use
of a pullup resistor (R
) connected from the output
P
to the positive supply rail (see Figure 43). There
are two disadvantages to the use of this circuit.
First, the NMOS pulldown transistor N4 (see
equivalent schematic) must sink a comparatively
large amount of current. In this circuit, N4 behaves
like a linear resistor with an on resistance between
approximately 60 Ω and 180 Ω, depending on
how hard the operational amplifier input is driven.
With very low values of R
, a voltage offset from
P
0 V at the output occurs. Secondly , pullup resistor
R
acts as a drain load to N4 and the gain of the
P
operational amplifier is reduced at output voltage
levels where N5 is not supplying the output
current.
–
V
I
+
R2
R1
Figure 43. Resistive Pullup to Increase V
V
I
TA = 25°C
f = 1 kHz
V
= 1 V
I(PP)
Figure 44. Test Circuit for Output Characteristics
IL)
V
O
OH
V
O
I
P
All operating characteristics of the TLV233x are measured using a 20-pF load. The device drives higher
capacitive loads; however, as output load capacitance increases, the resulting response pole occurs at lower
frequencies thereby causing ringing, peaking, or even oscillation (see Figure 44 and Figure 45). In many cases,
adding some compensation in the form of a series resistor in the feedback loop alleviates the problem.
(a) CL = 20 pF, RL = NO LOAD(b) CL = 170 pF, RL = NO LOAD(c) CL = 190 pF, RL = NO LOAD
Figure 45. Effect of Capacitive Loads
28
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
MECHANICAL INFORMATION
D (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE
14 PIN SHOWN
14
1
0.069 (1,75) MAX
0.050 (1,27)
A
0.020 (0,51)
0.014 (0,35)
0.010 (0,25)
0.004 (0,10)
8
7
0.010 (0,25)
0.157 (4,00)
0.150 (3,81)
M
0.244 (6,20)
0.228 (5,80)
Seating Plane
0.004 (0,10)
PINS **
DIM
A MAX
A MIN
0.008 (0,20) NOM
Gage Plane
0°–8°
8
0.197
(5,00)
0.189
(4,80)
14
0.344
(8,75)
0.337
(8,55)
0.044 (1,12)
0.016 (0,40)
4040047/B 03/95
16
0.394
(10,00)
0.386
(9,80)
0.010 (0,25)
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. Body dimensions do not include mold flash or protrusion, not to exceed 0.006 (0,15).
D. Four center pins are connected to die mount pad.
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Body dimensions do not include mold flash or protrusion not to exceed 0,15.
D. Falls within JEDEC MO-153
8
3,10
2,90
14
5,10
4,90
16
5,10
20
6,60
6,404,90
24
7,90
7,70
28
9,80
9,60
4040064/D 10/95
32
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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