Two 8-Bit Back-to-Back Registers Store
Data Flowing in Both Directions
D
Noninverting Outputs
D
T ypical V
(Output Ground Bounce) < 1 V
OLP
at VCC = 5 V, TA = 25°C
D
Latch-Up Performance Exceeds 500 mA Per
JESD 17
D
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB), and Thin Shrink Small-Outline (PW)
Packages, Ceramic Chip Carriers (FK),
Ceramic Flat (W) Package, and Plastic (NT)
and Ceramic (JT) DIPs
description
The ’ABT2952A transceivers consist of two 8-bit
back-to-back registers that store data flowing in
both directions between two bidirectional buses.
Data on the A or B bus is stored in the registers on
the low-to-high transition of the clock (CLKAB or
CLKBA) input provided that the clock-enable
(CLKENAB
output-enable (OEAB or OEBA) input low
accesses the data on either port.
T o ensure the high-impedance state during power
up or power down, OE should be tied to V
through a pullup resistor; the minimum value of
the resistor is determined by the current-sinking
capability of the driver.
or CLKENBA) input is low. Taking the
CC
SN54ABT2952A . . . JT OR W PACKAGE
SN74ABT2952A . . . DB, DW, PW, OR NT PACKAGE
OEAB
CLKAB
CLKENAB
SN54ABT2952A . . . FK PACKAGE
B5
B4
B3
NC
B2
B1
OEAB
NC – No internal connection
(TOP VIEW)
B8
1
B7
2
B6
3
B5
4
B4
5
B3
6
B2
7
B1
8
9
10
11
GND
12
(TOP VIEW)
B7
B8
B6
3212827
426
5
6
7
8
9
10
11
12 13 14 15 16 17 18
GND
CLKAB
CLKENAB
24
23
22
21
20
19
18
17
16
15
14
13
CC
V
NC
NC
CLKENBA
V
CC
A8
A7
A6
A5
A4
A3
A2
A1
OEBA
CLKBA
CLKENBA
A8
A7
A6
25
A5
24
A4
23
NC
22
A3
21
A2
20
A1
19
OEBA
CLKBA
The SN54ABT2952A is characterized for
operation over the full military temperature range
of –55°C to 125°C. The SN74ABT2952A is
characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1998, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
1
SN54ABT2952A, SN74ABT2952A
OCTAL BUS TRANSCEIVERS AND REGISTERS
WITH 3-STATE OUTPUTS
SCBS203D – AUGUST 1992 – REVISED JANUARY 1998
logic symbol
FUNCTION TABLE
INPUTS
CLKENAB CLKAB OEABA
HXLXB
XH or LLXB
L↑LL L
L↑LH H
XXHXZ
†
A-to-B data flow is shown; B-to-A data flow is similar,
but uses CLKENBA
‡
Level of B before the indicated steady-state input
conditions were established
, CLKBA, and OEBA.
†
OUTPUT
B
‡
0
‡
0
§
OEBA
CLKENBA
CLKBA
OEAB
CLKENAB
CLKAB
A1
A2
A3
A4
A5
A6
A7
A8
15
13
14
9
11
10
16
17
18
19
20
21
22
23
EN3
G1
1 C5
EN4
G2
2 C6
31
8
5D
16D
4
B1
7
B2
6
B3
5
B4
4
B5
3
B6
2
B7
1
B8
§
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the DB, DW, JT, NT, PW, and W packages.
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
logic diagram (positive logic)
SN54ABT2952A, SN74ABT2952A
OCTAL BUS TRANSCEIVERS AND REGISTERS
WITH 3-STATE OUTPUTS
SCBS203D – AUGUST 1992 – REVISED JANUARY 1998
CLKENAB
CLKAB
OEAB
CLKENBA
CLKBA
OEBA
A1
11
10
9
13
14
15
16
C1
1D
8
B1
Pin numbers shown are for the DB, DW, JT, NT, PW, and W packages.
C1
1D
To Seven Other Channels
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54ABT2952A, SN74ABT2952A
UNIT
OCTAL BUS TRANSCEIVERS AND REGISTERS
WITH 3-STATE OUTPUTS
SCBS203D – AUGUST 1992 – REVISED JANUARY 1998
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace
length of zero.
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Figure 1)
f
clock
t
w
su
h
VCC = 5 V,
TA = 25°C
MINMAXMINMAXMINMAX
Clock frequency015001500150MHz
Pulse duration, CLK high or low3.33.33.3ns
up time before
me after
A or B
CLKEN
A or B1.51.51.5
CLKEN222
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
w
2.532.5
333
SN54ABT2952A SN74ABT2952A
UNIT
5
SN54ABT2952A, SN74ABT2952A
(INPUT)
(OUTPUT)
CLKAB
CLKBA
B or A
ns
OEBA
OEAB
A or B
ns
OEBA
OEAB
A or B
ns
OCTAL BUS TRANSCEIVERS AND REGISTERS
WITH 3-STATE OUTPUTS
SCBS203D – AUGUST 1992 – REVISED JANUARY 1998
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, C
PARAMETER
f
max
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
= 50 pF (unless otherwise noted) (see Figure 1)
L
FROM
or
or
or
TO
VCC = 5 V,
TA = 25°C
MINTYPMAXMINMAXMINMAX
150150150MHz
23.35.226.325.9
2.546.12.56.82.56.3
1.53.24.71.55.71.55.6
23.75.726.726.6
1.53.55.11.56.51.56.4
1.53.45.91.56.71.56.2
SN54ABT2952A SN74ABT2952A
UNIT
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 50 pF
(see Note A)
SN54ABT2952A, SN74ABT2952A
OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS203D – AUGUST 1992 – REVISED JANUARY 1998
PARAMETER MEASUREMENT INFORMATION
7 V
500 Ω
500 Ω
S1
Open
GND
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
WITH 3-STATE OUTPUTS
Open
7 V
Open
LOAD CIRCUIT
t
w
Input
Input
Output
Output
INVERTING AND NONINVERTING OUTPUTS
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
1.5 V1.5 V
t
PLH
1.5 V
t
PHL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
t
PHL
1.5 V
t
PLH
1.5 V1.5 V
3 V
0 V
3 V
0 V
V
V
V
V
OH
OL
OH
OL
Timing Input
Data Input
Output
Control
Output
Waveform 1
S1 at 7 V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
1.5 V
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V
t
PZL
t
PLZ
1.5 V
t
t
PZH
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
PHZ
1.5 V
VOLTAGE WAVEFORMS
t
h
1.5 V
VOL + 0.3 V
VOH – 0.3 V
3 V
0 V
3 V
0 V
3 V
0 V
3.5 V
V
OL
V
OH
≈ 0 V
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf≤ 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
IMPORTANT NOTICE
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any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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