TEXAS INSTRUMENTS SN65HVD1040 Technical data

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3
V
CC
7
6
CANL
4
RXD
WAKEUP
FILTER
BUSMONITOR
MUX
OVER
TEMPERATURE
SENSOR
DRIVER
TIME -OUT
DOMINANT
1
TXD
30 Am
STB
8
10 Am
SLEEP MODE
5
SPLIT
/ 2
2
OUTPUT
LOGIC
INPUT LOGIC
V
CC
V
CC
V
CC
SN65HVD1040
SLLS631B – MARCH 2007 – REVISED APRIL 2007
LOW-POWER CAN TRANSCEIVER WITH BUS WAKE-UP

FEATURES APPLICATIONS

Improved Drop-in Replacement for the
TJA1040
± 12 kV ESD Protection
Low-Current Standby Mode with Bus Wake-up: 5 µ A Typical
Bus-Fault Protection of –27 V to 40 V
Rugged Split-Pin Bus Stability
Dominant Time-Out Function
Power-Up/Down Glitch-Free Bus Inputs and
Outputs – High Input Impedance with Low V
CC
Monotonic Outputs During Power Cycling
DeviceNet Vendor ID # 806

DESCRIPTION

The SN65HVD1040 meets or exceeds the specifications of the ISO 11898 standard for use in applications employing a Controller Area Network (CAN). As CAN transceivers, these devices provide differential transmit and receive capability for a CAN controller at signaling rates of up to 1 megabit per second (Mbps).
Designed for operation in especially harsh environments, the device features ± 12 kV ESD protection on the bus and split pins, cross-wire, overvoltage and loss of ground protection from –27 to 40 V, overtemperature shutdown, a –12 V to 12 V common-mode range, and will withstand voltage transients from –200 V to 200 V according to ISO 7637.

Battery Operated Applications

Hand-Held Diagnostics
Medical Scanning and Imaging
HVAC
Security Systems
Telecom Base Station Status and Control
SAE J1939 Standard Data Bus Interface
NMEA 2000 Standard Data Bus Interface
ISO 11783 Standard Data Bus Interface
Industrial Automation
DeviceNet™ Data Buses
(1)
(1) The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
DeviceNet is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Copyright © 2007, Texas Instruments Incorporated
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1
2
3
4
8
7
6
5
TXD
GND
V
CC
RXD
STB CANH CANL SPLIT
SN65HVD1040
SN65HVD1040
SLLS631B – MARCH 2007 – REVISED APRIL 2007
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.

DESCRIPTION (Continued)

The STB input (pin 8) selects between two different modes of operation; high-speed or low-power mode. The high-speed mode of operation is selected by connecting STB to ground.
If a high logic level is applied to the STB pin of the SN65HVD1040, the device enters a low-power bus-monitor standby mode. While the SN65HVD1040 is in the low-power bus-monitor standby mode, a dominant bit greater than 5 µ s on the bus is passed by the bus-monitor circuit to the receiver output. The local protocol controller may then reactivate the device when it needs to transmit to the bus.
A dominant-time-out circuit in the SN65HVD1040 prevents the driver from blocking network communication during a hardware or software failure. The time-out circuit is triggered by a falling edge on TXD (pin 1). If no rising edge is seen before the time-out constant of the circuit expires, the driver is disabled. The circuit is then reset by the next rising edge on TXD.
The SPLIT output (pin 5) is available on the SN65HVD1040 as a V split-termination network.
The SN65HVD1040 is characterized for operation from –40 ° C to 125 ° C.
/2 common-mode bus voltage bias for a
CC
ORDERING INFORMATION
PART NUMBER PACKAGE
SN65HVD1040 YES YES SOIC-8 VP1040
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com .
DOMINANT LOW-POWER MARKED
TIME-OUT BUS MONITOR AS
(1)
ORDERING NUMBER
SN65HVD1040D (rail)
SN65HVD1040DR (reel)
2
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SN65HVD1040
SLLS631B – MARCH 2007 – REVISED APRIL 2007

ABSOLUTE MAXIMUM RATINGS

V
CC
V
I(bus)
I
O(OUT)
Supply voltage Voltage range at any bus terminal (CANH, CANL, SPLIT) –27 V to 40 V Receiver output current -20 mA to 20 mA Voltage input, transient pulse Human Body Model Bus terminals and GND ± 12 kV
ESD
Human body model Charged-device-model Machine model ± 200 V
V
I
T
J
Voltage input range (TXD, STB) –0.5 V to 6 V Junction temperature –55 ° C to 170 ° C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal. (3) Tested in accordance with ISO 7637, test pulses 1, 2, 3a, 3b, 5, 6 & 7. (4) Tested in accordance JEDEC Standard 22, Test Method A114-A. (5) Tested in accordance JEDEC Standard 22, Test Method C101.
(2)
(4)

RECOMMENDED OPERATING CONDITIONS

V
CC
VIor V V
IH
V
IL
V
ID
I
OH
I
OL
t
SS
T
J
(1) The algebraic convention, in which the least positive (most negative) limit is designated as minimum is used in this data sheet.
Supply voltage 4.75 5.25 V Voltage at any bus terminal (separately or common mode) –12
IC
High-level input voltage 2 5.25 V Low-level input voltage 0 0.8 V Differential input voltage –6 6 V
High-level output current mA
Low-level output current mA
Maximum pulse width to remain in standby 0.7 µ s Junction temperature –40 150 C
(1)
VALUE
–0.3 V to 7 V
(3)
, (CANH, CANL, SPLIT) –200 V to 200 V
All pins ± 4 kV
(5)
All pins ± 1 kV
MIN NOM MAX UNIT
(1)
TXD, STB
Driver –70 Receiver –2 Driver 70 Receiver 2
12 V

SUPPLY CURRRENT

over operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Dominant VI= 0 V, 60 Load, STB at 0 V 50 70
I
CC
Supply current, V
CC
Recessive VI= VCC, STB at 0 V 6 10 Standby STB at VCC, VI = VCC 5 12 µ A

DEVICE SWITCHING CHARACTERISTICS

over recommended operating conditiions (unless otherwise noted)
PARAMETER
t
Total loop delay, driver input to receiver output, Recessive to Dominant 90 230
loop1
t
Total loop delay, driver input to receiver output, Dominant to Recessive 90 230
loop2
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TEST MIN TYP MAX UNIT
CONDITIONS
STB at 0 V, See Figure 9
mA
ns
3
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SN65HVD1040
SLLS631B – MARCH 2007 – REVISED APRIL 2007

DRIVER ELECTRICAL CHARACTERISTICS

over recommended operating conditiions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP
V
O(D)
V
O(R)
V
O
V
OD(D)
V
SYM
V
OD(R)
V
OC(D)
V
OC(pp)
I
IH
I
IL
I
O(off)
I
OS(ss)
C
O
Bus output voltage VI= 0 V, STB at 0 V, RL= 60 , See Figure 1 and (Dominant) Figure 2
Bus output voltage (Recessive) VI= 3 V, STB at 0 V, See Figure 1 and Figure 2 2 2.5 3 V Bus output voltage (Standby) RL= 60 , STB at VCC, See Figure 1 and Figure 2 –0.1 0.1 V
Differential output voltage (Dominant) V
Output symmetry (Dominant or Recessive) [ V
+ V
O(CANH)
Differential output voltage (Recessive) V
Common-mode output voltage (Dominant)
Peak-to-peak common-mode output voltage
High-level input current, TXD input VIat V Low-level input current, TXD input VIat 0 V –50 –10 µ A Power-off TXD Leakage current V
Short-circuit steady-state output current
Output capacitance
(1) All typical values are at 25 C with a 5-V supply.
CANH 2.9 3.4 4.5 CANL 0.8 1.75
VI= 0 V, RL= 60 , STB at 0 V, See Figure 1 and
Figure 2 , and Figure 3
VI= 0 V, RL= 45 , STB at 0 V, See Figure 1 and
Figure 2
STB at 0 V, See Figure 2 and Figure 13 0.9 × V
)
O(CANL)
VI= 3 V, RL= 60 , STB at 0 V, See Figure 1 and
Figure 2
VI= 3 V, STB at 0 V, No Load –0.5 0.05
STB at 0 V, See Figure 8 V
at 0 V, TXD at 5 V 1 µ A
CC
V
CANH
V
CANH
V
CANL
V
CANL
See Input capacitance to ground in RECEIVER
ELECTRICAL CHARACTERISTICS .
(1)
1.5 3
1.4 3
V
CC
1.1 × V
CC
–0.012 0.012
2 2.3 3
0.3
CC
–2 2 µ A
= –12 V, CANL Open, See Figure 12 –120 –72
= 12 V, CANL Open, See Figure 12 0.36 1 = –12 V, CANH Open, See Figure 12 –1 –0.5 = 12 V, CANH Open, See Figure 12 71 120
MAX UNIT
V
V
CC
mA

DRIVER SWITCHING CHARACTERISTICS

over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
PLH
t
PHL
t
sk(p)
t
r
t
f
t
en
t
dom
4
Propagation delay time, low-to-high-level output 25 65 120 Propagation delay time, high-to-low-level output 25 45 120 Pulse skew (|t
t
PHL
|) STB at 0 V, See Figure 4 25 ns
PLH
Differential output signal rise time 25 Differential output signal fall time 50 Enable time from silent mode to dominant See Figure 7 10 µ s Dominant time-out See Figure 10 300 450 700 µ s
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RECEIVER ELECTRICAL CHARACTERISTICS

over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP
Positive-going input threshold
V
IT+
voltage Negative-going input threshold
V
IT–
voltage
V
Hysteresis voltage (V
hys
V
Input threshold voltage Standby mode STB at V
IT
V
High-level output voltage IO= –2 mA, See Figure 6 4 4.6 V
OH
V
Low-level output voltage IO= 2 mA, See Figure 6 0.2 0.4 V
OL
I
Power-off bus input current 5 µ A
I(off)
I
Power-off RXD leakage current V
O(off)
C
Input capacitance to ground, (CANH or CANL) TXD at 3 V, VI= 0.4 sin (4E6 π t) + 2.5 V 20 pF
I
C
Differential input capacitance TXD at 3 V, VI= 0.4 sin (4E6 π t) 10 pF
ID
R
Differential input resistance TXD at 3 V, STD at 0 V 30 80
ID
R
Input resistance, (CANH or CANL) TXD at 3 V, STD at 0 V 15 30 40
IN
Input resistance matching
R
I(m)
[1 (R
IN (CANH)
/ R
V
IT+
)] x 100%
IN (CANL)
(1) All typical values are at 25 C with a 5-V supply.
High-speed mode 500 650
) STB at V
IT–
SN65HVD1040
SLLS631B – MARCH 2007 – REVISED APRIL 2007
(1)
800 900
STB at 0 V, See Table 1
CC CC
CANH or CANL = 5 V, V TXD at 0 V
at 0 V, RXD at 5 V 20 µ A
CC
V
= V
CANH
CANL
at 0 V,
CC
100 125 500 1150
–3% 0% 3%
MAX UNIT
mV
k

RECEIVER SWITCHING CHARACTERISTICS

over recommended operating conditiions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
Propagation delay time, low-to-high-level output 60 100 130
pLH
t
Propagation delay time, high-to-low-level output 45 70 130
pHL
t
Output signal rise time 8
r
t
Output signal fall time 8
f
t
Dominant time required on bus for wake-up from
BUS
(1)
standby
(1) The device under test shall not signal a wake-up condition with dominant pulses shorter than t
condition with dominant pulses longer than t wake-up.
(max). Dominant pulses with a length between t
BUS
STB at 0 V, TXD at 3 V, See
Figure 6
STB at V
Figure 11 0.7 5 µ s
CC
(min) and shall signal a wake-up
BUS
(min) and t
BUS
BUS

SPLIT-PIN CHARACTERISTICS

over recommended operating conditiions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
O
I
O(stb)
Output voltage –500 µ A < IO< 500 µ A 0.3 × V
0.5 × V
CC
CC
Standby mode leakage current STB at 2 V, –12 V VO≤ 12 V –5 5 µ A

STB-PIN CHARACTERISTICS

over recommended operating conditiions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
I
High level input current STB at 2 V –10 0 µ A
IH
I
Low level input current STB at 0 V –10 0 µ A
IL
ns
(max) may lead to a
0.7 × V
V
CC
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2.5 V
3.5
V
1.5 V
Recessive
Dominant
O
(CANH)
V
O
(CANL)
V
TXD
STB
I
I
V
I
V
OD
R
L
2
I
O(CANH)
V
O(CANH)
V
OC
I
O(CANL)
V
O(CANL)
V
O(CANH)
+ V
O(CANL)
0 V
V
OD
+
_
CANH
CANL
TXD
STB
60 +1%
330 +1%
330 +1%
−2 V 3 V
TEST
3 7 V
RL = 60 W +1‘%
V
O
STB
CANH
CANH
V
I
TXD
(see Note A)
t
f
t
r
10%
90%
0.9 V
0 V
V
O(D)
V
I
V
O
V
O(R)
CL = 100 pF +20% (see Note B)
V
CC
2
V
CC
2
t
PLH
t
PHL
0.5 V
V
CC
V
O
CANH
CANL
RXD
V
I
(CANH)
V
I
(CANL)
I
O
V
ID
V
I(CANH)
+ V
I(CANL)
2
VIC =
SN65HVD1040
SLLS631B – MARCH 2007 – REVISED APRIL 2007
Figure 1. Driver Voltage, Current, and Test Definition Figure 2. Bus Logic State Voltage Definitions

PARAMETER MEASUREMENT INFORMATION

Figure 3. Driver V
Figure 4. Driver Test Circuit and Voltage Waveforms
Figure 5. Receiver Voltage and Current Definitions
Test Circuit
OD
6
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CANH
CANL
RXD
V
I
STB
V
O
I
O
2V
2.4V
3.5V
V
OH
t
f
t
r
1.5V
V
OL
90%
10%
V
I
V
O
1.5V
(seeNote A)
CL=15pF 20% (seeNoteB)
t
PLH
t
PLH
0.7V
CC
0.3V
CC
50%
50%
CANH
CANL
C
L
TXD
STB
RXD
+
V
O
15 pF 20%
DUT
60 W 1%
V
I
V
O
t
en
V
CC
0 V V
OH
V
OL
NOTE: CL = 100 pF Includes Instrumentation and Fixture Capacitance Within ±20%
CANH
CANL
V
I
TXD
STB
27 W +1%
27 W +1%
47 nF +20%
VOC =
V
O (CANH)
+ V
O (CANL)
2
V
OC
V
OC(PP)
SN65HVD1040
SLLS631B – MARCH 2007 – REVISED APRIL 2007
PARAMETER MEASUREMENT INFORMATION (continued)
A. The input pulse is supplied by a generator having the following characteristics: PRR 125 kHz, 50% duty cycle, tr≤
6 ns, tf≤ 6ns, ZO= 50 .
B. CLincludes instrumentation and fixture capacitance within 20%.
Figure 6. Receiver Test Circuit and Voltage Waveforms
Table 1. Differential Input Voltage Threshold Test
INPUT OUTPUT
V
CANH
–11.1 V –12 V 900 mV L V
12 V 11.1 V 900 mV L –6 V –12 V 6 V L 12 V 6 V 6 V L
–11.5 V –12 V 500 mV H V
12 V 11.5 V 500 mV H
–12 V –6 V 6 V H
6 V 12 V 6 V H
Open Open X H
V
CANL
|V
| R
ID
OL
OH
Figure 7. tenTest Circuit and Voltage Waveforms
A. All VIinput pulses are from 0 V to V
Pulse Repetition Rate (PRR) = 125 kHz, 50% duty cycle.
Figure 8. Peak-to-Peak Common Mode Output Voltage Test and Waveform
and supplied by a generator having the following characteristics: tror tf≤ 6 ns.
CC
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