•8-Bit Input LVDS Data Bus
– Byte-Wide Interleaved Data Load
– 8 Sample Input FIFO
– Optional Data Pattern Checker
•Multi-DAC Synchronization
•Selectable 2x-4x Interpolation Filters
– Stop-Band Attenuation > 85 dB
•Fs/2 and ± Fs/4 Coarse Mixer
•Digital Quadrature Modulator Correction
– Gain, Phase and Offset Correction
•Temperature Sensor
•3- or 4-Wire Serial Control Interface
•On-Chip 1.2-V Reference
•Differential Scalable Output: 2 to 20 mA
•Single-Carrier TM1 WCDMA ACLR: 82 dBc at
f
= 122.88 MHz
OUT
•Low Power: 1.3 W at 800 MSPS
•Space Saving Package: 48-pin 7×7mm QFN
SLAS693A –MARCH 2010–REVISED APRIL 2010
APPLICATIONS
•Cellular Base Stations
•Diversity Transmit
•Wideband Communications
•Digital Synthesis
DESCRIPTION
The DAC3283 is a dual-channel 16-bit 800 MSPS
digital-to-analog converter (DAC) with an 8-bit LVDS
input data bus with on-chip termination, optional
2x-4x interpolation filters, digital IQ compensation and
internal voltage reference. The DAC3283 offers
superior linearity, noise and crosstalk performance.
Input data can be interpolated by 2x or 4x through
on-chip interpolating FIR filters with over 85 dB of
stop-band attenuation. Multiple DAC3283 devices can
be fully synchronized.
The DAC3283 allows either a complex or real output.
An optional coarse mixer in complex mode provides
frequency upconversion and the dual DAC output
produces a complex Hilbert Transform pair. The
digital IQ compensation feature allows optimization of
phase, gain and offset to maximize sideband rejection
and minimizeLO feed-throughof anexternal
quadrature modulator performing the final single
sideband RF up-conversion.
The DAC3283 is characterized for operation over the
entire industrial temperature range of –40°C to 85°C
and is available in a 48-pin 7×7mm QFN package.
ORDERING INFORMATION
T
A
–40°C to 85°CRGZ/64QFN Quad Flatpack No-LeadTape and Reel
(1) Thermal Pad Size: 5,6 mm × 5,6 mm
(2) MSL Peak Temperature: Level-3-260C-168 HR
(3) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
BIASJ43OFull-scale output current bias. For 20mA full-scale output current, connect a 960Ω resistor to GND.
CLKVDD181, 35I
D[7..0]P15, 21, 23,I
D[7..0]N16, 22, 24,ID7N is most significant data bit (MSB) – pin 10
DACCLKP3IPositive external LVPECL clock input for DAC core with a self-bias of approximately CLKVDD18/2.
DACCLKN4IComplementary external LVPECL clock input for DAC core. (see the DACCLKP description)
1.8V CMOS output for ALARM condition. The ALARM output functionality is defined through the
CONFIG6 register. Default polarity is active low, but can be changed to active high via CONFIG0
alarm_pol control bit. Optionally, it can be used as the uni-directional data output in 4-pin serial
interface mode (CONFIG 23 sif4_ena = '1').
Internal clock buffer supply voltage. (1.8 V) It is recommended to isolate this supply from DACVDD18
and DIGVDD18.
LVDS positive input data bits 0 through 7. Each positive/negative LVDS pair has an internal 100 Ω
termination resistor. Data format relative to DATACLKP/N clock is Double Data Rate (DDR) with two
data transfers per DATACKP/N clock cycle. Dual channel 16-bit data is transferred byte-wide on this
single 8-bit data bus using FRAMEP/N as a frame strobe indicator.
The order of the bus can be reversed via CONFIG19 rev bit.
LVDS negative input data bits 0 through 15. (See D[7:0]P description above)
DAC core supply voltage. (1.8 V) It is recommended to isolate this supply from CLKVDD18 and
DIGVDD18.
D7P is most significant data bit (MSB) – pin 9
D0P is least significant data bit (LSB) – pin 27
D0N is least significant data bit (LSB) – pin 28
Product Folder Link(s): DAC3283
DAC3283
SLAS693A –MARCH 2010–REVISED APRIL 2010
www.ti.com
TERMINAL FUNCTIONS (continued)
TERMINAL
NAMENO.
DATACLKP17IInput data D[7:0]P/N is latched on both edges of DATACLKP/N (Double Data Rate) with two data
DATACLKN18ILVDS negative input data clock. (See DATACLKP description)
DIGVDD188, 29I
EXTIO44I/O= '1'. Used as internal reference output when CONFIG25 extref_ena = '0' (default). Requires a 0.1µF
FRAMEP19I
FRAMEN20ILVDS frame indicator negative input. (See the FRAMEN description)
GNDIPin 5 and the Thermal Pad located on the bottom of the QFN package is ground for all supplies.
IOUTA138Ofull scale current sink and the least positive voltage on the IOUTA1 pin. Similarly, a 0xFFFF data input
IOUTA239OIOUTA1 described above. An input data value of 0x0000 results in a 0 mA sink and the most positive
IOUTB147OB-Channel DAC current output. Refer to IOUTA1 description above.
IOUTB246OB-Channel DAC complementary current output. Refer to IOUTA2 description above.
OSTRP6IDACCLKP/N. It is used to reset the clock dividers and for multiple DAC synchronization. If unused it
OSTRN7ILVPECL output strobe negative input. (See the OSTRP description)
SCLK32I1.8V CMOS serial interface clock. Internal pull-down.
SDENB33I1.8V CMOS active low serial data enable, always an input to the DAC3283. Internal pull-up.
SDIO31I/O
TXENABLE30IWhen TXENABLE is low, the digital logic section is forced to all 0, and any input data is ignored.
VFUSE41I
5, Thermal
Pad
I/ODESCRIPTION
LVDS positive input data clock. This positive/negative pair has an internal 100 Ω termination resistor.
transfers input per DATACLKP/N clock cycle.
Digital supply voltage. (1.8V) It is recommended to isolate this supply from CLKVDD18 and
DACVDD18.
Used as external reference input when internal reference is disabled through CONFIG25 extref_ena
decoupling capacitor to AGND when used as reference output.
LVDS frame indicator positive input. This positive/negative pair has an internal 100Ω termination
resistor. This signal is captured with the rising edge of DATACLKP/N and used to indicate the
beginning of the frame. It is also used as a reset signal by the FIFO. The FRAMEP/N signal should be
edge-aligned with D[7:0]P/N.
A-Channel DAC current output. An offset binary data pattern of 0x0000 at the DAC input results in a
results in a 0 mA current sink and the most positive voltage on the IOUTA1 pin.
A-Channel DAC complementary current output. The IOUTA2 has the opposite behavior of the
voltage on the IOUTA2 pin.
LVPECL output strobe positive input. This positive/negative pair is captured with the rising edge of
can be left floating.
1.8V CMOS serial interface data. Bi-directional in 3-pin mode (default). In 4-pin interface mode, the
SDIO pin is an input only. Internal pull-down.
1.8V CMOS active high input. TXENABLE must be high for the DATA to the DAC to be enabled.
Internal pull-down.
Digital supply voltage. (1.8V) This supply pin is also used for factory fuse programming. Connect to
over operating free-air temperature range (unless otherwise noted)
DACDVDD18
DIGVDD18
Supply voltage rangeCLKVDD18
VFUSE
AVDD33
CLKVDD18 to DIGDVDD18–0.5 to 0.5V
DACVDD18 TO DIGVDD18–0.5 to 0.5V
D[7..0]P ,D[7..0]N, DATACLKP, DATACLKN, FRAMEP, FRAMEN
Terminal voltage
range
DACCLKP, DACCLKN, OSTRP, OSTRN
ALARM_SDO, SDIO, SCLK, SDENB, TXENABLE
IOUTA1/B1, IOUTA2/B2
EXTIO, BIASJ
Peak input current (any input)20mA
Peak total input current (all inputs)–30mA
Operating free-air temperature range, TA: DAC3283–40 to 85°C
Storage temperature range–65 to 150°C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of these or any other conditions beyond those indicated under recommended operating conditions is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Measured with respect to GND.
(2)
(2)
(2)
(2)
(2)
(2)
(2)
(2)
(1)
VALUEUNIT
–0.5 to 2.3V
–0.5 to 2.3V
–0.5 to 2.3V
–0.5 to 2.3V
–0.5 to 4V
(2)
–0.5 to DIGVDD18 + 0.5V
–0.5 to CLKVDD18 + 0.5V
(2)
–0.5 to DIGCLKVDD18 + 0.5V
–1.0 to AVDD33 + 0.5V
–0.5 to AVDD33 + 0.5V
THERMAL CHARACTERISTICS
over operating free-air temperature range (unless otherwise noted)
THERMAL CONDUCTIVITY48ld QFNUNIT
T
Maximum junction temperature
J
Theta junction-to-ambient (still air)30
q
JA
Theta junction-to-ambient (150 lfm)24
q
Theta junction-to-board8°C/W
JB
q
Theta junction-to-pad1.3°C/W
Jp
(1) Air flow or heat sinking reduces qJAand may be required for sustained operation at 85° under maximum operating conditions.
(2) It is strongly recommended to solder the device thermal pad to the board ground plane.
Coarse gain linearity±0.04LSB
Offset errorMid code offset±0.01%FSR
Gain error
With external reference±2%FSR
With internal reference±2%FSR
Gain mismatchWith internal reference–22%FSR
Minimum full scale output current2mA
Maximum full scale output current20mA
Output compliance range
(1) Measured differential across IOUTA1 and IOUTA2 with 25 Ω each to AVDD.
(2) The lower limit of the output compliance is determined by the CMOS process. Exceeding this limit may result in transistor breakdown,
resulting in reduced reliability of the DAC3283 device. The upper limit of the output compliance is determined by the load resistors and
full-scale output current. Exceeding the upper limit adversely affects distortion performance and integral nonlinearity.
(3) Use an external buffer amplifier with high impedance input to drive any external load.
Over recommended operating free-air temperature range, nominal supplies, IOUTFS = 20 mA (unless otherwise noted)
PARAMETERTEST CONDITIONSMINTYP MAXUNIT
ANALOG OUTPUT
f
DAC
t
s(DAC)
t
pd
t
r(IOUT)
t
f(IOUT)
Power-up
time
AC PERFORMANCE
SFDRf
IMD3f
NSDdBc/Hz
WCDMA
(3)
(1) Measured single-ended into 50Ω load.
(2) 4:1 transformer output termination, 50Ω doubly terminated load
(3) Single carrier, W-CDMA with 3.84 MHz BW, 5-MHz spacing, centered at f
(1)
1x Interpolation312.5
Maximum DAC output update rate 2x Interpolation625MSPS
4x Interpolation800
Output settling time to 0.1%Transition: Code 0x0000 to 0xFFFF10.4ns
Output propagation delayDAC outputs are updated on the falling edge of DAC2
clock. Does not include digital latency (see below).
ns
Output rise time 10% to 90%220ps
Output fall time 90% to 10%220ps
IOUT current settling to 1% of IOUTFS. Measured
DAC wake-up timefrom SDENB rising edge; Register CONFIG24,90
toggle sleepa from 1 to 0.
IOUT current settling to less than 1% of IOUTFS.
µs
DAC sleep timeMeasured from SDENB rising edge; Register90
CONFIG24, toggle sleepa from 0 to 1.
1x Interpolation59
Digital latencyclock
2x Interpolation139
4x Interpolation290
DAC
cycles
QMC24
(2)
f
Spurious free dynamic range (0 to
f
/2)Tone at 0 dBFS
DAC
Third-order two-tone
intermodulation distortion
Each tone at –12 dBFS
Noise spectral density tone at
ELECTRICAL CHARACTERISTICS – DIGITAL SPECIFICATIONS
over recommended operating free-air temperature range, nominal supplies, IOUTFS = 20 mA (unless otherwise noted)
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
LVDS INTERFACE:D[7:0]P/N, DATACLKP/N, FRAMEP/N
f
DATA
f
BUS
V
V
V
Z
C
A,B+
A,B–
COM
T
L
Input data rate312.5MSPS
Byte-wide LVDS data transfer rate1250MSPS
Logic high differential input voltage threshold150400mV
Logic low differential input voltage threshold–150–400mV
Input common mode0.91.21.5V
Internal termination85110135Ω
LVDS Input capacitance2pF
Setup time, SDENB to rising edge of SCLK20ns
Setup time, SDIO valid to rising edge of
SCLK
Hold time, SDIO valid to rising edge of SCLK5ns
Period of SCLK
(1)
Byte-wide DDR format
DATACLK frequency = 625 MHz
–25ps
375ps
is DATACLK frequency in MHz1/2f
DATACLK
is1/2f
DACCLK
DATACLK
DACCLK
0.41.0V
f
= f
OSTR
frequency in MHz
/ (n × 8 × Interp) where n is
DACCLK
DACCLK
is DACCLK
f
DACCLK
x interp)
/ (8
200ps
200ps
I
= –100 mAV
load
I
= –2mAV
load
I
= 100 mA0.2V
load
I
= 2 mA0.5V
load
DIGVDD18
–0.2
0.8 x
DIGVDD18
10ns
Register CONFIG5 read (temperature
sensor read)
1ms
All other registers100ns
ns
ns
(1) See LVDS INPUTS section for terminology.
(2) Driving the clock input with a differential voltage lower than 1V will result in degraded performance.