TEXAS INSTRUMENTS DAC3283 Technical data

DAC3283
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Dual-Channel, 16-Bit, 800 MSPS, Digital-to-Analog Converter (DAC)
Check for Samples: DAC3283
1

FEATURES

Dual, 16-Bit, 800 MSPS DACs
8-Bit Input LVDS Data Bus – Byte-Wide Interleaved Data Load – 8 Sample Input FIFO – Optional Data Pattern Checker
Multi-DAC Synchronization
Selectable 2x-4x Interpolation Filters – Stop-Band Attenuation > 85 dB
Fs/2 and ± Fs/4 Coarse Mixer
Digital Quadrature Modulator Correction – Gain, Phase and Offset Correction
Temperature Sensor
3- or 4-Wire Serial Control Interface
On-Chip 1.2-V Reference
Differential Scalable Output: 2 to 20 mA
Single-Carrier TM1 WCDMA ACLR: 82 dBc at f
= 122.88 MHz
OUT
Low Power: 1.3 W at 800 MSPS
Space Saving Package: 48-pin 7×7mm QFN
SLAS693A –MARCH 2010–REVISED APRIL 2010

APPLICATIONS

Diversity Transmit
Wideband Communications
Digital Synthesis

DESCRIPTION

The DAC3283 is a dual-channel 16-bit 800 MSPS digital-to-analog converter (DAC) with an 8-bit LVDS input data bus with on-chip termination, optional 2x-4x interpolation filters, digital IQ compensation and internal voltage reference. The DAC3283 offers superior linearity, noise and crosstalk performance.
Input data can be interpolated by 2x or 4x through on-chip interpolating FIR filters with over 85 dB of stop-band attenuation. Multiple DAC3283 devices can be fully synchronized.
The DAC3283 allows either a complex or real output. An optional coarse mixer in complex mode provides frequency upconversion and the dual DAC output produces a complex Hilbert Transform pair. The digital IQ compensation feature allows optimization of phase, gain and offset to maximize sideband rejection and minimize LO feed-through of an external quadrature modulator performing the final single sideband RF up-conversion.
The DAC3283 is characterized for operation over the entire industrial temperature range of –40°C to 85°C and is available in a 48-pin 7×7mm QFN package.
ORDERING INFORMATION
T
A
–40°C to 85°C RGZ/64QFN Quad Flatpack No-Lead Tape and Reel
(1) Thermal Pad Size: 5,6 mm × 5,6 mm (2) MSL Peak Temperature: Level-3-260C-168 HR (3) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
ORDER CODE PACKAGE DRAWING/TYPE
DAC3283IRGZT 250 DAC3283IRGZR 2000
(1) (2) (3)
TRANSPORT MEDIA QUANTITY
Copyright © 2010, Texas Instruments Incorporated
100100
Pattern
Test
De-interleave
8 Sample FIFO
16
16
100
x2
x2
Coarse Mixer
Fs/4, -Fs/4, Fs/2
QMC
Phase and Gain
1.2 V
Reference
16-b DAC
16-b DAC
ControlInterface
Temp
Sensor
ClockDistribution
A
gain
B
gain
FrameStrobe
EXTIO
BIASJ
IOUTA1
IOUTA2
IOUTB1
IOUTB2
DACCLKP
DACCLKN
DATACLKP
DATACLKN
D7P
D7N
D0P
D0N
FRAMEP
FRAMEN
OSTRP
OSTRN
QMC
A-offset
QMC
B-offset
ALARM_SDO
SDIO
SDENB
SCLK
TXENABLE
AVDD33
CLKVDD18
DIGVDD18
VFUSE
DACVDD18
GND
LVPECL
LVDS
LVPECL
LVDS
LVDS
FIR1FIR0
59 taps 23 taps
100
LVDS
x2
x2
Programmable Delay
(0-3T)
DAC3283
SLAS693A –MARCH 2010–REVISED APRIL 2010
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
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FUNCTIONAL BLOCK DIAGRAM
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37
38
39
40
41
42
43
44
45
46
47
48
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
35
34
33
32
31
30
29
28
27
26
25
DAC3283
RGZPackage
48-QFN 7x7mm
(TopView )
36
GND
DACCLKN
D5P
D5N
D4P
D4N
DATACLKP
DATACLKN
FRAMEP
FRAMEN
D3P
D3N
D2P
D2N
D1P
D1N
D0P
D0N
TXENABLE
SDIO
SCLK
SDENB
AVDD33
AVDD33
IOUTB1
IOUTB2
VFUSE
BIASJ
EXTIO
AVDD33
IOUTA2
IOUTA1
AVDD33
AVDD33
D6N
D6P
D7N
D7P
DIGVDD18
OSTRN
OSTRP
DACCLKP
DACVDD18
CLKVDD18 DACVDD18
CLKVDD18
ALARM_SDO
DIGVDD18
DAC3283
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SLAS693A –MARCH 2010–REVISED APRIL 2010
DAC3283
RGZ PACKAGE
(TOP VIEW)
TERMINAL FUNCTIONS
TERMINAL
NAME NO.
AVDD33 I
37, 40, 42, Analog supply voltage. (3.3 V)
45, 48
ALARM_SDO 34 O
BIASJ 43 O Full-scale output current bias. For 20mA full-scale output current, connect a 960Ω resistor to GND. CLKVDD18 1, 35 I
D[7..0]P 15, 21, 23, I
D[7..0]N 16, 22, 24, I D7N is most significant data bit (MSB) – pin 10
DACCLKP 3 I Positive external LVPECL clock input for DAC core with a self-bias of approximately CLKVDD18/2. DACCLKN 4 I Complementary external LVPECL clock input for DAC core. (see the DACCLKP description)
DACVDD18 2, 36 I
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9, 11, 13,
25, 27
10, 12, 14,
26, 28
I/O DESCRIPTION
1.8V CMOS output for ALARM condition. The ALARM output functionality is defined through the CONFIG6 register. Default polarity is active low, but can be changed to active high via CONFIG0 alarm_pol control bit. Optionally, it can be used as the uni-directional data output in 4-pin serial interface mode (CONFIG 23 sif4_ena = '1').
Internal clock buffer supply voltage. (1.8 V) It is recommended to isolate this supply from DACVDD18 and DIGVDD18.
LVDS positive input data bits 0 through 7. Each positive/negative LVDS pair has an internal 100 termination resistor. Data format relative to DATACLKP/N clock is Double Data Rate (DDR) with two data transfers per DATACKP/N clock cycle. Dual channel 16-bit data is transferred byte-wide on this single 8-bit data bus using FRAMEP/N as a frame strobe indicator.
The order of the bus can be reversed via CONFIG19 rev bit. LVDS negative input data bits 0 through 15. (See D[7:0]P description above)
DAC core supply voltage. (1.8 V) It is recommended to isolate this supply from CLKVDD18 and DIGVDD18.
D7P is most significant data bit (MSB) – pin 9 D0P is least significant data bit (LSB) – pin 27
D0N is least significant data bit (LSB) – pin 28
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TERMINAL FUNCTIONS (continued)
TERMINAL
NAME NO.
DATACLKP 17 I Input data D[7:0]P/N is latched on both edges of DATACLKP/N (Double Data Rate) with two data
DATACLKN 18 I LVDS negative input data clock. (See DATACLKP description) DIGVDD18 8, 29 I
EXTIO 44 I/O = '1'. Used as internal reference output when CONFIG25 extref_ena = '0' (default). Requires a 0.1µF
FRAMEP 19 I
FRAMEN 20 I LVDS frame indicator negative input. (See the FRAMEN description) GND I Pin 5 and the Thermal Pad located on the bottom of the QFN package is ground for all supplies.
IOUTA1 38 O full scale current sink and the least positive voltage on the IOUTA1 pin. Similarly, a 0xFFFF data input
IOUTA2 39 O IOUTA1 described above. An input data value of 0x0000 results in a 0 mA sink and the most positive
IOUTB1 47 O B-Channel DAC current output. Refer to IOUTA1 description above. IOUTB2 46 O B-Channel DAC complementary current output. Refer to IOUTA2 description above.
OSTRP 6 I DACCLKP/N. It is used to reset the clock dividers and for multiple DAC synchronization. If unused it
OSTRN 7 I LVPECL output strobe negative input. (See the OSTRP description) SCLK 32 I 1.8V CMOS serial interface clock. Internal pull-down. SDENB 33 I 1.8V CMOS active low serial data enable, always an input to the DAC3283. Internal pull-up.
SDIO 31 I/O
TXENABLE 30 I When TXENABLE is low, the digital logic section is forced to all 0, and any input data is ignored.
VFUSE 41 I
5, Thermal
Pad
I/O DESCRIPTION
LVDS positive input data clock. This positive/negative pair has an internal 100 termination resistor. transfers input per DATACLKP/N clock cycle.
Digital supply voltage. (1.8V) It is recommended to isolate this supply from CLKVDD18 and DACVDD18.
Used as external reference input when internal reference is disabled through CONFIG25 extref_ena decoupling capacitor to AGND when used as reference output.
LVDS frame indicator positive input. This positive/negative pair has an internal 100Ω termination resistor. This signal is captured with the rising edge of DATACLKP/N and used to indicate the beginning of the frame. It is also used as a reset signal by the FIFO. The FRAMEP/N signal should be edge-aligned with D[7:0]P/N.
A-Channel DAC current output. An offset binary data pattern of 0x0000 at the DAC input results in a results in a 0 mA current sink and the most positive voltage on the IOUTA1 pin.
A-Channel DAC complementary current output. The IOUTA2 has the opposite behavior of the voltage on the IOUTA2 pin.
LVPECL output strobe positive input. This positive/negative pair is captured with the rising edge of can be left floating.
1.8V CMOS serial interface data. Bi-directional in 3-pin mode (default). In 4-pin interface mode, the SDIO pin is an input only. Internal pull-down.
1.8V CMOS active high input. TXENABLE must be high for the DATA to the DAC to be enabled. Internal pull-down.
Digital supply voltage. (1.8V) This supply pin is also used for factory fuse programming. Connect to
DACVDD18 pins for normal operation.
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ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range (unless otherwise noted)
DACDVDD18 DIGVDD18
Supply voltage range CLKVDD18
VFUSE AVDD33 CLKVDD18 to DIGDVDD18 –0.5 to 0.5 V DACVDD18 TO DIGVDD18 –0.5 to 0.5 V
D[7..0]P ,D[7..0]N, DATACLKP, DATACLKN, FRAMEP, FRAMEN Terminal voltage range
DACCLKP, DACCLKN, OSTRP, OSTRN
ALARM_SDO, SDIO, SCLK, SDENB, TXENABLE
IOUTA1/B1, IOUTA2/B2
EXTIO, BIASJ Peak input current (any input) 20 mA Peak total input current (all inputs) –30 mA Operating free-air temperature range, TA: DAC3283 –40 to 85 °C Storage temperature range –65 to 150 °C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Measured with respect to GND.
(2)
(2)
(2)
(2)
(2)
(2)
(2)
(2)
(1)
VALUE UNIT
–0.5 to 2.3 V –0.5 to 2.3 V –0.5 to 2.3 V –0.5 to 2.3 V
–0.5 to 4 V
(2)
–0.5 to DIGVDD18 + 0.5 V
–0.5 to CLKVDD18 + 0.5 V
(2)
–0.5 to DIGCLKVDD18 + 0.5 V
–1.0 to AVDD33 + 0.5 V –0.5 to AVDD33 + 0.5 V

THERMAL CHARACTERISTICS

over operating free-air temperature range (unless otherwise noted)
THERMAL CONDUCTIVITY 48ld QFN UNIT
T
Maximum junction temperature
J
Theta junction-to-ambient (still air) 30
q
JA
Theta junction-to-ambient (150 lfm) 24
q
Theta junction-to-board 8 °C/W
JB
q
Theta junction-to-pad 1.3 °C/W
Jp
(1) Air flow or heat sinking reduces qJAand may be required for sustained operation at 85° under maximum operating conditions. (2) It is strongly recommended to solder the device thermal pad to the board ground plane.
(1) (2)
125 °C
°C/W
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ELECTRICAL CHARACTERISTICS — DC SPECIFICATIONS

(1)
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over operating free-air temperature range, nominal supplies, IOUTFS = 20 mA (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
RESOLUTION 16 Bits DC ACCURACY
DNL Differential nonlinearity ±2 INL Integral nonlinearity ±4
1 LSB = IOUTFS/2
ANALOG OUTPUT
Coarse gain linearity ±0.04 LSB Offset error Mid code offset ±0.01 %FSR
Gain error
With external reference ±2 %FSR
With internal reference ±2 %FSR Gain mismatch With internal reference –2 2 %FSR Minimum full scale output current 2 mA Maximum full scale output current 20 mA Output compliance range
(2)
Nominal full-scale current, IOUTFS = 16 x IBIAS
current.
IOUTFS = 20 mA AVDD –0.5V AVDD +0.5V V Output resistance 300 k Output capacitance 5 pF
REFERENCE OUTPUT
V
ref
Reference output voltage 1.14 1.2 1.26 V Reference output current
(3)
REFERENCE INPUT
V
EXTIO
Input voltage range 0.1 1.2 1.25 V Input resistance 1 M
External reference mode
Small signal bandwidth 472 kHz Input capacitance 100 pF
TEMPERATURE COEFFICIENTS
Offset drift With external reference ±1
Gain drift With internal reference
Reference voltage drift ±8 ppm/°C
POWER SUPPLY
AVDD33 3.0 3.3 3.6 V DACVDD18, DIGVDD18, CLKVDD18 1.7 1.8 1.9 V
I
(AVDD33)
I
(DIGDVDD)
I
(DACVDD18)
I
(CLKVDD18)
Analog supply current 149 mA Digital supply current 340 mA DAC supply current 55 mA
Mode 1 (below)
Clock supply current 37 mA
Mode 1: f
4x interpolation, Fs/4 mixer on, QMC on
Mode 2: f
2x interpolation, Mixer off, QMC on
P Power dissipation
Mode 3: Sleep mode
f
= 800MSPS, 4x interpolation, Fs/4 mixer on, 750 mW
DAC
CONFIG24 sleepa, sleepb set = 1
Mode 4: Power-Down mode
No clock, static data pattern,
CONFIG23 clkpath_sleep_a, clkpath_sleepb set = 1
CONFIG24 clkrecv_sleep, sleepa, sleepb set = 1
PSRR Power supply rejection ratio DC tested ±0.2 %FSR/V T Operating range –40 25 85 °C
(1) Measured differential across IOUTA1 and IOUTA2 with 25 each to AVDD. (2) The lower limit of the output compliance is determined by the CMOS process. Exceeding this limit may result in transistor breakdown,
resulting in reduced reliability of the DAC3283 device. The upper limit of the output compliance is determined by the load resistors and full-scale output current. Exceeding the upper limit adversely affects distortion performance and integral nonlinearity.
(3) Use an external buffer amplifier with high impedance input to drive any external load.
= 800MSPS,
DAC
= 491.52MSPS,
DAC
16
LSB
100 nA
ppm of
FSR/°C ±15 ±30
ppm of
FSR/°C
1300 1450 mW
1000 mW
7 18 mW
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SLAS693A –MARCH 2010–REVISED APRIL 2010

ELECTRICAL CHARACTERISTICS — AC SPECIFICATIONS

Over recommended operating free-air temperature range, nominal supplies, IOUTFS = 20 mA (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ANALOG OUTPUT
f
DAC
t
s(DAC)
t
pd
t
r(IOUT)
t
f(IOUT)
Power-up time
AC PERFORMANCE
SFDR f
IMD3 f
NSD dBc/Hz
WCDMA
(3)
(1) Measured single-ended into 50load. (2) 4:1 transformer output termination, 50Ω doubly terminated load (3) Single carrier, W-CDMA with 3.84 MHz BW, 5-MHz spacing, centered at f
(1)
1x Interpolation 312.5
Maximum DAC output update rate 2x Interpolation 625 MSPS
4x Interpolation 800 Output settling time to 0.1% Transition: Code 0x0000 to 0xFFFF 10.4 ns Output propagation delay DAC outputs are updated on the falling edge of DAC 2
clock. Does not include digital latency (see below).
ns
Output rise time 10% to 90% 220 ps Output fall time 90% to 10% 220 ps
IOUT current settling to 1% of IOUTFS. Measured DAC wake-up time from SDENB rising edge; Register CONFIG24, 90
toggle sleepa from 1 to 0.
IOUT current settling to less than 1% of IOUTFS.
µs
DAC sleep time Measured from SDENB rising edge; Register 90
CONFIG24, toggle sleepa from 0 to 1.
1x Interpolation 59
Digital latency clock
2x Interpolation 139
4x Interpolation 290
DAC
cycles
QMC 24
(2)
f Spurious free dynamic range (0 to f
/2)Tone at 0 dBFS
DAC
Third-order two-tone intermodulation distortion
Each tone at –12 dBFS Noise spectral density tone at
0dBFS Adjacent channel leakage ratio,
single carrier Alternate channel leakage ratio,
single carrier Channel isolation f
= 800 MSPS, f
DAC
= 800 MSPS, f
DAC
f
= 800 MSPS, f
DAC
f
= 800 MSPS, f
DAC
= 800 MSPS, f
DAC
f
= 800 MSPS, f
DAC
f
= 800 MSPS, f
DAC
f
= 800 MSPS, f
DAC
f
= 737.28 MSPS, f
DAC
f
= 737.28 MSPS, f
DAC
f
= 737.28 MSPS, f
DAC
f
= 737.28 MSPS, f
DAC
= 800 MSPS, f
DAC
= 20.1 MHz 85
OUT
= 50.1 MHz 76 dBc
OUT
= 70.1 MHz 72
OUT
= 30 ± 0.5 MHz 93
OUT
= 50 ± 0.5 MHz 90 dBc
OUT
= 100 ± 0.5 MHz 86
OUT
= 10.1 MHz 162
OUT
= 80.1 MHz 160
OUT
= 30.72MHz 85
OUT
= 153.6MHz 81
OUT
= 30.72MHz 91
OUT
= 153.6MHz 85
OUT
= 10MHz 84 dBc
OUT
, PAR = 12dB. TESTMODEL 1, 10 ms
OUT
dBc
dBc
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ELECTRICAL CHARACTERISTICS – DIGITAL SPECIFICATIONS

over recommended operating free-air temperature range, nominal supplies, IOUTFS = 20 mA (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
LVDS INTERFACE:D[7:0]P/N, DATACLKP/N, FRAMEP/N
f
DATA
f
BUS
V V V Z C
A,B+ A,B– COM T
L
Input data rate 312.5 MSPS Byte-wide LVDS data transfer rate 1250 MSPS
Logic high differential input voltage threshold 150 400 mV Logic low differential input voltage threshold –150 –400 mV Input common mode 0.9 1.2 1.5 V Internal termination 85 110 135 LVDS Input capacitance 2 pF
TIMING LVDS INPUTS: DATACLKP/N DOUBLE EDGE LATCHING – See Figure 40
t
s(DATA)
t
h(DATA)
t
(FRAME)
t
_align
Setup time, D[7:0]P/N and FRAMEP/N, valid FRAMEP/N latched on rising edge of to either edge of DATACLKP/N DATACLKP/N only
Hold time, D[7:0]P/N and FRAMEP/N, valid FRAMEP/N latched on rising edge of after either edge of DATACLKP/N DATACLKP/N only
FRAMEP/N pulse width f Maximum offset between DATACLKP/N and FIFO bypass mode only f
DACCLKP/N rising edges DACCLK frequency in MHz –0.55
CLOCK INPUT (DACCLKP/N)
Duty cycle 40% 60% Differential voltage
(2)
DACCLKP/N Input Frequency 800 MHz
OUTPUT STROBE (OSTRP/N)
f
OSTR
Frequency any positive integer f
Duty cycle 40% 60% Differential voltage 0.4 1.0 V
TIMING OSTRP/N INPUT: DACCLKP/N RISING EDGE LATCHING
t
s(OSTR)
t
h(OSTR)
Setup time, OSTRP/N valid to rising edge of DACCLKP/N
Hold time, OSTRP/N valid after rising edge of DACCLKP/N
CMOS INTERFACE: ALARM_SDO, SDIO, SCLK, SDENB, TXENABLE
V
IH
V
IL
I
IH
I
IL
High-level input voltage 1.25 V Low-level input voltage 0.54 V High-level input current –40 40 mA Low-level input current –40 40 mA
CI CMOS input capacitance 2 pF
V
OH
V
OL
ALARM_SDO, SDIO
ALARM_SDO, SDIO
SERIAL PORT TIMING – See Figure 32 and Figure 33
t
s(SDENB)
t
s(SDIO)
t
h(SDIO)
t
(SCLK)
Setup time, SDENB to rising edge of SCLK 20 ns Setup time, SDIO valid to rising edge of
SCLK Hold time, SDIO valid to rising edge of SCLK 5 ns
Period of SCLK
(1)
Byte-wide DDR format DATACLK frequency = 625 MHz
–25 ps
375 ps
is DATACLK frequency in MHz 1/2f
DATACLK
is 1/2f
DACCLK
DATACLK
DACCLK
0.4 1.0 V
f
= f
OSTR
frequency in MHz
/ (n × 8 × Interp) where n is
DACCLK
DACCLK
is DACCLK
f
DACCLK
x interp)
/ (8
200 ps
200 ps
I
= –100 mA V
load
I
= –2mA V
load
I
= 100 mA 0.2 V
load
I
= 2 mA 0.5 V
load
DIGVDD18
–0.2
0.8 x
DIGVDD18
10 ns
Register CONFIG5 read (temperature sensor read)
1 ms
All other registers 100 ns
ns ns
(1) See LVDS INPUTS section for terminology. (2) Driving the clock input with a differential voltage lower than 1V will result in degraded performance.
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ELECTRICAL CHARACTERISTICS – DIGITAL SPECIFICATIONS (continued)
over recommended operating free-air temperature range, nominal supplies, IOUTFS = 20 mA (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
(SCLKH)
t
(SCLKL)
t
d(Data)
Register CONFIG5 read (temperature
High time of SCLK
Low time of SCLK
Data output delay after falling edge of SCLK 10 ns
sensor read) All other registers 40 ns Register CONFIG5 read (temperature
sensor read) All other registers 40 ns
0.4 ms
0.4 ms
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-5
-4
-3
-2
-1
0
1
2
3
4
5
Error-LSB
0 10000 20000 30000 40000 50000 60000 70000
Code
0 10000 20000 30000 40000 50000 60000 70000
Code
-5
-4
-3
-2
-1
0
1
2
3
4
5
Error-LSB
50
55
60
65
70
75
80
85
90
95
100
0 50 100 150 200 250 300 350
f -MHz
OUT
0dBFS
-6dBFS
-12dBFS
f = 800 MSPS, 4x Interpolation, IOUTFS = 20 mA
DAC
SecondHarmonic-dBc
0dBFS
-6dBFS
-12dBFS
f = 800 MSPS,4x Interpolation, IOUTFS = 20 mA
DAC
50
55
60
65
70
75
80
85
90
95
100
SFDR-SpuriousFreeDynamicRange-dBc
0 50 100 150 200 250 300 350
f -MHz
OUT
DAC3283
SLAS693A –MARCH 2010–REVISED APRIL 2010
Figure 1. INTEGRAL NON-LINEARITY Figure 2. DIFFERENTIAL NON-LINEARITY
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TYPICAL CHARACTERISTICS

Figure 3. SPURIOUS FREE DYNAMIC RANGE vs INPUT SCALE Figure 4. SECOND HARMONIC vs INPUT SCALE
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0 20 40 60 80 100 120
1xinterpolation
2xinterpolation
4xinterpolation
f -MHz
OUT
50
55
60
65
70
75
80
85
90
95
100
SFDR-SpuriousFreeDynamicRange-dBc
f = 312.5 MSPS, 0 dBFS, IOUTFS = 20 mA
DAC
50
55
60
65
70
75
80
85
90
95
100
105
0 50 100 150 200 250 300 350
f -MHz
OUT
0dBFS
-6dBFS
-12dBFS
ThirdHarmonic-dBc
f = 800 MSPS, 4x Interpolation, IOUTFS = 20 mA
DAC
20mA
10mA
2mA
50
55
60
65
70
75
80
85
90
95
100
SFDR-SpuriousFreeDynamicRange-dBc
0 50 100 150 200 250 300 350
f -MHz
OUT
f = 800 MSPS,4x Interpolation, 0 dBFS
DAC
f =200MSPS
DAC
f =400MSPS
DAC
f =800MSPS
DAC
50
55
60
65
70
75
80
85
90
95
100
SFDR-SpuriousFreeDynamicRange-dBc
0 50 100 150 200 250 300 350
f -MHz
OUT
4x Interpolation, 0 dBFS
IOUTFS = 20 mA
DAC3283
www.ti.com
SLAS693A –MARCH 2010–REVISED APRIL 2010
TYPICAL CHARACTERISTICS (continued)
Figure 5. THIRD HARMONIC vs INPUT SCALE Figure 6. SPURIOUS FREE DYNAMIC RANGE vs
INTERPOLATION
Figure 7. SPURIOUS FREE DYNAMIC RANGE vs f
Copyright © 2010, Texas Instruments Incorporated Submit Documentation Feedback 11
DAC
Figure 8. SPURIOUS FREE DYNAMIC RANGE vs IOUTFS
Product Folder Link(s): DAC3283
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
10
Power-dBm
10 60 110 160 210
f-Frequency-MHz
2xInterpolation, f =500MSPS,
f =50MHz
DAC
OUT
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
10
Power-dBm
10 60 110 160 210
f-Frequency-MHz
2xInterpolation, f =500MSPS,
f =100MHz
DAC
OUT
50
55
60
65
70
75
80
85
90
95
100
IMD3-dBc
0 50 100 150 200 250 300 350
f -MHz
OUT
0dBFS
-6dBFS
-12dBFS
f = 800 MSPS, 4x Interpolation, Tonesat f ±0.5 MHz, IOUTFS = 20 mA
DAC
OUT
10 60 110 160 210 260 310 360
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
10
Power-dBm
f-Frequency-MHz
4xInterpolation,0dBFS f =800MSPS,
f =150MHz
DAC
OUT
DAC3283
SLAS693A –MARCH 2010–REVISED APRIL 2010
TYPICAL CHARACTERISTICS (continued)
Figure 9. SINGLE TONE SPECTRAL PLOT Figure 10. SINGLE TONE SPECTRAL PLOT
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12 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated
Figure 11. SINGLE TONE SPECTRAL PLOT Figure 12. IMD3 vs INPUT SCALE
Product Folder Link(s): DAC3283
65
70
75
80
85
90
95
100
0 20 40 60 80 100 120 140 160
1xinterpolation
2xinterpolation
4xinterpolation
IMD3-dBc
f -MHz
OUT
f = 312.5 MSPS, Tonesat f ±0.5 MHz, 0 dBFS, IOUTFS = 20 mA
DAC
OUT
f =200MSPS
DAC
f =400MSPS
DAC
f =800MSPS
DAC
50
55
60
65
70
75
80
85
90
95
100
IMD3-dBc
0 50 100 150 200 250 300 350
f -MHz
OUT
4x Interpolation, Tonesat f ±0.5 MHz,
0 dBFS, IOUTFS = 20 mA
OUT
130
135
140
145
150
155
160
165
170
0 50 100 150 200 250 300 350
f -MHz
OUT
NSD-dBc/Hz
0dBFS
-6dBFS
-12dBFS
f = 800 MSPS, 4x Interpolation, IOUTFS = 20 mA
DAC
50
55
60
65
70
75
80
85
90
95
100
105
20mA
10mA
2mA
0 50 100 150 200 250 300 350
f -MHz
OUT
IMD3-dBc
f = 800 MSPS, 4x Interpolation, Tonesat f ±0.5 Mhz, 0 dBFS
DAC
OUT
DAC3283
www.ti.com
SLAS693A –MARCH 2010–REVISED APRIL 2010
TYPICAL CHARACTERISTICS (continued)
Figure 13. IMD3 vs INTERPOLATION Figure 14. IMD3 vs f
DAC
Copyright © 2010, Texas Instruments Incorporated Submit Documentation Feedback 13
Figure 15. IMD3 vs IOUTFS Figure 16. NSD vs INPUT SCALE
Product Folder Link(s): DAC3283
140
145
150
155
160
165
170
0 20 40 60 80 100 120 140 160
f -MHz
OUT
1xinterpolation
2xinterpolation
4xinterpolation
NSD-dBc/Hz
f = 312.5 MSPS, 0 dBFS, IOUTFS = 20 mA
DAC
130
135
140
145
150
155
160
165
170
f =200MSPS
DAC
f =400MSPS
DAC
f =800MSPS
DAC
0 50 100 150 200 250 300 350
f -MHz
OUT
NSD-dBc/Hz
4x interpolation, 0 dBFS, IOUTFS = 20 mA
60
65
70
75
80
85
0 50 100 150 200 250 300
ACLR,0dBFS
ACLR-6dBFS
Aternate,0dBFS
Alternate,-6dBFS
f -MHz
OUT
ACLR-dBc
f = 737.28 MSPS, 4x Interpolation, IOUTFS = 20 mA
DAC
65
70
75
80
85
90
95
100
0 50 100 150 200 250 300
Adjacent0dBFS
Adjacent-6dBFS
Alternate0dBFS
Alternate-6dBFS
f -MHz
OUT
ACLR-dBc
f = 737.28 MSPS, 4x Interpolation, IOUTFS = 20 mA
DAC
DAC3283
SLAS693A –MARCH 2010–REVISED APRIL 2010
TYPICAL CHARACTERISTICS (continued)
Figure 17. NSD vs INTERPOLATION Figure 18. NSD vs f
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DAC
Figure 19. SINGLE CARRIER WCDMA ACLR vs INPUT SCALE Figure 20. FOUR CARRIER WCDMA ACLR vs INPUT SCALE
14 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): DAC3283
A
Re f -1 2 .3 d Bm
*
*
*
CL RW R
RB W 3 0 k Hz
VB W 3 0 0 kH z
SW T 1 0 sAt t 1 0 d B*
1 R M
NO R
*
Ce nt er 7 0 MH z Spa n 2 5. 5 M Hz2. 55 MH z/
-1 20
-1 10
-1 00
-9 0
-8 0
-7 0
-6 0
-5 0
-4 0
-3 0
-2 0
Tx C h an n e l W -C D M A 3G P P FW D
Ba n d wi d th 3 .8 4 M Hz
P o w e r - 7 . 7 1 d B m
Ad j a ce n t Ch a nn e l
Ba n d wi d th 3 .8 4 M Hz
L o w e r - 8 2 . 2 0 d B
Sp a c in g 5 MH z
U p p e r - 8 2 . 0 7 d B
Al t e rn a te C h an n e l
Ba n d wi d th 3 .8 4 M Hz
L o w e r - 8 6 . 1 1 d B
Sp a c in g 10 MH z
U p p e r - 8 5 . 8 6 d B
4xInterpolation,0dBFS f =737.28MSPS,
f =70MHz
DAC
OUT
A
Re f -1 2 .8 d Bm
*
*
*
CL RW R
RB W 30 k Hz
VB W 30 0 kH z
SW T 10 sAt t 1 0 d B*
1 R M
NO R
*
Ce nt er 1 53 .6 MH z Sp an 2 5 .5 M Hz2. 55 MH z/
-1 20
-1 10
-1 00
-9 0
-8 0
-7 0
-6 0
-5 0
-4 0
-3 0
-2 0
Tx C h an n e l W - CD M A 3G P P FW D
Ba n d wi d th 3 .8 4 M Hz
P o w e r - 8 . 0 7 d B m
Ad j a ce n t Ch a nn e l
Ba n d wi d th 3 .8 4 M Hz
L o w e r - 8 0 . 6 9 d B
Sp a c in g 5 MH z
U p p e r - 8 1 . 0 0 d B
Al t e rn a te C h an n e l
Ba n d wi d th 3 .8 4 M Hz
L o w e r - 8 4 . 0 7 d B
Sp a c in g 10 MH z
U p p e r - 8 4 . 1 6 d B
4xInterpolation,0dBFS f =737.28MSPS,
f =153.6MHz
DAC
OUT
A
Re f -1 7. 9 d Bm
*
*
*
CL RW R
RB W 3 0 k Hz
VB W 3 00 kH z
SW T 1 0 sAt t 10 dB*
1 RM
NO R
*
Ce nt er 1 53 .6 M Hz Sp an 3 5 M Hz3. 5 M Hz /
-1 20
-1 10
-1 00
-9 0
-8 0
-7 0
-6 0
-5 0
-4 0
-3 0
-2 0
Tx C h an n e l W - CD M A 3G P P FW D
Ba n d wi d th 1 0 M Hz
P o w e r - 8 . 8 9 d B m
Ad j a ce n t Ch a nn e l
Ba n d wi d th 1 0 M Hz
L o w e r - 7 8 . 2 1 d B
Sp a c in g 1 0. 5 M Hz
U p p e r - 7 8 . 1 2 d B
4xInterpolation,0dBFS f =737.28MSPS,
f =153.6MHz
DAC
OUT
A
Re f -1 7 .4 d Bm
*
*
*
CL RW R
RB W 3 0 k Hz
VB W 3 0 0 kH z
SW T 1 0 sAt t 1 0 dB*
1 R M
NO R
*
Ce nt er 7 0 MH z Sp an 3 5 M Hz3. 5 M Hz /
-1 20
-1 10
-1 00
-9 0
-8 0
-7 0
-6 0
-5 0
-4 0
-3 0
-2 0
Tx C h an n e l W - CD M A 3G P P F WD
Ba n d wi d th 1 0 M H z
P o w e r - 8 . 5 0 d B m
Ad j a ce n t Ch a nn e l
Ba n d wi d th 1 0 M H z
L o w e r - 7 9 . 6 4 d B
Sp a c in g 1 0. 5 M H z
U p p e r - 8 0 . 0 5 d B
4xInterpolation,0dBFS f =737.28MSPS,
f =70MHz
DAC
OUT
A
Re f -1 9 d Bm
*
*
*
CL RW R
RB W 3 0 k Hz
VB W 3 0 0 kH z
SW T 1 0 sAtt 1 0 dB*
1 R M
NO R
*
Ce nt er 7 0 MH z Sp a n 65 MH z6. 5 M Hz /
-1 20
-1 10
-1 00
-9 0
-8 0
-7 0
-6 0
-5 0
-4 0
-3 0
Tx C h an n e l W - CD M A 3G P P F WD
Ba n dw i d th 2 0 M H z
P o w e r - 7 . 3 8 d B m
Ad j ac e n t C h a nn e l
Ba n dw i d th 2 0 M H z
L o w e r - 7 7 . 2 8 d B
Sp a ci n g 2 0. 5 M H z
U p p e r - 7 7 . 0 7 d B
4xInterpolation,0dBFS f =737.28MSPS,
f =70MHz
DAC
OUT
A
Re f -1 9. 6 d Bm
*
*
*
CL RW R
RB W 3 0 k Hz
VB W 3 00 kH z
SW T 1 0 sAt t 1 0 dB*
1 RM
NO R
*
Ce nt er 1 53 .6 M Hz Sp an 6 5 M Hz6. 5 M Hz /
-1 20
-1 10
-1 00
-9 0
-8 0
-7 0
-6 0
-5 0
-4 0
-3 0
Tx C h an n e l W -C D MA 3 G P P F W D
Ba n dw i d th 2 0 M Hz
P o w e r - 8 . 0 2 d B m
Ad j ac e n t Ch a nn e l
Ba n dw i d th 2 0 M Hz
L o w e r - 7 3 . 4 1 d B
Sp a ci n g 2 0. 5 M Hz
U p p e r - 7 3 . 5 4 d B
2xInterpolation,0dBFS f =492.52MSPS,
f =153.6MHz
DAC
OUT
DAC3283
www.ti.com
SLAS693A –MARCH 2010–REVISED APRIL 2010
TYPICAL CHARACTERISTICS (continued)
Figure 21. SINGLE CARRIER W-CDMA TEST MODEL 1 Figure 22. SINGLE CARRIER W-CDMA TEST MODEL 1
Figure 23. 10MHZ SINGLE CARRIER LTE Figure 24. 10MHZ SINGLE CARRIER LTE
Figure 25. 20MHZ SINGLE CARRIER LTE Figure 26. 20MHZ SINGLE CARRIER LTE
Copyright © 2010, Texas Instruments Incorporated Submit Documentation Feedback 15
Product Folder Link(s): DAC3283
2x
1x
4x
QMC
Mixer
0
200
400
600
800
1000
1200
f -MSPS
DAC
0 100 200 300 400 500 600 700 800 900
Power-mW
0
50
100
150
200
250
300
350
2x
0 100 200 300 400 500 600 700 800 900
DVDD18-mA
f -MSPS
DAC
1x
4x
QMC
Mixer
0
10
20
30
40
50
60
70
80
0 100 200 300 400 500 600 700 800 900
DACVDD18-mA
f -MSPS
DAC
MixerOn
MixerOff
0
5
10
15
20
25
30
35
40
0 100 200 300 400 500 600 700 800 900
CLKVDD18-mA
f -MSPS
DAC
DAC3283
SLAS693A –MARCH 2010–REVISED APRIL 2010
TYPICAL CHARACTERISTICS (continued)
Figure 27. POWER vs f
DAC
Figure 28. DVDD18 vs f
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DAC
16 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated
Figure 29. DACVDD18 vs f
DAC
Product Folder Link(s): DAC3283
Figure 30. CLKVDD18 vs f
DAC
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