Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.
CY74FCT399T
SCCS024 - March 1994 - Revised February 2000
Features
• Function, pinout and drive compatible with FCT and
F logic
• FCT-C speed at 6.1 ns max.
FCT-A speed at 7.0 ns max.
• Reduced V
FCT functions
(typically = 3.3V) versions of equivalent
OH
• Edge-rate control circuitry for significantly improved
noise characteristics
• Power-off disable feature
• Matched rise and fall times
• ESD > 2000V
• Fully compatible with TTL input and output logic levels
• Extended commercial range of −40˚C to +85˚C
• Sink current64 mA
Source current32 mA (Com’l),
Logic Block Diagram
I
0A
S
I
1A
I
0B
I
1B
D
CP
D
CP
Quad 2-Input Register
Functional Description
The FCT399T is a high-speed quad dual-port register that
selects four bits of data from either of two sources (Ports)
under control of a common Select input (S). The selected data
is transferred to a 4-bit output register synchronous with the
LOW-to-HIGH transition of the Clock input (CP). The 4-bit
D-type output register is fully edge-triggered. The Data inputs
(I
time prior to, and hold time after, the LOW-to-HIGH transition
of the Clock input for predictable operation. The FCT399T
offers true outputs.
The outputs are designed with a power-off disable feature to
allow for liv e insertion of boards.
Q
Q
A
Q
Q
B
) and Select input (S) must be stable only one set-up
0X,I1X
Pin Configurations
SOIC
Top View
S
Q
I
0A
I
1A
I
1B
I
0B
Q
GND
1
A
2
3
4
5
6
B
7
8
V
16
CC
Q
D
15
I
0D
14
I
1D
13
I
1C
12
I
0C
11
Q
10
C
CP
9
I
CP
0C
I
1C
I
0D
I
1D
D
CP
D Q
CP
Q
Pin Description
NameDescription
SCommon Select Input
CPClock Pulse Input (Active Rising Edge)
I
0
I
1
QRegister True Outputs
Note:
1. H = HIGH Voltage Level
h = HIGH Voltage Level one set-up time prior to the LOW-to-HIGH Clock Transition
L = LOW Voltage Level
l = LOW Voltage Level one set-up time prior to the LOW-to-HIGH Clock Transition
X = Don’t Care
Data Inputs from Source 0
Data Inputs from Source 1
All inputs0.2V
Input Clamp Diode VoltageVCC=Min., IIN=–18 mA–0.7–1.2V
Input HIGH CurrentVCC=Max., VIN=V
CC
Input HIGH CurrentVCC=Max., VIN=2.7V±1µA
Input LOW CurrentVCC=Max., VIN=0.5V±1µA
Output Short Circuit Current
Power-Off DisableVCC=0V, V
[6]
VCC=Max., V
OUT
=0.0V–60–120–225mA
OUT
=4.5V±1µA
[4]
Max.Unit
CC
5µA
Capacitance
ParameterDescriptionTyp.
C
IN
C
OUT
Notes:
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
4. Typical values are at V
5. This parameter is specified but not tested.
6. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques is preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a
highoutput mayraise thechip temperaturewell above normal and therebycause invalidreadings in other parametrictests. Inany sequence of parameter tests,
tests should be performed last.
I
OS
[5]
[4]
Max.Unit
Input Capacitance510pF
Output Capacitance912pF
or ground.
=5.0V, TA=+25˚C ambient.
CC
CC
2
Power Supply Characteristics
ParameterDescriptionTest ConditionsTyp.
I
CC
∆I
CC
I
CCD
I
C
Notes:
7. Per TTL driven input (V
8. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
9. I
C
IC=ICC+∆ICCDHNT+I
I
CC
∆I
D
N
I
CCD
f
0
f
1
N
All currents are in milliamps and all frequencies are in megahertz.
10. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.
Quiescent Power Supply CurrentVCC=Max., VIN≤0.2V,
V
IN≥VCC
Quiescent Power Supply Current
(TTL inputs)
Dynamic Power Supply Current
[8]
VCC=Max., VIN=3.4V, f1=0, Outputs Open
[7]
VCC=Max., One Input Toggling,
50% Duty Cycle, Outputs Open,
V
≤0.2V or VIN≥VCC–0.2V
IN
VCC=Max., f0=10 MHz, 50% Duty Cycle,
Total Power Supply Current
[9]
Outputs Open, One Input Toggling
at f
=5 MHz, S=Steady State
1
V
≤0.2V or VIN≥VCC–0.2V
IN
VCC=Max., f0=10 MHz, 50% Duty Cycle,
Outputs Open, One Input Toggling
at f
=5 MHz, S=Steady State
1
V
=3.4V or VIN=GND
IN
VCC=Max., f0=10 MHz, 50% Duty Cycle,
Outputs Open, Four Inputs Toggling
at f
=5 MHz, S=Steady State
1
V
≤0.2V or VIN≥VCC–0.2V
IN
VCC=Max., f0=10 MHz, 50% Duty Cycle,
Outputs Open, Four Inputs Toggling
at f
=5 MHz, S=Steady State
1
V
=3.4V or VIN=GND
IN
=3.4V); all other inputs at VCC or GND.
IN
=I
QUIESCENT
= Quiescent Current with CMOS input levels
= Power Supply Current for a TTL HIGH input (VIN=3.4V)
CC
= Duty Cycle for TTL inputs HIGH
H
= Number of TTL inputs at D
T
= Dynamic Current caused by an input transition pair (HLH or LHL)
= Clock frequency for registered devices, otherwise zero
= Input signal frequency
= Number of inputs changing at f
1
+ I
INPUTS
CCD(f0
+ I
DYNAMIC
/2 + f1N1)
H
1
–0.2V
CY74FCT399T
[4]
Max.Unit
0.10.2mA
0.52.0mA
0.060.12mA/MHz
0.71.4mA
1.23.4mA
1.63.2
2.98.2
[10]
[10]
mA
mA
3
CY74FCT399T
Switching Characteristics Over the Operating Range
11. Minimum limits are specified but not tested on Propagation Delays.
12. See “Parameter Measurement Information” in the General Information Section.
Package
NamePackage Type
Operating
[12]
Range
Document #: 38-00280-B
4
Package Diagrams
CY74FCT399T
16-Lead Molded SOIC S1
5
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