Texas Instruments CY74FCT399CTSOCT, CY74FCT399CTSOC, CY74FCT399ATSOCT, CY74FCT399ATSOC Datasheet

1CY74FCT399T
Data sheet acquired from Cypress Semiconductor Corporation. Data sheet modified to remove devices not offered.
CY74FCT399T
SCCS024 - March 1994 - Revised February 2000
Features
F logic
FCT-C speed at 6.1 ns max.
FCT-A speed at 7.0 ns max.
Reduced V
FCT functions
(typically = 3.3V) versions of equivalent
OH
Edge-rate control circuitry for significantly improved
noise characteristics
Power-off disable feature
Matched rise and fall times
ESD > 2000V
• Fully compatible with TTL input and output logic levels
• Extended commercial range of 40˚C to +85˚C
• Sink current 64 mA Source current 32 mA (Com’l),
Logic Block Diagram
I
0A
S
I
1A
I
0B
I
1B
D
CP
D
CP
Quad 2-Input Register
Functional Description
The FCT399T is a high-speed quad dual-port register that selects four bits of data from either of two sources (Ports) under control of a common Select input (S). The selected data is transferred to a 4-bit output register synchronous with the LOW-to-HIGH transition of the Clock input (CP). The 4-bit D-type output register is fully edge-triggered. The Data inputs (I time prior to, and hold time after, the LOW-to-HIGH transition of the Clock input for predictable operation. The FCT399T offers true outputs.
The outputs are designed with a power-off disable feature to allow for liv e insertion of boards.
Q
Q
A
Q
Q
B
) and Select input (S) must be stable only one set-up
0X,I1X
Pin Configurations
SOIC
Top View
S Q I
0A
I
1A
I
1B
I
0B
Q
GND
1
A
2 3 4 5 6
B
7 8
V
16
CC
Q
D
15
I
0D
14
I
1D
13
I
1C
12
I
0C
11
Q
10
C
CP
9
I
CP
0C
I
1C
I
0D
I
1D
D
CP
D Q
CP
Q
Pin Description
Name Description
S Common Select Input CP Clock Pulse Input (Active Rising Edge) I
0
I
1
Q Register True Outputs
Note:
1. H = HIGH Voltage Level h = HIGH Voltage Level one set-up time prior to the LOW-to-HIGH Clock Transition L = LOW Voltage Level l = LOW Voltage Level one set-up time prior to the LOW-to-HIGH Clock Transition X = Don’t Care
Data Inputs from Source 0 Data Inputs from Source 1
Q
C
Q
D
Logic Symbol
Function Table
S I
l
l h h
I
I
I
I
S CP
0A
1A
0B
Q
A
1B
Q
B
I0CI1CI0DI
Q
Q
C
1D
D
[1]
Inputs Outputs
0
l h X X
I
1
X X
l
h
Q
L
H
L
H
Copyright © 2000, Texas Instruments Incorporate
CY74FCT399T
Maximum Ratings
[2, 3]
(Above which the useful life may be impaired. For user guide­lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
DC Output Current (Maximum Sink Current/Pin) ......120 mA
Power Dissipation..........................................................0.5W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Operating Range
Power Applied.............................................–65°C to +135°C
Supply Voltage to Ground Potential...............–0.5V to +7.0V
DC Input Voltage............................................–0.5V to +7.0V
Range Range
Commercial All –40°C to +85°C 5V ± 5%
Ambient
Temperature V
DC Output Voltage.........................................–0.5V to +7.0V
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.
V
V V V V V I
I
I
IH
I
IL
I
OS
I
OFF
OH
OL IH IL H IK
Output HIGH Voltage VCC=Min., IOH=–32 mA 2.0 V
VCC=Min., IOH=–15 mA 2.4 3.3 V Output LOW Voltage VCC=Min., IOL=64 mA 0.3 0.55 V Input HIGH Voltage 2.0 V Input LOW Voltage 0.8 V Hysteresis
[5]
All inputs 0.2 V Input Clamp Diode Voltage VCC=Min., IIN=–18 mA –0.7 –1.2 V Input HIGH Current VCC=Max., VIN=V
CC
Input HIGH Current VCC=Max., VIN=2.7V ±1 µA Input LOW Current VCC=Max., VIN=0.5V ±1 µA Output Short Circuit Current Power-Off Disable VCC=0V, V
[6]
VCC=Max., V
OUT
=0.0V –60 –120 –225 mA
OUT
=4.5V ±1 µA
[4]
Max. Unit
CC
5 µA
Capacitance
Parameter Description Typ.
C
IN
C
OUT
Notes:
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
4. Typical values are at V
5. This parameter is specified but not tested.
6. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques is preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a highoutput mayraise thechip temperaturewell above normal and therebycause invalidreadings in other parametrictests. Inany sequence of parameter tests,
tests should be performed last.
I
OS
[5]
[4]
Max. Unit
Input Capacitance 5 10 pF Output Capacitance 9 12 pF
or ground.
=5.0V, TA=+25˚C ambient.
CC
CC
2
Power Supply Characteristics
Parameter Description Test Conditions Typ.
I
CC
I
CC
I
CCD
I
C
Notes:
7. Per TTL driven input (V
8. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
9. I
C
IC=ICC+ICCDHNT+I I
CC
I D N I
CCD
f
0
f
1
N All currents are in milliamps and all frequencies are in megahertz.
10. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.
Quiescent Power Supply Current VCC=Max., VIN≤0.2V,
V
IN≥VCC
Quiescent Power Supply Current (TTL inputs)
Dynamic Power Supply Current
[8]
VCC=Max., VIN=3.4V, f1=0, Outputs Open
[7]
VCC=Max., One Input Toggling, 50% Duty Cycle, Outputs Open, V
0.2V or VIN≥VCC–0.2V
IN
VCC=Max., f0=10 MHz, 50% Duty Cycle,
Total Power Supply Current
[9]
Outputs Open, One Input Toggling at f
=5 MHz, S=Steady State
1
V
0.2V or VIN≥VCC–0.2V
IN
VCC=Max., f0=10 MHz, 50% Duty Cycle, Outputs Open, One Input Toggling at f
=5 MHz, S=Steady State
1
V
=3.4V or VIN=GND
IN
VCC=Max., f0=10 MHz, 50% Duty Cycle, Outputs Open, Four Inputs Toggling at f
=5 MHz, S=Steady State
1
V
0.2V or VIN≥VCC–0.2V
IN
VCC=Max., f0=10 MHz, 50% Duty Cycle, Outputs Open, Four Inputs Toggling at f
=5 MHz, S=Steady State
1
V
=3.4V or VIN=GND
IN
=3.4V); all other inputs at VCC or GND.
IN
=I
QUIESCENT
= Quiescent Current with CMOS input levels = Power Supply Current for a TTL HIGH input (VIN=3.4V)
CC
= Duty Cycle for TTL inputs HIGH
H
= Number of TTL inputs at D
T
= Dynamic Current caused by an input transition pair (HLH or LHL) = Clock frequency for registered devices, otherwise zero = Input signal frequency = Number of inputs changing at f
1
+ I
INPUTS
CCD(f0
+ I
DYNAMIC
/2 + f1N1)
H
1
–0.2V
CY74FCT399T
[4]
Max. Unit
0.1 0.2 mA
0.5 2.0 mA
0.06 0.12 mA/MHz
0.7 1.4 mA
1.2 3.4 mA
1.6 3.2
2.9 8.2
[10]
[10]
mA
mA
3
CY74FCT399T
Switching Characteristics Over the Operating Range
[11]
CY74FCT399AT CY74FCT399CT
Commercial Commercial
Parameter Description
t
PLH
t
PHL
t
S
t
H
t
S
t
H
t
W
Propagation Delay CP to Q
Set-Up Time HIGH or LOW I
to CP
n
Hold Time HIGH or LOW I
to CP
n
Set-Up Time HIGH or LOW S to CP
Hold Time HIGH or LOW S to CP
Clock Pulse Width
[5]
HIGH or LOW
Min. Max. Min. Max.
2.5 7.0 2.5 6.1 ns 1, 5
3.5 3.5 ns 4
1.0 1.0 ns 4
8.5 8.5 ns 4
0 0 ns 4
5.0 5.0 ns 5
Unit Fig. No.
Ordering Information
Speed
(ns) Ordering Code
6.1 CY74FCT399CTSOC/SOCT S1 16-Lead (300-Mil) Molded SOIC Commercial
7.0 CY74FCT399ATSOC/SOCT S1 16-Lead (300-Mil) Molded SOIC Commercial
Notes:
11. Minimum limits are specified but not tested on Propagation Delays.
12. See “Parameter Measurement Information” in the General Information Section.
Package
Name Package Type
Operating
[12]
Range
Document #: 38-00280-B
4
Package Diagrams
CY74FCT399T
16-Lead Molded SOIC S1
5
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