Texas Instruments CY74FCT2541CTSOCT, CY74FCT2541CTSOC, CY74FCT2541CTQCT, CY74FCT2541CTQC, CY74FCT2541ATSOCT Datasheet
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8-Bit Buffer/Line Drive
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CY74FCT2541T
SCCS041 - September 1994 - Revised March 2000
Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.
Copyright © 2000, Texas Instruments Incorporated
Features
• Function and pinout compatible with FCT and F logic
• FCT-C speed at 4.1 ns max.
FCT-A speed at 4.8 ns max.
• 25Ωoutputseriestoreducetransmissionlinereflection
noise
• Reduced V
OH
(typically = 3.3V) versions of equivalent
FCT functions
• Edge-rate control circuitry for significantly improved
noise characteristics
• Power-off disable feature
• ESD > 2000V
• Matched rise and fall times
• Fully compatible with TTLinput andoutput logic levels
• Sink current 12 mA
Source current 15 mA
• Extended commercial temp. range of –40˚C to +85˚C
• Three-state outputs
Functional Description
The FCT2541T is an octal buffer and line driver designed
to be employed as a memory address dr iver, clock dr iver,
andbus-oriented transmitter/receiv er .On-chiptermination resistors
havebeen addedto the outputs to reducesystem noisecaused by
reflections.The FCT2541Tcan beused toreplacethe FCT541Tto
reduce noisein an existingdesign. The speed ofthe FCT2541T is
comparableto bipolar logiccounterpartswhile reducing powerdissipation. The input and output voltage lev els allow direct interface
with TTL and CMOS devices without e xternal components.
The outputs are designed with a power-off disable feature to
allow for live insertion of boards.
]
Logic Block Diagram
Pin Configurations
1
2
3
4
5
6
7
8
9
10 11
12
16
17
18
19
20
13
14
V
CC
FCT2541T–2
15
SOIC/QSOP
Top View
GND
FCT2541T
–3
O
0
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
0
O
1
O
2
O
3
O
4
O
5
O
6
O
7
OE
B
OE
A
O
0
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
0
O
1
O
2
O
3
O
4
O
5
O
6
O
7
OE
B
OE
A
Function Table
[1]
Inputs
OutputOE
A
OE
B
D
L
L
H
L
L
H
L
H
X
L
H
Z
Note:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High Impedance
CY74FCT2541T
2
Maximum Ratings
[2,3]
(Above which theuseful life may be impaired.For user guidelines, not tested.)
Storage Temperature .....................................−65°C to +150°C
Ambient Temperature with
Power Applied..................................................−65°C to +135°C
Supply Voltage to Ground Potential..................−0.5V to +7.0V
DC Input Voltage .................................................−0.5V to +7.0V
DC Output Voltage..............................................−0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin) ......120 mA
Power Dissipation..........................................................0.5W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Operating Range
Range
Ambient
Temperature V
CC
Commercial −40°C to +85°C 5V ± 5%
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.
[5]
Max. Unit
V
OH
Output HIGH Voltage VCC= Min., IOH= −15 mA 2.4 3.3 V
V
OL
Output LOW Voltage VCC= Min., IOL= 12 mA 0.3 0.55 V
R
OUT
Output Resistance VCC= Min., IOL= 12 mA 20 25 40 Ω
V
IH
Input HIGH Voltage 2.0 V
V
IL
Input LOW Voltage 0.8 V
V
H
Hysteresis
[6]
All inputs 0.2 V
V
IK
Input Clamp Diode Voltage VCC= Min., IIN= −18 mA −0.7 −1.2 V
I
I
Input HIGH Current VCC= Max., VIN= V
CC
5 µA
I
IH
Input HIGH Current VCC= Max., VIN= 2.7V ±1 µA
I
IL
Input LOW Current VCC= Max., VIN= 0.5V ±1 µA
I
OZH
Off State HIGH-Level
Output Current
VCC= Max., V
OUT
= 2.7V 15 µA
I
OZL
Off State LOW-Level
Output Current
VCC = Max., V
OUT
= 0.5V −15 µA
I
OS
Output Short Circuit Current
[7]
VCC= Max., V
OUT
= 0.0V −60 −120 −225 mA
I
OFF
Power-Off Disable VCC= 0V, V
OUT
= 4.5V ±1 µA
Capacitance
[6]
Parameter Description Typ.
[5]
Max. Unit
C
IN
Input Capacitance 5 10 pF
C
OUT
Output Capacitance 9 12 pF
Notes:
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
4. TA is the “instant on” case temperature.
5. Typical values are at VCC=5.0V, TA=+25˚C ambient.
6. This parameter is specified but not tested.
7. Not more thanone output shouldbeshorted ata time. Duration of shortshould not exceedone second. The useof high-speed testapparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting
of a high outputmayraisethe chip temperature wellabovenormaland thereby cause invalidreadings in otherparametrictests.In any sequence ofparameter
tests, IOS tests should be performed last.
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