IS457
IS457
High Speed Response Type
OPIC Light Detector
■
Features Outline Dimensions
1. High speed response type (t
:TYP. 300ns
PHL
)
2. Pattern with semiconductor laser spot positional deviation
(
taken into consideration
Detector size : 0.5mm x 3.0mm
3. Open collector output
4. Angle adjustment by means of outer mounting resistance
■
Applications
1. Laser beam printers
■
0.1
-
+0.2
)
* OPIC (Optical IC) is a trademark of the SHARP Corporation. An OPIC consists of
0.4
1
Detector
center
0.8
a light-detecting element and signal-processing circuit integrated onto a single chip.
3.0
2
±0.2
2.75
4.4± 0.1
+0.5
2.7
2.7
(
R0.2
+0.2
- 0.4
Internal connection diagram
-0
)
±0.1
4.4
V
REF
0.25
+0.5
- 0
0.7
+0.3
4
3
- 0
0.15
±0.2
2.5
±0.3
3.81
± 0.1
1.5
4
1
2
3
(Unit : mm)
±0.1
5.0
±0.1
5.0
10˚
1.07
10˚ 10˚
Gain resistance (Ro)
(Outer mounting)
1 R
O
2 V
O
3 GND
4 V
CC
10˚
■
Absolute Maximum Ratings
*1
Supply voltage VCC-0.5 to + 7
Parameter
High level output voltage V
Low level output voltage I
Operating temperature T
Storage temperature T
*2
Soldering temperature T
Symbol
OH
OL
opr
stg
sol
(Ta=25˚C)
Rating Unit
V
7V
40 mA
-25 to +80
-40 to +85
˚C
˚C
260 ˚C
Soldering area Soldering area
Total power dissipation P 150 mW
I
e
24 mW
5mW
60 W/cm
2
Ro terminal dissipation
*3
Incident light intensity P
*3
Radiant intensity E
*1 For 1 minute
*2 For 3 seconds at the position shown in the right drawing
*3 Max. allowable incident light intensity and radiant intensity of laser beams (λ =780 nm) to the detector
“ In the absence of confirmation by device specification sheets, SHARP takes no responsibility for any defects that occur in equipment using any of SHARP's devices, shown in catalogs,
data books, etc. Contact SHARP in order to obtain the latest version of the device specification sheets before using any SHARP's device.”
P
RO
Electro-optical Characteristics
■
Parameter Symbol Conditions MIN. TYP. MAX. Unit
High level output voltage
Low level output voltage
High level supply current
Low level supply current
Ro terminal offset voltage =5.1kΩ
*4
"High →Low" threshold illuminance 1
*4
"High →Low" threshold illuminance 2
"High→Low" threshold incident light intensity
"High→Low" propagation delay time
Response time
"Low →High" propagation delay time
Rise time
Fall time
*4 E , E : Illuminance by CIE standard light source A (tungsten lamp) to bring about change from "High" to "Low"
VHL1 VHL2
■
Recommended Operating Conditions
I
OH
V
OL
I
CCH
I
CCL
I
OSRO
E
VHL1
E
VHL2
P
IHL
t
PHL
PLH
r
f
=51kΩ , E
R
O
IOL=40mA, E
RO=51kΩ , E
RO=51kΩ , E
R
O
=0 lx
v
=1 000 lx
V
=0 lx
V
=1 000 lx
V
RO=51kΩ 250 360 470
RO=5.1kΩ -RO=5.1kΩ , λ =780nm - 100 - µW
=15pF, Duty ratio=1:1
C
L
PI=0.2mW, λ =780nm
=5.1kΩ , RL=510Ω
R
O
Parameter Symbol MIN. MAX. Unit
Operating supply voltage
Operating temperature
Incident light intensity ( λ=780 nm)
Gain resistance
In order to stabilize power supply line, connect a by-pass capacitor of 0.1 µF between Vcc and GND
at a position within 1 cm from the lead.
V
T
P
R
4.5 5.5 V
cc
opr
I
O
060˚C
-
0.39
2.5
5.1
mW
kΩ
(
=5V, Ta = 25˚C
V
CC
- - 100 µ A
- 0.35 0.52 V
- 3.0 6.5 mA
-
5.8
-
8.6
8
mA
15
µ A
lx
4 500
lx
- 300 500 ns
- 300 500 nst
- 100 500 nst
- 50 200 nst
IS457
)
■
Test Circuit for Response Time
Vcc
Ro
V
ref
Notes 1. C includes the probe-to-line capacitance.
L
Vo
GND
2. Add a by-pass capacitor of 0.1µF at a position
within 1 cm from the Vcc-GND terminal.
0.1µF
5.1kΩ
C
L
510Ω
5V
Vo
GND
P
I
tt
PHL PLH
V
O
0.2mW
0.1mW
0mW
5.0V
1.5V