SGS Thomson Microelectronics M27C256B Datasheet

256 Kbit (32Kb x 8) UV EPROM and OTP EPROM

5V ± 10% SUPPLYVOLTAGEin READ
OPERATION

FASTACCESSTIME: 45ns
LOW POWERCONSUMPTION:
– ActiveCurrent 30mAat 5MHz
– StandbyCurrent 100µA
PROGRAMMING VOLTAGE:12.75V ± 0.25V
PROGRAMMINGTIME: 100µs/byte

(PRESTOII ALGORITHM)
ELECTRONICSIGNATURE
– ManufacturerCode:20h
– DeviceCode: 8Dh

28

1

FDIP28W (F)

M27C256B

28

1

PDIP28 (B)

DESCRIPTION

TheM27C256Bisa256 KbitEPROMofferedin the
two ranges UV (ultra violet erase) and OTP (one
time programmable). It is ideally suited for micro­processorsystems and is organizedas 32,768 by
8 bits.

The FDIP28W(window ceramicfrit-seal package)
has a transparent lid which allows the user to
expose the chipto ultravioletlight to erase the bit
pattern. A new pattern can then be written to the
deviceby followingthe programmingprocedure.

Forapplicationswhere the content isprogrammed
only one time and erasure is not required, the
M27C256B is offered in PDIP32, PLCC32 and
TSOP28(8 x 13.4mm) packages.

Table1. Signal Names

A0-A14 Address Inputs
Q0-Q7 Data Outputs
E Chip Enable
G Output Enable
V

PP

Program Supply

PLCC32 (C)

TSOP28 (N)

8 x 13.4mn

Figure1. Logic Diagram

V

15

A0-A14 Q0-Q7

E

G

V

CC

M27C256B

V

PP

SS

8

AI00755B

V

CC

V

SS

July 1998 1/15

Supply Voltage
Ground

M27C256B

Figure2A. DIPPin Connections

V

PP

A12

A7
A6
A5
A4
A3
A2
A1
A0

Q0

Q2
SS

1
2
3
4
5
6
7

M27C256B

8
9
10
11
12
13
14

28
27
26
25
24
23
22
21
20
19
18
17
16
15

AI00756

V

CC

A14
A13
A8
A9
A11
G
A10
E
Q7
Q6
Q5Q1
Q4
Q3V

Figure2B. LCC PinConnections

PP

CC

A13

DU

32

DU

V

Q3

A14

Q4

25

Q5

A8
A9
A11
NC
G
A10
E
Q7
Q6

AI00757

V

A7

A12

A6
A5
A4
A3
A2

9
A1
A0

NC

Q0

Q1

Warning: NC = Not Connected, DU = Dont’t Use.

1

M27C256B

17

Q2

SS

V

Figure2C. TSOPPin Connections

G

A11

A13
A14

V

V

A12

A9
A8

CC

PP

A7
A6
A5
A4
A3

22

28

M27C256B

1

78

21

15
14

AI00614B

A10
E
Q7
Q6
Q5
Q4
Q3
V

SS

Q2
Q1
Q0
A0
A1
A2

DEVICEOPERATION

The operating modes of the M27C256B are listed
in the Operating Modes. A single power supply is
requiredinthereadmode. AllinputsareTTLlevels
exceptforV

and12V on A9for ElectronicSigna-

PP

ture.

Read Mode

The M27C256Bhas two control functions,both of
which must be logically active in order to obtain
data at the outputs.Chip Enable (E) is the power
control and should be used for device selection.
OutputEnable(G) is theoutputcontrol and should
be used to gate data to the output pins, inde­pendent of device selection. Assuming that the
addresses are stable, the address access time

)isequaltothedelayfromE tooutput(t

(t

AVQV

Datais available at the output after delay of t

ELQV

GLQV

from the falling edge of G, assuming that E has
been low and the addresses have been stable for
at leastt

AVQV-tGLQV

.

StandbyMode

The M27C256B has a standby mode which re­ducesthe supplycurrentfrom 30mAto 100µA.The
M27C256Bis placed in the standby mode by ap­plyinga CMOShigh signal to the E input.When in
thestandbymode,theoutputs are ina highimped­ance state,independentof theG input.

).

2/15

M27C256B

Table2. AbsoluteMaximum Ratings

(1)

Symbol Parameter Value Unit

T

A

T

BIAS

T

STG

V

IO

V

CC

V

A9

V

PP

Notes: 1. Except for the rating ”Operating Temperature Range”, stresses above those listed in the Table ”Absolute Maximum Ratings”

2. Minimum DC voltage on Input or Output is –0.5V withpossible undershoot to –2.0V for a period less than 20ns. Maximum DC

3. Depends on range.

Ambient Operating Temperature
TemperatureUnder Bias –50 to 125
Storage Temperature –65 to 150

(2)

Input or Output Voltages(except A9) –2 to 7 V
Supply Voltage –2 to 7 V

(2)

A9 Voltage –2 to 13.5 V
Program SupplyVoltage –2 to 14 V

may cause permanent damage to the device. These are stress ratingsonly and operation of the device at these or any other
conditions above those indicated in the Operating sections of this specificationis not implied. Exposure to Absolute Maximum
Rating conditions for extended periods may affectdevice reliability. Refer also tothe STMicroelectronics SURE Program and other
relevant quality documents.

voltage on Output is V

+0.5V with possible overshoot to VCC+2V for a period less than20ns.

CC

(3)

–40 to 125

C

°

C

°

C

°

Table3. Operating Modes

Mode E G A9 V

Read V
Output Disable V
Program V
Verify V
Program Inhibit V
Standby V
Electronic Signature V

Note:X =VIHor VIL,VID= 12V±0.5V

IL

IL

Pulse V

IL

IH

IH

IH

IL

PP

V

IL

V

IH

IH

V

IL

V

IH

XVCCData Out
XVCCHi-Z
XVPPData In
XVPPData Out
XVPPHi-Z

XXVCCHi-Z

V

IL

V

ID

V

CC

Q0 - Q7

Codes

Table4. Electronic Signature

Identifier A0 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 Hex Data

Manufacturer’s Code V
Device Code V

IL

IH

Two Line OutputControl

BecauseEPROMsareusuallyusedin largermem­ory arrays, this product features a 2 line control
functionwhich accommodatesthe use of multiple
memory connection. The two line control function
allows:

a. the lowest possiblememory power dissipation,
b. complete assurancethat output bus contention

00100000 20h
10001101 8Dh

Forthe mostefficientuse of thesetwocontrollines,
E should be decoded and used as the primary
deviceselectingfunction, whileG shouldbe made
a common connection to all devices in the array
and connected to the READ line from the system
controlbus.Thisensuresthat all deselectedmem­ory devices are in their low power standby mode
and that the outputpins are only active when data
is desired from a particular memorydevice.

will not occur.

3/15

M27C256B

Table5. AC MeasurementConditions

High Speed Standard

Input Rise and Fall Times
Input Pulse Voltages 0 to 3V 0.4V to 2.4V
Input and Output Timing Ref. Voltages 1.5V 0.8V and2V

≤

10ns

≤

20ns

Figure3. AC TestingInput Output Waveform

High Speed

3V

1.5V

0V

Standard

2.4V

0.4V

Table6. Capacitance

Symbol Parameter Test Condition Min Max Unit

C

IN

C

OUT

Note: 1. Sampled only, not 100% tested.

(1)

(TA=25°C, f =1 MHz)

Input Capacitance VIN=0V 6 pF
Output Capacitance V

2.0V

0.8V

AI01822

Figure4. AC TestingLoad Circuit

1.3V

1N914

3.3kΩ

DEVICE

UNDER

TEST

C

L

CL= 30pF for High Speed
CL= 100pFfor Standard
CLincludes JIG capacitance

=0V 12 pF

OUT

OUT

AI01823B

SystemConsiderations

The power switching characteristics of Advance
CMOS EPROMsrequire careful decoupling of the
devices. The supply current, I

, has three seg-

CC

ments that are of interest to thesystem designer:
the standby current level, the active current level,
and transient current peaks that are produced by
thefalling and risingedgesof E. Themagnitudeof
this transient current peaks is dependent on the
capacitiveandinductiveloadingofthe deviceat the
output.

4/15

The associated transient voltage peaks can be
suppressed by complying with the two line output
control and by properly selected decoupling ca­pacitors. It is recommended that a 0.1µF ceramic
capacitor be used on every device between V

CC

andVSS. Thisshould bea highfrequencycapacitor
of low inherent inductance and should be placed
as close to the device as possible. In addition, a

4.7µF bulk electrolytic capacitor should be used
betweenV

and VSSforeveryeight devices.The

CC

bulk capacitor should be located near the power
supply connection point. The purpose of the bulk
capacitoris to overcome the voltage drop caused
by the inductiveeffects of PCB traces.

M27C256B

Table7. Read Mode DC Characteristics

(1)

(TA=0 to 70°C, –40 to 85°C, –40 to 105°C or –40 to 125°C; VCC=5V±5% or 5V± 10%;VPP=VCC)

Symbol Parameter Test Condition Min Max Unit

I

LI

I

LO

I

CC

I

CC1

I

CC2

I

PP

V

V

IH

V

OL

V

OH

Notes: 1. VCCmust be applied simultaneouslywith or before VPPand removed simultaneously or after VPP.

Input Leakage Current 0V≤V
Output Leakage Current 0V≤V

Supply Current

E=V

= 0mA, f = 5MHz

I

OUT

Supply Current (Standby) TTL E = V
Supply Current(Standby) CMOS E > VCC– 0.2V 100
Program Current VPP=V
Input Low Voltage –0.3 0.8 V

IL

(2)

Input High Voltage 2 VCC+1 V
Output Low Voltage IOL= 2.1mA 0.4 V
Output High Voltage TTL IOH= –1mA 3.6 V
Output High Voltage CMOS I

2. Maximum DC voltage on Outputis V

CC

+0.5V.

OH

V

≤

IN

CC

V

≤

OUT

CC

,G=VIL,

IL

IH

CC

= –100µAV

– 0.7 V

CC

10

±

10

±

µ
µ

30 mA

1mA

µ

100

µ

A
A

A
A

Table8A. ReadMode AC Characteristics

(1)

(TA=0 to 70°C, –40 to 85°C, –40 to 105°C or –40 to 125°C; VCC=5V±5% or 5V± 10%;VPP=VCC)

M27C256B

Symbol Alt Parameter Test Condition

t

AVQVtACC

t

ELQV

t

GLQV

(2)

t

EHQZ

(2)

t

GHQZ

t

AXQX

Notes: 1. VCCmust be applied simultaneously with or before VPPand removed simultaneously or afterVPP.

2. Sampled only,not 100% tested.

3. In caseof 45ns speed see High Speed ACmeasurement conditions.

Address Validto
Output Valid

Chip Enable Low to

t

CE

Output Valid
Output Enable Low

t

OE

to Output Valid
Chip Enable High to

t

DF

Output Hi-Z
Output Enable High

t

DF

to Output Hi-Z
Address Transition to

t

OH

Output Transition

E=V

G=V

G=V

E=V

,G=V

IL

E=V

E=V

,G=V

IL

IL

IL

IL

IL

IL

IL

(3)

-45

-60 -70 -80

Min Max Min Max Min Max Min Max

45 60 70 80 ns

45 60 70 80 ns

25 30 35 40 ns

0 25 0 30 0 30 0 30 ns

0 25 0 30 0 30 0 30 ns

0000ns

Unit

5/15