The M27C1024 is a 1 MbitEPROM offered in the
two ranges UV (ultra violet erase) and OTP (one
time programmable). It is ideally suited for microprocessorsystemsrequiringlargedata or program
storage and is organized as 65,536 words of 16
bits.
The FDIP40W(window ceramic frit-seal package)
has a transparent lid which allows the user to
expose the chip to ultraviolet light to erase the bit
pattern. A new pattern can then be written to the
deviceby followingthe programming procedure.
For application where the content is programmed
only one time and erasure is not required, the
M27C1024 is offered in PDIP40, PLCC44 and
TSOP40(10 x 14mm) packages.
40
1
FDIP40W (F)
PLCC44 (C)TSOP40 (N)
Figure1. Logic Diagram
V
CC
16
A0-A15
M27C1024
40
1
PDIP40 (B)
10 x 14mm
V
PP
16
Q0-Q15
Table1. Signal Names
A0-A15Address Inputs
Q0-Q15Data Outputs
EChip Enable
GOutput Enable
PProgram
V
The modes of operations of the M27C1024 are
listedin theOperatingModestable.Asingle power
supplyis required in the read mode. All inputsare
TTL levels except for Vpp and 12V on A9 for
ElectronicSignature.
Read Mode
The M27C1024 has two control functions,both of
which must be logically active in order to obtain
data at the outputs. Chip Enable(E) is the power
control and should be used for device selection.
OutputEnable(G) is the outputcontroland should
be used to gate data to the output pins, independent of device selection. Assuming that the
addresses are stable, the address access time
)isequaltothedelayfromEtooutput(t
(t
AVQV
Data is available at the output after a delayof t
ELQV
OE
from the falling edge of G, assuming that E has
been low and the addresses have been stable for
at least t
AVQV-tGLQV
.
StandbyMode
The M27C1024 has a standby mode which reducestheactive current from 35mAto 100µA.
The M27C1024 is placed in the standby mode by
applyinga TTLhigh signal to theE input. When in
thestandbymode, theoutputsare ina highimpedance state,independentof the G input.
).
2/15
M27C1024
Table2. AbsoluteMaximum Ratings
(1)
SymbolParameterValueUnit
T
A
T
BIAS
T
STG
V
IO
V
CC
V
A9
V
PP
Notes: 1. Except for therating ”Operating Temperature Range”, stresses above those listed in the Table ”AbsoluteMaximum Ratings”
2. Minimum DC voltage on Input or Output is –0.5V with possible undershoot to –2.0V for a periodlessthan 20ns. Maximum DC
3. Depends on range.
Ambient Operating Temperature
Temperature Under Bias–50 to125
Storage Temperature–65 to150°C
(2)
Input or Output Voltages (except A9)–2 to7V
Supply Voltage–2 to7V
(2)
A9 Voltage–2 to13.5V
Program Supply Voltage–2 to14V
may cause permanentdamage to thedevice. These are stress ratings only and operationof the device at these or any other
conditions above those indicated in the Operating sections of this specification is not implied.Exposure to Absolute Maximum
Rating conditions for extended periods may affect device reliability.Refer also to the STMicroelectronics SURE Program and other
relevant qualitydocuments.
voltage on Output is V
+0.5Vwith possible overshoot toVCC+2V for a periodless than 20ns.
CC
(3)
–40 to125°C
°
C
Table3. Operating Modes
ModeEGPA9V
ReadV
Output DisableV
ProgramV
VerifyV
Program InhibitV
StandbyV
Electronic SignatureV
Note: X= VIHor VIL,VID= 12V ±0.5V
PP
IL
IL
IL
IL
IH
IH
IL
V
IL
V
IH
XV
V
IL
XXXVPPHi-Z
XXXV
V
IL
V
IH
XXV
PulseXV
IL
V
IH
V
IH
XV
CC
CC
or V
or V
PP
SS
SS
XVPPData Output
or V
CC
SS
V
ID
V
CC
Q0 - Q15
Data Output
Hi-Z
Data Input
Hi-Z
Codes
Table4. ElectronicSignature
IdentifierA0Q7Q6Q5Q4Q3Q2Q1Q0Hex Data
Manufacturer’s CodeV
Device CodeV
Note: Outputs Q8-Q15 are set to ’0’.
IL
IH
00100000 20h
100011008Ch
3/15
M27C1024
Table5. AC Measurement Conditions
High SpeedStandard
Input Rise and Fall Times
Input Pulse Voltages0 to 3V0.4V to 2.4V
Input and Output Timing Ref. Voltages1.5V0.8V and 2V
≤
10ns
≤
20ns
Figure3. AC TestingInput Output Waveform
High Speed
3V
1.5V
0V
Standard
2.4V
0.4V
Table6. Capacitance
SymbolParameterTest ConditionMinMaxUnit
C
IN
C
OUT
Note: 1. Sampled only, not 100% tested.
Input CapacitanceVIN=0V6pF
Output CapacitanceV
(1)
(TA=25°C, f = 1 MHz)
2.0V
0.8V
AI01822
Figure4. AC TestingLoad Circuit
1.3V
1N914
3.3kΩ
DEVICE
UNDER
TEST
C
L
CL= 30pF for High Speed
CL= 100pF for Standard
CLincludes JIGcapacitance
=0V12pF
OUT
OUT
AI01823B
Two Line Output Control
BecauseEPROMs areusuallyusedinlargermemory arrays, this product features a 2 line control
functionwhich accommodates the use of multiple
memory connection. The two line control function
allows:
a. the lowest possiblememory powerdissipation,
b. complete assurancethat output bus contention
will not occur.
Forthemostefficientuseofthesetwocontrollines,
E should be decoded and used as the primary
deviceselectingfunction,whileG should be made
a common connection to all devices in the array
and connected to the READline from the system
4/15
controlbus.Thisensuresthat all deselectedmemory devices are in their low power standby mode
and that the output pins are only active when data
is requiredfrom a particular memory device.
SystemConsiderations
The power switching characteristics of Advanced
CMOSEPROMs require careful decoupling of the
devices. The supply current, I
, has three seg-
CC
mentsthat are of interestto the system designer :
the standby current level, the active current level,
and transient current peaks that are producedby
thefalling and rising edges ofE. Themagnitudeof
transientcurrentpeaksisdependentonthecapacitive and inductive loading of the device at the
output.
M27C1024
Table7. Read Mode DC Characteristics
(1)
(TA=0 to 70 °C, –40 to 85 °C; –40 to 105 °C or –40 to 125 °C; VCC=5V±5% or 5V ± 10%; VPP=VCC)
SymbolParameterTest ConditionMinMaxUnit
I
LI
I
LO
I
CC
I
CC1
I
CC2
I
PP
V
IL
V
IH
V
OL
V
OH
Notes: 1. VCCmust be applied simultaneouslywith or before VPPand removed simultaneously with or afterV
2. Maximum DC voltage on Output is VCC+0.5V.
Input Leakage Current0V ≤ VIN≤ V
Output Leakage Current0V≤V
Supply Current
E=V
= 0mA, f = 5MHz
I
OUT
Supply Current (Standby) TTLE= V
≤
OUT
,G=VIL,
IL
IH
CC
V
CC
Supply Current (Standby) CMOSE > VCC–0.2V100µA
Program CurrentVPP=V
CC
Input Low Voltage–0.30.8V
(2)
Input High Voltage2VCC+1V
Output Low VoltageIOL= 2.1mA0.4V
Output High VoltageTTLIOH= –400µA2.4V
Output High VoltageCMOSI
= –100µAV
OH
CC
– 0.7V
PP.
±10µA
10
±
A
µ
35mA
1mA
100
A
µ
Table8A. ReadModeAC Characteristics
(1)
(TA=0 to 70 °C, –40 to 85 °C; –40 to 105 °C or –40 to 125 °C; VCC=5V±5% or 5V ± 10%; VPP=VCC)
M27C1024
SymbolAltParameterTest Condition
-35
(3)
-45
Min Max Min Max Min Max
t
t
AVQV
t
ELQV
t
GLQV
(2)
t
EHQZ
(2)
t
GHQZ
t
AXQX
Notes: 1. VCCmust be applied simultaneouslywith or before VPPand removed simultaneously with or afterV
2. Sampled only, not 100% tested.
3. Speed obtainedwith High Speed AC measurementconditions.
Address Valid to Output ValidE = VIL,G=V
ACC
tCEChip Enable Low to Output ValidG = V
tOEOutput Enable Low to Output ValidE = V
tDFChip Enable High to Output Hi-ZG = V
tDFOutput Enable High to Output Hi-ZE = V
Address Transition to Output
t
OH
Transition
E=V
,G=VIL000ns
IL
IL
IL
IL
IL
IL
354555ns
354555ns
202530ns
030030030ns
030030030ns
(3)
PP.
-55
Unit
(3)
5/15
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