Any and all SANYO products described or contained herein do not have specifications that can handle
applications that require extremely high levels of reliability, such as life-support systems, aircraft’s
control systems, or other applications whose failure can be reasonably expected to result in serious
physical and/or material damage. Consult with your SANYO representative nearest you before using
any SANYO products described or contained herein in such applications.
SANYO assumes no responsibility for equipment failures that result from using products at values that
exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges,or other
parameters) listed in products specifications of any and all SANYO products described or contained
herein.
Monolithic Linear IC
FM Noise Canceller
Ordering number:ENN855F
LA2110
SANYO Electric Co.,Ltd. Semiconductor Company
TOKYO OFFICE Tokyo Bldg., 1-10, 1 Chome, Ueno, Taito-ku, TOKYO, 110-8534 JAPAN
Overview
The LA2110 has the capability to effectively remove external noise (pulse noise) caused by engine, etc. and is used
in conjunction with a PLL FM multiplex stereo demodula-
tor (such as LA3375) with pilot signal canceller.
Package Dimensions
unit:mm
3193-SIP16Z
[LA2110]
24.2
3.25
Features
• Pilot signal compensation function.
• By using in conjunction with PLL FM multiplex stereo
demodulator with pilot signal canceller, adverse effect
caused by pilot signal can be compensated.
• Low distortion factor : THD=0.02%, 300mV.
• Good space facator due to single end package.
• Variable input type noise A GC system. This system widens the noise detector’s dynamic range, so that pulse noise
can be satisfactorily detected even in a weak electric field ,
and pulse noise is removed without adversely affecting
distortion factor.
Specifications
Absolute Maximum Ratings at Ta = 25˚C
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8.8max
3.6
116
0.85
3.0
1.5
0.5
3.0
0.25
1.5
SANYO : SIP16Z
2.2min
˚C
˚C
21V
11200TH (KT)/D247KI/4115KI, TS No.855–1/6
LA2110
Operating Conditions at Ta = 25˚C, VCC=12V, See specified Test Circuit
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No.855–2/6