Rohde Schwarz RTO-K26, RTP-K26 User Manual
R&S®RTO-K26, R&S®RTP-K26
D-PHY Compliance Test
Test Procedures
(=J::2)
1326101002
Version 06
This manual describes the D-PHY compliance test procedures with the following option:
●
R&S®RTO-K26 (1317.5668.02) - D-PHY
●
R&S®RTP-K26 (1337.8727.02) - D-PHY
The tests require the R&S ScopeSuite software.
The software contained in this product uses several valuable open source software packages. For information, see the "Open
Source Acknowledgment" document, which is available for download from the R&S RTO/R&S RTP product page at http://
www.rohde-schwarz.com/product/rto.html > "Software".
Rohde & Schwarz would like to thank the open source community for their valuable contribution to embedded computing.
© 2021 Rohde & Schwarz GmbH & Co. KG
Mühldorfstr. 15, 81671 München, Germany
Phone: +49 89 41 29 - 0
Email: info@rohde-schwarz.com
Internet: www.rohde-schwarz.com
Subject to change – data without tolerance limits is not binding.
R&S® is a registered trademark of Rohde & Schwarz GmbH & Co. KG.
Trade names are trademarks of the owners.
1326.1010.02 | Version 06 | R&S®RTO-K26, R&S®RTP-K26
The following abbreviations are used throughout this manual: R&S®RTO is abbreviated as R&S RTO, R&S®RTP is abbreviated as
R&S RTP and R&S®ScopeSuite is abbreviated as R&S ScopeSuite.
R&S®RTO-K26, R&S®RTP-K26
Contents
1 R&S ScopeSuite Overview....................................................................5
2 Preparing the Measurements................................................................7
2.1 Test Equipment..............................................................................................................7
2.2 Installing Software and License.................................................................................. 7
2.3 Setting Up the Network.................................................................................................8
2.4 Starting the R&S ScopeSuite....................................................................................... 9
2.5 Connecting the R&S RTO/R&S RTP............................................................................ 9
2.6 Report Configuration.................................................................................................. 10
3 Performing Tests..................................................................................12
3.1 Starting a Test Session...............................................................................................12
Contents
3.2 Configuring the Test................................................................................................... 13
3.2.1 General Test Settings....................................................................................................13
3.3 Getting Test Results....................................................................................................15
4 D-PHY Compliance Tests.................................................................... 17
4.1 Starting D-PHY Compliance Tests............................................................................. 19
4.2 Test Configuration for D-PHY.....................................................................................19
4.3 Data Lane LP-TX Signaling Requirements (Group 1).............................................. 23
4.3.1 Test Setup..................................................................................................................... 24
4.3.2 Performing Group 1 Test Cases....................................................................................25
4.3.3 Measurements.............................................................................................................. 26
4.4 Clock Lane LP-TX Signaling Requirements (Group 2)............................................ 33
4.4.1 Test Setup..................................................................................................................... 34
4.4.2 Performing Group 2 Test Cases....................................................................................35
4.4.3 Measurements.............................................................................................................. 36
4.5 Data Lane HS-TX Signaling Requirements (Group 3)..............................................42
4.5.1 Test Setup..................................................................................................................... 42
4.5.2 Performing Group 3 Test Cases....................................................................................46
4.5.3 Measurements.............................................................................................................. 47
4.6 Clock Lane HS-TX Signaling Requirements (Group 4)............................................66
4.6.1 Test Setup..................................................................................................................... 67
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4.6.2 Performing Group 4 Test Cases....................................................................................70
4.6.3 Measurements.............................................................................................................. 71
4.7 HS-TX Clock-to-Data Lane Timing Requirements (Group 5)...................................91
4.7.1 Test Setup..................................................................................................................... 92
4.7.2 Performing Group 5 Test Cases....................................................................................95
4.7.3 Measurements.............................................................................................................. 96
Contents
4Test Procedures 1326.1010.02 ─ 06
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1 R&S ScopeSuite Overview
The R&S ScopeSuite software is used with R&S RTO/R&S RTP oscilloscopes. It can
be installed on a test computer or directly on the oscilloscope. For system requirements, refer to the Release Notes.
R&S ScopeSuite Overview
The R&S ScopeSuite main panel has several areas:
●
"Settings": connection settings to oscilloscope and other instruments also default
report settings
●
"Compliance Tests": selection of the compliance test
●
"Demo": accesses demo test cases that can be used for trying out the software
without having a connection to an oscilloscope
●
"Help": opens the help file, containing information about the R&S ScopeSuite configuration
●
"About": gives information about the R&S ScopeSuite software
●
"Tile View": allows a personalization of the compliance test selection
You can configure which tests are visible in the compliance test section and which
are hidden, so that only the ones you use are displayed.
► To hide a test from the "Compliance Tests" view, do one of the following:
5Test Procedures 1326.1010.02 ─ 06
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a) Right-click on the compliance test you want to hide.
The icon of the test changes, see Figure 1-1. Now with a left click you can hide
the test.
Figure 1-1: Unpin icon
b) Click on "Title View" to show a list of the available test cases. By clicking a test
case in the show list, you can pin/unpin it from the main panel.
R&S ScopeSuite Overview
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2 Preparing the Measurements
2.1 Test Equipment
For D-PHY compliance tests, the following test equipment is needed:
●
R&S RTO/R&S RTP oscilloscope with 4 channels and at least 4 GHz bandwidth
●
For measuring the clock signal (+ and -): either 1 differential probe or 2 singleended probes with at least 4 GHz bandwidth. However, note that D-PHY Group 2
and Group 4 tests require 2 probes for the clock signal.
●
For measuring the data signal (+ and -): 2 probes with at least 4 GHz bandwidth
●
R&S RTO/R&S RTP-K26 D-PHY compliance test option (required option, installed
on the oscilloscope)
●
Recommended test fixture for LP-TX tests: MIPI D-PHY Capacitive Load (C
fixture from The University of New Hampshire InterOperability Laboratory (UNH-
IOL)
●
Recommended termination board for HS-TX tests: MIPI D-PHY Reference Termination Board (RTB) from The University of New Hampshire InterOperability Laboratory (UNH-IOL)
●
The free-of-charge R&S ScopeSuite software, which can be installed on a computer or directly on the oscilloscope.
Preparing the Measurements
Installing Software and License
)
LOAD
2.2 Installing Software and License
The preparation steps are performed only once for each computer and instrument that
are used for testing.
Uninstall older versions of the R&S ScopeSuite
If an older version of the R&S ScopeSuite is installed, make sure to uninstall the old
version before you install the new one. You can find the version number of the current
installation in "Help" menu > "About". To uninstall the R&S ScopeSuite, use the Windows "Control Panel" > "Programs".
For best operation results, we recommend that the installed firmware versions of the
R&S ScopeSuite and the oscilloscope are the same.
To install the R&S ScopeSuite
1. Download the latest R&S ScopeSuite software from the "Software" section on the
Rohde & Schwarz R&S RTO/R&S RTP website:
www.rohde-schwarz.com/product/rtp.html
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2. Install the R&S ScopeSuite software:
● On the computer that is used for testing.
● On the R&S RTO/R&S RTP.
For system requirements, refer to the Release Notes.
To install the license key on the R&S RTO/R&S RTP
► When you got the license key of the compliance test option, enable it on the oscil-
loscope using [Setup] > "SW Options".
For a detailed description, refer to the R&S RTO/R&S RTP user manual, chapter
"Installing Options", or to the online help on the instrument.
2.3 Setting Up the Network
If the R&S ScopeSuite software runs on a test computer, the computer and the testing
oscilloscope require a LAN connection.
Preparing the Measurements
Setting Up the Network
For some test cases, you need an additional instrument: arbitrary waveform generator
(AWG), vector network analyzer (VNA), or spectrum analyzer. These instruments can
be used in automatic or manual mode. For automatic testing, a LAN connection to the
additional instrument is required.
There are two ways of connection:
●
LAN (local area network): It is recommended that you connect to a LAN with DHCP
server. This server uses the Dynamic Host Configuration Protocol (DHCP) to
assign all address information automatically.
If no DHCP server is available, or if the Tabor WX2182B or WX2182C is used for
automatic testing, assign fixed IP addresses to all devices.
●
Direct connection of the instruments and the computer or connection to a switch
using LAN cables: Assign fixed IP addresses to the computer and the instruments
and reboot all devices.
To set up and test the LAN connection
1. Connect the computer and the instruments to the same LAN.
2. Start all devices.
3. If no DHCP server is available, assign fixed IP addresses to all devices.
4. Ping the instruments to make sure that the connection is established.
5. If VISA is installed, check if VISA can access the instruments.
a) Start VISA on the test computer.
b) Validate the VISA address string of each device.
See also:
●
Chapter 2.5, "Connecting the R&S RTO/R&S RTP", on page 9
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Preparing the Measurements
Connecting the R&S
2.4 Starting the R&S ScopeSuite
To start the R&S ScopeSuite on the test computer or on the oscilloscope:
► Double-click the R&S ScopeSuite program icon.
To start the R&S ScopeSuite on the instrument, in the R&S RTO/R&S RTP firmware:
► On the "Analysis" menu, tap "Start Compliance Test".
2.5 Connecting the R&S RTO/R&S RTP
If the R&S ScopeSuite is installed directly on the instrument, the software detects the
R&S RTO/R&S RTP firmware automatically, and the "Oscilloscope" button is not available in the R&S ScopeSuite.
If the R&S ScopeSuite software runs on a test computer, the computer and the testing
oscilloscope require a LAN connection, see Chapter 2.3, "Setting Up the Network",
on page 8. The R&S ScopeSuite software needs the IP address of the oscilloscope to
establish connection.
RTO/R&S RTP
1. Start the R&S RTO/R&S RTP.
2. Start the R&S ScopeSuite software.
3. Click "Settings" > "Osilloscope".
4. Enter the IP address of the oscilloscope.
9Test Procedures 1326.1010.02 ─ 06
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To obtain the IP address: Press the [Setup] key on the instrument and tap the "System" tab.
5. Click "Get Instrument Information".
The computer connects with the instrument and gets the instrument data.
Preparing the Measurements
Report Configuration
If the connection fails, an error message is shown.
2.6 Report Configuration
In the "Report Configuration" menu, you can select the format of the report and the
details to be included in the report. You can also select an icon that is displayed in the
upper left corner of the report.
Also, you can enter common information on the test that is written in the "General Information" section of the test report.
10Test Procedures 1326.1010.02 ─ 06
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Preparing the Measurements
Report Configuration
11Test Procedures 1326.1010.02 ─ 06
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3 Performing Tests
3.1 Starting a Test Session
Performing Tests
Starting a Test Session
After you open a compliance test,the "Session Selection" dialog appears. In this dialog,
you can create new sessions, open or view existing report.
The following functions are available for handling test sessions:
Function Description
"Add" Adds a new session
"Open" Opens the selected session
"Remove" Removes the selected session
"Rename" Changes the "Session Name"
"Comment" Adds a comment
"Show report" Generates a report for the selected session
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3.2 Configuring the Test
1. In the R&S ScopeSuite window, select the compliance test to be performed:
● "D-PHY"
2. Open a test session, see Chapter 3.1, "Starting a Test Session", on page 12.
3. Adjust the "Properties" settings for the test cases you want to perform.
4. Click "Limit Manager" and edit the limit criteria, see Chapter 3.2.1.1, "Limit Man-
ager", on page 14.
5. If you want to use special report settings the "Report Config" tab to define the format and contents of the report. Otherwise the settings defined in "RSScopeSuite" >
"Settings" > "Report" are used. See Chapter 2.6, "Report Configuration",
on page 10.
6. Click "Test Checked"/"Test Single" and proceed as described in the relevant test
case chapter.
Performing Tests
Configuring the Test
3.2.1 General Test Settings
Each session dialog is divided into several sections:
13Test Procedures 1326.1010.02 ─ 06
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●
"Properties": shows the settings that can be made for the test case selected on the
left side of the dialog. You can differentiate between the "All" and the sub test properties
In the "All" > "Properties" tab you can configure the settings for all test cases in the
current session. Once you change and save a setting in this tab, the changes will
be done for all test in the sessions. At the same time, there will be a special marking for the functions that have different settings for different sub tests.
●
"Limit Manager": sets the measurement limits that are used for compliance testing,
see Chapter 3.2.1.1, "Limit Manager", on page 14.
●
"Results": shows an overview of the available test results for this session.
●
"Instruments": defines instruments settings for connecting to external devices, that
are specific for this test session.
When a session is first created the global settings ("RSScopeSuite" > "Settings" >
"Instruments") are copied to the session. This "Instruments" tab can be used to
change those copied defaults.
●
"Report Config": defines the format and contents of the report for this session.
When a session is first created the global settings ("RSScopeSuite" > "Settings" >
"Report") are copied to the session. This "Report Config" tab can be used to
change those copied defaults.
●
"Test Checked"/ "Test Single": starts the selected test group.
Performing Tests
Configuring the Test
3.2.1.1 Limit Manager
The "Limit Manager" shows the measurement limits that are used for compliance testing.
Each limit comprises the comparison criterion, the unit, the limit value A, and a second
limit value B if the criterion requires two limits.
You can set the values to defaults, change the values in the table, export the table in
xml format, or import xml files with limit settings.
1. Select the "Test Type".
2. Check and adjust the measurement limits.
14Test Procedures 1326.1010.02 ─ 06
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Performing Tests
Getting Test Results
3.3 Getting Test Results
For each test, the test data - report, diagrams and waveform files - is saved in the following folder:
%ProgramData%\Rohde-Schwarz\RSScopeSuite2\Sessions\D-PHY\
<Session_Name>
If you resume an existing session, new measurements are appended to the report,
new diagrams and waveform files are added to the session folder. Existing files are not
deleted or replaced. Sessions data remain until you delete them in the "Results" tab of
the session.
The report format can be defined in "RSScopeSuite" > "Settings" > "Report" for all
compliance tests (see also Chapter 2.6, "Report Configuration", on page 10). If you
want to use special report settings for a session, you can define the format and contents of the report in the "Report Config" tab of the session.
All test results are listed in the "Results" tab. Reports can be provided in PDF,
MSWord, or HTML format. To view and print PDF reports, you need a PDF viewer, for
example, the Acrobat Reader.
The test report file can be created at the end of the test, or later in the "Session Selection" dialog.
15Test Procedures 1326.1010.02 ─ 06
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To show a test report
1. In the R&S ScopeSuite window, select the compliance test to be performed.
2. Select the session name in the "Session Selection" dialog and click "Show report".
The report opens in a separate application window, depending on the file format.
You can check the test results and print the report.
To delete the results, diagrams and waveform files of a session
1. In the "Session Selection" dialog select the session and open it.
2. In the "Results" tab, select the result to be deleted.
3. Click "Remove".
Performing Tests
Getting Test Results
16Test Procedures 1326.1010.02 ─ 06
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4 D-PHY Compliance Tests
D-PHY Ethernet compliance tests require option R&S RTO/R&S RTP-K26.
The software closely follows the MIPI Alliance's Conformance Test Suite for D-PHY
Physical Layer Version 1.1 Revision 03, dated June 5th, 2013. Should anything
remain unclear in this manual, please refer to that CTS document, which is available
for members of the MIPI Alliance at https://members.mipi.org/wg/All-Members/home/
approved-specs.
Table 4-1: Overview of D-PHY compliance tests
Test Groups and Tests see
D-PHY Compliance Tests
Group 1 (7 tests): Data Lane LP-TX Signaling Requirements
1.1.1 – Data Lane LP-TX Thevenin Output High Level Voltage (VOH)
1.1.2 – Data Lane LP-TX Thevenin Output Low Level Voltage (VOL)
1.1.3 – Data Lane LP-TX 15%-85% Rise Time (T
1.1.4 – Data Lane LP-TX 85%-15% Fall Time (T
1.1.5 – Data Lane LP-TX Slew Rate vs. C
LOAD
1.1.6 – Data Lane LP-TX Pulse Width of Exclusive-OR Clock (T
1.1.7 – Data Lane LP-TX Period of Exclusive-OR Clock (T
)
RLP
)
FLP
(δV/δtSR)
LP-PULSE-TX
LP-PER-TX
)
)
Group 2 (5 tests): Clock Lane LP-TX Signaling Requirements
1.2.1 – Clock Lane LP-TX Thevenin Output High Level Voltage (VOH)
1.2.2 – Clock Lane LP-TX Thevenin Output Low Level Voltage (VOL)
1.2.3 – Clock Lane LP-TX 15%-85% Rise Time (T
1.2.4 – Clock Lane LP-TX 85%-15% Fall Time (T
1.2.5 – Clock Lane LP-TX Slew Rate vs. C
LOAD
)
RLP
)
FLP
(δV/δtSR)
Group 3 (16 tests): Data Lane HS-TX Signaling Requirements
1.3.1 – Data Lane HS Entry: Data Lane T
1.3.2 – Data Lane HS Entry: Data Lane T
1.3.3 – Data Lane HS Entry: Data Lane T
1.3.4 – Data Lane HS-TX Differential Voltages V
1.3.5 – Data Lane HS-TX Differential Voltage Mismatch ΔV
1.3.6 – Data Lane HS-TX Single-Ended Output Voltages V
1.3.7 – Data Lane HS-TX Static Common-Mode Voltages V
1.3.8 – Data Lane HS-TX Static Common-Mode Voltage Mismatch ΔV
Value
LPX
HS-PREPARE
HS-PREPARE
OD(0)
Value
+ T
HS-ZERO
and V
Value
OD(1)
OD
OHHS(DP)
CMTX(1)
and V
and V
OHHS(DN)
CMTX(0)
CMTX(1,0)
1.3.9 – Data Lane HS-TX Dynamic Common-Level Variations Between 50-450 MHz ΔV
1.3.10 – Data Lane HS-TX Dynamic Common-Level Variations Above 450 MHz ΔV
1.3.11 – Data Lane HS-TX 20%-80% Rise Time t
1.3.12 – Data Lane HS-TX 80%-20% Fall Time t
1.3.13 – Data Lane HS Exit: T
HS-TRAIL
Value
1.3.14 – Data Lane HS Exit: 30%-85% Post-EoT Rise Time T
1.3.15 – Data Lane HS Exit: T
1.3.16 – Data Lane HS Exit: T
Value
EOT
HS-EXIT
Value
R
F
REOT
CMTX(HF)
page
23
page
33
page
42
CMTX(LF)
17Test Procedures 1326.1010.02 ─ 06
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Test Groups and Tests see
D-PHY Compliance Tests
Group 4 (18 tests): Clock Lane HS-TX Signaling Requirements
1.4.1 – Clock Lane HS Entry: T
1.4.2 – Clock Lane HS Entry: T
1.4.3 – Clock Lane HS Entry: T
1.4.4 – Clock Lane HS-TX Differential Voltages V
1.4.5 – Clock Lane HS-TX Differential Voltage Mismatch ΔV
1.4.6 – Clock Lane HS-TX Single-Ended Output Voltages V
1.4.7 – Clock Lane HS-TX Static Common-Mode Voltages V
1.4.8 – Clock Lane HS-TX Static Common-Mode Voltage Mismatch ΔV
Value
LPX
CLK-PREPARE
CLK-PREPARE
Value
+ T
CLK-ZERO
OD(0)
Value
and V
OD(1)
OD
OHHS(DP)
CMTX(1)
and V
and V
OHHS(DN)
CMTX(0)
CMTX(1,0)
1.4.9 – Clock Lane HS-TX Dynamic Common-Level Variations Between 50-450 MHz ΔV
1.4.10 – Clock Lane HS-TX Dynamic Common-Level Variations Above 450 MHz ΔV
1.4.11 – Clock Lane HS-TX 20%-80% Rise Time t
1.4.12 – Clock Lane HS-TX 80%-20% Fall Time t
1.4.13 – Clock Lane HS Exit: T
CLK-TRAIL
Value
1.4.14 – Clock Lane HS Exit: 30%-85% Post-EoT Rise Time T
1.4.15 – Clock Lane HS Exit: T
1.4.16 – Clock Lane HS Exit: T
Value
EOT
HS-EXIT
Value
1.4.17 – Clock Lane HS Clock Instantaneous: UI
F
INST
R
REOT
Value
CMTX(HF)
1.4.18 – Clock Lane HS Clock Delta UI: (ΔUI) Value
Group 5 (4 tests): HS-TX Clock-to-Data Lane Timing Requirements
1.5.1 – HS Entry: T
1.5.2 – HS Exit: T
CLK-PRE
CLK-POST
Value
Value
1.5.3 – HS Clock Rising Edge Alignment to First Payload Bit
1.5.4 – Data-to-Clock Skew (T
1.5.5 – Initial HS Skew Calibration Burst T
1.5.6 – Periodic HS Skew Calibration Burst T
SKEW[TX]
)
SKEWCAL-SYNC
and T
SKEWCAL-SYNC
SKEWCAL
and T
SKEWCAL
page
66
CMTX(LF)
page
91
Any D-PHY configuration consists of at least one clock lane module, and one or several data lane modules. Each module provides a synchronized connection between
master and slave. During normal operation, a lane switches between the modes "low
power" (LP) and "high speed" (HS). High speed functions are used for HS data transmission in bursts with an arbitrary number of payload data bytes. Low power functions
are mainly used for control, but have other optional use cases, like LP escape mode.
The presence of HS and LP functions is correlated.
● Starting D-PHY Compliance Tests.......................................................................... 19
● Test Configuration for D-PHY..................................................................................19
● Data Lane LP-TX Signaling Requirements (Group 1).............................................23
● Clock Lane LP-TX Signaling Requirements (Group 2)........................................... 33
● Data Lane HS-TX Signaling Requirements (Group 3)............................................ 42
● Clock Lane HS-TX Signaling Requirements (Group 4)...........................................66
● HS-TX Clock-to-Data Lane Timing Requirements (Group 5)..................................91
18Test Procedures 1326.1010.02 ─ 06
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4.1 Starting D-PHY Compliance Tests
Before you run the test, complete the following actions:
●
Initial setup of the equipment, see Chapter 2.2, "Installing Software and License",
on page 7
●
LAN connection of the oscilloscope and the computer running the R&S ScopeSuite, see Chapter 2.5, "Connecting the R&S RTO/R&S RTP", on page 9
1. Select "D-PHY" in the R&S ScopeSuite start window.
2. In the "Session Selection" dialog, add a new test session and open it, see Chap-
ter 3.1, "Starting a Test Session", on page 12.
3. Check the test configuration settings and adjust them, if necessary. See:
● Chapter 3.2.1.1, "Limit Manager", on page 14
● Chapter 4.2, "Test Configuration for D-PHY", on page 19
Specific information on the required settings is given in the "Test Requirements" chapters for each test group.
D-PHY Compliance Tests
Test Configuration for D-PHY
4. Select/check the test cases you want to run and click "Test Single"/"Test checked".
5. A step-by step guide explains the following individual setup steps. When you have
finished all steps of the step-by-step guide, the compliance test runs automatically.
4.2 Test Configuration for D-PHY
The test configuration consists of the general configuration settings as described in
Chapter 3.2, "Configuring the Test", on page 13, and some additional test-specific con-
figuration settings, described below:
●
Low power properties for DUT lanes in low power (LP) mode, groups 1 and 2
●
High speed for DUT lanes in high speed (HS) mode, groups 3, 4 and 5
19Test Procedures 1326.1010.02 ─ 06
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D-PHY Compliance Tests
Test Configuration for D-PHY
Figure 4-1: LP Configuration for D-PHY compliance test cases, Groups 1 and 2
Select the "Properties" tab for Group 1 and 2 test cases configuration of:
●
"Data Lane Under Test"
●
"C
"
LOAD
●
"Probe Config"
●
"Use Previous Settings"
●
"Low Pass Filter"
●
"Export Waveform"
●
"Offline execution"
20Test Procedures 1326.1010.02 ─ 06
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D-PHY Compliance Tests
Test Configuration for D-PHY
Figure 4-2: HS configuration for D-PHY compliance test cases, Groups 3, 4 and 5
Select the "HS Configuration" tab for Group 3, 4 and 5 test cases configuration of:
●
"DUT"
●
"Bitrate"
●
"Clock Type"
●
"Data Lane Under Test"
●
"ZID"
●
"Probe Config"
●
"Use Previous Settings"
●
"Export Waveform"
Some fields are shared between the "Properties" for the high speed and low power
modes, as well as other compliance tests in the R&S ScopeSuite.
CTS 1.1 /CTS 1.2
Selects the conformance test suite version.
DUT
Defines if the DUT is a camera (CSI-2) or display (DSI).
Bitrate ← DUT
If the bitrate of the DUT is known, enable "Bitrate" and enter the bitrate value in Mbps.
This is useful if the signal is noisy. This selection is only applicable for Group 3 test
cases.
Data/Clock Type ← Bitrate ← DUT
Sets the data/clock type according to your DUT:
21Test Procedures 1326.1010.02 ─ 06
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●
If the DUT has a burst or non-continuous clock, select "Normal Burst".
●
If the DUT has a partial burst clock, select "HS Entry and Exit".
●
If the DUT has a continuous clock, select "All Continuous".
Data Lane
Select the data lane number to be tested. This selection is only applicable for Group 1,
3 and 5 test cases. Default selection is data lane "0".
C
LOAD
●
If a C
LOAD
MIPI Alliance Specification for D-PHY, version 1.1, select "50 pF".
●
If the 50 pF C
The test results may not be valid, if no C
tance is used. The optional "Open" configuration setting is used to provide a qualitative
estimate of the amount of C
Z
ID
The software supports all three cases of terminations, ZID:
●
100 ohms (nominal load)
●
80 ohms (minimum load)
●
125 ohms (maximum load)
Specify the termination which is applied to the DUT. This selection is only applicable for
Group 3, 4 and 5 test cases.
D-PHY Compliance Tests
Test Configuration for D-PHY
test fixture with 50 pF termination capacitance is used, as required in the
fixture is removed, select "Open".
LOAD
test fixture with 50 pF termination capaci-
LOAD
contributed by the DUT's PCB.
LOAD
Probe Config
Selects the number of probes used.
This setting is useful when running multiple groups in the D-PHY compliance test. You
would be able to run from group 1-5 without removing probes /switching probes on
each of the channel of the oscilloscope.
With 4 single ended/differential probes connected on Channel 1 to Channel 4, you
would be able to run continuously Group 1 to Group 5.
On the other hand, with less than 4 probes connected to channel 1(optional), channel
3, channel 4, user would be able to run continuously Group 1 to Group 5 with at least
one differential probe. The differential probe has to be connected to the clock. At the
same time you can connect either differential probes or single ended proves to the
"D0-" and "DO+"
This selection is applicable for Group 1, 2, 3, 4 and 5 test cases.
Use Previous Settings
Check this if you want to use the previous settings (which include trigger conditions,
vertical scale and horizontal time scale) for a new execution of the same group of test
cases with the same configurations.
If this is not checked, the software will...
●
In case of LP configuration: ...use the pre-defined trigger conditions, vertical scale
and horizontal time scale.
●
In case of HS configuration: ...go through a set of pre-defined routines to determine
the best trigger conditions and horizontal time scale.
22Test Procedures 1326.1010.02 ─ 06
R&S®RTO-K26, R&S®RTP-K26
D-PHY Compliance Tests
Data Lane LP-TX Signaling Requirements (Group
Low Pass Filter
If "Low Pass Filter" is enabled, the software applies a 4th order Butterworth low pass
filter with a cutoff frequency of 400 MHz to the input signal, as required in the MIPI Alliance Specification for D-PHY, version 1.1. Keep this option enabled, as some measurements are very sensitive to high-frequency noise.
Export Waveform
Enables you to export a waveform. You can later load the waveforms to run the tests in
the offline mode, see Offline Execution.
You can define an export directory, or use the default one:
MyDocuments\Rohde-Schwarz\RSScopeSuite\<Version>\Waveforms\
<ComplianceTest>\<SessionType>\<SessionName>
For example:
%ProgramData%\Rohde-Schwarz\RSScopeSuite\4.80.0\Sessions\D-PHY
Offline Execution
1)
If enabled, allows you to use exported waveforms as a source for the execution of the
compliance test.
You can select one waveform for each needed signal.
4.3 Data Lane LP-TX Signaling Requirements (Group 1)
The purpose of Group 1 test cases is to verify various requirements specific to data
lane low power (LP) signaling.
Group 1 consists of seven test cases, described in Chapter 4.3.3, "Measurements",
on page 26. They perform related LP-TX measurements on a single data lane LP
transmit waveform sequence.
The software is intended to facilitate the execution of a set of LP-TX measurements on
a pair of captured LP data lane waveforms with ULPS Entry sequence.
These test cases are typically performed on CSI-2 and DSI Master devices, only.
23Test Procedures 1326.1010.02 ─ 06
R&S®RTO-K26, R&S®RTP-K26
D-PHY Compliance Tests
4.3.1 Test Setup
Table 4-2: Equipment for Group 1 Data Lane LP-TX Signaling Requirements test
Item Description, model Quantity
Rohde & Schwarz oscilloscope R&S RTO/R&S RTP with 4 channels and at least 4 GHz
Probes Differential probes: at least 4 GHz bandwidth, or
Test fixture
DUT Any MIPI D-PHY CSI-2 or DSI device 1
* In this group of tests, sampling the signals requires 2 probes: either single-ended, or differential used in
single-ended mode.
1
We recommend to use a MIPI D-PHY Capacitive Load ©
Hampshire InterOperability Laboratory (UNH-IOL). Refer to https://www.iol.unh.edu/services/testing/mipi/
fixtures.php for details.
Data Lane LP-TX Signaling Requirements (Group
bandwidth
Single-ended probes: at least 4 GHz bandwidth
UNH-IOL MIPI D-PHY Capacitive Load ©
) test fixture from the University of New
LOAD
LOAD
1
)
1)
1
2 (*)
1
Figure 4-3: MIPI D-PHY Capacitive Load test fixture from UNH-IOL
Waveform requirements
Group 1 test cases require the DUT to source a MIPI D-PHY LP data lane ULPS Entry
sequence. The figure below shows a typical ULPS Entry sequence waveform. It consists of:
●
(a) Escape Mode Entry: LP-11>10>00>01>00
●
(b) Ultra-Low Power State Entry Command Pattern: 00011110
24Test Procedures 1326.1010.02 ─ 06
R&S®RTO-K26, R&S®RTP-K26
The software requires a pair of waveforms containing (a) and (b) as stated above to
measure correctly and perform the test successfully.
Settings in the "LP Configuration" dialog box
See also: Chapter 4.2, "Test Configuration for D-PHY", on page 19.
●
Data Lane Under Test
If the DUT implements multiple data lanes, select which pair of data lanes is to be
tested.
●
C
Requirements
LOAD
Select "C
Most of the Group 1 tests require a 50 pF C
used as maximum capacitive load. Some other tests are independent of termina-
tion capacitance. For procedural consistency, all tests are performed using a 50 pF
C
test fixture.
LOAD
●
Low Pass Filter
Enable the "Low Pass Filter". For details regarding this filter, see Chapter 4.2, "Test
Configuration for D-PHY", on page 19.
Data Lane LP-TX Signaling Requirements (Group 1)
" to be "50 pF" (which is also the default selection).
LOAD
test fixture, which is practically
LOAD
D-PHY Compliance Tests
4.3.2 Performing Group 1 Test Cases
1. Start the test as described in Chapter 4.1, "Starting D-PHY Compliance Tests",
on page 19.
2. Select the test case group: "Data Lane LP-TX Signaling Requirements (Group 1)".
25Test Procedures 1326.1010.02 ─ 06
R&S®RTO-K26, R&S®RTP-K26
D-PHY Compliance Tests
Data Lane LP-TX Signaling Requirements (Group
3. Click "Test Single" to run only the selected test case.
Click "Test Checked" to run all test cases that are checked on the tree.
1)
4. Follow the instructions of the step-by step guide. Group 1 of test cases requires 2
setup steps.
This group of tests uses the MIPI D-PHY Capacitive Load ©
the UNH-IOL. The C
The data signals can be tapped on the DUT or the C
between the DUT and the C
Switch the probes to tap a specific pair of data lanes under test, if the DUT implements multiple data lanes.
When you have finished all steps, the compliance test runs automatically.
Further steps:
●
Chapter 3.3, "Getting Test Results", on page 15
4.3.3 Measurements
● Test 1.1.1 – Data Lane LP-TX Thevenin Output High Level Voltage (VOH).............27
● Test 1.1.2 – Data Lane LP-TX Thevenin Output Low Level Voltage (VOL)..............27
● Test 1.1.3 – Data Lane LP-TX 15%-85% Rise Time (T
● Test 1.1.4 – Data Lane LP-TX 85%-15% Fall Time (T
● Test 1.1.5 – Data Lane LP-TX Slew Rate vs. C
● Test 1.1.6 – Data Lane LP-TX Pulse Width of Exclusive-OR Clock (T
● Test 1.1.7 – Data Lane LP-TX Period of Exclusive-OR Clock (T
fixture provides 50 pF capacitive load.
LOAD
LOAD
.
LOAD
FLP
(δV/δtSR)................................ 31
LOAD
) test fixture from
LOAD
or even the SMA cables
).....................................28
RLP
)...................................... 29
LP-PULSE-TX
LP-PER-TX
).............. 33
)...32
26Test Procedures 1326.1010.02 ─ 06
R&S®RTO-K26, R&S®RTP-K26
D-PHY Compliance Tests
Data Lane LP-TX Signaling Requirements (Group
4.3.3.1 Test 1.1.1 – Data Lane LP-TX Thevenin Output High Level Voltage (VOH)
The purpose of this test case is to verify that the Thevenin Output High Level Voltage
(VOH) of the DUT’s data lane LP transmitter is within the conformance limits. The con-
formance range for VOH is between 1.1 and 1.3 Volts.
VOH is measured as the mode of all waveform samples, which are greater than 50% of
the absolute peak-to-peak VDP and VDN signal amplitudes, and across all LP-1 states in
a single LP Escape Mode sequence.
A ULPS Entry sequence is specified for this test. The measurement is performed separately on both VDP and VDN waveforms for each data lane.
An example is shown in Figure 4-4.
1)
Figure 4-4: Typical result of a data lane LP-TX Thevenin output High Level and Low Level voltage
measurement
4.3.3.2 Test 1.1.2 – Data Lane LP-TX Thevenin Output Low Level Voltage (VOL)
The purpose of this test case is to verify that the Thevenin Output Low Level Voltage
(VOL) of the DUT’s data lane LP transmitter is within the conformance limits. The con-
formance range for VOL is between -50 and +50 mV.
VOL is measured as the mode of all waveform samples, which are less than 50% of the
absolute peak-to-peak VDP and VDN signal amplitudes, and across all LP-0 states in a
single LP Escape Mode sequence.
27Test Procedures 1326.1010.02 ─ 06
R&S®RTO-K26, R&S®RTP-K26
A ULPS Entry sequence is specified for this test. The measurement is performed separately on both VDP and VDN waveforms for each data lane.
An example is shown in Figure 4-4.
D-PHY Compliance Tests
Data Lane LP-TX Signaling Requirements (Group 1)
4.3.3.3 Test 1.1.3 – Data Lane LP-TX 15%-85% Rise Time (T
The purpose of this test case is to verify that the 15%-85% Rise Time (T
DUT’s data lane LP transmitter is within the conformance limits. The conformance
range for TRLP is less than 25 ns.
Using the measured VOH and VOL LP-TX Thevenin Output Voltage Levels as references, the 15%-85% Rise Time (T
) is measured for each rising edge of the VDP and
RLP
VDN waveforms. The mean value across all observed rising edges are computed to
produce the final T
RLP
result.
A ULPS Entry sequence is specified for this test. The measurement is performed separately on both VDP and VDN waveforms for each data lane.
An example is shown in Figure 4-5
RLP
)
) of the
RLP
Figure 4-5: Typical result of a data lane LP-TX 15%-85% rise time measurement for V_DP
28Test Procedures 1326.1010.02 ─ 06
R&S®RTO-K26, R&S®RTP-K26
D-PHY Compliance Tests
Data Lane LP-TX Signaling Requirements (Group 1)
Figure 4-6: Typical result of a data lane LP-TX 15%-85% rise time measurement for V_DN
4.3.3.4 Test 1.1.4 – Data Lane LP-TX 85%-15% Fall Time (T
The purpose of this test case is to verify that the 85%-15% Fall Time (T
DUT’s data lane LP transmitter is within the conformance limits. The conformance
range for T
is less than 25 ns.
FLP
Using the measured VOH and VOL LP-TX Thevenin Output Voltage Levels as references, the 85%-15% Fall Time (T
) is measured for each falling edge of the VDP and
FLP
VDN waveforms. The mean value across all observed falling edges are computed to
produce the final T
FLP
result.
A ULPS Entry sequence is specified for this test. The measurement is performed separately on both VDP and VDN waveforms for each data lane.
An example is shown in Figure 4-7.
FLP
)
) of the
FLP
29Test Procedures 1326.1010.02 ─ 06
R&S®RTO-K26, R&S®RTP-K26
D-PHY Compliance Tests
Data Lane LP-TX Signaling Requirements (Group 1)
Figure 4-7: Typical result of a data lane LP-TX 85%-15% Fall time and slew rate measurement for
V_DP
30Test Procedures 1326.1010.02 ─ 06
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