The W24L257 is a normal-speed, very low-power CMOS static RAM organized as 32768 × 8 bits that
operates on a wide voltage range from 3.0V to 3.6V power supply. This device is manufactured using
Winbond's high performance CMOS technology.
FEATURES
•
Low power consumption:
−
Active: 126 mW (max.)
•
Access time: 70 nS
•
Single 3.3V power supply
•
Fully static operation
•
All inputs and outputs directly TTL compatible
PIN CONFIGURATIONS BLOCK DIAGRAM
VCC
28-pin
TSOP
28
27
WE
26
A13
25
A8
A9
24
A11
23
OE
22
A10
21
20
CS
I/O 8
19
I/O 7
18
I/O 6
17
16
I/O 5
15
I/O 4
28
A10
27
CS
26
I/O8
25
I/O7
24
I/O6
23
I/O5
22
I/O4
21
V
SS
20
I/O3
19
I/O2
18
I/O1
17
A0
16
A1
15
A2
1
A14
2
A12
3
A7
A6
4
A5
5
A4
6
A3
7
A2
8
A1
9
A0
10
11
I/O 1
12
I/O 2
13
I/O 3
V
SS
14
OE
A11
2
A9
3
A8
4
A13
5
WE
6
V
DD
7
A14
8
A12
9
A7
10
A6
11
12
A5
13
A4
14
A3
•
Three-state outputs
•
Battery back-up operation capability
•
Data retention voltage: 2V (min.)
•
Packaged in 450 mil SOP, standard type one
TSOP (8 mm × 20 mm) ,
CLK GEN.PRECHARGE CKT.
A12
A14
A2
A3
A4
A5
A6
A7
A13
I/O1
I/O8
WE
CS
OE
R
O
CORE CELL ARRAY
W
512 ROWS
D
E
32 X 8 COLUMNS
C
O
D
E
DATA
:
CNTRL
CLK
GEN.
I/O CKT.
COLUMN DECODER
A10
A11
A8A1A0
A9
PIN DESCRIPTION
SYMBOL DESCRIPTION
A0−A14
I/O1−I/O8
CS
WE
OE
VDD Power Supply
VSS Ground
NC No Connection
Address Inputs
Data Inputs/Outputs
Chip Select Input
Write Enable Input
Output Enable Input
Publication Release Date: May 2000
- 1 - Revision A1
Preliminary W24L257
OE WE
TRUTH TABLE
V
CS
MODE
I/O1
−
I/O8
H X X Not Selected High Z ISB, I
L H H Output Disable High Z IDD
L L H Read Data Out IDD
L X L Write Data In IDD
DC CHARACTERISTICS
Absolute Maximum Ratings
PARAMETER RATING UNIT
Supply Voltage to VSS Potential -0.5 to +4.6 V
Input/Output to V
Allowable Power Dissipation 1.0 W
Storage Temperature -65 to +150
Operating Temperature LL 0 to 70
LE -20 to 85
Note: Exposure to conditions beyond those listed under Absolute Maximum Ratings may adversely affect the life and reliability
of the device.
SS
Potential -0.5 to VDD +0.5 V
DD CURRENT
SB1
°
C
°
C
Operating Characteristics
(VDD = 3.0V to 3.6V; VSS = 0V; TA (°C) = 0 to 70 for LL, -20 to 85 for LE)
PARAMETER SYM. TEST CONDITIONS MIN. MAX. UNIT
I
IL
IH
LI
LO
OL
OH
DD
- -0.5 +0.6 V
- +2.0 VDD +0.5 V
VIN = VSS to VDD -1 +1
VI/O = VSS to VDD,
CS
OE = V
WE
IH
(min.) or
= V
IH
(min.) or
= VIL (max.)
-1
IOL = +2.1 mA - 0.4 V
IOH = -1.0 mA 2.2 - V
CS
= VIL (max.) and
I/O = 0 mA,
-
Cycle = min. Duty = 100%
- 2 -
Input Low Voltage V
Input High Voltage V
Input Leakage Current I
Output Leakage Current I
Output Low Voltage V
Output High Voltage V
Operating Power Supply
Current
+1
35
µ
A
µ
A
mA
Preliminary W24L257
Operating Characteristics, continued
PARAMETER SYM. TEST CONDITIONS MIN. MAX. UNIT
Standby Power Supply
Current
I
Note: Typical parameter is measured under ambient temperature TA = 25° C and VDD = 3.3V
CAPACITANCE
(VDD = 3.3V, TA = 25° C, f = 1 MHz)
PARAMETER SYM. CONDITIONS MAX. UNIT
Input Capacitance CIN V
Input/Output Capacitance C
Note: These parameters are sampled but not 100% tested.
AC Characteristics
AC Test Conditions
Input Pulse Levels 0V to 3.0V
Input Rise and Fall Times 5 nS
Input and Output Timing Reference Level 1.5V
Output Load See the drawing below
PARAMETER CONDITIONS
SB
I
CS
= V
IH
(min.) or
Cycle = min. Duty = 100%
SB1
CS
≥ VDD -0.2V
I/O
V
IN
= 0V 6 pF
OUT
= 0V 8 pF
-
1
- 15 µ
mA
A
AC Test Loads and Waveform
OUTPUT
1 TTL
100 pF
Including
Jig and
Scope
3.0 V
0 V
5 nS
OUTPUT
(For TTTTTT)
CLZ, OLZ,
90%
10%
CHZ,
90%
10%
5 nS
1 TTL
5 pF
Including
Jig and
Scope
OHZ, WHZ, OW
Publication Release Date: May 2000
- 3 - Revision A1
Preliminary W24L257
AC Characteristics, continued
(V
DD = 3.0V to 3.6 V; VSS = 0V; TA (
Read Cycle
PARAMETER SYMBOL W24L257-70LL/LE UNIT
Read Cycle Time TRC 70 - nS
Address Access Time TAA - 70 nS
Chip Select Access Time T
Output Enable to Output Valid T
Chip Selection to Output in Low Z T
Output Enable to Output in Low Z T
Chip Deselection to Output in High Z T
Output Disable to Output in High Z T
Output Hold from Address Change TOH 10 - nS
These parameters are sampled but not 100% tested
∗
Write Cycle
C) = 0 to 70 for LL, -20 to 85 for LE)
°
MIN. MAX.
ACS
- 70 nS
AOE
- 35 nS
CLZ
* 10 - nS
OLZ
* 5 - nS
CHZ
* - 30 nS
OHZ
* - 30 nS
PARAMETER SYMBOL W24L257-70LL/LE UNIT
MIN. MAX.
Write Cycle Time TWC 70 - nS
Chip Selection to End of Write TCW 55 - nS
Address Valid to End of Write TAW 55 - nS
Address Setup Time TAS 0 - nS
Write Pulse Width TWP 40 - nS
WR
Write Recovery Time
CS
WE
,
T
0 - nS
Data Valid to End of Write TDW 35 - nS
Data Hold from End of Write TDH 0 - nS
Write to Output in High Z T
Output Disable to Output in High Z T
WHZ
* - 25 nS
OHZ
* - 25 nS
Output Active from End of Write TOW 5 - nS
These parameters are sampled but not 100% tested
∗
- 4 -
TIMING WAVEFORMS
Read Cycle 1
(Address Controlled)
Address
DOUT
Read Cycle 2
(Chip Select Controlled)
CS1
D
OUT
Preliminary W24L257
T
RC
AA
T
TOH
T
ACS
T
CLZ
T
OH
T
CHZ
Read Cycle 3
(Output Enable Controlled)
T
RC
Address
T
AA
OE
T
AOE
T
CS
D
OUT
OLZ
T
ACS
T
CLZ
- 5 - Revision A1
T
OH
T
OHZ
T
CHZ
Publication Release Date: May 2000
Timing Waveforms, continued
Write Cycle 1
Address
OE
CS
WE
D
OUT
D
IN
Preliminary W24L257
T
WC
T
WR
T
CW
T
AW
T
T
AS
T
OHZ
(1, 4)
WP
T
T
DW
DH
Write Cycle 2
(OE = VIL Fixed)
T
WC
Address
T
CW
CS
T
AW
WE
D
OUT
D
IN
T
AS
T
Notes:
1. During this period, I/O pins are in the output state, so input signals of opposite phase to the outputs should not be applied.
2. The data output from D
OUT
3. D
provides the read data for the next address.
OUT are the same as the data written to DIN during the write cycle.
4. Transition is measured ±500 mV from steady state with CL = 5 pF. This parameter is guaranteed but not 100% tested.
T
WR
WP
T
WHZ
(1, 4)
T
DW
T
OH
T
OW
T
DH
(2)(3)
- 6 -
Preliminary W24L257
DATA RETENTION CHARACTERISTICS
(TA (°C) = 0 to 70 for LL, -20 to 85 for LE)
PARAMETER SYM. TEST CONDITIONS MIN. TYP. MAX. UNIT
VDD for Data Retention VDR
Data Retention Current I
Chip Deselect to Data
DDDR
CDR
T
CS
≥ VDD -0.2V
CS
≥ VDD -0.2V, VDD = 3V
See data retention waveform 0 - - nS
Retention Time
Operation Recovery Time TR TRC* - - nS
Read Cycle Time
*
DATA RETENTION WAVEFORM
V
DD
CS
0.9
T
V
CDR
DD
CS
V
>
2V
DR
=
>
V
-
DD
=
0.9
0.2V
2.0 - - V
- - 15
V
DD
T
R
µ
A
ORDERING INFORMATION
PART NO. ACCESS
TIME
(nS)
OPERATING
VOLTAGE
(V)
OPERATING
TEMPERATURE
(
°
C)
STANDBY
CURRENT
MAX.(
µ
A)
W24L257S70LL 70 3.0V to 3.6V 0 to 70 15 450 mil SOP
W24L257S70LE 70 3.0V to 3.6V 0 to 70 15 450 mil SOP
W24L257Q70LL 70 3.0V to 3.6V 0 to 70 15 Small TSOP
W24L257Q70LE 70 3.0V to 3.6V 0 to 70 15 Small TSOP
Notes:
1. Winbond reserves the right to make changes to its products without prior notice.
2. Purchasers are responsible for performing appropriate quality assurance testing on products intended for use in applications
where personal injury might occur as a consequence of product failure.
Publication Release Date: May 2000
- 7 - Revision A1
PACKAGE
Preliminary W24L257
BONDING PAD DIAGRAM
6
4
3
529
A7
A5
A6
A4
7
A3
8
A2
9A11020
11 12
I/O0 I/O1
A0
30
1
2
A14
DD
V
15 16 17 18
14
V
SS
V
V
SS
A12
Y
13
I/O2
X
DD
27
28
A13
WEB
I/O4 I/O5
A8
AC5394
19
I/O6
242526
A11A9
23
OEB
22
A10
21
I/O7I/O3
CSB
Note: For bare chip form (C.O.B.) applications, the substrate must be connected to VDD or left floating in the PCB layout.