The W2465 is a slow-speed, low-power CMOS static RAM organized as 8192 × 8 bits that operates
on a single 5-volt power supply. This device is manufactured using Winbond's high performance
CMOS technology.
PARAMETERRATINGUNIT
Supply Voltage to VSS Potential-0.5 to +7.0V
Input/Output to VSS Potential-0.5 to VDD +0.5V
Allowable Power Dissipation1.0W
Storage Temperature-65 to +150
Operating Temperature0 to +70
Note: Exposure to conditions beyond those listed under Absolute Maximum Ratings may adversely affect the life and reliability of the
device.
VDD CURRENT
°C
°C
Operating Characteristics
(VDD = 5V ±10%, VSS = 0V, TA = 0 to 70° C)
PARAMETERSYM.TEST CONDITIONSMIN.TYP.MAX.UNIT
Input Low VoltageVIL--0.5-+0.8V
Input High VoltageVIH-+2.2-VDD +0.5V
Input Leakage CurrentILIVIN = VSS to VDD-2-+2
Output Leakage
Current
Output Low VoltageVOLIOL = +4.0 mA--0.4V
Output High VoltageVOHIOH = -1.0 mA2.4--V
Operating Power
Supply Current
Standby Power Supply
Current
Note: Typical characteristics are at VDD = 5 V, TA = 25° C.
ILOVI/O = VSS to VDD
= VIH (min.) or CS2
= VIL (max.) or OE = VIH
IDD
(min.) or
= VIL (max.),
= VIL (max.)
CS2 = VIH (min.)
I/O = 0 mA,
Cycle = min.
Duty = 100%
ISB
= VIH (min.) or CS2
= VIL (max.), Cycle = min.
Duty = 100%
Note: These parameters are sampled but not 100% tested.
AC CHARACTERISTICS
AC Test Conditions
PARAMETERCONDITIONS
Input Pulse Levels0.6V to 2.4V
Input Rise and Fall Times5 nS
Input and Output Timing Reference Level1.5V
Output LoadCL = 100 pF, IOH/IOL = -1 mA/4 mA
AC Test Loads and Waveform
R1 1000 ohm
5V
OUTPUT
100 pF
Including
Jig and
Scope
R2
660 ohm
2.4V
0.6V
5 nS
(For T
90%90%
10%
10%
R1 1000 ohm
5V
OUTPUT
5 pF
Including
Jig and
Scope
CLZ1,
TTTTTTT
CLZ2,
5 nS
OLZ,
CHZ1,
CHZ2,
OHZ,
WHZ,
R2
660 ohm
)
OW
Publication Release Date: April 1997
- 3 -Revision A8
W2465
CS1
CS1
CS1
CS1
CS1,WE
AC Characteristics, continued
(VDD = 5V ±10%, VSS = 0V, TA = 0 to 70° C)
Read Cycle
PARAMETERSYM.W2465-70W2465-10UNIT
MIN.MAX.MIN.MAX.
Read Cycle TimeTRC70-100-nS
Address Access TimeTAA-70-100nS
Chip Select Access Time
CS2TACS2-70-100nS
Output Enable to Output ValidTAOE-35-50nS
Chip Selection to Output in Low Z
CS2TCLZ2*5-10-nS
Output Enable to Output in Low ZTOLZ*5-5-nS
Chip Deselection to Output in High Z
CS2TCHZ2*-30-35nS
Output Disable to Output in High ZTOHZ*-30-35nS
Output Hold from Address ChangeTOH10-10-nS
* These parameters are sampled but not 100% tested.
TACS1-70-100nS
TCLZ1*5-10-nS
TCHZ1*-30-35nS
Write Cycle
PARAMETERSYM.W2465-70W2465-10UNIT
MIN.MAX.MIN.MAX.
Write Cycle TimeTWC70-100-nS
Chip Selection to End of Write
CS2TCW260-80-nS
Address Valid to End of WriteTAW60-80-nS
Address Setup TimeTAS0-0-nS
Write Pulse WidthTWP45-60-nS
Write Recovery Time
TCW160-80-nS
TWR10-0-nS
CS2TWR20-0-nS
Data Valid to End of WriteTDW30-40-nS
Data Hold from End of WriteTDH0-0-nS
Write to Output in High ZTWHZ*-30-30nS
Output Disable to Output in High ZTOHZ*-30-30nS
Output Active from End of WriteTOW0-0-nS
* These parameters are sampled but not 100% tested.
- 4 -
TIMING WAVEFORMS
Read Cycle 1
(Address Controlled)
Address
D
OUT
Read Cycle 2
(Chip Select Controlled)
CS1
CS2
D
OUT
W2465
T
RC
T
AA
T
OH
T
ACS1
T
ACS2
T
CLZ1
T
CLZ2
T
OH
T
CHZ1
T
CHZ2
Read Cycle 3
(Output Enable Controlled)
Address
OE
CS1
CS2
D
OUT
T
T
RC
T
AA
T
CHZ2
T
CHZ1
T
OH
T
OHZ
CLZ1
T
CLZ2
T
T
T
ACS1
ACS2
OLZ
T
AOE
Publication Release Date: April 1997
- 5 -Revision A8
Timing Waveforms, continued
Write Cycle 1
Address
OE
CS1
W2465
T
WC
T
WR1
T
CW1
CS2
WE
D
OUT
D
IN
Write Cycle 2
(OE = VIL Fixed)
Address
CS1
CS2
WE
D
OUT
D
IN
T
CW2
T
AW
T
T
AS
T
OHZ
(1, 4)
T
AW
T
AS
WP
T
WC
T
CW1
T
CW2
T
WP
T
WHZ(1, 4)
T
WR2
T
DW
T
DW
T
T
WR1
WR2
T
DH
T
OH
T
OW
T
DH
(2)
(3)
Notes:
1. During this period, I/O pins are in the output state, so input signals of opposite phase to the outputs should not be applied.
2. The data output from DOUT are the same as the data written to DIN during the write cycle.
3. DOUT provides the read data for the next address.
4. Transition is measured ±500 mV from steady state with CL = 5 pF. This parameter is guaranteed but not 100% tested.
- 6 -
W2465
CS1
CS1
DATA RETENTION CHARACTERISTICS
(TA = 0 to 70° C)
PARAMETERSYM.TEST CONDITIONSMIN.TYP.MAX.UNIT
VDD for Data RetentionVDR
≥ VDD -0.2V, or
CS2 ≤ 0.2V
Data Retention CurrentIDDDR
≥ VDD -0.2V, or
LL--10
CS2 ≤ 0.2V
VDD = 3VL--20
Chip Deselect to Data
Retention Time
TCDRSee data retention
waveforms
Operation Recovery TimeTRTRC*--nS
TRC* = Read Cycle Time
DATA RETENTION WAVEFORMS
DATA RETENTION MODE
V
DD
CS1
4.5V
T
CDR
IH
V
>
V
DR
2V
=
>
V
DD
=
4.5V
TR
0.2VCS1
-
2.0--V
0--nS
VIH
µA
µA
V
CS2
VIL
CS2<0.2V
=
IL
ORDERING INFORMATION
ACCESS TIME
PART NO.
(nS)
W2465-70LL707020600 mil DIP
W2465-10L1006050600 mil DIP
W2465S-70LL707020330 mil SOP
W2465S-10L1006050330 mil SOP
W2465K-70LL707020300 mil Skinny
W2465K-10L1006050300 mil Skinny
Notes:
1. Winbond reserves the right to make changes to its products without prior notice.
2. Purchasers are responsible for performing appropriate quality assurance testing on products intended for use in applications
where personal injury might occur as a consequence of product failure.