Rainbow Electronics TS81102G0 User Manual

Features
Programmable DMUX Ratio:
– 1:4: Data Rate Max = 1 Gsps – PD (8b/10b) < 4.3/4.7 W (ECL 50 output) – 1:8: Data Rate Max = 2 Gsps – PD (8b/10b) < 6/6.9 W (ECL 50 output) – 1:16 with 1 TS8388B or 1 TS83102G0B and 2 DMUX
Parallel Output Mode
ECL Differential Input Data
DataReady or DataReady/2 Input Clock
Input Clock Sampling Delay Adjust
Single-ended Output Data:
– Adjustable Common Mode and Swing – Logic Threshold Reference Output – (ECL, PECL, TTL)
Asynchronous Reset
Synchronous Reset
ADC + DMUX Multi-channel Applications:
– Stand-alone Delay Adjust Cell for ADCs Sampling Instant Alignment
Differential Data Ready Output
Built-in Self Test (BIST)
Dual Power Supply V
Radiation Tolerance Oriented Design (More than 100 Krad (Si) Expected)
TBGA 240 (Cavity Down) Package
= -5V, VCC = +5V
EE
DMUX 8-/10-bit 2 GHz 1:4/8
TS81102G0
Description
The TS81102G0 is a monolithic 10-bit high-speed (up to 2 GHz) demultiplexor, designed to run with all kinds of ADCs and more specifically with Atmel’s high-speed ADC 8-bit 1 Gsps TS8388B and ADC 10-bit 2 Gsps TS83102G0B.
The TS81102G0 uses an inn ovative architecture, including a sampling delay adjust and tunable output levels. It allows users to process the high-speed output data stream down to processor speed and uses the very high-speed bipolar technology (25 GHz NPN cut-off frequency).
Rev. 2105C–BDC–11/03
1
Block Diagram
Figure 1. Block Diagram
Data Path Clock Path
SwiAdj
VplusDOut
VCC
even
master
latch
even
slave
latch
GND
VEE
DIODE
BIST
8/10
BIST
8/10
FS/8
mux
I[0..7/9]
odd
master
latch
odd
slave
latch
NbBit
NAP
RatioSel
DEMUXDelAdjCtrl
ClkInType
B 2
Phase control
ClkPar
shift register)
Port Selection Clock
8
ClkIn
delay
mux
Counter
(8 stage
8
FS/8
AsyncReset
SyncReset
(to be confirmed)
RstGen
Reset
8
Counter Status
RatioSel
ADCDelAdjCtrl
ADCDelAdjIn
delay
Latch Sel Even/Odd [1..8/10]
Data
8
Output
Clock
8/10
A[0..7/9]
C[0..7/9]
E[0..7/9]
G[0..7/9]
B[0..7/9]
D[0..7/9]
F[0..7/9]
RefA
RefC
RefE
RefG
RefB
RefD
Even Ports Odd Ports
2
TS81102G0
H[0..7/9]
RefF
RefH
1
3
DataReady generation
DR/DR
ADCDelAdjOut
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TS81102G0
Internal Timing
This diagram corresponds to an established opera tion of the DMUX with Synchronous Reset.
Diagram
Figure 2. Internal Timing Diagram
500 ps min
N N+2 N+3 N+4 N+5 N+6 N+7 N+8 N+9 N+10 N+11 N+12 N+13 N+14 N+15 N+16 N+17 N+18 N+19 N+20 N+21 N+22 N+23 N+24
Data In
DR In = Fs
DR/2 In = Fs/2 = ClkPar
Master Even Latch
Master Odd Latch
Slave Even Latch
Slave Odd Latch
Synchronous reset = Fs/8
Internal reset pulse
Port Select A Port Select B Port Select C
N+1
N+1 N+31
N
N+1
N+25 N+26 N+27 N+28 N+29 N+30 N+31
N+24 N+26 N+28 N+30N+14 N+16 N+18 N+20 N+22N+6 N+8 N+10 N+12N N+2 N+4
N+3 N+5 N+7 N+9 N+11 N+13 N+15 N+17 N+19 N+21 N+23 N+25 N+27 N+29
N+2
N+4
N+6
N+8
N+10
N+12
N+14
N+16
N+18
N+20
N+22
N+24
N+26
N+3
N+5
N+7
N+9
N+11
N+13
N+15
N+17
N+19
N+21
N+23
N+25
N+27
N+28
N+30
N+29
Port Select D Port Select E
Port Select F Port Select G Port Select H
Latch Select A Latch Select B Latch Select C Latch Select D Latch Select E Latch Select F
Latch Select G
Latch Select H
A to H Port Out
A to H LatchOut
DROut
N N+8 N+16 N+24
N+1 N+9 N+17 N+25
N+2 N+10 N+18 N+26
N+3 N+11 N+19 N+27
N+4 N+12 N+20
N+5 N+13 N+21
N+6 N+14 N+22
N+7 N+15 N+23
N to N+7 N+8 to N+15 N+16 to N+23
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Functional Description
The TS81102G0 is a demultiplexer based on an advanced high-speed bipolar technology fea­turing a cutoff frequency of 25 GHz. Its role is to reduce the data rate so that the data can be processed at the DMUX output.
The TS81102G0 provides 2 programmable ratios: 1:4 and 1:8. The maximum data rate is 1 Gsps for the 1:4 ratio and 2 Gsps for the 1:8 ratio.
The TS81102G0 is able to process 8 or 10-bit data flows. The input clock can be an ECL differential signal or single-ended DC cou pled signal. Mo reover
it can be a DataReady or DataReady/2 clock. The input digital data must be an ECL differential signal. The output signals (Data Ready, digital data and reference voltage) are adjustable with
VplusD independent power supply. Typical output modes are ECL, PECL or TTL. The Data Ready output is a differential signal. The digital output data and reference voltages
are single-ended signals. The TS81102G0 is started by an Asynchronous Reset. A Synchronous Reset enables the
user to re-synchronize the output port selection and to minimize loss of data that could occur within the DMUX.
A delay adjust cell is available to ensure a good phase between the DMUX’ input clock and input data.
Another delay adjust cell is available to contro l the ADCss sampling instant alignment, in case of the ADCs interleaving.
A 10-bit generator is implemented in the TS81102G0, the Built-In Self Test (BIST). This test sequence is very useful for testing the DMUX at first use.
A fine tuning of the output swing is also available. The TS81102G0 can be used with the following Atmel ADCs:
TS8388B(F/FS/GL), 8-bit 1 Gsps ADC
TS83102G0B, 10-bit 2 Gsps ADC
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TS81102G0
2105C–BDC–11/03
Main Function Description
TS81102G0
Programmable DMUX Ratio
The conversion ratio is programmable: 1:4 or 1:8. Figure 3. Programmable DMUX Ratio
Input Words:
1,2,3,4,5,6,7,8,...
1:4
Input Words:
1,2,3,4,5,6,7,8,...
1:8
Output Words: PortA
PortB PortC PortD PortE PortF PortG
PortH
Output Words: PortA
PortB PortC PortD PortE PortF PortG PortH
1 2 3
4 not used not used not used not used
1 2
3 4 5 6 7
8
5 6 7 8
9 10
11 12 13 14 15 16
...
...
Parallel Output Mode
Figure 4. Parallel Mode
ClkIn
DR PortA PortB PortC PortD PortE PortF
PortG PortH
Input Clock Sampling Delay Adjust (DEMUXDELADJCTRL)
The input clock phase can be adjusted with an adjustable delay (from 250 to 750 ps). This is to ensure a proper phase between the clock and input data of the DMUX.
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N N+1 N+2 N+3 N+4 N+5 N+6 N+7
5
Asynchronous Reset (ASYNCRESET)
Figure 5. Asynchronous Reset
CLKIN
AsyncReset Port A selected Port B selected
Port C selected Port D selected
Port E selected Port F selected
Port G selected Port H selected
The Asynchronous Reset is a master reset of the port selection, which works on TTL levels. It is active on the high level. During an asynchronous reset, the clock must be in a known state. It is used to start the DMUX.
When it is active, it paralyzes the outputs (the out put clock and output d ata remain at the same level as before the asynchronous reset). When it comes back to its low leve l, the DMUX star ts: the outputs are active and the first processed data is on port A.
Synchronous Reset (SYNCRESET)
Figure 6. Synchronous Reset
FS
DR/2
SyncReset = FS/8
Internal reset
pulse
Port A selected Port B selected Port C selected Port D selected Port E selected
Port F selected Port G selected Port H selected
The DMUX can be synchronously reset to a programmable state dependin g on the conversion ratio. The clock must not be stopped during reset. The synchronizat ion signal is a clock (SyncRest) whose frequency is FS/8*n where n is an integer (n = 1,2,3,…) in 1:8 mode and FS/4*n in 1:4 mode. The front edge of this clock is synchronized with Clkln inside the DMUX, and generates a 200 ps reset pulse. This reset pulse occurs during a f ixed level of Clkln.
If the DMUX was synchronized with Syncreset previous to a possible loss of synchronization, then the output data is immediately corre ct, no modification can b e seen at the output o f the DMUX, and no data is lost (“Internal Timing Diagram” on page 3).
If the DMUX was not synchronized with SyncReset previous to a possible lo ss o f syn chroniza­tion, then the output data and data r eady of the DM UX are chang ed. The outp ut data is corr ect after a number of input clocks corresponding to the pipe line delay (“Timing Diagr ams with Syn­chronous Reset” on page 19).
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TS81102G0
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TS81102G0
Counter Programmable State
When the counter is reset, its initial states depends on the conversion ratio:
1:8: counting on 8 bits,
1:4: counting on 4 bits.
Pipeline Delay The maximum pipeline delay depends on the conversion ratio:
1:8: pipeline delay = 7
1:4: pipeline delay = 3
8-/10-bit, with NAP Mode for the 2
The DMUX is a 10-bit parallel device. The last two bits (bits 8 and 9) may not be used, a nd the corresponding functions are set to nap mode to reduce power consumption.
Unused Bit ECL Differential
Input Data
Input data are ECL compatible (Voh = -0.8V, Vol = -1.8V). The minimum swing required is 100 mV differential. All inputs have a 100 differential termination resistor. The middle point of these resistor s is
connected to ground through a 10 pF capacitor. Figure 7. ECL Differential Input Data
Gnd
50 Differential Output Data
ClkIn ClkInb
50 50
10 pF
The output clock for the ADC is generate d th ro ug h a 50 loaded long tailed. The 50 resistor is connected to the ground pad via a diode. The levels are (on the 100 differential termina­tion resistor): Vol = -1.4V, Voh = -1.0V.
Figure 8. 50 Differential Output Data
Gnd
50
ADCDelAdjOut
50
ADCDelAdjOutb
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7
Single-ended Output Data
To reduce the pin number and power consumption of the DMUX, the eight output ports are single-ended.
To reach the high frequency output (up to 250 MHz) with a reasonable power consumption, the swing must be limited to a maximum of ±500 mV. The common mode is adjustab le from
-1.3V to +2V, with Vplus DOut pins. To ensure better noise immunity, a reference level (com­mon mode) is available (one level by output port).
The output buffers are of ECL type (open emitters – not resistive adapted impedances). They are designed for a 15 mA average output current, and may be used with a 50 termin ation impedance.
Figure 9. Single-ended Output Data
VPlusDOut
PadOut
Vee
Following are three application examples for these buffers: ECL/PECL/TTL. Please note that it is possible to have any other odd output format as far as current (36 mA max) and voltage (Vplus Dout – V
8.3V) limits are not overrid den. The maximum frequency in TTL output
EE
mode depends on the load to be driven.
Table 1. Examples of Application of Buffers
Parameter ECL PECL TTL Unit
VplusDout 0 3.3 3.3 V Vtt -2 1.3 0 V Swing ±0.5 ±0.5 ±1 V Reference -1.3 2 1.5 V Voh -0.8 2.5 2.5 V Vol -1.8 1.5 0.5 V Load 50 50 75 Average Output Current 14 14 15 mA Output Data rate max. 250 250 250 Msps
This corresponds to the “Adjustable Logic Single” in the pinout description. The “Adjustable Single” buffers for reference voltage are the same buffers, but the information
available at the output of these buffers is more like analog than logic.
Note: The Max Output Data Rate is given for a typical 50/2 pF load.
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TS81102G0
2105C–BDC–11/03
TS81102G0
Differential Data Ready Output
Built-in Self Test (BIST)
Specifications
Absolute Maximum Ratings
The front edge of the DataReady output occurs when data is available on the correspo nding port. The frequency of this clock depends on the conversion ratio (1: 8 or 1:4), with a dut y cycle of 50%.
The definition is the same as for single-ended output data, but the buffers are differential. This corresponds to the “Adjustable Logic Differential” in the pinout description.
A pseudo-random 10-bit generator is impleme nted in t he DMUX. It generat es a 10-bit signal in the output of the DMUX, with a period of 512 input clocks. The probability of occurrence of codes is uniformly spread over the 1024 possible codes: 0 or 1/1024.
Note that the 256 codes of bits 1 to 8 occur at least once. They start with a BIST command, in phase with the FS/8 clock on Port A. The logic output obt ained on the A to H ports depend s on the conversion ratio. The driving clock of BIST is Clkln. The ClklnType must be set to ‘1’ (DataReady ADC clock) to have a different 10-bit code on each output.
The complete BIST sequence is available on request.
Table 2. Absolute Maximum Ratings
Parameter Symbol Comments Value Unit
Positive supply voltage V Positive output buffer supply voltage V Negative supply voltage V Analog input voltages ADCDelAdjCtrl,
ECL 50 input voltage Clkln or Clklnb or
Maximum difference between ECL 50 input voltages
CC
PLUSD
EE
ADCDelAdjCtrlb or DMUXDelAdjCtrl, DMUXDelAdjCtrlb or SwiAdj
I[0…9] or I[0…9]b or SyncReset or SyncResetb or ADCDelAdjln or ADCDelAdjlnb
Clkln – Clklnb or I[0…9] - I[0…9]b or SyncReset – Syncresetb or ADCDelAdjln ­ADCDelAdjlnb
Voltage range for each pad
Differential voltage range
Voltage range for each pad
Minimum differential swing
Maximum differential swing
GND to 6 V GND to 4 V
GND to -6 V
-1 to +1
-1 to +1
-2.2 to +0.6 V
0.1
2
V
V
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Table 2. Absolute Maximum Ratings (Continued)
Parameter Symbol Comments Value Unit
Data output current A[0…9] to H[0…9] or
RefA to RefH or DR or DRb
Maximum current 36 mA
TTL input voltage Clkln Type
GND to V
CC
V RatioSel NbBit AsyncReset BIST
Maximum input voltage on diode for
DIODE 700 mV
temperature measurement Maximum input current on diode DIODE 8 mA Maximum junction temperature T Storage temperature T
j
stg
135 °C
-65 to 150 °C
Note: Absolute maximum ratings are limiting values, to be applied individually, while other parameters are within specified operating
conditions. Long exposure to maximum rating may affect device reliability. The use of a thermal heat sink is mandator y. See “Thermal and Moisture Characteristics” on page 26.
Recommended Operating Conditions
Table 3. Recommended Operating Conditions
Parameter Symbol Comments
Positive supply voltage V Positive output buffer supply
voltage Positive output buffer supply
voltage Positive output buffer supply
voltage Negative supply voltage V Operating temperature range T
10
TS81102G0
CC
V
PLUSD
V
PLUSD
V
PLUSD
EE
J
ECL output compatibility 0 V
PECL output compatibility 3.3 V
TTL output compatibility 3.3 V
Commercial grade: “C” Industrial grade: “V”
Recommended Value
Min Typ Max Unit
4.45 5 5.25 V
-5.25-5-4.75V 0 < Tc; Tj < 90
°C
-40 < Tc; Tj < 110
2105C–BDC–11/03
TS81102G0
Electrical Operating
Tj (typical) = 70°C. Full Temperature Range: -40°C < Tc; Tj < 110°C. (Guaranteed temperature range are depending on part number)
Characteristics
Table 4. Electrical Specifications
Parameter Symbol Power Requirements
Positive supply voltage
V
V
PLUSD
V
PLUSD
V
PLUSD
V
I
I
PLUSD
I
I
PLUSD
I
I
PLUSD
I
I
PLUSD
I
I
I
PLUSD
I
I
PLUSD
I
I
PLUSD
I
I
PLUSD
I
Negative supply voltage
Supply Currents ECL (50) and PECL (50Ω)
V
(for every configuration)
CC
1:8, 8 bits
1:8, 10 bits
1:4, 8 bits
1:4, 10 bits
TTL (75Ω)
(for every configuration)
V
CC
1:8, 8 bits
1:8, 10 bits
1:4, 8 bits
1:4, 10 bits
Nominal power dissipation
V
PLUSDOUT
PECL
V
CC
ECL
TTL
V
EE
CC
EE
EE
EE
EE
CC
EE
EE
EE
EE
CC
EE
Test
Value
Level
4.75 –
1
-0.25
3.135
3.135
5 – 0
3.3
3.3
5.25 –
0.25
3.465
3.465
1 -5.25 -5 -4.75 V
540
640
1
270
320
760
900
1
380
450
31
1180
719
1140
790 590 592 720 634
31
1610
872
1770
980 810 670 880 729
1820
2240
910
1120
2440
3010
1220
1510
Unit NoteMin Typ Max
V – V V V
(1)
mA mA mA mA mA mA mA mA mA
mA mA mA mA mA mA mA mA mA
(1)
ECL (50Ω)
1:8, 8 bits 1:8, 10 bits 1:4, 8 bits 1:4, 10 bits
2105C–BDC–11/03
PD PD PD PD
5.2
1
5.9
3.9
4.2
5.6
6.4
4.1
4.5
6
6.9
4.3
4.7
W W W W
11
Table 4. Electrical Specifications (Continued)
Parameter Symbol
PECL (50Ω)
1:8, 8 bits 1:8, 10 bits 1:4, 8 bits 1:4, 10 bits
PD PD PD PD
TTL (75Ω)
1:8, 8 bits 1:8, 10 bits 1:4, 8 bits 1:4, 10 bits
PD PD PD PD
Delay Adjust Control
DMUXDelAdjCtrl differential voltage
DDAC 250 ps 500 ps 750 ps Input current
ADCDelAdjCtrl differential voltage
IDDAC
ADAC 250 ps 500 ps 750 ps Input current
IADAC
Digital Outputs
ECL Output (assuming V
= 0V, SWIADJ = 0V, 50
PLUSD
termination resistor on board)
Logic “0” voltage Logic “1” voltage Reference voltage
V
OL
V
OH
V
REF
PECL Output (assuming V
= 3.3V, SWIADJ = 0V, 50
PLUSD
termination resistor on board)
Logic “0” voltage Logic “1” voltage Reference voltage
V
OL
V
OH
V
REF
TTL Output (assuming V
= 3.3V, SWIADJ = 0V, 75
PLUSD
termination resistor on board)
Logic “0” voltage Logic “1” voltage Reference voltage
Output level drift with temperature (data and DR outputs)
V
OL
V
OH
V
REF
–––-1.3mV/
Test
Level
5.8
1
6.6
4.2
4.6
6.8
1
7.8
4.7
5.2
– –
– – –
– –
– – –
1–
– –
1–
– –
1–
– –
Value
6.2
7.1
4.4
4.8
7.3
8.4
4.9
5.5
-0.5 0
0.5 –
-0.5 0
0.5 –
-2.12
-1.16
-1.40
1.27
2.44
1.83
0.9
2.31
1.2
6.6
7.6
4.6
5.1
7.7 9
5.1
5.8
– – – – –
– – – – –
– – –
– – –
– – –
Unit NoteMin Typ Max
W W W W
W W W W
V V V
mA
V V V
mA
V V V
V V V
V V V
°C
12
TS81102G0
2105C–BDC–11/03
Table 4. Electrical Specifications (Continued)
TS81102G0
Parameter Symbol
Output level drift with temperature (reference outputs)
Digital Inputs
ECL Input Voltages
Logic “0” voltage Logic “1” voltage
TTL Input Voltages
Logic “0” voltage Logic “1” voltage
Note: 1. The supply current I
- the minimum values correspond to all the output buffers at low level,
- the maximum values correspond to all the output buffers at high level,
- the typical values correspond to an equal sharing-out of the output buffers between high and low levels.
Switching Performance and Characteristics
and the power dissipation depend on the state of the output buffers:
PLUSD
50% clock duty cycle (CLKIN, CLKINB). Tj (typical) = 70°C. Full temperature range: -40°C < Tc; Tj < 110°C. (Guaranteed temperature ranges depend on the part number)
V V
V V
Test
Level
–1–-0.9mV/
IL IH
IL IH
1
1
-1.1
2.0
Value
– –
– –
-1.4 –
0.8 –
Unit NoteMin Typ Max
°C
V V
V V
See Timing Diagrams Figure 10 on page 16 to Figure 19 on page 21.
Table 5. Switching Performances
Test
Parameter Symbol Input Clock
Maximum clock frequency
1:8 ratio
1:4 ratio Clock pulse width (high) TC1 100 ps Clock pulse width (low) TC2 100 ps Clock Path pipeline delay
DR input clock
DR/2 input clock Clock rise/fall time TRCKIN
Asynchronous Reset
Asynchronous Reset pulse width PWAR 1000 ps Setup time from Asynchronous to Clkln TSAR 1500 ps Rise/fall time for (10% – 90%) TRAR
FMAX 2
TCPD TCPD
TFCKIN
TF AR
Level
1
–––981
100 ps
1000 ps
Value
– –
1084
2.2
1.1
– –
Unit NoteMin Typ Max
GHz
ps ps
(1) (2)
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13
Table 5. Switching Performances (Continued)
Value
Unit NoteMin Typ Max
Parameter Symbol
Test
Level
Synchronous Reset
Setup time from SyncReset to Clkln
DR input clock
DR/2 input clock
TSSR
-580
-477
– –
ps ps
Hold time from Clkln to SyncReset
DR input clock
DR/2 input clock
THSR
780
677
– –
ps ps
Rise/fall for (10% – 90%) TSRR/TFSR 100 ps
Input Data
Setup time from I[0…9] to Clkln
DR input clock
DR/2 input clock
TSCKIN
-794
-691
– –
ps ps
Hold time from Clkln to I[0…9]
DR input clock
DR/2 input clock
THCKIN
994
891
– –
ps ps
Rise/fall for (10% – 90%) TRDI/TFDI 100 ps
Output Data
Data output delay
DR input clock
DR/2 input clock
TOD
1820
1717
– –
ps ps
(3) (4)
(5) (6)
(7) (8)
(9)
(10)
(11) (12)
Data pipeline delay
DR input clock, 1:4 ratio
DR input clock, 1:8 ratio
DR/2 input clock, 1:4 ratio
DR/2 input clock, 1:8 ratio
TPD
– – – –
3
7 3/2 7/2
– – –
Number
of input
clock
Rise/fall for (10% – 90%) TROD/tfod 497/484 ps
Data Ready
Data ready Falling edge
DR input clock DR/2 input clock
TDRF
1856
1753
– –
ps ps
Data ready Rising edge
DR input clock DR/2 input clock
TDRR
1828
1725
– –
ps
ps Asynchr; Reset to DataReady delay TARDR 1918 ps Synchr. Reset to DataReady delay TSRDR 1037 ps Rise/fall for (10% – 90%) TRDR/TFDR 450 ps Rising edge uncertainty JITTER 62 ps
Built-In Self Test
Hold time from Clkln to BIST THBIST ps
(13)
(14)
(15) (16)
(17) (18)
(19)
(20)
(21)
(22)
14
TS81102G0
2105C–BDC–11/03
Table 5. Switching Performances (Continued)
TS81102G0
Test
Parameter Symbol
Setup time from Bist to Clkln TSBIST 1000 ps Rise/fall time for (10% – 90%) TRBIST/
TFBIST
ADC Delay Adjust
Input frequency FMADA 2 2.2 GHz Input pulse width (high) TC1ADA 90 ps Input pulse width (low) TC2ADA 90 ps Input rise/fall time TRIADA/
TFIADA
Output rise/fall time TROADA/
TFOADA
Data output delay (typical delay adjust setting)
Output delay drift with temperature TADAT 2.5 ps/°C Output delay uncertainly JITADA 30 ps
Notes: 1. TCPD is tuned with DMUXDelAdjCtrl: TCPD = 981 ± 250 ps.
2. TCPD is tuned with DMUXDelAdjCtrl: TCPD = 1084 ± 250 ps.
3. TSSR depends on DMUXDelAdjCtrl: TSSR = -580 ± 250 ps. TSSR < 0 because of Clock Path internal delay.
4. TSSR depends on DMUXDelAdjCtrl: TSSR = -477 ± 250 ps. TSSR < 0 because of Clock Path internal delay.
5. THSR depends on DMUXDelAdjCtrl: THSR = 780 ± 250 ps.
6. THSR depends on DMUXDelAdjCtrl: THSR = 677 ± 250 ps.
7. TSCKIN depends on DMUXDelAdjCtrl: TSCKIN = -794 ± 250 ps. TSCKIN < 0 because of Clock Path internal delay.
8. TSCKIN depends on DMUXDelAdjCtrl: TSCKIN = -691 ± 250 ps. TSCKIN < 0 because of Clock Path internal delay.
9. THCKIN depends on DMUXDelAdjCtrl: THCKIN = 994 ± 250 ps.
10.THCKIN depends on DMUXDelAdjCtrl: THCKIN = 891 ± 250 ps.
11.TOD depends on DMUXDelAdjCtrl: TOD = 1820 ± 250 ps. TOD is given for ECL 50/2 pFoutput load.
12.TOD depends on DMUXDelAdjCtrl: TOD = 1717 ± 250 ps. TOD is given for ECL 50/2 pFoutput load.
13.TPD is the number of Clkln clock cycle from selection of Port A to selection of Port H in 1:8 conversion mode, and from selection of Port A to selection of Port D in 1:4 conversion mode. It is the maximum number of Clkln clock cycle, or pipeline delay, that a data has to stay in the DMUX before being sorted out. This maximum delay occurs for the data sent to Port A. For instance, the data sent to Port H goes directly from the input to the Port H, and its pipeline is 0. Bu t even for this data, there is an additional delay due to physical propagation time in the DMUX.
14.TROD and TFOD are given for ECL 50/2 pF output load. In TTL mode, the TROD and TFOD are twice the ones for ECL. (For other termination topology, apply proper derating value 50 ps/pF in ECL, 100 ps/pF in TTL mode.)
15.TDRF depends on DMUXDelAdjCtrl: TDRF = 1856 ± 250 ps. It is given for ECL 50/2 pF output load.
16.TDRF depends on DMUXDelAdjCtrl: TDRF = 1753 ± 250 ps. It is given for ECL 50/2 pF output load.
17.TDRR depends on DMUXDelAdjCtrl: TDRR = 1858 ± 250 ps. It is given for ECL 50/2 pF output load.
18.TDRR depends on DMUXDelAdjCtrl: TDRR = 1725 ± 250 ps. It is given for ECL 50/2 pF output load.
19.TARDR is given for ECL 50/2 pF output load.
20.TSRDR is given for ECL 50/2 pF output load. It is minimum value since RstSync clock is synchronized with Clkln clock.
21.TRDR and TFDR are given for ECL 50/2 pF output load.
22.THBIST depends on the configuration of the DMUX. There must be enough Clkln clock cycles to have all the 512 codes, (see different Timing Diagrams).
23.With transmission line (ZO = 50) and output load R = 50; C = 2 pF.
24.Without output load.
25.With transmission line (ZO = 50) and output load R = 50; C = 2 pF.
TADA
Level
1000 ps
100 100
– –
– –
Value
150 150
145 104
784 896
– –
– –
– –
Unit NoteMin Typ Max
ps
ps
ps
(23)
(24) (25)
2105C–BDC–11/03
15
Input Clock Timings Figure 10. Input Clock
TC2
TFCKIN
TC1
TRCKIN
Clkln
Data [0..9]
TSCKIN
d1 d2 d3 d4
Clkln Type = 1 DataReady Mode (DR)
THCKIN
ADC Delay Adjust Timing Diagram
Figure 11. ADC Delay Adjust Timing Diagram
d5
TC2
TFCKIN
TC1
TRCKIN
TSCKIN
d1 d2 d3 d4 d5
Clkln Type = 0 DataReady/2 Mode (DR/2)
THCKIN
TC2ADA
TFIADA
TC1ADA
TRIADA
ADCDelAdjIn
TFOADA
ADCDelAdjOut
TROADA
TADA
16
TS81102G0
2105C–BDC–11/03
TS81102G0
Timing Diagrams with Asynchronous Reset
With a nominal tuning of DMUXDelAdj at a frequency of 2 GHz, d1 and d2 data is lost because of the internal clock’s path propagation delay TCPD. TCPD is tuned with DMUXDelAdjCt rl pins to obtain good setup and hold times between Clkln and the da ta.
Figure 12. Start with Asynchronous Rest, 1:8 Ratio, DR Mode
ASyncReset
Clkn
Internal Port Selection
(not available out of the DEMUX)
I[0..9]
A[0..9]
B[0..9]
C[0..9]
D[0..9]
E[0..9]
F[0..9]
G[0..9]
H[0..9]
DR
TRAR
TARDR
PWAR
TFAR
TCPD
ABCD
d1 d2 d3 d4 d5 d6 d7 d8 d9 d10 d11
TDRR
TPD
EFGH BACDEFGH
TOD
TDRF
d12 d13 d14 d15 d16 d17
d3
d4
d5
d6
d7
d8
d9
TRDR TFDR
TOD
TROD/TFOD
d10
d11
d12
d13
d14
d15
d16
d17
With a nominal tuning of DMUXDelAdj at 2 GHz, d1 an d d 2 dat a is lost be ca use of t he int er nal clock’s path propagation delay TCPD. TCPD is tuned with DMUXDelAdjCtrl pins to obtain good setup and hold times between Clkln and the input data. This timing diagram does not change with the opposite phase of Clkln.
Figure 13. Start with Asynchronous Rest, 1:8 Ratio, DR/2 Mode
ASyncReset
Clkn
Internal Port Selection
(not available out of the DEMUX)
I[0..9]
A[0..9]
B[0..9]
C[0..9]
D[0..9]
E[0..9]
F[0..9]
G[0..9]
H[0..9]
DR
TRAR
TARDR
TFAR
PWAR
TCPD
ABCD
d1 d2 d3 d4 d5 d6 d7 d8 d9 d10 d11
TDRR
TPD
TCPD
EFGH BACDEFGH
TOD
TDRF
d12 d13 d14 d15 d16 d17
d3
d4
d5
d6
d7
d8
d9
TRDR TFDR
TOD
TROD/TFOD
d10
d11
d12
d13
d14
d15
d16
d17
2105C–BDC–11/03
17
With a nominal tuning of DMUXDelAdj, at 1 GHz (1:4 mode) d1 data is lost because of the internal clock’s path propagation delay TCPD. TCPD is tuned with DMUXDelAdjCtrl pins and is used to obtain good setup and hold times between Clkln and the input data.
Figure 14. Start with Asynchronous Reset, 1:4 Ratio, DR Mode
ASyncReset
Clkn
Internal Port Selection
(not available out of the DEMUX)
TRAR
PWAR
TFAR
TCPD
ABCD
TPD
BACD
I[0..9]
A[0..9]
B[0..9]
C[0..9]
D[0..9]
TARDR
DR
d1 d2 d3 d4 d5 d6 d7 d8
TDRR
TRDR
With a nominal tuning of DMUXDelAdj, at 1 GHz (1:4 mode) d1 data is lost because of the internal clock’s path propagation delay TCPD. TCPD is tuned with DMUXDelAdjCtrl pins and is used to obtain good setup and hold times betwe en Clkln and the input data. This timing dia­gram does not change with the opposite phase of Clkln.
Figure 15. Start with Asynchronous Reset, 1:4 Ratio, DR/2 Mode
ASyncReset
Clkn
Internal Port Selection
(not available out of the DEMUX)
TRAR
PWAR
TFAR
TCPD
A
B
TOD
TDRF TDRR
TFDR
TCPD
CD
TPD
d2
d3
d4
TOD
d5
d6
d7
d8
TROD/TFOD
BA C
18
I[0..9]
A[0..9]
B[0..9]
C[0..9]
D[0..9]
DR
TS81102G0
TARDR
d1 d2 d3 d4 d5 d6 d7 d8
TOD
d5
d6
d7
d8
TROD/TFOD
TDRR
TRDR
TOD
d2
d3
d4
TDRF
TFDR
2105C–BDC–11/03
TS81102G0
Timing Diagrams with Synchronous Reset
Following is an example of the Synchronous Reset’s utility in case of de-synchronization of the DMUX output port selection. The de-synchronization event happens after the selection of Port D.
DMUXDelAdjCtrl value is nominal. TSSR < 0 because of Clkln’s internal propagation delay TCPD. After selection of Port C, instead of selecting Por t D, t he de -synchronization makes the port selection to restart on Port A. Since Port H was not selected, the data is not output to the ports but the last data (d1 to d 8) is latc hed unt il t he ne xt sel ectio n of Por t H. d9 to d16 ar e lo st . The synchronous Reset ensures a re-synchronization of the port selection.
Figure 16. Synchronous Reset, 1:8 Ratio, DR Mode
SyncReset
Clkn
I[0..9]
Internal Port Selection
(not available out of the DEMUX)
A[0..9] B[0..9] C[0..9] D[0..9] E[0..9] F[0..9]
G[0..9]
H[0..9]
DR
d1d0 d2 d3 d4 d5 d6 d7 d8 d9 d10 d11
ABCD
TDRR
TSSR
EDEFGH BACBAC DEFGHBAC DBA C
TOD
TDRF TDRR TDRF
TCPD
THSR
THSR
TSSR
d12 d13 d14 d15 d16 d17 d18 d19 d20 d21 d22 d23 d24 d25 d26 d27
d2
TSRDR
THSR
TSSR
TCPD
TOD
d17d1
d18
d19d3
d20d4
d21d5
d22d6
d23d7
d24d8
Period of uncertainty due to desynchronization
Example of the Synchronous Reset’s utility in case of de-synchronization of the DMUX output port selection. The de-synchronization event happens after the selection of Port D.
DMUXDelAdjCtrl value is nominal. TSSR < 0 because of Clkln’s internal propagation delay TCPD. After selection of Port C, instead of selecting Por t D, t he de -synchronization makes the port selection to restart on Port A. Since Port H was not selected, the data is not output to the ports but the last data (d1 to d4) is latched until the next selection of Port H. d5 to d8 are lost. The synchronous Reset ensures a re-synchronization of the port selection.
2105C–BDC–11/03
19
Figure 17. Synchronous Reset, 1:4 Ratio, DR Mode
SyncReset
Clkn
I[0..9]
Internal Port Selection
(not available out of the DEMUX)
A[0..9]
B[0..9]
C[0..9]
D[0..9]
d1 d2 d3 d4 d5 d6 d7 d8 d9 d10 d11
DR
Example of Synchronous Reset’s utility in case of de-synchronization of the DMUX output port selection. The de-synchronization event happens after the selection of Port D.
DMUXDelAdjCtrl value is nominal. TSSR < 0 because of Clkln’s internal propagation delay TCPD. After selection of Port C, instead of selecting Por t D, t he de -synchronization makes the port selection to restart on Port A. Since Port H was not selected, the data is not output to the ports but the last data (d1 to d 8) is latc hed unt il t he ne xt sel ectio n of Por t H. d9 to d16 ar e lo st . The synchronous Reset ensures a re-synchronization of the port selection.
THSR
TSSR
TCPD
d12 d13 d14 d15
ABCD BCDAB CDAB CD
d1
d2
d3
d4
Period of uncertainty due to desynchronization
TOD
d9
d10
d11
d12
TDRF TDRR
d16
Figure 18. Synchronous Reset, 1:8 ratio, DR/2 Mode
SyncReset
Clkn
I[0..9]
Internal Port Selection
(not available out of the DEMUX)
A[0..9] B[0..9]
C[0..9] D[0..9] E[0..9] F[0..9]
G[0..9]
H[0..9]
DR
d1d0 d2 d3 d4 d5 d6 d7 d8 d9 d10 d11
ABCD
TOD
TSSR
TCPD
EDEFGH BACBAC DEFGHBAC DBA C
TDRF
Example of Synchronous Reset’s utility in case of de-synchronization of the DMUX output port selection. The de-synchronization event happens after the selection of Port D.
DMUXDelAdjCtrl value is nominal. TSSR < 0 because of Clkln’s internal propagation delay TCPD. After selection of Port C, instead of selecting Por t D, t he de -synchronization makes the port selection to restart on Port A. Since Port H was not selected, the data is not output to the ports but the last data (d1 to d4) is latched until the next selection of Port H. d5 to d8 are lost. The synchronous Reset ensures a re-synchronization of the port selection.
THSR
THSR
TSRR
d12 d13 d14 d15 d16 d17 d18 d19 d20 d21 d22 d23 d24 d25 d26 d27
d1
d2
TSDRR
Period of uncertainty due to desynchronization
TDRR
THSR
TSRR
TCPD
TDRF
TOD
d17
d18 d19d3
d20d4
d21d5
d22d6
d23d7
d24d8
20
TS81102G0
2105C–BDC–11/03
TS81102G0
Figure 19. Synchronous Reset, 1:4 ratio, DR/2 Mode
SyncReset
Clkn
I[0..9]
Internal Port Selection
(not available out of the DEMUX)
A[0..9]
B[0..9]
C[0..9]
D[0..9]
d1 d2 d3 d4 d5 d6 d7 d8 d9 d10 d11
ABCD BC AABCDABCD
DR
Period of uncertainty due to desynchronization
Note: In case of low clock frequency and start with asynchronous reset, o nly the first data is lost and the fi rst data to b e pro cessed is
the second one. This data is output from the DMUX through port B.
TSSR
TCPD
d1
d2
d3
d4
THSR
TOD
TDRF
d12 d13 d14 d15
d9
d10
d11
d12
TDRR
d16
2105C–BDC–11/03
21
Explanation of Test Levels
Table 6. Explanation of Test Levels
Num Characteristics
(1)
1 100% production tested at +25 2 100% production tested at +25°C, and sample tested at specified temperatures. 3 Sample tested only at specified temperatures.
4
5 Parameter is a typical value only.
Notes: 1. The level 1 and 2 tests are performed at 50 MHz.
Parameter is guaranteed by design and characterization testing (thermal steady-state conditions at specified temperature).
2. Only MIN and MAX values are guaranteed (typical values are issuing from characterization results).
°C.
(1)
22
TS81102G0
2105C–BDC–11/03
TS81102G0
Package Description
Pin Description
Table 7. TS81102G0 Pin Description
Type Name Levels Comments
Digital Inputs I[0…9] Differential ECL Data input.
On-chip 100 differential termination resistor.
Clkln Differential ECL Clock input (Data Ready ADC).
On-chip 100 differential termination resistor.
Outputs A[0…9] H[0…9] Adjustable Logic
Single
DR Adjustable Logic
Differential
RefA RefH Adjustable Single Reference voltage for output channels A to H.
Control Signals ClklnType TTL DataReady or Dataready/2: logic 1: Data Ready.
RatioSel TTL DMUX ratio; logic 1: 1:4
Data ready for port A to H. Common mode is adjusted with VplusDOut. Swing is adjusted with SwiAdj. 50 termination possible.
Data ready for channel A to H. Common mode is adjusted with VplusDOut. Swing is adjusted with SwiAdj. 50 termination possible.
Common mode is adjustable with VplusDOut. 50 termination possible.
Bist TTL Reset and Switch of built-in Self Test (BIST): logic 0: BIST active. SwiAdj 0V ± 0.5V Swing fine adjustment of output buffers. Diode Analog Diode for chip temperature measurement. NbBit TTL Number of bit 8 or 10: logic 1: 10-bit.
Synchronization AsyncReset TTL Asynchronous reset: logic 1: reset on.
SyncReset Differential ECL Synchronous reset: active on rising edge. DMUXDelAdjCtrl Differential analog
input of ±0.5V around 0V common mode
ADCDelAdjCtrl Differential analog
input of ±0.5V around 0V common mode
ADCDelAdjln Differential ECL Stand-alone delay adjust input for ADC.
ADCDelAdjOut 50 differential
output
Power Supplies GND Ground 0V Common ground.
V
EE
V
PlusDOut
V
CC
Power -5V Digital negative power supply. Adjustable power
from 0V to +3.3V Power +5V Digital positive power supply.
Control of the delay line of DataReady input: differential input = -0.5V: delay = 250 ps differential input = 0V: delay = 500 ps differential input = 0.5V: delay = 750 ps
Control of the delay line for ADC: differential input = - 0.5V: delay = 250 ps differential input = 0V: delay = 500 ps differential input = 0.5V: delay = 750 ps
Differential termination of 100 inside the buffer. Stand-alone delay adjust output for ADC.
Common mode adjustment of output buffers.
2105C–BDC–11/03
23
TBGA 240 Package – Pinout
Row Col Name Row Col Name Row Col Name Row Col Name
VEE
17
A A A A A A A A A A A A A A A A A A A B B B B B B B B B B B B B B B B B B
B C C C C C C C C C C C C C C C C C C C D D D
E3
2
E5
3
E7
4
E9
5
C0
6
C2
7
C4
8
C6
9
C8
10
REFA
11
A1
12
A3
13
A5
14
A7
15
A9
16
DEMUXDELADJCTRL
17
RSTSYNCB
18
NC
19
E1
1
E2
2
E4
3
E6
4
E8
5
REFC
6
C1
7
C3
8
C5
9
C7
10
C9
11
A0
12
A2
13
A4
14
A6
15
A8
16
ASYNCRESET
17
DEMUXDELADJCTRLB
18
RSTSYNC
19
REFE
1
E0
2
VEE
3
VPLUSDOUT
4
VPLUSDOUT
5
VPLUSDOUT
6
VPLUSDOUT
7
VEE
8
VPLUSDOUT
9
VEE
10
VPLUSDOUT
11
VEE
12
VPLUSDOUT
13
VPLUSDOUT
14
VPLUSDOUT
15
GND
16
GND
17
GND
18
DIODE
19
G8
1
G9
2
VEE
3
NC
1
D D D D D D D D D D D D D D D D E E E E E E E E
F F F F F F F
F G G G G G G G G H H H H H H H H
J
J
J
J
J
J
J
J K K K K
VEE
5
VPLUSDOUT
6
VPLUSDOUT
7
VEE
8
VPLUSDOUT
9
VEE
10
VPLUSDOUT
11
VEE
12
VPLUSDOUT
13
GND
14
VCC
15
VCC
16
GND
17
I0B
18
I0
19
G6
1
G7
2
VPLUSDOUT
3
VEE
4
VEE
16
VEE
17
I1B
18
I1
19
G4
1
G5
2
GND
3
GND
4
GND
16
GND
17
I2B
18
I2
19
G2
1
G3
2
VEE
3
VEE
4
VEE
16
VEE
17
I3B
18
I3
19
G0
1
G1
2
GND
3
GND
4
GND
16
GND
17
CLKINB
18
CLKIN
19
DR
1
REFG
2
VPLUSDOUT
3
VCC
4
VEE
16
VEE
17
I4B
18
I4
19
SWIADJ
1
DRB
2
VEE
3
VEE
4
VEE
4
K K K K
L L L L L L L
L M M M M M M M M N N N N N N N N P P P P P P P P R R R R R R R R
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
GND
17
I5B
18
I5
19
H9
1
RATIOSEL
2
VPLUSDOUT
3
VPLUSDOUT
4
VEE
16
VEE
17
I6B
18
I6
19
H7
1
H8
2
GND
3
GND
4
GND
16
GND
17
I7B
18
I7
19
H5
1
H6
2
VPLUSDOUT
3
VPLUSDOUT
4
VEE
16
VEE
17
I8B
18
I8
19
H3
1
H4
2
GND
3
GND
4
GND
16
GND
17
I9B
18
I9
19
H1
1
H2
2
VPLUSDOUT
3
VPLUSDOUT
4
VEE
16
GND
17
ADCDELADJOUT
18
ADCDELADJOUTB
19
REFH
1
H0
2
VEE
3
VEE
4
VEE
5
VPLUSDOUT
6
VPLUSDOUT
7
VEE
8
VPLUSDOUT
9
VEE
10
VPLUSDOUT
11
VEE
12
VPLUSDOUT
13
VPLUSDOUT
14
GND
15
VEE
16
VEE
16
T T T U U U U U U U U U U U U U U U U U U U V V V V V V V V V V V V V V V V V V
V W W W W W W W W W W W W W W W W W W W
ADCDELADJIN
18
ADCDELADJINB
19
F8
1
F9
2
VEE
3
VPLUSDOUT
4
VPLUSDOUT
5
VPLUSDOUT
6
VPLUSDOUT
7
VEE
8
VPLUSDOUT
9
VEE
10
VPLUSDOUT
11
VEE
12
VPLUSDOUT
13
VPLUSDOUT
14
VPLUSDOUT
15
GND
16
GND
17
GND
18
GND
19
F7
1
F6
2
F4
3
F2
4
F0
5
D9
6
D7
7
D5
8
D3
9
D1
10
REFD
11
B8
12
B6
13
B4
14
B2
15
B0
16
BIST
17
CLKINTYPE
18
ADCDELADJCTRL
19
NC
1
F5
2
F3
3
F1
4
REFF
5
D8
6
D6
7
D4
8
D2
9
D0
10
B9
11
B7
12
B5
13
B3
14
B1
15
REFB
16
NBBIT
17
ADCDELADJCTRLB
18
NC
19
24
TS81102G0
2105C–BDC–11/03
Figure 20. TBGA 240 Package: Bottom View
19181716151413121110987654321
TS81102G0
RstSyncb
RstSync
Demuxdeladjctrclb
DIODE
GND
I0
I0b
I1b
I1
I2b GND GND
I2
I3 I3b
CLK CLKb
I4b
I4
I5
I5b
I6b
I6
I7b
I7
I8b
I8
Demuxdeladjctrcl
Asyncreset
GND
GND
VEE VEE
VEE VEE
GND GND
VEE VEE
GND VEE
VEE VEE
GND
VEE VEE
C8A1
A0 C9
VEE
VEE
REFA
VPLUSD
VPLUSD
C6
C7
C5 C3 E6
VPLUSD
VEE
VPLUSD
VEE
A9 A5A7
A3
A4A8 A6 A2
VPLUSD
VPLUSD
GND
VCC VCC VEE
GND
VPLUSD
VPLUSD
C4
VEE
VEE
C2
C1
VPLUSD
VPLUSD
C0
REFC
VPLUSD
VPLUSD
E9
E8
VPLUSD
VEE
VPLUSD
VEE
GND GND
VEE
GND GND
VCC
VEE VEE
VPLUSD
GND
GND GND
VPLUSD VPLUSD
E5 E3E7
E4
VEE
VEE
VPLUSD
VEE
VPLUSD
VPLUSD
E2 E1
E0
G9 G8
G7 G6
G5 G4
G1 G0
REFG
DRb
RATIOSEL
H8 H7
H6
REFE
G2G3
DR
SWIadj
H9
H5
A
B
C
D
E
F
G
H
J
K
L
M
N
I9
GND
ADCDELADJCTRL
ADCDELADJCTRLb
2105C–BDC–11/03
I9b
ADCdelayadjoutADCdelayadjoutB
ADCdelayadjinADCdelayadjinB
GND
CLKINTYPE
GND
GND
VEE
GND
BIST
NbBIT
GND
VEE
VEE
GND
B0
REFB
GND
VPLUSD
B2
VPLUSD
VPLUSD
B4
B3B1 B5
VPLUSD
VPLUSD
B6
VEE
VEE
B8
VPLUSD
VPLUSD
REFD
VEE
VEE
D1
VPLUSD
VPLUSD
D3
VEE
VEE
VPLUSD
VPLUSD
D7D5
VPLUSD
VPLUSD
D9 F0
VEE
VPLUSD
REFF
GND
VPLUSD
VEE
VPLUSD
F2
F1B9B7 D0 D2 D6D4 D8
GND
VPLUSD
VEE
VEE
F4
F3 F5
H4
H3
H2
H1
REFH
H0
F9
F8
F7F6
P
R
T
U
V
W
25
Outline Dimensions
Figure 21. Package Dimension – 240 Tape Ball Grid Array
11
Corner
45 degree
0.5 mm chamfer (4 PLCS)
P
D
Top View
Detail A
Side View
0.10
- A -
- B -
E E1
C
10
18
e
Detail B
D1
Bottom View
g
g
b
4
Detail B
A1
A
ccc C
e
0.30
M M M M
0.30
1
35791113151719
246810121416
A C E G J L N R U
W
A
C B C
Dimensional References
Ref.
B D F H K M P T V
A
A1
D
D1
E
E1
b
c M N
aaa ccc
e
g
P
Notes: 1. All dimensions are in millimeters.
Min.
1.30
0.50
24.80
24.80
0.60
0.80
-
-
0.35
0.15
2. "e" represents the basic solder ball grid pitch.
3. "M" represents the basic solder ball matrix size, and symbol "N" is the maximum allowable number of balls after depopulating.
4 "b" is measured at the maximum solder ball diameter parallel to primary datum - C -
5 Dimension "aaa" is measured parallel to primary datum - C -
6 Primary datum - C - and seatin plane are defined by the spherical crowns of the solder balls.
7. Package surface shall be black oxide.
8. Cavity depth various with die thickness.
9. Substrate material base is copper. 10
Bilateral tolerance zone is applied to each side of
package body. 11
45 deg. 0.5 mm chamfer corner and white dot for
pin 1 identification.
Nom.
1.50
0.60
25.00
22.86 (BSC.)
25.00
22.86 (BSC.)
0.75
0.90
19.00
240.00
---
-
1.27 TYP.
-
-
Max.
1.70
0.70
25.20
25.20
0.90
1.00
0.15
0.25
-
-
Detail A
Thermal and Moisture Characteristics
Thermal Resistance from Junction to Case: RTHJC
26
TS81102G0
- C -
aaa
5
C
6
The Rth from junction to case for th e TBGA package is estimated at 1.05 °C/W that ca n be bro­ken down as follows:
Silicon: 0.1°C/W
Die attach epoxy: 0.5°C/W (thickness # 50 µm)
Copper block (back side of the package): 0.1°C/W
Black Ink: 0.251°C/W.
2105C–BDC–11/03
TS81102G0
Thermal Resistance from Junction to Ambient: RTHJA
A pin-fin type heat sink of a size 40 mm x 40 mm x 8 mm can be used to r edu ce ther ma l re si s­tance. This heat sink should not be glued to the t op of the pa ckage as Atmel cannot guar antee the attachment to the board in such a configurat ion. The h eat sink could be clip ped or screwed on the board.
With such a heat sink, the Rthj-a is about 6°C/W (if we take 10°C/W for Rth from the junction to air through the package and heat sink in para llel with 15°C/W from the junction to the board through the package body, through balls and thr ough board copper).
Without the heat sink, the Rth junction to air for a p ackage reported on-board can be estimated at 13 to 20°C/W (depending on the board used).
The worst value 20°C/W is given for a 1-layer board (13°C for a 4-layer board).
Thermal Resistance from Junction to Bottom of Balls
The thermal resistance from the junction to the bottom of the balls of the package corresponds to the total thermal resistance to be considered from the silicon’s die junction to the interface with a board. This thermal resistance is estimated to be 4.8°C/W max.
The following diagram points out how the previous thermal resistances were calcula ted for this packaged device.
Figure 22. Thermal Resistance from Junction to Bottom of Balls
DEMUX − Axpproximative Model for 240 TBGA Assumptions:
Square die 7.0 x 7.0 = 49 mm², 75 µm thick Epoxy/Ag glue, 0.40 mm copper thickness under die, Sn60Pb40 columns diameter 0.76 mm, 23 x 23 mm TBGA
Typical values (values are in °C/Watt)
Silicon Die
49 mm²
λ = 0.95Watt/°C
Epoxy/Ag glue
λ = 0.025Watt/°C
(Top half of thickness)
Copper base
λ = 25Watt/°C
Copper base
Black ink
Thermal Resistance Junction to case typical =
0.10 + 0.60 + 0.05 + 0.05 + 0.25 = 1.05°C/W Thermal Resistance Junction to case Max = 1.40°C/W
0.10
0.60
0.05
0.05
0.25
Top of
package
1.87
0.40
2 internal
rows
(104 balls)
0.251.70
2 external
(136 balls)
rows
1.43
0.31
Tape + glue over balls
λ = 0.02Watt/°C
Balls PbSn
λ = 0.40Watt/°C
Case were all Bottom of Balls are connected to infinite heatsink (values are in °C/Watt)
Silicon JunctionSilicon Junction
0.10
0.60
0.05
Infinite heatsink
at bottom of balls
Thermal Resistance Junction to bottom of balls = 4.8°C/W Max
Reduction
Silicon
0.251.70
2.47 1.74 1.99
Junction
Infinite heatsink
at bottom of balls
Reduction
Silicon
Junction
2.45
3.55
2.47
Infinite heatsink
at bottom of balls
2105C–BDC–11/03
27
Temperature Diode Characteristic
The theoretical characteristic of the diode according to the temperature when I = 3 mA is depicted below.
Figure 23. Temperature Diode Characteristic
Moisture Characteristic
Vdiode
1.0
900m
(V)
800m
700m
-70.0 -20.0 30.0 80.0
DiodeT I = 3 mA
dV/dT = 1.32 mV/°C
130.0
Temperature (°C)
This device is sensitive to moisture (MSL3 according to the JEDEC standard). The shelf life in a sealed bag is 12 months at < 40°C and < 90% relative humidity (RH). After this bag is opened, devices that might be subjected to infrared reflow, vapor-phase
reflow, or equivalent processing (peak package body temperature 220°C) must be:
mounted within 168 hours at factory conditions of 30°C/60% RH, or
•stored at 20% RH.
28
The devices require baking before mounting, if the humidity indicator is > 20% when read at 23°C ±5°C.
If baking is required, the devices may be baked for:
192 hours at 40°C + 5°C/-0°C and < 5% RH for low temperature device containers, or
24 hours at 125°C ± 5°C for high-temperature device containers.
TS81102G0
2105C–BDC–11/03
TS81102G0
Detailled Cross
The following diagram depicts a detailed cross sectio n of the DM UX TBG A packa ge .
Section
Figure 24. TBGA 240: 1/2 Cross Section
Die Attach Epoxy/Ag
Silicon Die
Block Epoxy resin encapsulant
In the DMUX package shown above, the die’s rear side is attached to the copper heat spreader, so the copper heat spreader is at -5V.
Gold wires
Copper Heatspreader
Copper traces and Solder Balls Pads on metal 1 side
Block overcoat
Sn/Pb/Ag 62/36/2 Eutectic Solder Balls
Adhesive
Solder Mask Metal 2 side
Polyimide Tape
Solder Mask Metal 1 side
It is necessary to use a heat sink tied to the copper heat speader. Moreover, there is only a little layer of painting over the copper heat spreader which does not
isolate it. It is therefore recommended to either isolate the heat sink from the other components of the
board or to electrically isolate the copper heat spreader from the heat sink. In the latter case, one should use adequate low Rth electrical isolation.
2105C–BDC–11/03
29
Applying the TS81102G0 DMUX
The TSEV81102G0 DMUX evaluation board is designed to be connected with the TSEV8388G and TSEV83102G0 ADC evaluation boards.
Figure 25. TSEV81102G0 DMUX Evaluation Boards
VplusD = 0V 3.3V
CLOCK BUFFER
Clkln
Analog
Input
ADC
Data
Bus
Data
Ready
8bits 1 GHz TS8388B
10bits 2 GHz TS83102G0
s-e or diff.
(2 GHz)
(1 GHz)
8b/10b diff.
(1 - 2 GHz)
1b diff.
ECL
Rload = 50 Vih = -1.0V Vil = -1.4V
FS
Vcc = +5V
I[0..9]
Clkln
Delay adjust
control
DEMUX
delay
Number
of bits (8/10)
Vee = -5V
A[0..9] H[0..9]
Synchronous or
Asynchronous
TS81102G0
RefA RefH
DR
Reset
(125 MHz) 8x8b/10b single
(DC) 8 ref
(250 MHz) 1b diff.
ECL + ref
VplusD = ground Rload = 50 Vtt = -2V Voh = -0.8V Vol = -1.8V
TTL + ref
VplusD = 3.3V Rload 75 Vtt = ground Voh = 2.5V Vol = 0.5V
PECL + ref
VplusD = 3.3V Rload = 50 Vtt = 1.3V Voh = 2.5V Vol = 1.5V
ASIC
30
Please refer to the "ADC and DMUX Application Note" for more information.
TS81102G0
2105C–BDC–11/03
TS81102G0
ADC to DMUX Connections
The DMUX inputs configuration has been optimized to be connected to the TS8388B ADC. The die in the TBGA package is up. For the ADC, different types of packages can be used
such as CBGA with die up or the CQFP68 down. The DMUX device being completely sym­metrical, both ADC packages can be connected to the TBGA pa ckage of the DMUX criss­crossing the lines (see Table 8).
Table 8. ADC to DMUX Connections
ADC Digital Outputs
CQFP68 Package
D0 I7 D0 I0 D1 I6 D1 I1 D2 I5 D2 I2 D3 I4 D3 I3 D4 I3 D4 I4 D5 I2 D5 I5 D6 I1 D6 I6 D7 I0 D7 I7
18 not connected 18 not connected – 19 not connected 19 not connected
DMUX Data Inputs
TBGA Package
ADC Digital Outputs
CBGA Package
DMUX Data Inputs
TBGA Package
Note: The connection between the ADC evaluation board and the DMUX evaluation board requires a
4-pin shift to make the D0 pin match either the I7 or I0 pin of the DMUX evaluation board.
2105C–BDC–11/03
31
TSEV81102G0TP: Device Evaluation Board
General Description
The TSEV81102G0TP DMUX Evaluation Board (EB) is designed to simplify the characteriza­tion and the evaluation of the TS81102G0 device (2 Gsps DMUX). The DMUX EB enables testing of all the DMUX functions: Synchronous and Asynchronous reset functions, selection of the DMUX ratio (1:4 or 1:8), selection of the number of bits (8 or 10), output data common mode and swing adjustment, die junction temperature measurements over military tempera­ture range, etc.
The DMUX EB has been designed to enable easy connection to Atme’s ADC Evaluation Boards (such as TSEV8388BGL or TSEV83102G0BGL) for an extended functionality evalua­tion (ADC and DMUX multi-channel applications).
The DMUX EB comes fully assembled and tested, with a TS81102G0 device implemented on the board and a heat sink assembled on the device.
32
TS81102G0
2105C–BDC–11/03
TS81102G0
Ordering Information
Table 9. Ordering Information
Part Number Package Temperature Range Screening Comments
JTS81102G0-1V1A Die Ambient Visual inspection TS81102G0CTP TBGA 240 "C" grade
0°C < Tc; Tj < 90°C
TS81102G0VTP TBGA 240 "V" grade
-40°C < Tc; Tj < 110°C
TSEV81102G0TPZR3 TBGA 240 Ambient Prototype Evaluation board (delivered
Datasheet
Standard
Standard
with heatsink)
Status Description
Table 10. Datasheet Status
Datasheet Status Validity
Objective specification This datasheet contains target and
goal specifications for discussion with customer and application validation.
Target specification This datasheet contains target or
goal specifications for product development.
Preliminary specificati on α-site
Preliminary specificati on β-site
Product specification This datasheet contai ns final product
Limiting Values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application Information
This datasheet contains preliminary data. Additional data may be published later; could include simulation results.
This datasheet contains also characterization results.
specification.
Before design phase
Valid during the design phase
Valid before characterization phase
Valid before the industrialization phase
Valid for production purposes
Life Support Applications
2105C–BDC–11/03
Where application information is given, it is advisory and does not form part of the specification.
These products are not designed for use in life-support appliances, devices or systems where malfunction of these products can reasonably be expected to result in person al injury. Atmel customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Atmel for any damages resulting from such improper use or sale.
33
Addendum This section has been added to the description of the device for better understanding of the
synchronous reset operation. It puts particular stress on the setup and hold times defined in the switching characteristics table (Table 5), linked with the device performances when used at full speed (2 Gsps).
Synchronous Reset Operation
SETUP and HOLD Timings
It first describes the operation of the synchron ous reset in case the DMUX is used in DR mode and then when used in the DR/2 mode.
As a reminder, the synchronous reset has to be a signal frequency of Fs/8N in 1:8 ratio or Fs/4N in 1:4 ratio, where N is an integer.
The effect of the synchronous reset is to ensure that at each new port selection cycle, the first port to be selected is port A. The synchronous reset ensures the internal cyclic synchroniza­tion of the device during operation. It is also highly recommended in the case of multichannel applications using 2 synchronized DMUXs.
The setup and hold times for the reset are defined as follows:
SETUP from SynchReset to Clkin: Required delay between the rising edge of the reset and the rising edge of the clock to ensure
that the reset will be taken into account at the next clock edge. If the reset rising edge occurs at less than this setup time, it will be taken into account only at the second next rising edge of the clock.
A margin of ± 100ps has to be added to this setup time to compensate for the delays from the drivers and lines.
HOLD from Clkin and SynchReset: Minimum duration of the reset signal at a high level to be taken int o account by the DMUX.
This means that the reset signal has to s atisfy 2 requ iremen ts: a frequ ency of Fs/8 N or Fs/4N (N is an integer) depending on the ratio and a duty cycle such that it is high during at least the hold time.
Operation in DR Mode In DR mode, the DMUX input clock can run at up to 2 GHz in 1:8 ratio or 1 GHz in 1:4 ratio.
Both cases are described in the following timing diagrams.
Figure 26. Synchronous Reset Operation in DR Mode, 1:4 ratio, 1GHz (Full Speed) – Principle of Operation
Fs
Sync_RESET
34
TS81102G0
2105C–BDC–11/03
TS81102G0
Figure 27. Synchronous Reset Operation in DR Mode, 1:4 ratio, 1GHz (Full Speed) – TIMINGS
Fs
Time Zones
Allowed for
the reset
Sync_RESET
Note: The clock edge to which the reset applies is the one identified by the arrow. If the reset rising edge had occurred in the second allowed window, the reset would have been effective on the third clock rising edge (not
represented, on the right of the edge represented with the arrow).
Figure 28. Synchronous Reset Operation in DR Mode, 1:8 ratio, 2 GHz (Full-speed) – Principle of Operation
Fs
Sync_RESET
Figure 29. Synchronous Reset Operation in DR Mode, 1:8 rati o, 2 GHz (Full-speed) – Timings
Fs
Times Zones
Allowed for
the reset
Sync_RESET
Note: The clock edge to which the reset applies is the one identified by the arrow.
If the reset rising edge had occurred in the second allowed window, the reset would have been effective on the fourth clock rising edge (last clock rising edge, on the right of the edge re presented with the arrow).
This case is the most critical one with only a 300 ps window for the reset.
2105C–BDC–11/03
35
Operation in DR/2 Mode
In DR/2 mode, the DMUX input clock can run at up to 1 GHz in 1:8 ratio or 500 MHz in 1:4 ratio, since the DR/2 clock from the ADC is half the sampling frequency.
Both cases are described in the following timing diagrams.
Figure 30. Synchronous Reset Operation in DR/2 Mode, 1:4 ratio, 500MHz (Full Speed) – Principle of Operation
Fs/2
Sync_RESET
Figure 31. Synchronous Reset Operation in DR/2 Mode, 1:4 ratio, 500 MHz (Full-speed) – Timings
Fs/2
Times Zones
Allowed for the
reset
Sync_RESET
Note: The clock edge to which the reset applies is the one identified by the arrow.
If the reset rising edge had occurred in the first allowed window (on the le ft) , the re set w ould have been effective on the fi rst represented clock rising edge (first clock rising edge of the schematic, on the left of the edge represented with the arrow).
Figure 32. Synchronous Reset Operation in DR/2 Mode, 1:8 ratio, 1GHz (Full Speed) – Principle of Operation
Fs/2
Sync_RESET
36
TS81102G0
2105C–BDC–11/03
TS81102G0
Figure 33. Synchronous Reset Operation in DR/2 Mode, 1:8 ratio, 1GHz (Full-speed) – Timings
Fs/2
Times Zones
Allowed for the
reset
Sync_RESET
Note: The clock edge to which the reset applies is the one identified by the arrow. If the reset rising edge had occurred in the second allowed window, the reset would have been effective on the fourth clock rising edge
(not represented, on the right of the edge represented with the arrow).
2105C–BDC–11/03
37
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© Atmel Corporation 2002.
Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company’s standard warrant y which is detailed in Atmel’s Terms and Conditions located on the Company’s web site. The Company assumes no responsibility for any errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without notice, and does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are granted by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel’s products are not auth ori zed for use as critical components in life support devices or systems.
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2105C–BDC–11/03
0M
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