Q-Tech LOW PHASE NOISE OCXO User Manual

Q-TECH

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ONE INCH SQUARE LOW PHASE NOISE OCXO

Description

Q-Tech’s High Stability OCXO is a high reliability signal
generator that provides an HCMOS or Sine Wave output. The
OCXO is available in a Through hole package.

A flexible design allows Q-Tech Corporation to offer a variety
of choices of output standard, power and load. Based on this
flexibility, Q-Tech welcomes specifications with parameters
other than standard.

Low G-Sensitivity SC-Cut Crystal utilized in the design
guarantees 1PPB/G or better. The reliable construction of this
design qualifies it for stringent environmental applications.

Features

3.3 to 12Vdc - 1MHz to 125MHz

Ordering Information

(Sample part number)

QT5006SJM-10 0 . 0 0 0 MHz

Q T 5 0 0 6 S J M- 100.000MHz

• Made in the USA

• ECCN: EAR99

• DFARS 252-225-7014 Compliant:
Electronic Component Exemption

• USML Registration # M17677

• Supply voltages 3.3Vdc, 5Vdc and 12Vdc

• Wide temperature range (-40ºC to +85ºC)

• SC-Cut crystal

• Low phase noise and jitter

• Choice of output power and load

• Hermetically sealed packages

• Custom design available tailored to meet customer’s needs

• Q-Tech does not use pure lead or pure tin in its products

Applications

• Designed to meet today’s requirements for communication
systems.

• Wide military clock applications

• Control and measurement

• Signal processing

Package Type:

0 Through Hole

Supply Voltage:

3 +3.3V
5 +5.0V
6 +12.0V

Logic:

C HCMOS

S Sine Wave

Frequency vs. Temperature Code
G ± 100PPB at -20ºC to +70ºC
H ± 10PPB at -20ºC to +70ºC

J ± 200PPB at -40ºC to +85ºC

D ± 20PPB at -40ºC to +85ºC

For Non-Standard requirements, contact Q-Tech Corporation at

[e-mail]

Output Frequency

Blank No Screening

Screening Option:

M Per MIL-PRF-55310, Level B

Packaging Options

• Standard packaging in black foam

Other Options Available For An Additional Charge

• P. I. N. D. test (MIL-STD 883, Method 2020)

• Phase Noise test (Static and under vibration)

• Jitter test

Specifications subject to change without prior notice.

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-te ch.co m

QPDS-0005 (Revision A, April 2013 )(ECO # 10836)

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ONE INCH SQUARE LOW PHASE NOISE OCXO

3.3 to 12Vdc - 1MHz to 125MHz

Electrical Characteristics

Parameters Conditions Requirements

Output Frequency Range

Supply Voltage ±5.0% 3.3V, 5V and 12V
Initial Tolerance @+25°C ±50 PPB
Temperature Range See Option Codes

Frequency Stability vs. Temperature See Option Codes

Frequency Stability vs. Voltage Variation Over temperature range ±20 PPB

Frequency Stability vs. Load Variation ±5.0% Load Variation ±20 PPB

Warm-up Power @-40°C 4.5W (for codes D and J)

Steady State Power @+25°C 1.5W (for codes D and J)

Warm-up Time @+25°C to ±100PPB (shours ref.) 5min

Output Waveform

Output Power +3.0±1.0 dBm

Output Power Stability Over temperature range ±1.0 dBm

Duty Cycle

Output Load

Harmonics

Spurious

Aging

Phase Noise for 100MHz OCXO (typ.)

Over temperature range 50%±5.0%

Over temperature range -35dBc
Over temperature range -90dBc

Per day 1PPB

15 years 1.5PPM

10Hz -90dBc/Hz
100Hz -120dBc/Hz
1kHz -150dBc/Hz
10kHz -160dBc/Hz
100kHz -162dBc/Hz

1MHz — 125MHz

Sine Wave HCMOS

50Ω 10kΩ//15pF

Other Design and Test Options

• Supply voltage +3.3Vdc to +12Vdc

• Phase Noise and Jitter built to specification including static
and vibration.

• QCI tests

• Tight frequency stability versus temperature, supply voltage,
and load variations

• Low g-sensitivity and low phase noise

• Low spurious (see note 3)

• Low frequency aging, Allan Variance

• High-shock resistant

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-te ch.co m

QPDS-0005 (Revision A, April 2013 )(ECO # 10836)

Notes:

1. The output level is determined by the supply voltage, load,
and package size.

2. Typical amplitude stability over temperature is ±10% or less.

3. Typical spurious level is better than -100dBc over the
spectrum of 100kHz to 1GHz.

4. Guaranteed by design, can be tested by customer request.

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Package Outline and Pin Connections

Dimensions are in inches (mm)

ONE INCH SQUARE LOW PHASE NOISE OCXO

3.3 to 12Vdc - 1MHz to 125MHz

Pin No.

1
2
3
4
5

Designation

OUTPUT

GND/CASE

VOLTAGE CONTROL

NC

SUPPLY VOLTAGE

Package Information

Package Material: COLD ROLLED Steel
Bright Nickel Plated 500µ inches

NC (No Connection)

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-te ch.co m

QPDS-0005 (Revision A, April 2013 )(ECO # 10836)

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ONE INCH SQUARE LOW PHASE NOISE OCXO

3.3 to 12Vdc - 1MHz to 125MHz

Sine Wave Output Waveform into 50Ω load Test Circuit

HCMOS Load

Typical output of QT5006SJ-100.000MHz

Sine Wave Load

Typical Amplitude for Sine Wave Output Sine Wave Output Harmonic Distortion

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-te ch.co m

QPDS-0005 (Revision A, April 2013 )(ECO # 10836)

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Frequency vs. Temperature Curve

ONE INCH SQUARE LOW PHASE NOISE OCXO

3.3 to 12Vdc - 1MHz to 125MHz

Typical Stability of QT5006SJ-100.000MHz

Environmental Specifications

Q-Tech Standard Screening similar to (MIL-PRF-55310) is available. Q-Tech can also customize screening and test procedures to meet
your specific requirements. The packages are designed and processed to exceed the following test conditions:

Environmental Test Test Conditions

Temperature cycling MIL STD 883, Method 1010, Cond. B
Constant acceleration MIL STD 883, Method 2001, Cond. A, Y1
Seal Fine Leak MIL STD 883, Method 1014, Cond. A
Burn in 160 hours, 125°C with load
Aging 30 days, 70°C
Vibration sinusoidal MIL STD 202, Method 204, Cond. D
Shock, non operating MIL STD 202, Method 213, Cond. I
Thermal shock, non operating MIL STD 202, Method 107, Cond. B
Ambient pressure, non operating MIL STD 202, 105, Cond. C, 5 minutes dwell time minimum
Resistance to solder heat MIL STD 202, Method 210, Cond. C
Moisture resistance MIL STD 202, Method 106
Terminal strength MIL STD 202, Method 211, Cond. C
Resistance to solvents MIL STD 202, Method 215
Solderability MIL STD 202, Method 208
ESD Classification MIL STD 883, Method 3015, Class 1HBM 0 to 1,999V
Moisture Sensitivity Level J STD 020, MSL 1

Please contact Q-Tech for higher shock requirements

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-te ch.co m

QPDS-0005 (Revision A, April 2013 )(ECO # 10836)

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ONE INCH SQUARE LOW PHASE NOISE OCXO

3.3 to 12Vdc - 1MHz to 125MHz

Phase Noise and Phase Jitter Integration

Phase noise is measured in the frequency domain, and is expressed as a ratio of signal power to noise power measured in a 1Hz bandwidth
at an offset frequency from the carrier, e.g. 10Hz, 100Hz, 1kHz, 10kHz, 100kHz, etc. Phase noise measurement is made with an Agilent
E5052A Signal Source Analyzer (SSA) with built-in outstanding low-noise DC power supply source. The DC source is floated from the
ground and isolated from external noise to ensure accuracy and repeatability.

In order to determine the total noise power over a certain frequency range (bandwidth), the time domain must be analyzed in the frequency
domain, and then reconstructed in the time domain into an RMS value with the unwanted frequencies excluded. This may be done by
converting L(f) back to Sφ(f) over the bandwidth of interest, integrating and performing some calculations.

Symbol

∫L(f)

Sφ (f) (180/Π)x√2 ∫L(f)df

RMS jitter Sφ (f)/(fosc.360°) Jitter(in seconds) due to phase noise. Note Sφ (f) in degrees.

Integrated single side band phase noise (dBc)

Spectral density of phase modulation, also known as RMS phase error (in degrees)

Definition

The value of RMS jitter over the bandwidth of interest, e.g. 10kHz to 20MHz, 10Hz to 20MHz, represents 1 standard deviation of
phase jitter contributed by the noise in that defined bandwidth.

Figure below shows a typical phase noise/phase jitter of a QT5006S, 12V, 100.000MHz OCXO at offset frequencies 10Hz to 5MHz.

QT5006SJ-100.000MHz

ECO REV REVISION SUMMARY Page

10836

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-te ch.co m

QPDS-0005 (Revision A, April 2013 )(ECO # 10836)

A Fixed typo under “Other Design and Test Options” (from see note 5 to 3) 2

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