Philips 74ABT373APW, 74ABT373AN, 74ABT373ADB, 74ABT373AD Datasheet

INTEGRATED CIRCUITS
74ABT373A
Octal transparent latch (3-State)
Product specification 1995 Feb 17 IC23 Data Handbook
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Philips Semiconductors Product specification
FEA TURES
8-bit transparent latch
3-State output buffers
Output capability: +64mA/–32mA
Latch-up protection exceeds 500mA per JEDEC Std 17
ESD protection exceeds 2000 V per MIL STD 883 Method 3015
and 200 V per Machine Model
Power-up 3-State
Power-up reset
Live insertion/extraction permitted
QUICK REFERENCE DATA
SYMBOL PARAMETER
C
t
PLH
t
PHL
C
OUT
I
CCZ
IN
Propagation delay Dn to Qn
Input capacitance VI = 0V or V Output capacitance Outputs disabled; VO = 0V or V Total supply current Outputs disabled; VCC =5.5V 100 µA
DESCRIPTION
The 74ABT373A high-performance BiCMOS device combines low static and dynamic power dissipation with high speed and high output drive.
The 74ABT373A device is an octal transparent latch coupled to eight 3-State output buffers. The two sections of the device are controlled independently by Enable (E) and Output Enable (OE control gates.
The data on the D inputs are transferred to the latch outputs when the Latch Enable (E) input is High. The latch remains transparent to the data inputs while E is High, and stores the data that is present one setup time before the High-to-Low enable transition.
The 3-State output buffers are designed to drive heavily loaded 3-State buses, MOS memories, or MOS microprocessors. The active-Low Output Enable (OE independent of the latch operation.
When OE outputs. When OE “OFF” state, which means they will neither drive nor load the bus.
CONDITIONS = 25°C; GND = 0V
T
amb
CL = 50pF; VCC = 5V
CC
) controls all eight 3-State buffers
is Low, the latched or transparent data appears at the
is High, the outputs are in the High-impedance
TYPICAL UNIT
3.2
3.6
ns
4 pF
CC
7 pF
)
ORDERING INFORMATION
PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA DWG NUMBER
20-Pin Plastic DIP –40°C to +85°C 74ABT373A N 74ABT373A N SOT146-1 20-Pin plastic SO –40°C to +85°C 74ABT373A D 74ABT373A D SOT163-1 20-Pin Plastic SSOP Type II –40°C to +85°C 74ABT373A DB 74ABTD373A B SOT339-1 20-Pin Plastic TSSOP Type I –40°C to +85°C 74ABT373A PW 7ABT373APW DH SOT360-1
PIN CONFIGURATION
1
OE
2
Q0
3
D0
4
D1
5
Q1
6
Q2
7
D2
8
D3
9
Q3 Q4
10 11
GND
20
V
CC
Q7
19
D7
18
D6
17
Q6
16
Q5
15
D5
14
D4
13 12
E
PIN DESCRIPTION
PIN NUMBER SYMBOL FUNCTION
1 OE Output enable input (active-Low)
3, 4, 7, 8, 13,
14, 17, 18
2, 5, 6, 9, 12,
15, 16, 19
11 E Enable input (active-High) 10 GND Ground (0V) 20 V
D0-D7 Data inputs
Q0-Q7 Data outputs
Positive supply voltage
CC
SA00059
1995 Feb 17 853-1454 14852
2
Philips Semiconductors Product specification
OPERATING
74ABT373AOctal transparent latch (3-State)
LOGIC SYMBOL
3 4 7 8 13 14 1817
D0 D1 D2 D3 D4 D5 D6 D7
11
E
1
OE
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
2 5 6 9 12 15 16 19
SA00060
FUNCTION TABLE
INPUTS
OE E Dn
LLHHL
LL↓↓l
H
h
INTERNAL REGISTER
L
H
L
H
L L X NC NC Hold
HHLHX
Dn
NC
Dn
H = High voltage level h = High voltage level one set-up time prior to the High-to-Low E
transition L = Low voltage level l = Low voltage level one set-up time prior to the High-to-Low E
transition NC= No change X = Don’t care Z = High impedance “off” state = High-to-Low E transition
OUTPUTS
Q0 – Q7
L
H
L
H
Z Z
OPERATING
MODE
Enable and read register
Latch and read register
Disable outputs
LOGIC SYMBOL (IEEE/IEC)
1
11
32 45 76
89
13 12 14 15 17 16 18 19
EN C1
1D
SA00061
LOGIC DIAGRAM
1995 Feb 17
OE
D0
3 4 7 8 13 14 17 18
D
E Q
11
E
1
D1
D
EQ
2 5 6 9 12 15 16 19
Q0
D2
D
EQ
Q1 Q2 Q3 Q4 Q5 Q6 Q7
D3
D
EQ
D4
D
EQ
D5
D
EQ
D6
D
EQ
D7
D
EQ
SA00062
3
Philips Semiconductors Product specification
SYMBOL
PARAMETER
UNIT
74ABT373AOctal transparent latch (3-State)
ABSOLUTE MAXIMUM RATINGS
SYMBOL
V
CC
I
IK
V
I
I
OK
V
OUT
I
OUT
T
stg
DC supply voltage –0.5 to +7.0 V DC input diode current VI < 0 –18 mA DC input voltage DC output diode current VO < 0 –50 mA DC output voltage DC output current output in Low state 128 mA Storage temperature range –65 to 150 °C
PARAMETER CONDITIONS RATING UNIT
3
3
1, 2
–1.2 to +7.0 V
output in Off or High state –0.5 to +5.5 V
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
RECOMMENDED OPERATING CONDITIONS
LIMITS
Min Max
V
CC
V V V I
OH
I
OL
t/v Input transition rise or fall rate 0 5 ns/V
T
amb
DC supply voltage 4.5 5.5 V Input voltage 0 V
I
High-level input voltage 2.0 V
IH
Low-level input voltage 0.8 V
IL
High-level output current –32 mA Low-level output current 64 mA
Operating free-air temperature range –40 +85 °C
CC
V
1995 Feb 17
4
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