Philips 74ABT32PW, 74ABT32N, 74ABT32DB, 74ABT32D Datasheet

INTEGRATED CIRCUITS

74ABT32

Quad 2-input OR gate

Product specification

1995 Sep 22

IC23 Data Handbook

m n r

Philips Semiconductors	Product specification
Quad 2-input OR gate	74ABT32

QUICK REFERENCE DATA

CONDITIONS

SYMBOL

PARAMETER

Tamb = 25°C;

TYPICAL

UNIT

GND = 0V

tPLH

Propagation

2.3

delay

ns

tPHL

An, Bn to Yn

CL = 50pF;

1.9

VCC = 5V

tOSLH

Output to

0.4

ns

tOSHL

Output skew

CIN

Input

VI = 0V or VCC

3

pF

capacitance

ICC

Total supply

Outputs disabled;

50

μA

current

VCC = 5.5V

PIN CONFIGURATION

A0

1

14

VCC

B0

B3

2

13

Y0

A3

3

12

A1

Y3

4

11

B1

B2

5

10

Y1

A2

6

9

GND

Y2

7

8

SA00354

PIN DESCRIPTION

PIN

SYMBOL

NAME AND FUNCTION

NUMBER

1, 2, 4, 5, 9,

An, Bn

Data inputs

10, 12, 13

3, 6, 8, 11

Yn

Data outputs

7

GND

Ground (0V)

14

VCC

Positive supply voltage

LOGIC SYMBOL

1

2

4

5

9

10

12

13

A0

B0

A1

B1

A2

B2

A3

B3

Y0

Y1

Y2

Y3

VCC = Pin 14

3

6

8

11

GND = Pin 7

SA00355

LOGIC DIAGRAM

		A0	1	3
			2
		B0		Y0
		A1	4	6
			5
		B1		Y1
		A2	9	8
		B2	10	Y2
		A3	12	11
	VCC = Pin 14		13
		B3		Y3
	GND = Pin 7
				SA00356

LOGIC SYMBOL (IEEE/IEC)

1		1
2		3

4

6

5

9

8

10

12

11

13

SF00041

FUNCTION TABLE

		INPUTS			OUTPUT
		An		Bn	Yn
		L		L	L
		L		H	H
		H		L	H
		H		H	H
NOTES:
H	=	High voltage level
L	=	Low voltage level

ORDERING INFORMATION

PACKAGES	TEMPERATURE RANGE	OUTSIDE NORTH AMERICA	NORTH AMERICA	DWG NUMBER
14-Pin Plastic DIP	±40°C to +85°C	74ABT32 N	74ABT32 N	SOT27-1
14-Pin plastic SO	±40°C to +85°C	74ABT32 D	74ABT32 D	SOT108-1
14-Pin Plastic SSOP Type II	±40°C to +85°C	74ABT32 DB	74ABT32 DB	SOT337-1
14-Pin Plastic TSSOP Type I	±40°C to +85°C	74ABT32 PW	74ABT32PW DH	SOT402-1

1995 Sep 22

2

853-1812 15793

Philips Semiconductors	Product specification
Quad 2-input OR gate	74ABT32

ABSOLUTE MAXIMUM RATINGS1, 2

SYMBOL	PARAMETER	CONDITIONS	RATING	UNIT
VCC	DC supply voltage		±0.5 to +7.0	V
IIK	DC input diode current	VI < 0	±18	mA
VI	DC input voltage3		±1.2 to +7.0	V
IOK	DC output diode current	VO < 0	±50	mA
V	DC output voltage3	output in Off or High state	±0.5 to +5.5	V
OUT
IOUT	DC output current	output in Low state	40	mA
Tstg	Storage temperature range		±65 to 150	°C

NOTES:

1.Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under ªrecommended operating conditionsº is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

2.The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.

3.The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

RECOMMENDED OPERATING CONDITIONS

SYMBOL	PARAMETER		LIMITS		UNIT
		MIN		MAX
VCC	DC supply voltage	4.5		5.5	V
VI	Input voltage	0		VCC	V
VIH	High-level input voltage	2.0			V
VIL	Low-level input voltage			0.8	V
IOH	High-level output current			±15	mA
IOL	Low-level output current			20	mA
t/ v	Input transition rise or fall rate	0		10	ns/V
Tamb	Operating free-air temperature range	±40		+85	°C

DC ELECTRICAL CHARACTERISTICS

						LIMITS
SYMBOL	PARAMETER		TEST CONDITIONS	Tamb = +25°C			Tamb = ±40°C		UNIT
							to +85°C
				MIN	TYP	MAX	MIN	MAX
VIK	Input clamp voltage	VCC = 4.5V; IIK = ±18mA			±0.9	±1.2		±1.2	V
VOH	High-level output voltage	VCC = 4.5V; IOH = ±15mA; VI = VIL or VIH		2.5	2.9		2.5		V
VOL	Low-level output voltage	VCC = 4.5V; IOL = 20mA; VI = VIL or VIH			0.35	0.5		0.5	V
II	Input leakage current	VCC = 5.5V; VI = GND or 5.5V			±0.01	±1.0		±1.0	μA
IOFF	Power-off leakage current	VCC = 0.0V; VO or VI ≤ 4.5V			±5.0	±100		±100	μA
ICEX	Output High leakage current	VCC = 5.5V; VO = 5.5V; VI = GND or VCC			5.0	50		50	μA
I	Output current1	V	= 5.5V; V = 2.5V	±50	±75	±180	±50	±180	mA
O		CC	O
ICC	Quiescent supply current	VCC = 5.5V; VI = GND or VCC			2	50		50	μA
ICC	Additional supply current per	VCC = 5.5V; One data input at 3.4V, other			0.25	500		500	μA
	input pin2	inputs at VCC or GND

NOTES:

1.Not more than one output should be tested at a time, and the duration of the test should not exceed one second.

2.This is the increase in supply current for each input at 3.4V.

3.For valid test results, data must not be loaded into the flip-flop or latch after applying the power.

1995 Sep 22

3