Philips 74abt2953 DATASHEETS

Philips Semiconductors Product specification
74ABT2953Octal registered transceiver, inverting (3-State)

FEA TURES

8-bit registered transceiver
Independent registers for A and B buses
Output capability: +64mA/–32mA
ESD protection exceeds 2000V per MIL STD 883 Method 3015
and 200V per Machine Model
Live insertion/extraction permitted
Power-up 3-State

DESCRIPTION

The 74ABT2953 high-performance BiCMOS device combines low static and dynamic power dissipation with high speed and high output drive.
The 74ABT2953 device is an 8-bit registered inverting transceiver. Two 8-bit back-to-back registers store data flowing in both directions between two bidirectional buses. Data applied to the inputs is entered and stored on the rising edge of the Clock (CPXX) provided that the Clock Enable (CEXX the 3-State output buffers, but is only accessible when the Output Enable (OEXX
) is Low. Data flow from A inputs to B outputs is the
same as for B inputs to A outputs.
) is Low. The data is then present at
Power-up reset

QUICK REFERENCE DAT A

SYMBOL PARAMETER
t
PLH
t
PHL
C
C
I
CCZ
IN
I/O
Propagation delay CPBA to A
n or CPAB to Bn
CL = 50pF; VCC = 5V 5.0 ns
Input capacitance VI = 0V or V
I/O capacitance
Outputs disabled;
= 0V or V
V
O
Total supply current Outputs disabled; VCC =5.5V 500 nA

ORDERING INFORMATION

PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA DWG NUMBER
24-Pin Plastic DIP –40°C to +85°C 74ABT9253 N 74ABT2953 N SOT222-1 24-Pin plastic SO –40°C to +85°C 74ABT2953 D 74ABT2953 D SOT137-1 24-Pin Plastic SSOP Type II –40°C to +85°C 74ABT2953 DB 74ABT2953 DB SOT340-1 24-Pin Plastic TSSOP Type I –40°C to +85°C 74ABT2953 PW 74ABT2953PW DH SOT355-1
CONDITIONS = 25°C; GND = 0V
T
amb
CC
CC
TYPICAL UNIT
4 pF
7 pF

PIN CONFIGURA TION

PIN DESCRIPTION

PIN NUMBER SYMBOL NAME AND FUNCTION
1
B7
2
B6
3
B5
4
B4
5
B3
6
B2
7
B1
8
B0
9
OEAB
10 15
CPAB
11 14CEAB 12 13GND
TOP VIEW
1995 Sep 06 853-1555 15702
24
V
CC
23
A7
22
A6
21
A5
20
A4
19
A3
18
A2
17
A1
16
A0 OEBA CPBA CEBA
SA00305
1
10, 14
11, 13
16, 17, 18, 19,
20, 21, 22, 23
1, 2, 3, 4, 5, 6,
7, 8
9, 15
12 GND Ground (0V) 24 V
CPAB /
CPBA
CEAB /
CEBA
A0 – A7 Data inputs/outputs (A side)
B0 – B7 Data outputs/outputs (B side)
OEAB /
OEBA
CC
Clock input A to B / Clock input B to A
Clock enable input A to B / Clock enable input B to A
Output enable inputs
Positive supply voltage
Philips Semiconductors Product specification
74ABT2953Octal registered transceiver, inverting (3-State)

LOGIC SYMBOL

16 17 18 19 20 21 22 23
A0 A1 A2 A3 A4 A5 A6 A7
10
CPAB
11
CEAB
14
CPBA
13
CEBA
B0 B1 B2 B3 B4 B5 B6 B7
87654321
OEBA OEAB
FUNCTION TABLE for Register An or Bn
INPUTS INTERNAL OPERATING
An or
Bn
X X H NC Hold data L
H
H = High voltage level L =Low voltage level =Low-to-High transition X = Don’t care XX=AB or BA NC=No change
CPXX CEXX Q MODE
↑ ↑
L L
L
H
Load data
LOGIC SYMBOL (IEEE/IEC)
11 13 15
9
10 14
15
9
SA00306
16 8 17 7 18 6 19 5 20 4 21 3 22 2 23 1
EN1 EN2 EN3 EN4
C5 C6
2, 3, 6
1, 4, 5
SA00307
FUNCTION TABLE for Output Enable
INPUTS INTERNAL An or Bn OPERATING
OEXX Q OUTPUTS MODE
H X Z Disable outputs L
L
H = High voltage level L =Low voltage level X = Don’t care XX=AB or BA Z =High impedance ”off” state
L H
H
L
Enable outputs

ABSOLUTE MAXIMUM RATINGS

SYMBOL
V
CC
I
IK
V
I
I
OK
V
OUT
I
OUT
T
stg
DC supply voltage –0.5 to +7.0 V DC input diode current VI < 0 –18 mA DC input voltage DC output diode current VO < 0 –50 mA DC output voltage DC output current output in Low state 128 mA Storage temperature range –65 to 150 °C
PARAMETER CONDITIONS RATING UNIT
3
3
1, 2
–1.2 to +7.0 V
output in Off or High state –0.5 to +5.5 V
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1995 Sep 06
2
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