Panasonic AN8085M, AN8085, AN8035M, AN8035, AN8045M Datasheet

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AN8000/AN8000M Series
3-pin Positive Output Low Dropout Voltage Regulator (50mA Type)
Overview
The AN8000 series is 3-pin low-dropout fixed positi ve output monolithic voltage regulators. Since thier power consumption can be minimized, they are suitable for bat­tery stabilizing power supply and reference voltage. Thir ­teen types of output voltage are available ; 2V, 2.5V, 3V,
3.5V (TO-92 only) , 4V, 4.5V, 5V, 6V, 7V, 8V, 8.5V, 9V, and 10V.
Features
• Output current of up to 50mA
• Low bias current ; 0.6mA (typ.)
• Output voltage ; 2V, 2.5V, 3V, 3.5V (TO-92 only) , 4V ,
4.5V, 5V, 6V, 7V, 8V, 8.5V, 9V, and 10V.
• Over-voltage protective circuit built-in.
AN8000 Series
AN8000M Series
5.0±0.2
(Bottom View) TO-92 Plastic Package (SSIP003-P-0000)
2.6
45˚
2.54
321
0.45
4.6max.
1.8max.
+ 0.2 – 0.1
2.3±0.2
2.6max.
Unit:mm
Unit:mm
1.6max.
4.25max.
4.0±0.2
5.1±0.213.5±0.5
1 : Input 2 : Output 3 : GND
Block Diagram
V
Starter
I
Voltage Reference
+
Error Amp.
C
Current Limiter
+
OUT
0.48max.
123
3-pin Mini Power type Plastic Package (TO-243) (HSIP003-P-0000B)
R
2
R
1
1.5
0.58max.
3.0
: TO-92
0.8min.
0.44max.
1 : Output 2 : GND 3 : Input
: TO-243
231
123
V
O
R1=5k CIN=0.33µF C
=10µF
OUT
Absolute Maximum Ratings (Ta=25˚C)
Parameter Symbol Rating Supply voltage Supply current Power dissipation Operating ambient temperature
Storage temperature
*
Mounting onto the PCB (20 × 20 × 1.7mm glass epoxy copper foil 1 cm2 or more), for AN8000M Series.
AN8000 Series AN8000M Series
V
I
I
CC
P
D
T
opr
T
stg
20
100
*
650
–30 to+80 –55 to+150 –55 to+125
Electrical Characteristics (Ta=25˚C)
AN8002/AN8002M (2V Type)
·
Parameter Symbol Condition min typ max Output voltage Line regulation
Load regulation
Minimum I/O voltage difference
Bias current Ripple rejection ratio Output noise voltage Output voltage temperature coefficient
Note1) The specified condition T
=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that
j
REG
REG
V
DIF (min.)
V
V
I RR
V
bias
O
the drift in characteristic value due to a temperature rise at chip junction can be ignored.
Note2) Unless otherwise specified, VI=3V, IO=20mA, CO=10µF
T
=25˚C
O
j
=2.5 to 8V, Tj=25˚C
V
I
IN
=1 to 40mA, Tj=25˚C
I
O
L
=1 to 50mA, Tj=25˚C
I
O
VI=1.9V, IO=20mA, Tj=25˚C
=1.9V, IO=50mA, Tj=25˚C
V
I
I
=0mA, Tj=25˚C
O
V
=3 to 5V, f=120Hz
I
f=10Hz to 100kHz
no
=–30 to+125˚C
T
/Ta
j
1.92
62
10
0.12
74 60
0.1
2 7
Unit
V
mA
mW
˚C
˚C
2.08 V2 40 20 mV 25
0.2
0.3 1
mV/˚C
Unit
mV
mV
V0.06 V
mA0.6
dB
µV
AN8025/AN8025M (2.5V Type)
·
Parameter Symbol Condition min typ max Unit Output voltage Line regulation
Load regulation
Minimum I/O voltage difference
Bias current Ripple rejection ratio Output noise voltage Output voltage temperature coefficient
Note1) The specified condition T
V
REG
REG
V
DIF (min.)
bias
V
VO/Ta
=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that
j
Tj=25˚C
O
=3 to 8.5V, Tj=25˚C
V
I
IN
IO=1 to 40mA, Tj=25˚C
L
=1 to 50mA, Tj=25˚C
I
O
VI=2.4V, IO=20mA, Tj=25˚C VI=2.4V, IO=50mA, Tj=25˚C I
=0mA, Tj=25˚C
O
V
=3.5 to 5.5V, f=120Hz
I
f=10Hz to 100kHz
no
no
=–30 to+125˚C
T
j
the drift in characteristic value due to a temperature rise at chip junction can be ignored.
Note2) Unless otherwise specified, VI=3.5V, IO=20mA, CO=10µF
2.4
60
2.5
12.5
0.12
0.13
2.6 V2.5 50
mV
8
20 mV
mV
25
0.2
0.3
72 65
V0.07 V
mA0.6I
1
dBRR
µVV
mV/˚C
Electrical Characteristics (Ta=25˚C)
AN8003/AN8003M (3V Type)
·
Parameter Symbol Condition min typ max Output voltage Line regulation
Load regulation
Minimum I/O voltage difference
Bias current Ripple rejection ratio Output noise voltage Output voltage temperature coefficient
V
REG
REG
V
DIF (min.)
I
bias
RR
no
VO/Ta
O
=25˚C
T
j
IN
=1 to 40mA, Tj=25˚C
I
O
L
=1 to 50mA, Tj=25˚C
I
O
=2.9V, IO=20mA, Tj=25˚C
V
I
=2.9V, IO=50mA, Tj=25˚C
V
I
=0mA, Tj=25˚C
I
O
=4 to 6V, f=120Hz
V
I
f=10Hz to 100kHz
=–30 to+125˚C
T
j
2.88
58
3 9
15
0.12
70 70
Note1) The specified condition Tj=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that
the drift in characteristic value due to a temperature rise at chip junction can be ignored.
Note2) Unless otherwise specified, VI=4V, IO=20mA, CO=10µF
AN8035/AN8035M (3.5V Type)
·
Parameter Symbol Condition min typ max Output voltage Line regulation
Load regulation
Minimum I/O voltage difference
Bias current Ripple rejection ratio Output noise voltage Output voltage temperature coefficient
Note1) The specified condition T
V
REG
REG
V
DIF (min.)
bias
V
VO/Ta
=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that
j
Tj=25˚C
O
=4 to 9.5V, Tj=25˚C
V
I
IN
IO=1 to 40mA, Tj=25˚C
L
=1 to 50mA, Tj=25˚C
I
O
VI=3.4V, IO=20mA, Tj=25˚C VI=3.4V, IO=50mA, Tj=25˚C I
=0mA, Tj=25˚C
O
V
=4.5 to 6.5V, f=120Hz
I
f=10Hz to 100kHz
no
no
=–30 to+125˚C
T
j
3.36
57
3.5 10 20
0.12
69 75
0.2
the drift in characteristic value due to a temperature rise at chip junction can be ignored.
Note2) Unless otherwise specified, VI=4.5V, IO=20mA, CO=10µF
3.12 V3 50 25 mV 30
0.2
0.3 1
mV/˚C0.15
3.64 V3.5 50 30 mV 40
0.2
0.3 1
mV/˚C
Unit
mVVI=3.5 to 9V, Tj=25˚C
mV
mA0.6
µVV
Unit
mV
mV
mA0.6I
µVV
V0.07 V
dB
V0.07 V
dBRR
AN8004/AN8004M (4V Type)
·
Parameter Symbol Condition min typ max Output voltage Line regulation
Load regulation
Minimum I/O voltage difference
Bias current Ripple rejection ratio Output noise voltage Output voltage temperature coefficient
Note1) The specified condition T
V
REG
REG
V
DIF (min.)
I
bias
V
VO/Ta
=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that
j
Tj=25˚C
O
=4.5 to 10V, Tj=25˚C
V
I
IN
IO=1 to 40mA, Tj=25˚C
L
=1 to 50mA, Tj=25˚C
I
O
VI=3.8V, IO=20mA, Tj=25˚C VI=3.8V, IO=50mA, Tj=25˚C I
=0mA, Tj=25˚C
O
V
=5 to 7V, f=120Hz
I
f=10Hz to 100kHz
no
no
=–30 to+125˚C
T
j
the drift in characteristic value due to a temperature rise at chip junction can be ignored.
Note2) Unless otherwise specified, VI=5V, IO=20mA, CO=10µF
3.84
Unit
4.16 V4
3.5 10 20
0.12
56
67 80
0.2
50
mV
30 mV
mV
40
0.2
0.3 mA0.6
1
mV/˚C
V0.07 V
dBRR µVV
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