ON Semiconductor 2N5060 Technical data

2N5060 Series
Preferred Device
Sensitive Gate Silicon Controlled Rectifiers
Annular PNPN devices designed for high volume consumer applications such as relay and lamp drivers, small motor controls, gate drivers for larger thyristors, and sensing and detection circuits. Supplied in an inexpensive plastic TO−92/TO-226AA package which is readily adaptable for use in automatic insertion equipment.
Features
Sensitive Gate Trigger Current − 200 A Maximum
Low Reverse and Forward Blocking Current − 50 A Maximum,
TC = 110°C
Low Holding Current − 5 mA Maximum
Passivated Surface for Reliability and Uniformity
Device Marking: Device Type, e.g., 2N5060, Date Code
Pb−Free Packages are Available*
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SILICON CONTROLLED
RECTIFIERS
0.8 A RMS, 30 − 200 V
G
A
1
2
3
TO−92
CASE 29
STYLE 10
K
MARKING
DIAGRAM
2N 50xx YWW
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
Semiconductor Components Industries, LLC, 2005
January, 2005 − Rev. 7
1 Publication Order Number:
50xx Specific Device Code Y = Year WW = Work Week
PIN ASSIGNMENT
1 2 3
ORDERING INFORMATION
See detailed ordering and shipping information in the package dimensions section on page 6 of this data sheet.
Preferred devices are recommended choices for future use and best overall value.
Cathode
Gate
Anode
2N5060/D
2N5060 Series
MAXIMUM RATINGS (T
Peak Repetitive Off−State Voltage (Note 1)
(T
= 40 to 110°C, Sine Wave,
J
50 to 60 Hz, Gate Open) 2N5060
On-State Current RMS (180° Conduction Angles; TC = 80°C) I *Average On-State Current
= 25°C unless otherwise noted)
J
Rating
2N5061 2N5062 2N5064
Symbol Value Unit
V
V
DRM,
RRM
V
30
60 100 200
T(RMS)
I
T(AV)
0.8 A A
(180° Conduction Angles)
= 67°C)
(T
C
(T
= 102°C)
C
*Peak Non-repetitive Surge Current,
T
= 25°C
A
I
TSM
0.51
0.255 10 A
(1/2 cycle, Sine Wave, 60 Hz) Circuit Fusing Considerations (t = 8.3 ms) I2t 0.4 A2s *Average On-State Current
I
T(AV)
A
(180° Conduction Angles)
= 67°C)
(T
C
(T
= 102°C)
C
*Forward Peak Gate Power (Pulse Width 1.0 sec; TA = 25°C) P *Forward Average Gate Power (TA = 25°C, t = 8.3 ms) P *Forward Peak Gate Current (Pulse Width 1.0 sec; TA = 25°C) I *Reverse Peak Gate Voltage (Pulse Width 1.0 sec; TA = 25°C) V *Operating Junction Temperature Range T *Storage Temperature Range T
GM
G(AV)
GM RGM
J
stg
0.51
0.255
0.1 W
0.01 W
1.0 A
5.0 V
−40 to +110 °C
−40 to +150 °C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously . If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
1. V
and V
DRM
voltage shall not be applied concurrent with negative potential on the anode. Blocking voltages shall not be tested with a constant current
for all types can be applied on a continuous basis. Ratings apply for zero or negative gate voltage; however, positive gate
RRM
source such that the voltage ratings of the devices are exceeded.
THERMAL CHARACTERISTICS
Characteristic Symbol Max Unit
*Thermal Resistance, Junction−to−Case (Note 2) R Thermal Resistance, Junction−to−Ambient R
JC
JA
75 °C/W
200 °C/W
*Lead Solder Temperature (Lead Length 1/16 from case, 10 s Max) +230* °C
2. This measurement is made with the case mounted “flat side down” on a heatsink and held in position by means of a metal clamp over the curved surface.
*Indicates JEDEC Registered Data.
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2N5060 Series
ELECTRICAL CHARACTERISTICS (T
= 25°C unless otherwise noted)
C
Characteristic
OFF CHARACTERISTICS
*Peak Repetitive Forward or Reverse Blocking Current (Note 3)
(V
AK
= Rated V
DRM
or V
)T
RRM
C
T
C
= 25°C = 110°C
ON CHARACTERISTICS
*Peak Forward On−State Voltage (Note 4)
(I
= 1.2 A peak @ TA = 25°C)
TM
Gate Trigger Current (Continuous DC) (Note 5)
*(V
= 7.0 Vdc, RL = 100 )T
AK
C
T
C
= 25°C = −40°C
Gate Trigger Voltage (Continuous DC) (Note 5) TC = 25°C
*(V
= 7.0 Vdc, RL = 100 )T
AK
= −40°C
C
*Gate Non−Trigger Voltage
(V
= Rated V
AK
, RL = 100 )TC = 110°C
DRM
Holding Current (Note 5) TC = 25°C
*(V
= 7.0 Vdc, initiating current = 20 mA) TC = −40°C
AK
Turn-On Time
Delay Time Rise Time (I
= 1.0 mA, VD = Rated V
GT
DRM
,
Forward Current = 1.0 A, di/dt = 6.0 A/s
Turn-Off Time
(Forward Current = 1.0 A pulse, Pulse Width = 50 s,
0.1% Duty Cycle, di/dt = 6.0 A/s, dv/dt = 20 V/s, I
= 1 mA) 2N5060, 2N5061
GT
2N5062, 2N5064
Symbol Min Typ Max Unit
I
, I
DRM
RRM
V
TM
I
GT
V
GT
V
GD
10
50
1.7 V
200
350
0.8
1.2
0.1
I
H
t
d
t
r
t
q
10 30
5.010mA
3.0
0.2
AA
A
V
V
s
s
DYNAMIC CHARACTERISTICS
Critical Rate of Rise of Off−State Voltage
(Rated V
, Exponential)
DRM
3. RGK = 1000 is included in measurement.
4. Forward current applied for 1 ms maximum duration, duty cycle 1%.
current is not included in measurement.
5. R
GK
*Indicates JEDEC Registered Data.
Voltage Current Characteristic of SCR
Symbol Parameter
V I
DRM
V I
RRM
V I
H
DRM
RRM
TM
Peak Repetitive Off State Forward Voltage Peak Forward Blocking Current Peak Repetitive Off State Reverse Voltage Peak Reverse Blocking Current Peak on State Voltage Holding Current
I
RRM
Reverse Avalanche Region
Anode −
dv/dt 30 V/s
on state
at V
RRM
Reverse Blocking Region
(off state)
+ Current
V
TM
I
H
Forward Blocking Region
(off state)
I
DRM
Anode +
at V
DRM
+ Voltage
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